JP2022520547A5 - - Google Patents

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Publication number
JP2022520547A5
JP2022520547A5 JP2021545951A JP2021545951A JP2022520547A5 JP 2022520547 A5 JP2022520547 A5 JP 2022520547A5 JP 2021545951 A JP2021545951 A JP 2021545951A JP 2021545951 A JP2021545951 A JP 2021545951A JP 2022520547 A5 JP2022520547 A5 JP 2022520547A5
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JP
Japan
Prior art keywords
scintillator
tunnel
computed tomography
image
tomography scanner
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2021545951A
Other languages
English (en)
Japanese (ja)
Other versions
JP2022520547A (ja
JP7506677B2 (ja
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Publication date
Priority claimed from EP19155347.8A external-priority patent/EP3690429B1/en
Application filed filed Critical
Publication of JP2022520547A publication Critical patent/JP2022520547A/ja
Publication of JP2022520547A5 publication Critical patent/JP2022520547A5/ja
Application granted granted Critical
Publication of JP7506677B2 publication Critical patent/JP7506677B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2021545951A 2019-02-04 2020-01-31 トンネル型コンピュータ断層撮影スキャナおよびトンネル型コンピュータ断層撮影スキャナのシンチレータから画像を取得する方法 Active JP7506677B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP19155347.8 2019-02-04
EP19155347.8A EP3690429B1 (en) 2019-02-04 2019-02-04 Tunnel ct scanner
PCT/IB2020/050797 WO2020161581A1 (en) 2019-02-04 2020-01-31 Tunnel computerised tomographic scanner and method for acquiring images from a scintillator of a tunnel computerised tomography scanner

Publications (3)

Publication Number Publication Date
JP2022520547A JP2022520547A (ja) 2022-03-31
JP2022520547A5 true JP2022520547A5 (enExample) 2023-12-01
JP7506677B2 JP7506677B2 (ja) 2024-06-26

Family

ID=65910912

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021545951A Active JP7506677B2 (ja) 2019-02-04 2020-01-31 トンネル型コンピュータ断層撮影スキャナおよびトンネル型コンピュータ断層撮影スキャナのシンチレータから画像を取得する方法

Country Status (7)

Country Link
US (1) US11226296B2 (enExample)
EP (1) EP3690429B1 (enExample)
JP (1) JP7506677B2 (enExample)
AU (1) AU2020219470B2 (enExample)
DK (1) DK3690429T3 (enExample)
IL (1) IL284650B2 (enExample)
WO (1) WO2020161581A1 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT202000004246A1 (it) 2020-02-28 2021-08-28 Microtec Srl Apparecchiatura e metodo per eseguire una tomografia computerizzata di un oggetto che presenti forma allungata, in particolare tavole di legno
KR20230109134A (ko) * 2020-11-25 2023-07-19 하마마츠 포토닉스 가부시키가이샤 촬상 유닛 및 촬상 시스템

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5685328A (en) * 1979-12-17 1981-07-11 Uni Pitsutsubaagu Radioactive photographing apparatus
JPH0293351A (ja) * 1988-09-30 1990-04-04 Toshiba Corp 産業用ｃｔ装置
JPH06265487A (ja) * 1993-03-15 1994-09-22 Hitachi Ltd 透過ｘ線による断層像検出方法とその装置
RU2071725C1 (ru) * 1993-06-22 1997-01-20 Научно-производственная коммерческая фирма "Ренси Лтд." Вычислительный томограф (варианты)
WO1999019716A1 (en) * 1997-10-10 1999-04-22 Analogic Corporation Ct target detection using surface normals
GB0903198D0 (en) * 2009-02-25 2009-04-08 Cxr Ltd X-Ray scanners
JP4386812B2 (ja) * 2003-08-27 2009-12-16 パナソニック株式会社 Ｘ線検査装置
EP2438429A4 (en) * 2009-06-05 2014-04-30 Sentinel Scanning Corp TRANSPORT CONTAINER CHECK SYSTEM AND METHOD
JP5784916B2 (ja) * 2011-01-25 2015-09-24 浜松ホトニクス株式会社 放射線画像取得装置
US9250200B1 (en) * 2011-08-15 2016-02-02 Physical Optics Corporation Compton tomography system
JP5944254B2 (ja) * 2012-07-20 2016-07-05 浜松ホトニクス株式会社 放射線画像取得装置
DE102016206444A1 (de) * 2016-04-15 2017-10-19 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung zur optischen Aufnahme eines Schirms
WO2018115325A1 (en) * 2016-12-22 2018-06-28 Teknologisk Institut System and method of x-ray dark field analysis

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