JP2022519362A - 接続モジュール - Google Patents
接続モジュール Download PDFInfo
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- JP2022519362A JP2022519362A JP2021545460A JP2021545460A JP2022519362A JP 2022519362 A JP2022519362 A JP 2022519362A JP 2021545460 A JP2021545460 A JP 2021545460A JP 2021545460 A JP2021545460 A JP 2021545460A JP 2022519362 A JP2022519362 A JP 2022519362A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R25/00—Coupling parts adapted for simultaneous co-operation with two or more identical counterparts, e.g. for distributing energy to two or more circuits
- H01R25/006—Coupling parts adapted for simultaneous co-operation with two or more identical counterparts, e.g. for distributing energy to two or more circuits the coupling part being secured to apparatus or structure, e.g. duplex wall receptacle
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
- H01P5/00—Coupling devices of the waveguide type
- H01P5/12—Coupling devices having more than two ports
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07385—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using switching of signals between probe tips and test bed, i.e. the standard contact matrix which in its turn connects to the tester
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2889—Interfaces, e.g. between probe and tester
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
- H01P3/00—Waveguides; Transmission lines of the waveguide type
- H01P3/003—Coplanar lines
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
- H01R11/11—End pieces or tapping pieces for wires, supported by the wire and for facilitating electrical connection to some other wire, terminal or conductive member
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/648—Protective earth or shield arrangements on coupling devices, e.g. anti-static shielding
- H01R13/658—High frequency shielding arrangements, e.g. against EMI [Electro-Magnetic Interference] or EMP [Electro-Magnetic Pulse]
- H01R13/6581—Shield structure
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/66—Structural association with built-in electrical component
- H01R13/70—Structural association with built-in electrical component with built-in switch
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R24/00—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure
- H01R24/38—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts
- H01R24/40—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts specially adapted for high frequency
- H01R24/42—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts specially adapted for high frequency comprising impedance matching means or electrical components, e.g. filters or switches
- H01R24/46—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts specially adapted for high frequency comprising impedance matching means or electrical components, e.g. filters or switches comprising switches
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R24/00—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure
- H01R24/38—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts
- H01R24/40—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts specially adapted for high frequency
- H01R24/50—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts specially adapted for high frequency mounted on a PCB [Printed Circuit Board]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R31/00—Coupling parts supported only by co-operation with counterpart
- H01R31/005—Intermediate parts for distributing signals
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/0213—Electrical arrangements not otherwise provided for
- H05K1/0216—Reduction of cross-talk, noise or electromagnetic interference
- H05K1/0218—Reduction of cross-talk, noise or electromagnetic interference by printed shielding conductors, ground planes or power plane
- H05K1/0219—Printed shielding conductors for shielding around or between signal conductors, e.g. coplanar or coaxial printed shielding conductors
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/11—Printed elements for providing electric connections to or between printed circuits
- H05K1/118—Printed elements for providing electric connections to or between printed circuits specially for flexible printed circuits, e.g. using folded portions
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/14—Structural association of two or more printed circuits
- H05K1/147—Structural association of two or more printed circuits at least one of the printed circuits being bent or folded, e.g. by using a flexible printed circuit
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K5/00—Casings, cabinets or drawers for electric apparatus
- H05K5/0026—Casings, cabinets or drawers for electric apparatus provided with connectors and printed circuit boards [PCB], e.g. automotive electronic control units
- H05K5/0047—Casings, cabinets or drawers for electric apparatus provided with connectors and printed circuit boards [PCB], e.g. automotive electronic control units having a two-part housing enclosing a PCB
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K9/00—Screening of apparatus or components against electric or magnetic fields
- H05K9/0007—Casings
- H05K9/002—Casings with localised screening
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K9/00—Screening of apparatus or components against electric or magnetic fields
- H05K9/0007—Casings
- H05K9/0049—Casings being metallic containers
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Computer Hardware Design (AREA)
- General Engineering & Computer Science (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measuring Leads Or Probes (AREA)
- Structure Of Printed Boards (AREA)
- Waveguides (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
Description
Claims (22)
- 装置であって、
接続インタフェースと、
前記接続インタフェースに及び前記接続インタフェースから信号を伝導するためのルート伝送線を含む接続マトリクスであって、前記接続マトリクスは、前記ルート伝送線に及び前記ルート伝送線から前記信号を伝導するべく前記ルート伝送線に電気的に接続可能な複数の分岐伝送線をさらに含み、前記分岐伝送線の各々は、デバイスと前記ルート伝送線との間の電気経路の一部である、接続マトリクスと、
前記接続マトリクスを取り囲み、前記接続インタフェースへのアクセスを可能にするハウジングと、
を含み、
前記ルート伝送線と前記分岐伝送線はそれぞれが、前記信号をTEM(transverse electromagnetic)モードで伝導する多導体伝送線である、装置。 - 前記デバイスは、試験システムのためのプローブカードを含む、請求項1に記載の装置。
- 前記接続インタフェースは同軸接続インタフェースを含む、請求項1に記載の装置。
- 前記接続マトリクスは、開状態で前記電気経路に沿った電気接続を切断するように構成され、閉状態で前記電気経路に沿った電気接続をなすように構成されたスイッチを含む、請求項1に記載の装置。
- 前記分岐伝送線は第一の分岐伝送線と第二の分岐伝送線を含み、
前記接続マトリクスは、前記ルート伝送線が前記第一の分岐伝送線又は前記第二の分岐伝送線の何れかに電気的に接続されることを可能にするように構成された第一のスイッチを含む、請求項1に記載の装置。 - 前記スイッチはマルチプレクサ、半導体デバイス、機械的スイッチ、微小電気機械デバイス、又はマルチプレクサ、半導体デバイス、機械的スイッチ、又は微小電気機械デバイスのうちの2つ以上の組合せを含む、請求項5に記載の装置。
- 前記ハウジングは、前記接続マトリクスへの電磁干渉に対するシールドとして機能するように構成される、請求項1に記載の装置。
- 前記ハウジングは金属を含む、請求項1に記載の装置。
- 前記ハウジングは、1つ又は複数の固定具、ロウ付け、溶接、エポキシ、導電性エポキシ、又は固定具、ロウ付け、溶接、エポキシ、又は導電性エポキシのうちの2つ以上の組合せを用いて接続される第一の部分と第二の部分を含む、請求項1に記載の装置。
- 0.7平方インチ以下の断面積を有するモジュールである、請求項1に記載の装置。
- 前記デバイスはプローブカードのコアを含み、
前記コアはピンを含み、前記分岐伝送線の少なくともいくつかは、前記ピンのうちの対応するものと電気接続するように構成される、請求項1に記載の装置。 - 前記分岐伝送線は、1つの信号線と相互に接続された複数の接地線を有するように構成される、請求項11に記載の装置。
- 前記デバイスと前記分岐伝送線との間の前記電気経路の一部である第二の接続インタフェースをさらに含む、請求項1に記載の装置。
- 前記分岐伝送線のいくつかは前記第二の接続インタフェースで終端する、請求項13に記載の装置。
- 前記第二の接続インタフェースにおいて、前記分岐伝送線は少なくとも接地-信号-接地トリプレットを含み、
異なる分岐伝送線は385μm以下のピッチで構成される、請求項14に記載の装置。 - 前記接続マトリクスは、開状態で前記電気経路に沿った電気接続を切断し、閉状態で前記電気経路に沿った電気接続をなす複数のスイッチを含み、
各スイッチは、前記スイッチを開き、又は前記スイッチを閉じるための信号を受信する入力ポートを含む、請求項1に記載の装置。 - 前記接続マトリクスは薄膜回路を含む、請求項1に記載の装置。
- システムにおいて、
被検デバイスに接続されたプローブカードと、
前記プローブカードに請求項1に記載の装置を介して接続された試験機器であって、前記試験機器と前記装置との間の接続は、前記接続インタフェースとの接続によって実装される、試験機器と、
を含むシステム。 - 前記試験機器を介して試験を統合し、前記接続マトリクスを構成するための1つ又は複数のコンピューティングデバイスをさらに含む、
請求項18に記載のシステム。 - 前記被検デバイスはミリメートル波デバイスを含む、請求項18に記載のシステム。
- 前記プローブカードは前記被検デバイスと接触するコアを含み、前記装置は前記コアに電気的に接続する、請求項18に記載のシステム。
- 前記スイッチは、第一の数のルート伝送線と第二の数の分岐伝送線とを伝導するように構成される、請求項1に記載の装置。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US16/270,264 | 2019-02-07 | ||
US16/270,264 US10914757B2 (en) | 2019-02-07 | 2019-02-07 | Connection module |
PCT/US2019/062969 WO2020163004A1 (en) | 2019-02-07 | 2019-11-25 | Connection module |
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JP2022519362A true JP2022519362A (ja) | 2022-03-23 |
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JP2021545460A Pending JP2022519362A (ja) | 2019-02-07 | 2019-11-25 | 接続モジュール |
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US (1) | US10914757B2 (ja) |
JP (1) | JP2022519362A (ja) |
KR (1) | KR20210114069A (ja) |
CN (1) | CN113412560A (ja) |
WO (1) | WO2020163004A1 (ja) |
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CN112928560A (zh) * | 2021-02-05 | 2021-06-08 | 成都中科四点零科技有限公司 | 一种自带屏蔽结构的smp连接器 |
CN113092990B (zh) * | 2021-04-22 | 2021-12-21 | 南京米乐为微电子科技有限公司 | 矩阵式积木化毫米波模块搭建系统 |
CN115696888A (zh) * | 2021-07-22 | 2023-02-03 | 启碁科技股份有限公司 | 屏蔽结构及其制造方法 |
US20230045809A1 (en) * | 2021-08-11 | 2023-02-16 | Nanya Technology Corporation | Method for automatically cleaning a probe card and system for automatically performing a needle cleaning |
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JP2003130919A (ja) * | 2001-10-25 | 2003-05-08 | Agilent Technologies Japan Ltd | コネクションボックス及びdutボード評価システム及びその評価方法 |
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US20070040565A1 (en) * | 2005-08-19 | 2007-02-22 | National University of Singapore, Agency For Science, Technology and Research | Compliant probes and test methodology for fine pitch wafer level devices and interconnects |
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2019
- 2019-02-07 US US16/270,264 patent/US10914757B2/en active Active
- 2019-11-25 CN CN201980091524.7A patent/CN113412560A/zh active Pending
- 2019-11-25 KR KR1020217028207A patent/KR20210114069A/ko unknown
- 2019-11-25 JP JP2021545460A patent/JP2022519362A/ja active Pending
- 2019-11-25 WO PCT/US2019/062969 patent/WO2020163004A1/en active Application Filing
Also Published As
Publication number | Publication date |
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KR20210114069A (ko) | 2021-09-17 |
CN113412560A (zh) | 2021-09-17 |
US10914757B2 (en) | 2021-02-09 |
WO2020163004A1 (en) | 2020-08-13 |
US20200256891A1 (en) | 2020-08-13 |
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