JP2024108448A5 - - Google Patents

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Publication number
JP2024108448A5
JP2024108448A5 JP2023012826A JP2023012826A JP2024108448A5 JP 2024108448 A5 JP2024108448 A5 JP 2024108448A5 JP 2023012826 A JP2023012826 A JP 2023012826A JP 2023012826 A JP2023012826 A JP 2023012826A JP 2024108448 A5 JP2024108448 A5 JP 2024108448A5
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JP
Japan
Prior art keywords
arrangement
ray detector
detector
axis
adjustment mechanism
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JP2023012826A
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English (en)
Japanese (ja)
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JP7845687B2 (ja
JP2024108448A (ja
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Priority to JP2023012826A priority Critical patent/JP7845687B2/ja
Priority claimed from JP2023012826A external-priority patent/JP7845687B2/ja
Priority to US18/407,503 priority patent/US12487195B2/en
Publication of JP2024108448A publication Critical patent/JP2024108448A/ja
Publication of JP2024108448A5 publication Critical patent/JP2024108448A5/ja
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JP2023012826A 2023-01-31 2023-01-31 検出器台座及びｘ線回折装置 Active JP7845687B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2023012826A JP7845687B2 (ja) 2023-01-31 2023-01-31 検出器台座及びｘ線回折装置
US18/407,503 US12487195B2 (en) 2023-01-31 2024-01-09 Detector stand and X-ray diffraction apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2023012826A JP7845687B2 (ja) 2023-01-31 2023-01-31 検出器台座及びｘ線回折装置

Publications (3)

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JP2024108448A JP2024108448A (ja) 2024-08-13
JP2024108448A5 true JP2024108448A5 (https=) 2025-03-31
JP7845687B2 JP7845687B2 (ja) 2026-04-15

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JP2023012826A Active JP7845687B2 (ja) 2023-01-31 2023-01-31 検出器台座及びｘ線回折装置

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US (1) US12487195B2 (https=)
JP (1) JP7845687B2 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7845687B2 (ja) * 2023-01-31 2026-04-15 株式会社リガク 検出器台座及びｘ線回折装置

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01187441A (ja) * 1988-01-22 1989-07-26 Rigaku Denki Kk Ｘ線回折装置の三軸回転ゴニオメータ
JP2984232B2 (ja) * 1996-10-25 1999-11-29 株式会社テクノス研究所 Ｘ線分析装置およびｘ線照射角設定方法
US6744850B2 (en) * 2001-01-11 2004-06-01 Therma-Wave, Inc. X-ray reflectance measurement system with adjustable resolution
US6895075B2 (en) * 2003-02-12 2005-05-17 Jordan Valley Applied Radiation Ltd. X-ray reflectometry with small-angle scattering measurement
JP2005055241A (ja) * 2003-08-01 2005-03-03 Rigaku Corp 結晶試料ホルダと結晶評価システム
DE10340072A1 (de) * 2003-08-30 2005-03-31 Bruker Axs Gmbh Virtueller 2-dimensionaler Detektor
US7120228B2 (en) * 2004-09-21 2006-10-10 Jordan Valley Applied Radiation Ltd. Combined X-ray reflectometer and diffractometer
DE102004050543A1 (de) 2004-10-16 2006-04-20 Bruker Axs Gmbh Analysegerät mit variabel ausgeleuchtetem Streifendetektor
US7190762B2 (en) * 2004-10-29 2007-03-13 Broker Axs, Inc Scanning line detector for two-dimensional x-ray diffractometer
DE102006011004B4 (de) * 2006-03-09 2008-12-04 Siemens Ag Röntgensystem mit Röntgen-Flachdetektoren
JP2007256542A (ja) 2006-03-22 2007-10-04 Expert Of Japan:Kk 固定アタッチメント
US7920676B2 (en) * 2007-05-04 2011-04-05 Xradia, Inc. CD-GISAXS system and method
RU2419088C1 (ru) * 2010-02-01 2011-05-20 Учреждение Российской академии наук Физический институт им. П.Н. Лебедева РАН (ФИАН) Рентгеновский спектрометр
KR102003202B1 (ko) 2012-10-18 2019-07-24 칼 짜이스 엑스-레이 마이크로스코피, 인크. 결정학적 그레인 배향 맵핑 능력을 가진 실험실 x-레이 마이크로-단층촬영 시스템
JP2014089143A (ja) * 2012-10-31 2014-05-15 Rigaku Corp Ｘ線検出器およびｘ線回折装置
US9557282B1 (en) * 2013-06-17 2017-01-31 U.S. Department Of Energy High precision detector robot arm system
DE112017003580T5 (de) * 2016-07-15 2019-05-09 Rigaku Corporation Röntgeninspektionsvorrichtung, Röntgendünnfilminspektionsverfahren und Verfahren zum Messen einer Rocking-Kurve
US10794844B2 (en) * 2016-08-10 2020-10-06 Proto Manufacturing, Ltd. Mounting system and sample holder for X-ray diffraction apparatus
JP6467600B2 (ja) * 2016-09-30 2019-02-13 株式会社リガク 波長分散型蛍光ｘ線分析装置
US10295484B2 (en) * 2017-04-05 2019-05-21 Bruker Axs, Inc. Method and apparatus for extending angular coverage for a scanning two-dimensional X-ray detector
JP2018205247A (ja) * 2017-06-08 2018-12-27 富士通株式会社 Ｘ線回折分析方法及びｘ線回折分析装置
US11867595B2 (en) * 2019-10-14 2024-01-09 Industrial Technology Research Institute X-ray reflectometry apparatus and method thereof for measuring three dimensional nanostructures on flat substrate
EP3961199A1 (en) * 2020-08-24 2022-03-02 Malvern Panalytical B.V. X-ray detector for x-ray diffraction analysis apparatus
US12336851B2 (en) * 2022-04-20 2025-06-24 Arion Diagnostics, Inc. Diffractive analyzer of patient tissue
JP7845687B2 (ja) * 2023-01-31 2026-04-15 株式会社リガク 検出器台座及びｘ線回折装置

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