JP2024533115A5 - - Google Patents

Info

Publication number
JP2024533115A5
JP2024533115A5 JP2024513728A JP2024513728A JP2024533115A5 JP 2024533115 A5 JP2024533115 A5 JP 2024533115A5 JP 2024513728 A JP2024513728 A JP 2024513728A JP 2024513728 A JP2024513728 A JP 2024513728A JP 2024533115 A5 JP2024533115 A5 JP 2024533115A5
Authority
JP
Japan
Prior art keywords
power rail
thickness
bpr
contact
mol
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2024513728A
Other languages
English (en)
Japanese (ja)
Other versions
JP2024533115A (ja
Filing date
Publication date
Priority claimed from US17/474,271 external-priority patent/US20230083432A1/en
Application filed filed Critical
Publication of JP2024533115A publication Critical patent/JP2024533115A/ja
Publication of JP2024533115A5 publication Critical patent/JP2024533115A5/ja
Pending legal-status Critical Current

Links

JP2024513728A 2021-09-14 2022-09-07 半導体用埋設パワー・レール Pending JP2024533115A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US17/474,271 2021-09-14
US17/474,271 US20230083432A1 (en) 2021-09-14 2021-09-14 Buried power rail for semiconductors
PCT/CN2022/117553 WO2023040722A1 (en) 2021-09-14 2022-09-07 Buried power rail for semiconductors

Publications (2)

Publication Number Publication Date
JP2024533115A JP2024533115A (ja) 2024-09-12
JP2024533115A5 true JP2024533115A5 (https=) 2024-11-08

Family

ID=85478565

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2024513728A Pending JP2024533115A (ja) 2021-09-14 2022-09-07 半導体用埋設パワー・レール

Country Status (6)

Country Link
US (1) US20230083432A1 (https=)
JP (1) JP2024533115A (https=)
CN (1) CN117941054A (https=)
DE (1) DE112022003738T5 (https=)
GB (1) GB2625643A (https=)
WO (1) WO2023040722A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12588265B2 (en) 2023-08-10 2026-03-24 International Business Machines Corporation Semiconductor structure with enhanced placeholder position margin

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1569273A3 (fr) * 2003-07-30 2005-09-14 St Microelectronics S.A. Lignes conductrices enterrées dans des zones d'isolement
US7517736B2 (en) * 2006-02-15 2009-04-14 International Business Machines Corporation Structure and method of chemically formed anchored metallic vias
US10170413B2 (en) * 2016-11-28 2019-01-01 Taiwan Semiconductor Manufacturing Co., Ltd. Semiconductor device having buried metal line and fabrication method of the same
US10475692B2 (en) * 2017-04-07 2019-11-12 Globalfoundries Inc. Self aligned buried power rail
WO2019151024A1 (ja) * 2018-02-02 2019-08-08 東京エレクトロン株式会社 半導体装置及びその製造方法
CN111699550B (zh) * 2018-03-19 2023-05-09 东京毅力科创株式会社 三维器件及其形成方法
US10685865B2 (en) * 2018-07-17 2020-06-16 Varian Semiconductor Equipment Associates, Inc. Method and device for power rail in a fin type field effect transistor
KR102576212B1 (ko) * 2018-09-21 2023-09-07 삼성전자주식회사 반도체 장치
US10872818B2 (en) * 2018-10-26 2020-12-22 Taiwan Semiconductor Manufacturing Company, Ltd. Buried power rail and method forming same
EP3671825A1 (en) * 2018-12-20 2020-06-24 IMEC vzw Method for connecting a buried interconnect rail and a semiconductor fin in an integrated circuit chip
US10720391B1 (en) * 2019-01-04 2020-07-21 Globalfoundries Inc. Method of forming a buried interconnect and the resulting devices
US11101217B2 (en) * 2019-06-27 2021-08-24 International Business Machines Corporation Buried power rail for transistor devices
EP3840054B1 (en) * 2019-12-20 2023-07-05 Imec VZW Self-aligned contacts for walled nanosheet and forksheet field effect transistor devices
US20220020665A1 (en) * 2020-07-14 2022-01-20 Qualcomm Incorporated Double-side back-end-of-line metallization for pseudo through-silicon via integration
CN114512453B (zh) * 2020-11-17 2025-08-05 中芯国际集成电路制造(上海)有限公司 半导体结构及其形成方法

Similar Documents

Publication Publication Date Title
US10784167B2 (en) Isolation components for transistors formed on fin features of semiconductor substrates
TWI740877B (zh) 鰭型場效電晶體結構及其製造方法
US10242917B2 (en) Semiconductor devices including active fins and methods of manufacturing the same
US9659964B2 (en) Method and structure for preventing epi merging in embedded dynamic random access memory
US9437504B2 (en) Method for the formation of fin structures for FinFET devices
US10103247B1 (en) Vertical transistor having buried contact, and contacts using work function metals and silicides
US9373702B2 (en) Carbon-doped cap for a raised active semiconductor region
US8076190B2 (en) Sea-of-fins structure on a semiconductor substrate and method of fabrication
US8236634B1 (en) Integration of fin-based devices and ETSOI devices
TWI660511B (zh) 垂直場效電晶體與鞍形鰭式場效電晶體的整合
US11757015B2 (en) Semiconductor devices
US9793174B1 (en) FinFET device on silicon-on-insulator and method of forming the same
US9224654B2 (en) Fin capacitor employing sidewall image transfer
JP2024533115A5 (https=)
US9917174B2 (en) Semiconductor devices and methods of manufacturing the same
US10790282B2 (en) Semiconductor devices
CN106601678A (zh) 一种半导体器件及其制备方法、电子装置
US10211317B1 (en) Vertical-transport field-effect transistors with an etched-through source/drain cavity
TW201733015A (zh) 鰭狀場效電晶體及其製造方法
TW201203384A (en) Self-aligned contacts for field effect transistor devices
GB2625643A (en) Buried power rail for semiconductors
US11063150B2 (en) Semiconductor devices
TWI915936B (zh) 半導體裝置及其形成方法
US20260101582A1 (en) Integrated circuit with p/n gaa transistors of different channel materials
TWI732607B (zh) 半導體元件及其製備方法