JP2022537141A - 単一粒子分析のためのシステムおよび方法 - Google Patents

単一粒子分析のためのシステムおよび方法 Download PDF

Info

Publication number
JP2022537141A
JP2022537141A JP2021573447A JP2021573447A JP2022537141A JP 2022537141 A JP2022537141 A JP 2022537141A JP 2021573447 A JP2021573447 A JP 2021573447A JP 2021573447 A JP2021573447 A JP 2021573447A JP 2022537141 A JP2022537141 A JP 2022537141A
Authority
JP
Japan
Prior art keywords
ion
ions
poles
voltage
electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2021573447A
Other languages
English (en)
Japanese (ja)
Other versions
JP2022537141A5 (https=
Inventor
ユーペン チェン，
Original Assignee
シャンハイ ポラリス バイオロジー カンパニー， リミテッド
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by シャンハイ ポラリス バイオロジー カンパニー， リミテッド filed Critical シャンハイ ポラリス バイオロジー カンパニー， リミテッド
Publication of JP2022537141A publication Critical patent/JP2022537141A/ja
Publication of JP2022537141A5 publication Critical patent/JP2022537141A5/ja
Pending legal-status Critical Current

Links

Images

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/48—Biological material, e.g. blood, urine; Haemocytometers
    • G01N33/50—Chemical analysis of biological material, e.g. blood, urine; Testing involving biospecific ligand binding methods; Immunological testing
    • G01N33/68—Chemical analysis of biological material, e.g. blood, urine; Testing involving biospecific ligand binding methods; Immunological testing involving proteins, peptides or amino acids
    • G01N33/6803—General methods of protein analysis not limited to specific proteins or families of proteins
    • G01N33/6848—Methods of protein analysis involving mass spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/1031—Investigating individual particles by measuring electrical or magnetic effects
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0031—Step by step routines describing the use of the apparatus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/062—Ion guides
    • H01J49/063—Multipole ion guides, e.g. quadrupoles, hexapoles
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/067—Ion lenses, apertures, skimmers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/24—Vacuum systems, e.g. maintaining desired pressures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N2015/1006—Investigating individual particles for cytology
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2458/00—Labels used in chemical analysis of biological material
    • G01N2458/15—Non-radioactive isotope labels, e.g. for detection by mass spectrometry

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Molecular Biology (AREA)
  • Immunology (AREA)
  • Plasma & Fusion (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Hematology (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Biochemistry (AREA)
  • Urology & Nephrology (AREA)
  • General Physics & Mathematics (AREA)
  • Biomedical Technology (AREA)
  • Proteomics, Peptides & Aminoacids (AREA)
  • Biophysics (AREA)
  • Biotechnology (AREA)
  • Cell Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Microbiology (AREA)
  • Dispersion Chemistry (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2021573447A 2019-06-14 2020-05-13 単一粒子分析のためのシステムおよび方法 Pending JP2022537141A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
CNPCT/CN2019/091215 2019-06-14
CN2019091215 2019-06-14
PCT/CN2020/090016 WO2020248757A1 (en) 2019-06-14 2020-05-13 Systems and methods for single particle analysis

Publications (2)

Publication Number Publication Date
JP2022537141A true JP2022537141A (ja) 2022-08-24
JP2022537141A5 JP2022537141A5 (https=) 2023-04-28

Family

ID=73781330

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021573447A Pending JP2022537141A (ja) 2019-06-14 2020-05-13 単一粒子分析のためのシステムおよび方法

Country Status (6)

Country Link
US (1) US12154777B2 (https=)
EP (1) EP3983808A4 (https=)
JP (1) JP2022537141A (https=)
CN (1) CN114222922B (https=)
AU (1) AU2020292464A1 (https=)
WO (1) WO2020248757A1 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3983808A4 (en) 2019-06-14 2023-05-24 Shanghai Polaris Biology Co., Ltd. SINGLE PARTICLE ANALYSIS SYSTEMS AND METHODS
WO2025213276A1 (en) * 2024-04-11 2025-10-16 Phytronix Technologies Inc. Apparatus and method for generating an ionized sample

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000311650A (ja) * 1999-02-26 2000-11-07 Hitachi Ltd プラズマイオン源質量分析装置
JP2002181791A (ja) * 2000-12-19 2002-06-26 Mitsubishi Heavy Ind Ltd 化学物質検出装置
JP2007530924A (ja) * 2004-03-25 2007-11-01 エムディーエス インコーポレイテッド ドゥーイング ビジネス スルー イッツ エムディーエス サイエックス ディヴィジョン 元素分析とリンクしたフローサイトメトリーの方法および装置
JP2009516842A (ja) * 2005-11-23 2009-04-23 マイクロマス ユーケー リミテッド 質量分析計
JP2012517083A (ja) * 2009-02-06 2012-07-26 カメカ ２重集束を有する磁気色消し質量分析計
US20170110302A1 (en) * 2015-10-16 2017-04-20 Bruker Daltonik Gmbh Structural elucidation of intact heavy molecules and molecular complexes in mass spectrometers
JP2018520481A (ja) * 2015-07-23 2018-07-26 株式会社島津製作所 イオンガイド装置
US20180350575A1 (en) * 2017-06-02 2018-12-06 Thermo Fisher Scientific (Bremen) Gmbh Mass Error Correction Due to Thermal Drift in a Time of Flight Mass Spectrometer
US20190164737A1 (en) * 2017-06-06 2019-05-30 Shimadzu Research Laboratory(Shanghai) Co., Ltd. Ion migration rate analysis device and analysis method applied

Family Cites Families (53)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5689111A (en) 1995-08-10 1997-11-18 Analytica Of Branford, Inc. Ion storage time-of-flight mass spectrometer
DE19511333C1 (de) 1995-03-28 1996-08-08 Bruker Franzen Analytik Gmbh Verfahren und Vorrichtung für orthogonalen Einschuß von Ionen in ein Flugzeit-Massenspektrometer
US6987264B1 (en) 1998-01-23 2006-01-17 Analytica Of Branford, Inc. Mass spectrometry with multipole ion guides
US6265717B1 (en) 1998-07-15 2001-07-24 Agilent Technologies Inductively coupled plasma mass spectrometer and method
US6777671B2 (en) 2001-04-10 2004-08-17 Science & Engineering Services, Inc. Time-of-flight/ion trap mass spectrometer, a method, and a computer program product to use the same
JP2005515591A (ja) 2002-01-09 2005-05-26 トラスティーズ オヴ ボストン ユニヴァーシティ イオンサイクロトロン共鳴質量分析法のための装置および方法
US7034292B1 (en) 2002-05-31 2006-04-25 Analytica Of Branford, Inc. Mass spectrometry with segmented RF multiple ion guides in various pressure regions
US6891157B2 (en) 2002-05-31 2005-05-10 Micromass Uk Limited Mass spectrometer
GB2403591B (en) 2002-11-08 2005-09-14 Micromass Ltd Mass spectrometer
GB0226017D0 (en) 2002-11-08 2002-12-18 Micromass Ltd Mass spectrometer
US6838662B2 (en) 2002-11-08 2005-01-04 Micromass Uk Limited Mass spectrometer
JP2004259452A (ja) 2003-02-24 2004-09-16 Hitachi High-Technologies Corp 質量分析装置及び質量分析方法
US6900431B2 (en) 2003-03-21 2005-05-31 Predicant Biosciences, Inc. Multiplexed orthogonal time-of-flight mass spectrometer
US20040195503A1 (en) 2003-04-04 2004-10-07 Taeman Kim Ion guide for mass spectrometers
US7459693B2 (en) 2003-04-04 2008-12-02 Bruker Daltonics, Inc. Ion guide for mass spectrometers
EP1759402B1 (en) 2004-05-21 2015-07-08 Craig M. Whitehouse Rf surfaces and rf ion guides
DE102004028419B4 (de) 2004-06-11 2011-06-22 Bruker Daltonik GmbH, 28359 Massenspektrometer und Reaktionszelle für Ionen-Ionen-Reaktionen
GB0424426D0 (en) 2004-11-04 2004-12-08 Micromass Ltd Mass spectrometer
JP5357538B2 (ja) 2005-03-22 2013-12-04 レコ コーポレイション 等時性湾曲イオンインタフェースを備えた多重反射型飛行時間質量分析計
GB0522327D0 (en) 2005-11-01 2005-12-07 Micromass Ltd Mass spectrometer
GB0605089D0 (en) * 2006-03-14 2006-04-26 Micromass Ltd Mass spectrometer
EP2013895B8 (en) 2006-04-28 2019-07-17 Micromass UK Limited Mass spectrometer
GB0608470D0 (en) 2006-04-28 2006-06-07 Micromass Ltd Mass spectrometer
US8507850B2 (en) 2007-05-31 2013-08-13 Perkinelmer Health Sciences, Inc. Multipole ion guide interface for reduced background noise in mass spectrometry
US7514673B2 (en) 2007-06-15 2009-04-07 Thermo Finnigan Llc Ion transport device
US7781728B2 (en) 2007-06-15 2010-08-24 Thermo Finnigan Llc Ion transport device and modes of operation thereof
US7838826B1 (en) 2008-08-07 2010-11-23 Bruker Daltonics, Inc. Apparatus and method for parallel flow ion mobility spectrometry combined with mass spectrometry
WO2010041296A1 (ja) 2008-10-09 2010-04-15 株式会社島津製作所 質量分析装置
US8309936B2 (en) 2009-02-27 2012-11-13 Trustees Of Columbia University In The City Of New York Ion deflector for two-dimensional control of ion beam cross sectional spread
US8324565B2 (en) 2009-12-17 2012-12-04 Agilent Technologies, Inc. Ion funnel for mass spectrometry
US20110168880A1 (en) 2010-01-13 2011-07-14 Agilent Technologies, Inc. Time-of-flight mass spectrometer with curved ion mirrors
GB2476964A (en) 2010-01-15 2011-07-20 Anatoly Verenchikov Electrostatic trap mass spectrometer
CN101915800B (zh) * 2010-07-08 2012-10-31 中国科学院合肥物质科学研究院 一种微型解吸附离子迁移谱仪
JP5686566B2 (ja) 2010-10-08 2015-03-18 株式会社日立ハイテクノロジーズ 質量分析装置
US8679858B2 (en) * 2011-01-11 2014-03-25 The Board Of Trustees Of The Leland Stanford Junior University Lanthanide mass dots: nanoparticle isotope tags
US9006646B2 (en) 2011-01-25 2015-04-14 Analytik Jena Ag Mass spectrometry apparatus
GB201103255D0 (en) 2011-02-25 2011-04-13 Micromass Ltd Curved ion guide with non mass to charge ratio dependent confinement
US8698075B2 (en) 2011-05-24 2014-04-15 Battelle Memorial Institute Orthogonal ion injection apparatus and process
US8680462B2 (en) 2011-07-14 2014-03-25 Bruker Daltonics, Inc. Curved heated ion transfer optics
WO2013067366A2 (en) * 2011-11-02 2013-05-10 Leco Corporation Ion mobility spectrometer
CN104508475B (zh) * 2012-07-31 2018-05-04 莱克公司 具有高吞吐量的离子迁移率谱仪
US9218949B2 (en) * 2013-06-04 2015-12-22 Fluidigm Canada, Inc. Strategic dynamic range control for time-of-flight mass spectrometry
CA2938674C (en) * 2014-02-14 2021-04-27 Perkinelmer Health Sciences, Inc. Systems and methods for automated analysis of output in single particle inductively coupled plasma mass spectrometry and similar data sets
US9564305B2 (en) 2014-07-29 2017-02-07 Smiths Detection Inc. Ion funnel for efficient transmission of low mass-to-charge ratio ions with reduced gas flow at the exit
US9799503B2 (en) 2015-01-20 2017-10-24 Agilent Technologies, Inc. Traveling-well ion guides and related systems and methods
CN105470096B (zh) 2016-01-14 2018-06-26 苏州倍优精密仪器有限公司 一种离子漏斗和质谱检测系统
US10163614B1 (en) * 2017-06-26 2018-12-25 Hall Labs, Llc Ion modulator for characterizing larger biomolecules in a differential mobility spectrometer
EP3776623B1 (en) 2018-04-05 2022-12-28 Technische Universität München Partly sealed ion guide and ion beam deposition system
EP3550588A1 (en) 2018-04-05 2019-10-09 Technische Universität München Ion guide comprising electrode wires and ion beam deposition system
EP3550589A1 (en) 2018-04-05 2019-10-09 Technische Universität München Ion guide comprising electrode plates and ion beam deposition system
EP3550587A1 (en) 2018-04-05 2019-10-09 Technische Universität München Partly sealed ion guide and ion beam deposition system
EP3983808A4 (en) 2019-06-14 2023-05-24 Shanghai Polaris Biology Co., Ltd. SINGLE PARTICLE ANALYSIS SYSTEMS AND METHODS
WO2021142651A1 (en) * 2020-01-15 2021-07-22 Shanghai Polaris Biology Co., Ltd. Particle mass spectrometry

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000311650A (ja) * 1999-02-26 2000-11-07 Hitachi Ltd プラズマイオン源質量分析装置
JP2002181791A (ja) * 2000-12-19 2002-06-26 Mitsubishi Heavy Ind Ltd 化学物質検出装置
JP2007530924A (ja) * 2004-03-25 2007-11-01 エムディーエス インコーポレイテッド ドゥーイング ビジネス スルー イッツ エムディーエス サイエックス ディヴィジョン 元素分析とリンクしたフローサイトメトリーの方法および装置
JP2009516842A (ja) * 2005-11-23 2009-04-23 マイクロマス ユーケー リミテッド 質量分析計
JP2012517083A (ja) * 2009-02-06 2012-07-26 カメカ ２重集束を有する磁気色消し質量分析計
JP2018520481A (ja) * 2015-07-23 2018-07-26 株式会社島津製作所 イオンガイド装置
US20170110302A1 (en) * 2015-10-16 2017-04-20 Bruker Daltonik Gmbh Structural elucidation of intact heavy molecules and molecular complexes in mass spectrometers
US20180350575A1 (en) * 2017-06-02 2018-12-06 Thermo Fisher Scientific (Bremen) Gmbh Mass Error Correction Due to Thermal Drift in a Time of Flight Mass Spectrometer
US20190164737A1 (en) * 2017-06-06 2019-05-30 Shimadzu Research Laboratory(Shanghai) Co., Ltd. Ion migration rate analysis device and analysis method applied

Also Published As

Publication number Publication date
EP3983808A4 (en) 2023-05-24
AU2020292464A1 (en) 2021-12-09
US20220148871A1 (en) 2022-05-12
EP3983808A1 (en) 2022-04-20
CN114222922B (zh) 2024-04-05
CN114222922A (zh) 2022-03-22
CA3138502A1 (en) 2020-12-17
US12154777B2 (en) 2024-11-26
WO2020248757A1 (en) 2020-12-17

Similar Documents

Publication Publication Date Title
CN104126116B (zh) 用于离子迁移谱的设备和方法
JP6698698B2 (ja) オーバーサンプル型飛行時間質量分析
CN113169029B (zh) 用于分析离子的设备
US20050133712A1 (en) Scan pipelining for sensitivity improvement of orthogonal time-of-flight mass spectrometers
WO2014089910A1 (zh) 离子迁移率分析器和其组合设备以及离子迁移率分析方法
US12235238B2 (en) Ion mobility separation device
JP2006526265A (ja) 質量分析方法、及び質量分析計
CN101369510A (zh) 环形管状电极离子阱
GB2555247A (en) Ion separator
CN115335963B (zh) 去簇离子导向器
US12154777B2 (en) Systems and methods for single particle analysis
CN109964301B (zh) 用于运输带电粒子的运输装置
US12243736B2 (en) Particle mass spectrometry
JP7367850B2 (ja) 質量分析装置及び方法
CA3138502C (en) Systems and methods for single particle analysis
RU2815362C2 (ru) Системы и способы анализа одиночных частиц
JP2022537141A5 (https=)
HK40071781A (en) Systems and methods for single particle analysis
HK40071781B (zh) 用於单个粒子分析的系统和方法
US20260002905A1 (en) Hybridized ion pre-separation for mass spectrometry
US20260128269A1 (en) Ion Guide with Switchable Operation Modes
EP4693366A1 (en) Multiplexed ion pre-separation for mass spectrometry
US12261034B1 (en) Ion analysis apparatus and method
US20260094800A1 (en) Ion Guide with Configurable Length Electric Field Regions
EP4597541A1 (en) Apparatus and method

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20230420

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20230420

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20240313

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20240327

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20241017