JP2021504948A - 複合量子システムにおいて信号をルーティングするためのシステムおよび方法 - Google Patents
複合量子システムにおいて信号をルーティングするためのシステムおよび方法 Download PDFInfo
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Abstract
Description
Claims (14)
- 量子コンピュータ・システムであって、
2次元レイアウトに配列された複数の量子回路を備え、
前記複数の量子回路は、少なくとも1つの内部量子回路を含み、前記内部量子回路は、前記2次元レイアウトの外周に沿っていない量子回路であり、
前記複数の量子回路のうちの前記少なくとも1つの内部量子回路は、前記複数の量子回路の前記2次元レイアウトの外へ延びる信号線を含む、
量子コンピュータ・システム。 - 前記少なくとも1つの内部量子回路は、複数の層を備え、前記複数の層のうちの上部層は、前記複数の層のうちの底部層へのスルー・ホールを含み、
前記信号線は、少なくとも部分的に前記スルー・ホール内に置かれて、前記底部層を前記上部層へ接続する、
請求項1に記載の量子コンピュータ・システム。 - 前記複数の層のうちの前記底部層は、デバイス層を有する底部チップを備え、前記複数の層のうちの前記上部層は、ルーティング層を有する上部チップを備え、前記信号線は、前記底部チップの前記デバイス層を前記上部チップの前記ルーティング層へ通信接続し、前記信号線は、前記2次元レイアウトの面に平行ではない、請求項2に記載の量子コンピュータ・システム。
- 前記スルー・ホールは、反応性イオン・エッチングによって、またはレーザ・ミリングによって形成される、請求項3に記載の量子コンピュータ・システム。
- 前記スルー・ホールは、1000μm以下の直径を有する、請求項4に記載の量子コンピュータ・システム。
- 前記内部量子回路は、
前記デバイス層上に位置する第1のボンディング・パッド、および
前記ルーティング層上に位置する第2のボンディング・パッド
をさらに備える、請求項3に記載の量子コンピュータ・システム。 - 前記信号線は、前記第1のボンディング・パッドおよび前記第2のボンディング・パッドへ接続される、請求項6に記載の量子コンピュータ・システム。
- 前記少なくとも1つの内部量子回路は、デバイス層およびルーティング層を含み、
前記複数の量子回路の前記2次元レイアウトの外へ延びる前記信号線は、前記デバイス層を前記ルーティング層へ接続する、請求項1に記載の量子コンピュータ・システム。 - 前記ルーティング層中に形成されたスルー・ホールをさらに備え、前記信号線は、前記スルー・ホールを通過する、請求項8に記載の量子コンピュータ・システム。
- 前記スルー・ホールは、反応性イオン・エッチングによって、またはレーザ・ミリングによって形成される、請求項9に記載の量子コンピュータ・システム。
- 前記スルー・ホールは、1000μm以下の直径を有する、請求項9に記載の量子コンピュータ・システム。
- 前記内部量子回路は、
前記デバイス層上に位置する第1のボンディング・パッド、および
前記ルーティング層上に位置する第2のボンディング・パッド
をさらに備える、請求項8に記載の量子コンピュータ・システム。 - 前記信号線は、前記第1のボンディング・パッドおよび前記第2のボンディング・パッドへ接続される、請求項12に記載の量子コンピュータ・システム。
- 複数の量子回路のうちの少なくとも1つの内部量子回路のルーティング層および上部チップ中にスルー・ホールを形成するステップであって、前記内部量子回路は、2次元レイアウトの外周に沿っていない、前記形成するステップと、
キャピラリ・ツールを前記スルー・ホールの上へ位置合わせするステップと、
前記キャピラリ・ツールを前記スルー・ホール中へ挿入するステップと、
信号線の第1の端部を前記内部量子回路のデバイス層上に形成された前記スルー・ホールの底における第1のボンディング・パッドに付けるステップと、
前記信号線の第2の端部を前記内部量子回路のルーティング層上に形成された第2のボンディング・パッドに付けるステップと
を含む、方法。
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Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2011033601A1 (ja) * | 2009-09-21 | 2011-03-24 | 株式会社 東芝 | 3次元集積回路製造方法、及び装置 |
CN105957832A (zh) * | 2016-05-12 | 2016-09-21 | 中国科学院物理研究所 | 用于表面编码方案超导量子比特系统的布线方法及布线板 |
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US20090015317A1 (en) * | 2007-07-13 | 2009-01-15 | Divincenzo David Peter | Methods and systems for controlling qubits |
GB2475099B (en) * | 2009-11-06 | 2012-09-05 | Toshiba Res Europ Ltd | A photon source for producing entangled photons |
US8648331B2 (en) | 2010-11-10 | 2014-02-11 | Microsoft Corporation | Coherent quantum information transfer between topological and conventional qubits |
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US9438245B2 (en) | 2014-10-13 | 2016-09-06 | International Business Machines Corporation | Reducing spontaneous emission in circuit quantum electrodynamics by a combined readout and filter technique |
KR102344884B1 (ko) | 2014-11-25 | 2021-12-29 | 삼성전자주식회사 | 멀티 큐빗 커플링 구조 |
US10381542B2 (en) | 2015-04-30 | 2019-08-13 | International Business Machines Corporation | Trilayer Josephson junction structure with small air bridge and no interlevel dielectric for superconducting qubits |
US9455391B1 (en) * | 2015-05-19 | 2016-09-27 | The United States Of America As Represented By Secretary Of The Navy | Advanced process flow for quantum memory devices and josephson junctions with heterogeneous integration |
US9524470B1 (en) | 2015-06-12 | 2016-12-20 | International Business Machines Corporation | Modular array of vertically integrated superconducting qubit devices for scalable quantum computing |
US10134972B2 (en) * | 2015-07-23 | 2018-11-20 | Massachusetts Institute Of Technology | Qubit and coupler circuit structures and coupling techniques |
US20170033087A1 (en) | 2015-07-31 | 2017-02-02 | Samsung Electronics Co., Ltd. | Stack semiconductor package structure and method of manufacturing the same |
KR101809521B1 (ko) | 2015-09-04 | 2017-12-18 | 주식회사 네패스 | 반도체 패키지 및 그 제조방법 |
US9589236B1 (en) | 2015-09-28 | 2017-03-07 | International Business Machines Corporation | High fidelity and high efficiency qubit readout scheme |
KR102390376B1 (ko) | 2015-12-24 | 2022-04-25 | 삼성전자주식회사 | 멀티-큐비트 소자 및 이를 포함하는 양자컴퓨터 |
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Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2011033601A1 (ja) * | 2009-09-21 | 2011-03-24 | 株式会社 東芝 | 3次元集積回路製造方法、及び装置 |
CN105957832A (zh) * | 2016-05-12 | 2016-09-21 | 中国科学院物理研究所 | 用于表面编码方案超导量子比特系统的布线方法及布线板 |
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