JP2021145018A - 荷電粒子ビーム偏向デバイス - Google Patents
荷電粒子ビーム偏向デバイス Download PDFInfo
- Publication number
- JP2021145018A JP2021145018A JP2020041835A JP2020041835A JP2021145018A JP 2021145018 A JP2021145018 A JP 2021145018A JP 2020041835 A JP2020041835 A JP 2020041835A JP 2020041835 A JP2020041835 A JP 2020041835A JP 2021145018 A JP2021145018 A JP 2021145018A
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- JP
- Japan
- Prior art keywords
- substrate
- light
- optical
- charged particle
- particle beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
- H01J37/147—Arrangements for directing or deflecting the discharge along a desired path
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
- H01J37/045—Beam blanking or chopping, i.e. arrangements for momentarily interrupting exposure to the discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/24—Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
- H01J37/3174—Particle-beam lithography, e.g. electron beam lithography
- H01J37/3177—Multi-beam, e.g. fly's eye, comb probe
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/04—Means for controlling the discharge
- H01J2237/043—Beam blanking
- H01J2237/0432—High speed and short duration
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/04—Means for controlling the discharge
- H01J2237/043—Beam blanking
- H01J2237/0435—Multi-aperture
- H01J2237/0437—Semiconductor substrate
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- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
- Electron Beam Exposure (AREA)
Abstract
Description
Claims (7)
- 基板と、
前記基板に設けられた複数の開口と、
前記開口を通過する荷電粒子ビームを偏向する複数の電極と、
前記複数の電極に与える電圧を制御する複数の受光素子と、
連続光を前記基板に結合する第1光結合器と、
前記第1光結合器で結合した光を2次元面内に分配する光分配器と、
前記光分配器で分配した光の強度変調を行う複数の変調器と、
前記受光素子に変調光を結合させる複数の第2光結合器と、
を備える荷電粒子ビーム偏向デバイス。 - 前記基板は、第1基板と第2基板とを有し、
前記開口は、前記第1基板に設けられた第1開口と、前記第2基板に設けられた第2開口とを有し、
前記第1基板と前記第2基板は互いに積層され、前記第1開口と前記第2開口は、前記第1基板と前記第2基板との積層方向に重ねられ、
前記受光素子は、前記第1基板に設けられ、
前記第1光結合器、前記光分配器、前記変調器、および前記第2光結合器は、前記第2基板に設けられている請求項1記載の荷電粒子ビーム偏向デバイス。 - 前記第2光結合器は、前記第2基板の光導波路を伝播する前記変調光を、前記第1基板に設けられた前記受光素子に結合させる垂直結合器である請求項2記載の荷電粒子ビーム偏向デバイス。
- 前記光分配器と前記垂直結合器とを接続する光導波路が、前記第2基板上の異なる複数の層に設けられている請求項3記載の荷電粒子ビーム偏向デバイス。
- 前記光分配器は、散乱体を含む請求項1〜4のいずれか1つに記載の荷電粒子ビーム偏向デバイス。
- 前記光分配器は、マルチモード干渉カプラを含む請求項1〜4のいずれか1つに記載の荷電粒子ビーム偏向デバイス。
- 前記光分配器は、フォトニック結晶を含む請求項1〜4のいずれか1つに記載の荷電粒子ビーム偏向デバイス。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2020041835A JP7186739B2 (ja) | 2020-03-11 | 2020-03-11 | 荷電粒子ビーム偏向デバイス |
US17/012,656 US11158483B2 (en) | 2020-03-11 | 2020-09-04 | Charged particle beam deflection device |
Applications Claiming Priority (1)
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---|---|---|---|
JP2020041835A JP7186739B2 (ja) | 2020-03-11 | 2020-03-11 | 荷電粒子ビーム偏向デバイス |
Publications (2)
Publication Number | Publication Date |
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JP2021145018A true JP2021145018A (ja) | 2021-09-24 |
JP7186739B2 JP7186739B2 (ja) | 2022-12-09 |
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JP2020041835A Active JP7186739B2 (ja) | 2020-03-11 | 2020-03-11 | 荷電粒子ビーム偏向デバイス |
Country Status (2)
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US (1) | US11158483B2 (ja) |
JP (1) | JP7186739B2 (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2024088718A1 (en) * | 2022-10-27 | 2024-05-02 | Asml Netherlands B.V. | Charged particle-optical apparatus |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005202073A (ja) * | 2004-01-14 | 2005-07-28 | Murata Mfg Co Ltd | 光分岐素子 |
JP2006210460A (ja) * | 2005-01-26 | 2006-08-10 | Canon Inc | 電子線露光装置 |
JP2011258842A (ja) * | 2010-06-10 | 2011-12-22 | Nikon Corp | 荷電粒子線露光装置及びデバイス製造方法 |
US20120286168A1 (en) * | 2010-11-13 | 2012-11-15 | Mapper Lithography Ip B.V. | Data path for lithography apparatus |
JP2013546180A (ja) * | 2010-10-26 | 2013-12-26 | マッパー・リソグラフィー・アイピー・ビー.ブイ. | 変調装置およびそれを使用する荷電粒子マルチ小ビームリソグラフィシステム |
JP2019165188A (ja) * | 2018-03-20 | 2019-09-26 | 株式会社東芝 | 荷電粒子ビーム偏向デバイス |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7015467B2 (en) * | 2002-10-10 | 2006-03-21 | Applied Materials, Inc. | Generating electrons with an activated photocathode |
WO2005010618A2 (en) | 2003-07-30 | 2005-02-03 | Mapper Lithography Ip B.V. | Modulator circuitry |
TWI562186B (en) * | 2010-11-13 | 2016-12-11 | Mapper Lithography Ip Bv | Charged particle lithography system and method for transferring a pattern onto a surface of a target and modulation device for use in a charged particle lithography system |
-
2020
- 2020-03-11 JP JP2020041835A patent/JP7186739B2/ja active Active
- 2020-09-04 US US17/012,656 patent/US11158483B2/en active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005202073A (ja) * | 2004-01-14 | 2005-07-28 | Murata Mfg Co Ltd | 光分岐素子 |
JP2006210460A (ja) * | 2005-01-26 | 2006-08-10 | Canon Inc | 電子線露光装置 |
JP2011258842A (ja) * | 2010-06-10 | 2011-12-22 | Nikon Corp | 荷電粒子線露光装置及びデバイス製造方法 |
JP2013546180A (ja) * | 2010-10-26 | 2013-12-26 | マッパー・リソグラフィー・アイピー・ビー.ブイ. | 変調装置およびそれを使用する荷電粒子マルチ小ビームリソグラフィシステム |
US20120286168A1 (en) * | 2010-11-13 | 2012-11-15 | Mapper Lithography Ip B.V. | Data path for lithography apparatus |
JP2019165188A (ja) * | 2018-03-20 | 2019-09-26 | 株式会社東芝 | 荷電粒子ビーム偏向デバイス |
Also Published As
Publication number | Publication date |
---|---|
JP7186739B2 (ja) | 2022-12-09 |
US11158483B2 (en) | 2021-10-26 |
US20210287873A1 (en) | 2021-09-16 |
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