JP2022154731A - Heat exchanger testing device and heat exchanger testing method - Google Patents

Abstract

To provide a heat exchanger testing device capable of switching, within a short time, between a state where a high-temperature fluid flows into a primary side of a heat exchanger and a state where a low-temperature fluid flows into the primary side of the heat exchanger.SOLUTION: A heat exchanger testing device 100 is a testing device for a heat exchanger 10 including a primary-side passage 11 and a secondary-side passage 12 and comprises: a high-temperature passage 22 and a low-temperature passage 23 configured to communicate with the primary-side passage 11; a high-temperature branch path 25 branched from the high-temperature passage 22; a low-temperature branch path 26 branched from the low-temperature passage 23; and switch means 15 for switching a test state between a high-temperature test state where a fluid from the high-temperature passage 22 is mainly introduced to the primary-side passage 11 while a fluid from the low-temperature passage 23 is introduced to the low-temperature branch path 26, and a low-temperature test state where the fluid from the low-temperature passage 23 is mainly introduced to the primary-side passage 11 while the fluid from the high-temperature passage 22 is introduced to the high-temperature branch path 25.SELECTED DRAWING: Figure 1

Description

TECHNICAL FIELD The present invention relates to a heat exchanger testing apparatus and a heat exchanger testing method.

2. Description of the Related Art Conventionally, in various industrial fields, various heat exchangers are known that exchange heat between fluid on the primary side (heat source side) and fluid on the secondary side (use side). Heat exchangers may be used, for example, in environments where the fluid entering the primary side changes from hot to cold or cold to hot in a short period of time. In such heat exchangers, the thermal stress associated with the temperature difference between the high-temperature fluid and the low-temperature fluid causes deformation and deterioration of each part of the heat exchanger. Desired.

When creating such a test apparatus, the fluid flowing into the primary side of the heat exchanger, which is the test piece, is alternately switched between a fluid adjusted to a high temperature and a fluid adjusted to a low temperature. It is conceivable to configure so that the However, when switching, it takes time to adjust the temperature of the fluid using the heater and the cooler, that is, time to raise and lower the temperature of the fluid. It is difficult to switch the mixed fluid to flow into the primary side of the heat exchanger in a short period of time.

Accordingly, the present invention has been made in view of the above-mentioned prior art, and its object is to provide a state in which a fluid adjusted to a high temperature flows into the primary side of a heat exchanger and to It is an object of the present invention to provide a test device for a heat exchanger capable of switching between a state in which a fluid adjusted to a low temperature flows in and a state in which the fluid is adjusted to a low temperature.

In order to achieve the above object, a heat exchanger test apparatus according to the present invention is a test apparatus for testing a heat exchanger having a primary side flow path and a secondary side flow path, wherein the primary side flow a high temperature channel configured to connect to the primary side channel; a low temperature channel configured to connect to the primary side channel; a high temperature branch channel branching from the high temperature channel; and a low temperature channel branching from the low temperature channel. a high temperature test state in which fluid from the high temperature flow path is introduced as the primary fluid into the primary flow path while fluid from the low temperature flow path is introduced into the low temperature branch; A switch for switching the test state between a cold test state in which fluid from the cold channel is introduced as the primary fluid into the side channel while fluid from the hot channel is introduced into the hot branch. means.

In the heat exchanger test apparatus according to the present invention, when the test state of the test apparatus is switched to the high temperature test state by the switching means, the fluid in the high temperature flow path is mainly supplied to the primary side flow path of the heat exchanger. While entering as a side fluid, the cold flow path fluid enters the cold branch. Then, when the high-temperature test state is switched to the low-temperature test state, the fluid in the low-temperature channel, which has flowed toward the low-temperature branch channel until then, mainly flows into the primary-side channel, while the high-temperature branch channel: The fluid in the high-temperature flow path, which until then flowed toward the primary side flow path, flows in. That is, when the test state is switched, the inflow destination of the fluid that has flowed through the branch until then is switched to the heat exchanger, so that the test state can be switched in a short time.

Moreover, before switching the test state, it is possible to adjust the temperature of the fluid introduced from the high-temperature flow path or the low-temperature flow path to the branch path in advance. The fluid thus obtained can be immediately made to flow into the primary side flow path of the heat exchanger as the primary side fluid.

In this way, on the primary side of the heat exchanger, it is possible to switch in a short time between the state of introducing the primary side fluid adjusted to a high temperature and the state of introducing the primary side fluid adjusted to a low temperature. Become. As a result, this heat exchanger testing apparatus can be used for testing to evaluate heat exchangers used in an environment where the temperature of the fluid flowing into the primary flow path changes.

The heat exchanger testing device includes a circulation circuit for circulating the secondary fluid introduced into the secondary flow path, and a heat exchanger provided in the circulation circuit and connected to the high temperature branch and the low temperature branch. A heat utilization device may be provided with a fluid may be introduced from the low temperature branch when the switching means is switched to the high temperature test state, and the switching means may Fluid may be introduced from the hot branch when switched to the cold test state.

In this manner, during hot test conditions, the hot flow path fluid may be introduced into the primary flow path of the heat exchanger while the cold flow path fluid may be introduced into the heat utilization device through the cold branch. . In this case, the secondary fluid heated by the primary fluid can be cooled by the fluid from the low temperature branch in the heat utilization device. Similarly, during cold test conditions, the cold flow path fluid may be introduced into the primary flow path of the heat exchanger while the hot flow path fluid may be introduced into the heat utilization device through the hot branch. In this case, the secondary side fluid cooled by the primary side fluid can be heated by the fluid from the high temperature branch in the heat utilization device. Therefore, it is possible to utilize the fluid flowing through the high-temperature branch and the low-temperature branch for controlling the temperature of the fluid flowing through the circulation circuit.

The heat exchanger testing apparatus may include a heating and cooling unit that adjusts the temperature of the secondary side fluid circulating in the circulation circuit, and the heat utilization device is arranged such that the secondary side fluid flows in the circulation circuit. It may be arranged upstream of the heating and cooling unit in the direction.

In this aspect, the secondary side fluid is supplementarily cooled or heated by the fluid introduced from the low temperature channel or the high temperature channel in the heat utilization device, and then introduced into the heating and cooling unit. Therefore, the amount of heat required for heating or cooling the secondary side fluid in the heating/cooling unit can be reduced, and a heating/cooling unit with reduced heating/cooling capacity can be used.

The high temperature branch path may include a high temperature communication path configured to connect from the high temperature flow path to the heat utilization device, and a high temperature exhaust path configured to discharge fluid from the high temperature flow path, and the switching means selects an inflow destination of the fluid in the cold channel or distributes the fluid in the cold channel between the cold communication channel and the cold discharge channel in the high temperature test state; In the above, it may be configured to select an inflow destination of the fluid of the high-temperature channel or distribute the fluid of the high-temperature channel between the high-temperature communication channel and the high-temperature exhaust channel.

In this embodiment, during the hot test conditions, the hot flow path fluid is introduced into the primary flow path of the heat exchanger, while the cold flow path fluid is introduced into the cold connection or into the cold discharge path. It is possible to select either Alternatively, the cold channel fluid can be distributed between the cold communication channel and the cold exhaust channel. Similarly, in the cold test condition, the cold flow path fluid is introduced into the primary flow path of the heat exchanger, while the hot flow path fluid is either introduced into the hot connection or into the hot exhaust path. It is possible to select either Alternatively, the hot flow path fluid can be distributed between the hot communication path and the hot exhaust path. That is, it is possible to select whether or not to use the heat utilization device, and the heat of the fluid in the high-temperature flow path and the low-temperature flow path can be utilized by the heat utilization device as needed. Alternatively, the flow rate can be adjusted and distributed to the heat utilization device as needed.

The heat exchanger testing apparatus further includes a high temperature side temperature sensor provided in the high temperature channel or the high temperature branch, a low temperature side temperature sensor provided in the low temperature channel or the low temperature branch, and the circulation circuit. and a secondary temperature sensor for detecting the temperature of the secondary fluid flowing through the switching means, the switching means further comprising the high temperature side temperature sensor, the low temperature side temperature sensor, and the secondary side temperature sensor and select the destination of the fluid in the cold flow path between the cold communication path and the cold exhaust path in the high temperature test state, or select the flow path of the fluid in the cold flow path and configured to select a destination of the hot flow path fluid or distribute the hot flow path fluid between the hot communication path and the hot exhaust path in the cold test state. may be

In this aspect, use and non-use of the heat utilization device can be switched according to the respective temperatures of the fluid in the high temperature flow path, the fluid in the low temperature flow path, and the secondary side fluid. Alternatively, since each fluid is distributed and introduced, it is possible to adjust the flow rate and distribute to the heat utilization device as necessary.

The heat exchanger testing device includes a high temperature side heat utilization device that is connected to the high temperature branch passage and heats a portion of the high temperature passage downstream of the branch point of the high temperature branch passage with the fluid flowing through the high temperature branch passage. and a low-temperature side heat utilization device that is connected to the low-temperature branch passage and cools a portion of the low-temperature passage downstream of the branch point of the low-temperature branch passage with the fluid flowing through the low-temperature branch passage.

In this aspect, in the low-temperature test state, the temperature is likely to drop in the downstream side of the high-temperature branch path in the high-temperature flow path because the high-temperature fluid does not flow. However, since the high-temperature side heat utilization device heats the portion of the high-temperature flow path downstream of the high-temperature branch path, a decrease in the temperature of that portion is suppressed. Similarly, in the high-temperature test state, since the low-temperature fluid does not flow through the portion of the low-temperature flow path downstream of the low-temperature branch, the temperature of that portion tends to rise. However, since the low-temperature side heat utilization device cools the portion downstream of the low-temperature branch passage in the low-temperature flow path, the temperature rise of the portion is suppressed.

A cooler for cooling the fluid and a heater for heating the fluid may be provided in the low-temperature flow path. As a result, in the low temperature test state, the temperature of the fluid in the low temperature flow path is adjusted and introduced into the primary flow path regardless of the set temperature of the fluid flowing in the primary flow path.

A test method for a heat exchanger according to the present invention comprises a test apparatus comprising a high temperature flow path, a low temperature flow path, a high temperature branch flow path branching from the high temperature flow path, and a low temperature branch flow path branching from the low temperature flow path. A test method for testing a heat exchanger having a primary side flow path and a secondary side flow path, wherein the primary side flow path of the heat exchanger includes the high temperature flow path and the low temperature introducing fluid mainly from the hot flow path as primary fluid into the primary flow path of the heat exchanger, and introducing fluid from the low temperature flow path into the low temperature branch. a high temperature test step of introducing and testing the heat exchanger; introducing the fluid mainly from the low temperature flow path into the primary side flow path of the heat exchanger as the primary side fluid, and a cold test step of introducing fluid into the hot branch to test the heat exchanger, wherein switching between the hot test step and the cold test step comprises introducing fluid from the hot flow path. This is done by switching between a state of introducing mainly into the primary flow path of the heat exchanger and a state of introducing fluid from the cold flow path mainly into the primary flow path of the heat exchanger.

In the heat exchanger testing method according to the present invention, in the high-temperature test step, the fluid in the high-temperature channel mainly flows into the primary-side fluid of the heat exchanger as the primary-side fluid, while the fluid in the low-temperature channel has a low temperature. flow into the fork. Then, when the high-temperature test step is shifted to the low-temperature test step, while the fluid in the low-temperature channel that has flowed toward the low-temperature branch until then mainly flows into the primary-side channel, The fluid in the high-temperature flow path, which had been flowing toward the primary side flow path until , flows in. That is, when the test state is switched, the inflow destination of the fluid that has flowed through the branch path is switched, so that the test state can be switched in a short time.

Moreover, before switching the test state, the temperature of the fluid in the high-temperature flow path or the low-temperature flow path can be adjusted in advance. It can be made to flow into the primary side channel.

Therefore, according to this test method, on the primary side of the heat exchanger, the state of introducing the primary side fluid adjusted to a high temperature and the state of introducing the primary side fluid adjusted to a low temperature are switched in a short time. becomes possible. As a result, it is possible to conduct a test for evaluating the heat exchanger used in an environment where the temperature of the fluid flowing into the primary side flow path changes.

As described above, according to the present invention, a state in which a fluid adjusted to a high temperature flows into the primary side of the heat exchanger and a state in which a fluid adjusted to a low temperature flows into the primary side of the heat exchanger are distinguished. , can provide a test device for heat exchangers that can be switched in a short time.

BRIEF DESCRIPTION OF THE DRAWINGS It is a circuit diagram which shows the outline of the test apparatus for heat exchangers which concerns on 1st Embodiment. 4 is a flow chart showing processing of the test method of the first embodiment; It is a circuit diagram which shows a part of primary side circuit which concerns on 1st Embodiment. It is a circuit diagram which shows a part of primary side circuit which concerns on 1st Embodiment. It is a circuit diagram which shows the outline of the test apparatus for heat exchangers which concerns on 2nd Embodiment. It is a flow chart which shows a part of processing of the test method of a 2nd embodiment. It is a flow chart which shows a part of processing of the test method of a 2nd embodiment. It is a circuit diagram which shows the outline of the test apparatus for heat exchangers which concerns on 3rd Embodiment.

<First embodiment>
As shown in FIG. 1, a test apparatus 100 according to the first embodiment is a test apparatus for testing a heat exchanger 10, which is a test piece. Examples of tests performed by such a test apparatus 100 include, for example, a test in which a high-temperature fluid and a low-temperature fluid are repeatedly flowed into the primary side flow path of a heat exchanger to evaluate a product, a test in which durability is evaluated, and the like. be done. Such a test can be used to test a vehicle-mounted heat exchanger used in an environment where the primary side fluid changes between high temperature and low temperature.

The test apparatus 100 includes a primary side circuit 13 that causes a primary side fluid to flow through a primary side flow path 11 of the heat exchanger 10 and a secondary side circuit 14 that causes a secondary side fluid to flow through a secondary side flow path 12 of the heat exchanger 10 . and switching means 15 for switching the fluid to flow into the primary side flow path 11 . For example, gas such as air is used as the primary fluid, and liquid such as water or antifreeze is used as the secondary fluid. The primary fluid is not limited to gas, and may be liquid such as water or antifreeze. The secondary fluid is not limited to liquid, and may be gas such as air.

The primary side circuit 13 includes an introduction passage 21, a high temperature passage 22 provided with a heater 35, a low temperature passage 23 provided with a cooler 36 and a heater 37, a combined passage 24, and a high temperature branch passage 25. , a cold branch 26 , and an exhaust 27 . The introduction path 21 includes a compressor 31 that pressurizes the fluid supplied from the outside to a pressure greater than the pressure loss that occurs in the primary side flow path 11, and a cooler 32 that cools the fluid whose temperature has increased due to the pressurization. is provided. Further, the introduction path 21 is provided with a discharge means 33 that discharges excess fluid from the introduction path 21 to the outside to adjust the flow rates of the high-temperature flow path 22 and the low-temperature flow path 23 .

The high temperature channel 22 and the low temperature channel 23 are connected to the downstream end of the introduction channel 21 and the upstream end of the combined channel 24, respectively. A downstream end of the combined channel 24 is configured to be connectable to one end of the primary side channel 11 of the heat exchanger 10 as a test piece. The high temperature branch path 25 branches from the downstream side of the heater 35 in the high temperature flow path 22 and leads to the outside of the test apparatus 100 . The low-temperature branch channel 26 branches from the downstream side of the cooler 36 and the heater 37 in the low-temperature channel 23 and leads to the outside of the test apparatus 100 . The discharge path 27 is configured to be connectable to the other end of the primary side flow path 11 of the heat exchanger 10 as a test piece.

The secondary circuit 14 is configured to be connectable to the secondary flow path 12 of the heat exchanger 10, and the secondary circuit 14 is provided with a pump and a heating/cooling unit (not shown). The secondary circuit 14 may be an open circuit configured to be supplied with fluid from the outside, or may be a closed circuit configured to circulate fluid within the secondary circuit 14 .

The switching means 15 can switch the inflow state between a state in which the fluid flows from the high temperature flow path 22 to the primary side flow path 11 and a state in which the fluid flows from the low temperature flow path 23 to the primary side flow path 11. and a control section 43 for controlling the switching mechanism 42 .

The switching mechanism 42 includes a high temperature flow path valve 46 on the high temperature flow path 22, a low temperature flow path valve 47 on the low temperature flow path 23, a high temperature branch path valve 48 on the high temperature branch 25, and a and a cold branch valve 49 . The high temperature flow path valve 46 is arranged downstream of the branch point of the high temperature branch 25 in the high temperature flow path 22 , and the low temperature flow path valve 47 is located downstream of the branch point of the low temperature branch 26 in the low temperature flow path 23 . placed downstream. The four valves 46 to 49 are composed of open/close valves that can be switched between an open state and a closed state.

When the high temperature flow path valve 46 and the low temperature branch valve 49 are open and the low temperature flow path valve 47 and the high temperature branch path valve 48 are closed, the high temperature flow path 22 is connected to the primary side flow path 11 of the heat exchanger 10 . , and the test apparatus 100 is in a high temperature test state. At this time, since the fluid in the low temperature channel 23 flows into the low temperature branch channel 26, the temperature of the fluid in the low temperature channel 23 is reduced by the cooler 36 and the heater 37 before switching to the next low temperature test state. can be adjusted. Similarly, when the cold channel valve 47 and the hot branch valve 48 are open and the hot channel valve 46 and the cold branch valve 49 are closed, the cold channel 23 is on the primary side of the heat exchanger 10. Communicating with the flow path 11, the test apparatus 100 is in the cold test state. At this time, since the fluid in the high temperature channel 22 flows to the high temperature branch channel 25, the temperature of the fluid in the high temperature channel 22 can be adjusted by the heater 35 before switching to the next high temperature test state. In this manner, the test apparatus 100 is configured to switch the test state between the high temperature test state and the low temperature test state in a short time by switching the opening and closing of the four valves 46-49.

A test method of the test apparatus 100 configured as described above will be described with reference to FIG. Here, a test method will be described in which a high temperature test and a low temperature test are repeatedly performed a predetermined number of times on the heat exchanger 10, which is a test piece.

First, the primary side passage 11 of the heat exchanger 10 is connected to the combined passage 24 and the discharge passage 27, and the secondary side passage 12 of the heat exchanger 10 is connected to the secondary circuit 14 (step ST1).

When the tester issues a start command while the heat exchanger 10 is connected to the primary side circuit 13 and the secondary side circuit 14, the controller 43 closes the high temperature flow path valve 46 and the low temperature flow path valve 47. At the same time, the high temperature branch valve 48 and the low temperature branch valve 49 are opened. The control unit 43 further operates the compressor 31, the cooler 32, the heater 35, the cooler 36, and the heater 37 so that the fluid flows from the introduction passage 21 through the high temperature passage 22 to the high temperature branch passage 25, and the low temperature flow. Fluid flow is provided through passage 23 to cold branch 26 . The control unit 43 further causes the fluid having a predetermined temperature to flow into the secondary flow path 12 of the heat exchanger 10 . As a result, the test apparatus 100 enters a preparatory operation state in which the high temperature channel 22 is connected to the high temperature branch channel 25 and the low temperature channel 23 is connected to the low temperature branch channel 26 (step ST2).

In the preparatory operation state, when the temperature of the fluid flowing through the high-temperature branch 25 reaches a predetermined temperature and the temperature of the fluid flowing through the low-temperature branch 26 reaches a predetermined temperature, the control unit 43 opens the high-temperature flow path valve 46. At the same time, the high-temperature branch valve 48 is switched to the closed state (step ST3). That is, the inflow destination of the high-temperature fluid is switched from the high-temperature branch passage 25 to the primary side passage 11 of the heat exchanger 10, and the test apparatus 100 enters the high-temperature test state.

When a predetermined time has passed since the test apparatus 100 was switched to the high-temperature test state, the control unit 43 causes the switching mechanism 42 to switch from the state in which the high-temperature fluid from the high-temperature flow path 22 flows into the primary side flow path 11 to the low-temperature flow. The low-temperature fluid from the passage 23 is switched to flow into the primary passage 11 . That is, the high temperature branch valve 48 is switched to the open state, the high temperature flow path valve 46 is switched to the closed state, the low temperature flow path valve 47 is switched to the open state, and the low temperature branch path valve 49 is switched to the closed state ( step ST4). As a result, the inflow destination of the high temperature fluid is switched from the primary side flow path 11 to the high temperature branch path 25, and the inflow destination of the low temperature fluid is switched from the low temperature branch path 26 to the primary side flow path 11, and the test apparatus 100 performs the high temperature test. state to the cold test state.

After a predetermined period of time has passed since the test apparatus 100 was switched to the low-temperature test state, the control unit 43 determines the number of tests (step ST5). That is, if the number of times the high temperature test and the low temperature test have been performed has not reached the predetermined number, the test apparatus 100 repeats the high temperature test step (step ST3) and the low temperature test step (step ST4). On the other hand, when the number of times of execution reaches the predetermined number, the test apparatus 100 returns to the above-described preparatory operation state (step ST6).

After the test apparatus 100 returns to the preparatory operation state, the control unit 43 stops the operation of the devices 31, 32, 35, 36, and 37 of the test apparatus 100, and The inflow of fluid into the secondary channel 12 is stopped, and the test is terminated.

In the test apparatus 100 configured as described above, when switched to the high temperature test state, the high temperature fluid flows from the high temperature flow path 22 into the primary side flow path 11 as the primary side fluid. At this time, the low-temperature fluid is flowing from the low-temperature flow path 23 to the low-temperature branch path 26 . Therefore, the fluid in the low-temperature flow path 23 can be previously adjusted to the desired temperature before switching to the next low-temperature test state.

When the high-temperature test state is switched to the low-temperature test state, the low-temperature fluid that has flowed through the low-temperature branch passage 26 until then flows from the low-temperature passage 23 into the primary side passage 11, while the high-temperature branch from the high-temperature passage 22 flows. The high-temperature fluid that has flowed through the primary side flow path 11 until then flows into the path 25 . That is, when the destinations of the high-temperature fluid in the high-temperature flow path 22 and the low-temperature fluid in the low-temperature flow path 23 are switched, the destination of the fluid that has flowed through the branch paths 25 and 26 up to that point is changed to the heat exchanger 10. , the test state can be switched in a short time.

Moreover, since the temperature of the fluid introduced from the high-temperature flow path 22 or the low-temperature flow path 23 to the branch paths 25 and 26 can be adjusted before the test state is switched, the temperature can be adjusted when the test state is switched. The adjusted fluid can be immediately made to flow into the primary side flow path 11 of the heat exchanger 10 as the primary side fluid.

In this manner, the high-temperature fluid and the low-temperature fluid can be switched to flow into the primary side flow path 11 of the heat exchanger 10 in a short period of time. As a result, the test apparatus 100 can be used for evaluation tests of heat exchangers used in an environment where the temperature of the fluid flowing into the primary flow path 11 changes.

In the first embodiment, the primary circuit 13 is formed as an open circuit that discharges the fluid flowing out of the discharge path 27 to the outside of the test apparatus 100, but the fluid is returned from the discharge path 27 to the introduction path 21. It may be configured as a closed circuit.

Moreover, although the high temperature flow path 22 and the low temperature flow path 23 are connected to the combined flow path 24 and are connected to the heat exchanger 10, the configuration is not limited to this. For example, as shown in FIG. 3, the confluence channel 24 is omitted, and the high temperature channel 22 and the low temperature channel 23 are configured to directly connect to the header 28 of the primary side channel 11 without merging with each other. may

Moreover, the switching mechanism 42 has a high temperature flow path valve 46, a low temperature flow path valve 47, a high temperature branch path valve 48, and a low temperature branch path valve 49, but is not limited to this. For example, as shown in FIG. 4A, the switching mechanism 42 includes a high temperature side three-way valve 51 arranged at the connection point of the high temperature branch 25 in the high temperature channel 22 and a low temperature branch 26 in the low temperature channel 23. It may also have a low temperature side three-way valve 52 arranged at the connection point. In this case, the four valves 46-49 are omitted. The control unit 43 is configured to switch the inflow destination of the high-temperature fluid and the low-temperature fluid by controlling the flow directions of the high-temperature side three-way valve 51 and the low-temperature side three-way valve 52 to switch the test state of the test apparatus 100 .

Further, the switching mechanism 42 may be configured to have the high temperature side three-way valve 51, the low temperature flow path valve 47, and the low temperature branch path valve 49, and the switching mechanism 42 may include the low temperature side three-way valve 52 and , a hot flow path valve 46 and a hot branch valve 48 .

Moreover, as shown in FIG. 4B, the switching mechanism 42 may have a common three-way valve 53 arranged at the connection point of the high temperature flow path 22, the low temperature flow path 23 and the confluence flow path 24. FIG. In this case, the hot channel valve 46 and the cold channel valve 47 are omitted. The control unit 43 is configured to switch the flow path connected to the primary side flow path 11 by controlling the flow direction of the common three-way valve 53 to switch the test state of the test device 100 .

In addition, the test apparatus 100 is configured such that either one of the high-temperature fluid and the low-temperature fluid is introduced into the primary flow path 11 of the heat exchanger 10 in any test state. It is not limited to this. For example, the high-temperature flow path valve 46 and the low-temperature flow path valve 47 may be constituted by control valves whose opening degrees are adjusted by the controller 43 . In this case, in the high temperature test state, mainly the high temperature fluid of the high temperature flow path 22 flows into the primary side flow path 11, and the low temperature flow of the low temperature flow path 23 whose flow rate is adjusted by adjusting the opening degree of the low temperature flow path valve 47 The fluids are configured to enter simultaneously. Similarly, in the low temperature test state, mainly the low temperature fluid of the low temperature flow path 23 flows into the primary side flow path 11, and the high temperature flow of the high temperature flow path 22 whose flow rate is adjusted by adjusting the opening degree of the high temperature flow path valve 46 The fluids are configured to enter simultaneously.

Moreover, after the preparatory operation (step ST2), the high temperature test precedes the low temperature test, but the present invention is not limited to this. For example, a low temperature test may precede a high temperature test. In this case, after the low temperature test is switched to the high temperature test and a predetermined time has elapsed, the test apparatus 100 is configured to perform conditional determination of the number of tests (step ST5) instead of switching to the low temperature test. . That is, the test is performed in the order of preparatory operation (step ST2), low temperature test (step ST4), high temperature test (step ST3), and condition determination of the number of tests (step ST5).

Further, the test apparatus 100 is configured to switch to the high temperature test state when the fluid flowing through the high temperature branch 25 reaches a predetermined temperature and the fluid flowing through the low temperature branch 26 reaches a predetermined temperature (step ST3), but not limited to this. For example, when the temperature of the fluid flowing through the high temperature branch 25 has reached a predetermined temperature, the test apparatus 100 switches to the high temperature test state even if the temperature of the fluid flowing through the low temperature branch 26 has not reached a predetermined temperature. may be configured.

<Second embodiment>
A test apparatus 100 according to the second embodiment will be described with reference to FIG. Here, the same reference numerals are given to the same components as in the first embodiment, and detailed description thereof will be omitted. In the test apparatus 100 of the second embodiment, the secondary side circuit 14 is formed as a closed circuit that circulates the secondary side fluid, while the secondary side fluid is heated by the fluid of the high temperature branch 25 and the low temperature branch 26. - It differs from the first embodiment in that a heat utilization device 55 for cooling is provided.

The heat utilization device 55 has a heat radiation channel 56 through which the fluid of the high temperature branch 25 and the low temperature branch 26 flows, and a heat receiving channel 57 through which the circulation fluid circulating in the secondary circuit 14 flows. Heat exchange is performed between the channel 56 and the heat receiving channel 57 . A confluence channel 64 connected to the high temperature channel 22 and the low temperature channel 23 is connected to the upstream end of the heat dissipation channel 56 .

The high temperature branch channel 25 has a high temperature communication channel 60 connecting the high temperature channel 22 and the combined channel 64, and a high temperature discharge channel 62 connecting the high temperature channel 22 and the outside. The low temperature branch channel 26 has a low temperature communication channel 61 that connects the low temperature channel 23 and the combined channel 64, and a low temperature discharge channel 63 that connects the low temperature channel 23 and the outside. That is, the high temperature channel 22 is connected to the heat radiation channel 56 via the high temperature communication channel 60 and the combined channel 64, and the low temperature channel 23 is connected to the heat radiation channel 56 via the low temperature communication channel 61 and the combined channel 64. linked.

The secondary side circuit 14 is a closed circuit that circulates the secondary side fluid. and the other end connectable to the portion. A heat utilization device 55, a pump 73, and a heating/cooling unit 74 are provided in the secondary circuit 14, and a detour 75 is connected. One end of the bypass 75 is connected between the heat utilization device 55 and the pump 73 and the other end is connected between the heating/cooling unit 74 and the heat exchanger 10 . That is, the detour 75 is formed to connect the upstream portion of the heat exchanger 10 and the downstream portion of the heat utilization device 55 . 55 is bypassed. The secondary circuit 14 is provided with an on-off valve (not shown) upstream or downstream of the heat exchanger 10. In the preparation operation (step ST2), the circulating fluid passes through the heat exchanger 10. It is configured to circulate through the detour 75 without Therefore, in the preparatory operation (step ST2), the heating/cooling unit 74 adjusts the circulating fluid to a predetermined temperature.

Switching mechanism 42 further includes a hot link valve 66 on hot link 60 and a cold link valve 67 on cold link 61 . A hot branch valve 48 is located on the hot exhaust 62 and a cold branch valve 49 is located on the cold exhaust 63 . The six valves 46 , 47 , 48 , 49 , 66 , 67 are open/close valves that are controlled to open/close by the control unit 43 . By controlling the switching mechanism 42, the test apparatus 100 is configured such that the destinations of the fluid of the high temperature channel 22 and the fluid of the low temperature channel 23 are set to the primary side channel 11 of the heat exchanger 10 and the heat dissipation channel of the heat utilization device 55. 56 , hot exhaust 62 and cold exhaust 63 . That is, the test apparatus 100 is configured not only to switch the test state between the high temperature test and the low temperature test, but also to switch the inflow state of the fluid from the primary side circuit 13 to the heat utilization device 55 .

The test apparatus 100 further includes a high temperature side temperature sensor 77 provided on the high temperature channel 22 , a low temperature side temperature sensor 78 provided on the low temperature channel 23 , and a secondary temperature sensor 78 provided on the secondary circuit 14 . A side temperature sensor 79 is provided. The high temperature side temperature sensor 77 is arranged downstream of the heater 35 in the high temperature flow path 22 and detects the temperature T3 (high temperature side temperature) of the fluid flowing through the high temperature flow path 22 . The low-temperature side temperature sensor 78 is arranged downstream of the heater 37 in the low-temperature flow path 23 and detects the temperature T4 (low-temperature side temperature) of the fluid flowing through the low-temperature flow path. The secondary temperature sensor 79 includes a first temperature sensor 81 arranged upstream of the heat exchanger 10 in the secondary circuit 14 and a second temperature sensor 82 arranged downstream of the heat utilization device 55 . including. The first temperature sensor 81 detects the temperature T1 (upstream temperature) of the fluid immediately before it flows into the heat exchanger 10 in the secondary circuit 14 . The second temperature sensor 82 detects the temperature T2 (downstream temperature) of the fluid immediately after flowing out of the heat utilization device 55 in the secondary circuit 14 . Each temperature sensor 77, 78, 81, 82 transmits a signal indicating each detected temperature T1 to T4 to the control section 43. FIG. The six valves 46 to 49, 66, 67 of the switching mechanism 42 are configured such that the opening/closing states are controlled by the control section 43 based on the respective temperatures T1 to T4.

Here, the test method by the test apparatus 100 of 2nd Embodiment is demonstrated. The preparatory operation (steps ST1, 2, 6) and the condition determination of the number of tests (step ST5) in the second embodiment are the same as in the first embodiment, so the description is omitted here. Only the details are described.

In the high temperature test, as shown in FIG. 6, first, the controller 43 switches the high temperature flow path valve 46 to the open state and switches the high temperature branch path valve 48 and the high temperature communication path valve 66 to the closed state. As a result, the inflow destination of the high temperature fluid in the high temperature flow path 22 is switched to the primary side flow path 11 of the heat exchanger 10 (step ST10). At this time, the low temperature flow path valve 47 and the low temperature communication path valve 67 are switched to the closed state, and the low temperature branch path valve 49 is switched to the open state.

During the high temperature test, the control section 43 refers to the upstream temperature T1, the downstream temperature T2 and the low temperature T4 to determine conditions (step ST11).

When the downstream side temperature T2 is higher than the upstream side temperature T1 and the downstream side temperature T2 is higher than the low temperature side temperature T4, the controller 43 switches the low temperature communication path valve 67 to the open state and opens the low temperature branch path. The valve 49 is switched to the closed state (step ST12). That is, when the temperature of the low-temperature fluid is lower than the temperature of the circulating fluid at the outlet of the heat-utilizer 55, the low-temperature fluid in the low-temperature flow path 23 is caused to flow into the heat-dissipating flowpath 56 of the heat-utilizer 55, and the heat-receiving flowpath 57 to cool the circulating fluid flowing through the

On the other hand, when the upstream temperature T1 is equal to or higher than the downstream temperature T2, or when the low temperature temperature T4 is equal to or higher than the downstream temperature T2, the control unit 43 switches the low temperature communication valve 67 to the closed state, The branch passage valve 49 is switched to the open state (step ST13). That is, when the temperature of the low-temperature fluid is equal to or higher than the temperature of the circulating fluid at the outlet of the heat utilization device 55, the low-temperature fluid in the low-temperature flow path 23 is discharged from the low-temperature discharge path 63 to the outside of the test apparatus 100, and the secondary side circuit 14 circulating fluid is not cooled. Also, the heat utilization device 55 is not used when the upstream temperature T1 is equal to or higher than the downstream temperature T2.

After that, the control section 43 performs a condition determination regarding the elapsed time of the high temperature test (step ST14). If the elapsed time has not reached the predetermined time, the test apparatus 100 repeats the above-described temperature condition determination (step ST11) and control operation (steps ST12 and ST13). On the other hand, when the elapsed time reaches the predetermined time, the high temperature test is ended, and the low temperature test (step ST4) or condition determination of the number of tests (step ST5) is performed.

When performing the low temperature test, as shown in FIG. 7, the control unit 43 first switches the low temperature flow path valve 47 to the open state, and switches the low temperature branch path valve 49 and the low temperature communication path valve 67 to the closed state. As a result, the inflow destination of the low temperature fluid in the low temperature flow path 23 is switched to the primary side flow path 11 of the heat exchanger 10 (step ST15).

In the low temperature test, the control section 43 refers to the upstream temperature T1, the downstream temperature T2, and the high temperature temperature T3 to determine conditions (step ST16).

When the high temperature side temperature T3 is higher than the downstream side temperature T2 and the upstream side temperature T1 is higher than the downstream side temperature T2, the control unit 43 switches the high temperature communication path valve 66 to the open state, The valve 48 is switched to the closed state (step ST17). That is, when the temperature of the high-temperature fluid is higher than the temperature of the circulating fluid at the outlet of the heat-utilizer 55, the high-temperature fluid in the high-temperature flow path 22 is allowed to flow into the heat-dissipating flowpath 56 of the heat-utilizer 55, and the heat-receiving flow The circulating fluid flowing through passage 57 is heated.

On the other hand, when the high temperature side temperature T3 is lower than the downstream side temperature T2, or when the upstream side temperature T1 is lower than the downstream side temperature T2, the control section 43 switches the high temperature communication passage valve 66 to a closed state, The high-temperature branch valve 48 is switched to the open state (step ST18). That is, when the temperature of the high-temperature fluid is equal to or lower than the temperature of the circulating fluid at the outlet of the heat utilization device 55, the high-temperature fluid in the high-temperature flow path 22 is discharged from the high-temperature discharge path 62 to the outside of the test apparatus 100, and the secondary side It does not heat the circulating fluid in circuit 14. That is, the heat utilization device 55 is not used. Also, when the upstream temperature T1 is lower than the downstream temperature T2, the heat utilization device 55 is not used.

After that, the control section 43 performs a condition determination regarding the elapsed time of the low temperature test (step ST19). If the elapsed time has not reached the predetermined time, the test apparatus 100 repeats the above-described temperature condition determination (step ST16) and control operation (steps ST17 and ST18). On the other hand, when the elapsed time reaches the predetermined time, the low temperature test is ended, and the process proceeds to the high temperature test (step ST3) or condition determination of the number of tests (step ST5).

In this embodiment, in the high temperature test state, the fluid in the high temperature flow path 22 is introduced into the primary side flow path 11 of the heat exchanger 10, while the fluid in the low temperature flow path 23 is introduced into the heat utilization device 55 through the low temperature communication path 61. is introduced into the heat dissipation flow path 56 of the . At this time, the secondary side fluid that has undergone heat exchange with the high-temperature fluid in the primary side flow path 11 in the heat exchanger 10 flows into the heat receiving flow path 57 of the heat utilization device 55 . Therefore, the secondary side fluid heated by the primary side fluid can be cooled by the heat utilization device 55 in an auxiliary manner before being introduced into the heating/cooling unit 74 .

Similarly, in the low temperature test state, the fluid in the low temperature flow path 23 is introduced into the primary side flow path 11 of the heat exchanger 10, while the fluid in the high temperature flow path 22 is introduced into the heat utilization device 55 through the high temperature communication path 60. It is introduced into the heat dissipation channel 56 . At this time, the secondary side fluid that has undergone heat exchange with the low-temperature fluid in the primary side flow path 11 in the heat exchanger 10 flows into the heat receiving flow path 57 of the heat utilization device 55 . Therefore, the secondary side fluid cooled by the primary side fluid can be auxiliary heated by the heat utilization device 55 as a preliminary stage before being introduced into the heating/cooling unit 74 .

Therefore, the fluid flowing through the high-temperature flow path 22 and the low-temperature flow path 23 can be used to regulate the temperature of the fluid flowing through the secondary circuit 14 . Therefore, when the fluid in the primary circuit 13 is switched, a rapid temperature change occurring in the secondary channel 12 of the heat exchanger 10 can be alleviated, and the temperature control of the heating/cooling unit 74 at the time of switching can be facilitated. can be Moreover, since the fluid flowing into the heat utilization device can be switched between the fluid from the low temperature flow path 23 and the fluid from the high temperature flow path 22 according to the timing of switching the test state, the switching timing can be controlled. control means becomes unnecessary.

The secondary side fluid can be additionally heated and cooled by the heat utilization device 55 and introduced into the heating/cooling unit 74 . Therefore, the amount of heat required for heating or cooling the secondary side fluid in the heating/cooling unit 74 can be reduced, and the heating/cooling unit 74 with suppressed heating/cooling capacity can be used.

When the test apparatus 100 is in the high temperature test state or the low temperature test state, the six valves 46 to 49, 66, 67 of the switching mechanism 42 are detected by the four temperature sensors 77, 78, 81, 82 by the controller 43. It is configured to be controlled to open and close according to the temperatures T1 to T4. Therefore, the control unit 43 causes the high-temperature fluid and the low-temperature fluid to be introduced from the high-temperature flow path 22 and the low-temperature flow path 23 into the heat utilization device 55 as necessary, thereby auxiliary heating/cooling the secondary side fluid. can be done.

In the test apparatus 100, in the high temperature test state, the fluid in the high temperature channel 22 is introduced into the primary side channel 11 of the heat exchanger 10, while the fluid in the low temperature channel 23 is introduced into the low temperature communication channel 61. It is possible to select whether to introduce it into the low-temperature discharge passage 63 . Similarly, in the low temperature test state, the fluid in the cold flow path 23 is introduced into the primary flow path 11 of the heat exchanger 10, while the fluid in the high temperature flow path 22 is introduced into the high temperature communication path 60 or hot exhaust. It is possible to select whether to introduce it into the path 62 or not. That is, it is possible to select whether or not to use the heat utilization device 55, and the heat of the fluid in the high temperature flow path 22 and the low temperature flow path 23 can be utilized by the heat utilization device 55 as needed.

Although the secondary circuit 14 is formed as a closed circuit that circulates the secondary fluid, it is not limited to this. In the secondary circuit 14, as in the first embodiment, the secondary fluid supplied from one end passes through the secondary flow path 12 of the heat exchanger 10, and flows from the other end. It may also be configured as an open circuit to drain.

Also, the detour 75 may be omitted in the secondary circuit 14 .

Control unit 43 can control switching mechanism 42 based on the temperature detected by one of first temperature sensor 81 and second temperature sensor 82 of secondary temperature sensor 79 . In this case the other sensor is omitted.

Also, the control unit 43 may control the switching mechanism 42 not based on the temperature of the fluid. In this case, the four temperature sensors 77, 78, 81, and 82 are omitted, and the controller 43 causes the low-temperature fluid in the low-temperature flow path 23 to flow into the heat utilization device 55 during the high-temperature test, and the high-temperature fluid flow path 22 during the low-temperature test. of high-temperature fluid flows into the heat utilization device 55, the switching mechanism 42 is controlled.

In addition, in the determination of the temperature condition during the high temperature test (step ST11) and the determination of the temperature condition during the low temperature test (step ST16), the control unit 43 uses the upstream temperature T1 as one of determination factors. Not limited. For example, the control unit 43 may use the target temperature on the upstream side of the heat exchanger 10 instead of the upstream temperature T1, which is the detected temperature. Also, in the temperature condition determination for the high temperature test (step ST11) and the temperature condition determination for the low temperature test (step ST16), the downstream temperature T2 and the upstream temperature T1 (or the target temperature) are not compared. good too.

Moreover, the high temperature branch valve 48 , the low temperature branch valve 49 , the high temperature communication valve 66 , and the low temperature communication valve 67 may be configured by control valves whose openings are adjusted by the controller 43 . In this case, in the high-temperature test state, the fluid of the high-temperature channel 22 mainly flows into the primary-side channel 11, and the openings of the low-temperature branch channel valve 49 and the low-temperature communication channel valve 67 are adjusted to control the flow of the low-temperature channel 23. By distributing the fluid, the cryogenic fluid can be introduced to the heat exploiter 55 at a desired flow rate. Similarly, in the low temperature test state, the fluid of the low temperature channel 23 mainly flows into the primary side channel 11, and the opening of the high temperature branch channel valve 48 and the high temperature communication channel valve 66 is adjusted to control the flow of the high temperature channel 22. By distributing the fluid, the hot fluid can be introduced to the heat utilization device 55 at a desired flow rate.

Further, instead of the compressor 31, a pump for pressurizing the fluid supplied from the outside may be provided in the introduction path 21 of the primary circuit 13 .

Further, the secondary circuit 14 may be provided with a compressor for pressurizing the circulating fluid instead of the pump 73 .

The description of the first embodiment can be applied to the second embodiment, although the description of other configurations, functions and effects is omitted.

<Third Embodiment>
A test apparatus 100 according to the third embodiment will be described with reference to FIG. Here, the same reference numerals are given to the same components as in the first embodiment, and detailed description thereof will be omitted. The third embodiment differs from the first embodiment in that the test apparatus 100 is provided with a high temperature heat utilization device 85 and a low temperature heat utilization device 86 .

The high-temperature heat utilization device 85 is provided in order to suppress the temperature drop of the high-temperature flow path 22 during the low-temperature test, and is located downstream of the branch of the high-temperature branch 25 in the high-temperature flow path 22. It is connected to a portion on the upstream side of the passage valve 46 . The high-temperature heat utilization device 85 heats a portion of the high-temperature flow path 22 downstream of the branch portion of the high-temperature branch 25 with the fluid flowing through the high-temperature branch 25 . The high-temperature heat utilization device 85 may be connected upstream of the combined flow path 24 and downstream of the high-temperature flow path valve 46 .

A heat resistance member 87 is provided between the high temperature heat utilization device 85 and the high temperature flow path valve 46 in the high temperature flow path 22 . The heat resistance member 87 suppresses the heat (cold heat) downstream of the high temperature flow path valve 46 in the high temperature flow path 22 from being transmitted to the high temperature heat utilization device 85 side during the low temperature test.

The low-temperature heat utilization device 86 is provided to suppress an increase in the temperature of the low-temperature flow path 23 during the high-temperature test, and is located downstream of the branching portion of the low-temperature branch path 26 in the low-temperature flow path 23 . It is connected upstream of the passage valve 47 . The low-temperature heat utilization device 86 cools a portion of the low-temperature flow path 23 downstream of the branch of the low-temperature branch 26 with the fluid flowing through the low-temperature branch 26 . The low-temperature heat utilization device 86 may be connected upstream of the combined flow path 24 and downstream of the low-temperature flow path valve 47 .

A heat resistance member 88 is provided between the low temperature heat utilization device 86 and the low temperature flow path valve 47 in the low temperature flow path 23 . The heat resistance member 88 suppresses the heat downstream of the low temperature flow path valve 47 in the low temperature flow path 23 from being transferred to the low temperature heat utilization device 86 during the high temperature test.

Although the heat resistance members 87 and 88 are provided in this embodiment, the heat resistance members 87 and 88 may be omitted.

Although descriptions of other configurations, functions and effects are omitted, the description of the first embodiment can be applied to the second and third embodiments. For example, the mechanisms shown in FIGS. 3 and 4 can be incorporated into the second and third embodiments.

It should be understood that the embodiments disclosed this time are illustrative in all respects and not restrictive. The scope of the present invention is indicated by the scope of the claims rather than the above description, and is intended to include all modifications within the scope and meaning equivalent to the scope of the claims.

100 Test apparatus 10 Heat exchanger 11 Primary side channel 12 Secondary side channel 15 Switching means 22 High temperature channel 23 Low temperature channel 25 High temperature branch channel 26 Low temperature branch channel 36 Cooler 37 Heater 44 Heating and cooling unit 55 Heat utilization device 60 high temperature connecting path 61 low temperature connecting path 62 high temperature exhaust path 63 low temperature exhaust path 77 high temperature side temperature sensor 78 low temperature side temperature sensor 79 secondary side temperature sensor 85 high temperature side heat utilization device 86 low temperature side heat utilization device

Claims (8)

A test apparatus for testing a heat exchanger having a primary side flow path and a secondary side flow path,
a high temperature channel configured to be connected to the primary channel;
a low-temperature channel configured to be connected to the primary-side channel;
a high-temperature branch path branching from the high-temperature flow path;
a low-temperature branch channel branching from the low-temperature channel;
a high temperature test state in which the fluid from the high temperature channel is mainly introduced into the primary channel as the primary fluid while the fluid from the low temperature channel is introduced into the low temperature branch channel; a switching means for switching a test state between a low temperature test state in which the fluid from the low temperature flow path is introduced as the primary side fluid while the fluid from the high temperature flow path is introduced into the high temperature branch. a test device for a heat exchanger, comprising: a circulation circuit for circulating the secondary-side fluid introduced into the secondary-side channel;
a heat utilization device provided in the circulation circuit and connected to the high temperature branch and the low temperature branch,
Fluid may be introduced into the heat utilization device from the low temperature branch when the switching means is switched to the high temperature test state, and when the switching means is switched to the low temperature test state. 2. A heat exchanger test apparatus according to claim 1, wherein fluid may be introduced from said hot branch. A heating and cooling unit for adjusting the temperature of the secondary side fluid circulating in the circulation circuit,
3. The heat exchanger testing apparatus according to claim 2, wherein said heat utilization device is arranged upstream of said heating and cooling unit in the direction in which the secondary side fluid flows in said circulation circuit. The high temperature branch includes a high temperature communication path configured to lead from the high temperature flow path to the heat utilization device, and a high temperature discharge path for discharging fluid from the high temperature flow path,
The cold branch path includes a cold connection path configured to connect from the cold flow path to the heat utilization device, and a cold discharge path for discharging fluid from the cold flow path,
In the high-temperature test state, the switching means selects an inflow destination of the fluid in the low-temperature channel or distributes the fluid in the low-temperature channel between the low-temperature communication channel and the low-temperature exhaust channel. 3. The hot flow path fluid is configured to select or distribute the hot flow path fluid between the hot communication path and the hot exhaust path in a test state. The test device for heat exchangers according to claim 3. a high temperature side temperature sensor provided in the high temperature channel or the high temperature branch;
a low-temperature side temperature sensor provided in the low-temperature channel or the low-temperature branch channel;
a secondary temperature sensor that detects the temperature of the secondary fluid flowing through the circulation circuit;
The switching means switches between the low-temperature communication path and the low-temperature communication path in the high-temperature test state based on the temperature of the fluid detected by the high-temperature side temperature sensor, the low-temperature side temperature sensor, and the secondary side temperature sensor. selects the destination of the fluid in the cold flow path or distributes the fluid in the cold flow path between the high temperature communication path and the high temperature discharge path; 5. A heat exchanger testing apparatus according to claim 4, configured to select a hot flow path fluid destination or distribute said hot flow path fluid. a high-temperature side heat utilization device connected to the high-temperature branch passage, which heats a portion of the high-temperature passage downstream of a branch point of the high-temperature branch passage with the fluid flowing through the high-temperature branch passage;
and a low-temperature side heat utilization device connected to the low-temperature branch passage and cooling a downstream side of the low-temperature branch point of the low-temperature branch passage in the low-temperature passage with a fluid flowing through the low-temperature branch passage. A test device for heat exchangers as described. The heat exchanger test apparatus according to any one of claims 1 to 6, wherein the cold flow path is provided with a cooler for cooling the fluid and a heater for heating the fluid. Using a test apparatus having a high temperature channel, a low temperature channel, a high temperature branch channel branching from the high temperature channel, and a low temperature branch channel branching from the low temperature channel, a primary side channel and a secondary side flow A test method for testing a heat exchanger having channels, comprising:
connecting the high temperature channel and the low temperature channel to the primary side channel of the heat exchanger;
The fluid from the high temperature flow path is introduced as the primary side fluid into the primary flow path of the heat exchanger, and the fluid from the low temperature flow path is introduced into the low temperature branch to test the heat exchanger. a high temperature test step of performing
The fluid from the low temperature flow path is introduced as the primary side fluid into the primary flow path of the heat exchanger, and the fluid from the high temperature flow path is introduced into the high temperature branch path to test the heat exchanger. a cold test step of performing
The switching between the high temperature test step and the low temperature test step is performed by introducing mainly fluid from the high temperature flow path into the primary side flow path of the heat exchanger and introducing mainly fluid from the low temperature flow path. A method of testing a heat exchanger by switching between a state of introducing into the primary side flow path of the heat exchanger.

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