JP2023539422A5 - - Google Patents

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Publication number
JP2023539422A5
JP2023539422A5 JP2023506003A JP2023506003A JP2023539422A5 JP 2023539422 A5 JP2023539422 A5 JP 2023539422A5 JP 2023506003 A JP2023506003 A JP 2023506003A JP 2023506003 A JP2023506003 A JP 2023506003A JP 2023539422 A5 JP2023539422 A5 JP 2023539422A5
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JP
Japan
Prior art keywords
current
voltage
output terminal
channel
signal
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Application number
JP2023506003A
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English (en)
Japanese (ja)
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JP7800930B2 (ja
JP2023539422A (ja
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Priority claimed from PCT/IB2021/056696 external-priority patent/WO2022023915A1/en
Publication of JP2023539422A publication Critical patent/JP2023539422A/ja
Publication of JP2023539422A5 publication Critical patent/JP2023539422A5/ja
Application granted granted Critical
Publication of JP7800930B2 publication Critical patent/JP7800930B2/ja
Active legal-status Critical Current
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JP2023506003A 2020-07-27 2021-07-26 電気信号を生成及び測定するためのシステム及び方法 Active JP7800930B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
AU2020902625 2020-07-27
AU2020902625A AU2020902625A0 (en) 2020-07-27 Source measurement unit
PCT/IB2021/056696 WO2022023915A1 (en) 2020-07-27 2021-07-26 Systems and methods for generating and measuring electrical signals

Publications (3)

Publication Number Publication Date
JP2023539422A JP2023539422A (ja) 2023-09-14
JP2023539422A5 true JP2023539422A5 (enExample) 2024-04-25
JP7800930B2 JP7800930B2 (ja) 2026-01-16

Family

ID=80035277

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023506003A Active JP7800930B2 (ja) 2020-07-27 2021-07-26 電気信号を生成及び測定するためのシステム及び方法

Country Status (5)

Country Link
US (2) US12292458B2 (enExample)
EP (1) EP4189409A4 (enExample)
JP (1) JP7800930B2 (enExample)
CN (1) CN115989419A (enExample)
WO (1) WO2022023915A1 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20230030436A (ko) * 2021-08-25 2023-03-06 삼성전자주식회사 모니터링 회로, 모니터링 회로를 포함하는 집적 회로 및 모니터링 회로의 동작 방법
CN115598445B (zh) * 2022-10-25 2023-12-01 浙江御辰东智能科技有限公司 一种基于硬件在环的电气故障检测方法及装置
US12422461B2 (en) * 2023-10-05 2025-09-23 Analog Devices International Unlimited Company Method to measure high voltages accurately
WO2025208205A1 (en) * 2024-03-30 2025-10-09 Seron Electronics Ltd. Systems and methods for implementing and controlling source-measurement systems
WO2025219848A1 (en) * 2024-04-15 2025-10-23 Nicslab, Inc. Electrical power supplies and related systems

Family Cites Families (16)

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Publication number Priority date Publication date Assignee Title
US6836272B2 (en) * 2002-03-12 2004-12-28 Sun Microsystems, Inc. Frame buffer addressing scheme
US7256600B2 (en) * 2004-12-21 2007-08-14 Teradyne, Inc. Method and system for testing semiconductor devices
KR100643246B1 (ko) * 2005-05-31 2006-11-10 삼성전자주식회사 디스플레이 장치
JP4293245B2 (ja) * 2007-02-15 2009-07-08 株式会社デンソー 車両用バッテリ電流検出装置
US7903008B2 (en) * 2007-11-08 2011-03-08 National Instruments Corporation Source-measure unit based on digital control loop
JP5003955B2 (ja) * 2007-11-21 2012-08-22 横河電機株式会社 Ｉｃテスタ
KR20130068126A (ko) * 2011-12-15 2013-06-25 한국전자통신연구원 정류기, 이를 이용한 수신 신호 강도 표시기 및 수신기
US8847674B1 (en) * 2013-03-13 2014-09-30 General Electric Company Systems and methods for power limiting for a programmable I/O device
JP6531370B2 (ja) * 2014-10-17 2019-06-19 株式会社リコー 液滴吐出装置、液滴吐出方法、及びプログラム
DE112017001269T5 (de) 2016-03-11 2018-11-29 Analog Devices Global Unlimited Company Ausbildbare Hardwareplattform für Messung oder Steuerung
CN206460350U (zh) * 2017-02-17 2017-09-01 烟台海博电气设备有限公司 一种高精度多通道程控电流源电路
JP6797065B2 (ja) * 2017-04-27 2020-12-09 日立オートモティブシステムズ株式会社 車載用電子制御装置
KR101918167B1 (ko) 2017-06-19 2018-11-13 주식회사 지파랑 반도체 소자 측정용 소스 및 측정 장치
WO2020095140A1 (ja) * 2018-11-08 2020-05-14 株式会社半導体エネルギー研究所 半導体装置、及び電子機器
FR3097985A1 (fr) * 2019-06-28 2021-01-01 Stmicroelectronics (Grenoble 2) Sas Compensation de chute de tension de câble
US11558062B2 (en) * 2019-07-25 2023-01-17 Bfly Operations, Inc. Methods and apparatuses for turning on and off an ADC driver in an ultrasound device

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