JP2021063654A - Particle image display device, particle image display program, particle image display method, and particle measurement system - Google Patents

Abstract

To provide a particle image display device 3 that allows an operator to easily generate an intuitive image of a particle dispersion state.SOLUTION: Provided are: a particle information acquisition unit 31 that acquires particle information from one or a plurality of types of particle measuring devices 1 and 2 that measure the particle information, which is information about particles dispersed in a dispersion medium; a deformation rule storage unit 34 that stores a predetermined deformation rule; and a deformed image generation unit 33 that applies the deformation rule to the particle information and converts it to generate a deformed image showing a deformed particle dispersion mode different from the actual particle dispersion mode in the dispersion medium.SELECTED DRAWING: Figure 1

Description

The present invention relates to a particle image display device or the like that acquires information on dispersed particles such as a particle size distribution from a particle measuring device and displays an image of the dispersion mode of the particles.

As one of the particle measuring devices, for example, a light scattering type particle size distribution measuring device is known.

Examples of this type of particle size distribution measuring device include a light scattering type device that measures the particle size distribution based on the intensity of scattered light or diffracted light obtained by irradiating particles in a dispersion medium with light, and a CCD. An actual particle dispersion mode in a dispersion medium is imaged using a camera or an optical system, and the captured image is analyzed to analyze the particle size distribution, as well as individual particle morphologies such as particle aspect ratio, length, and color. There are known image analysis type particles that can measure up to.

The light scattering type has a relatively short measurement time, but it is difficult to measure even the individual morphology of the particles. On the contrary, the image analysis type has to capture and analyze a large number of images. Therefore, although the measurement time is long, even the individual morphology of the particles can be measured.

Therefore, conventionally, it has been considered to use these in combination (Patent Document 1).

Japanese Unexamined Patent Publication No. 2001-337028

However, both the light scattering type and the image analysis type have a problem that it is difficult to generate an image of the particle state in which the particles are actually dispersed and suspended, and it is difficult to intuitively grasp the state.

Therefore, not only does it make the operator feel unfamiliar and difficult to use, but when performing quality control on particle-related products such as pigments using this particle size distribution measuring device, the operator is not intuitive. , The measurement result data must be analyzed carefully, which may take time or cause omission.

Specifically, in the light scattering type, the measurement results are displayed as graphs, numerical values, etc., so it is difficult for even a proficient operator to intuitively grasp the state.

On the other hand, in the image analysis type, since the captured image of the dispersed and suspended particles is actually obtained, it seems that the intuitive state can be easily grasped at first glance. However, in reality, even when looking at such an captured image, since the particle density is low, the probability that particles are included in one image is statistically low, making it difficult to recognize the particles, and the particle size varies. If the display magnification is set so that large particles can be visually recognized, there are many cases where small particles cannot be visually recognized, and in the end, it is difficult to get an image of the particle state and it is difficult to intuitively grasp the state.

Then, such a problem may occur not only in the particle size distribution measuring device but also in other types of particle measuring devices.

The present invention is an epoch-making one made by overturning the common wisdom in the measuring device industry that accurate results are required in order to solve the above problems, and is an image of a faithful particle dispersion mode obtained from the measurement results. By generating a deformed image in which the required features and the like are emphasized from the measurement results, the operator can easily create an intuitive image of the particle dispersion state.

That is, the particle image display device according to the present invention stores a particle information acquisition unit that acquires particle information, which is information about dispersed particles, from one or a plurality of types of particle measurement devices, and a predetermined deformation rule. The deformed particle dispersion unit is converted by applying the deformed rule to the particle information, and the actual particle dispersion mode, that is, the deformed particle dispersion different from the particle dispersion mode obtained from the particle measuring device. It is characterized by including a deformed image generation unit that generates a deformed image in which an aspect is imaged.

The term "dispersed particles" as used herein means that, in addition to particles dispersed in a dispersion medium such as a liquid or gas, particles fixed and dispersed in a preparation or the like are also included.
In addition, "particles" means solid particles and liquid particles (atomic particles, etc.), as well as gas particles in liquid (bubbles, etc.) and liquid particles in liquid (emulsion, oil particles in water), and the like. is there.

According to the present invention described above, it is possible to generate a deformed image in which, for example, required features are emphasized, from the measurement result, instead of representing an image of a faithful particle dispersion mode obtained from the measurement result. You can easily create an intuitive image of the distributed state.

As a result, not only can the operator feel familiar and easy to use, but also, for example, when performing quality control on particle-related products such as pigments, the operator can use this deformed image to display the operator. Since it is possible to intuitively grasp the dispersed particle state, it can be expected that the check efficiency of the measurement result data by the operator will be improved and the check omission will be reduced.

The schematic whole view which shows the whole of the particle measurement system in one Embodiment of this invention. The schematic diagram which shows the particle model in the same embodiment. The flowchart which shows the operation of the deformed image generation part in the same embodiment. The schematic diagram which shows the particle model in another embodiment of this invention. The screen view which shows the deformed image in another embodiment of this invention.

An embodiment of the present invention will be described below with reference to the drawings.

As shown in FIG. 1, the particle measurement system 100 according to the present embodiment includes a plurality of (here, two types) particle measuring devices for measuring particle information which is information about particles dispersed in a dispersion medium, and the particle measurement. It is provided with a particle image display device 3 connected to the device.

The first particle measuring device 1 is a so-called static light scattering type particle size distribution measuring device here. The first particle measuring device 1 irradiates particles (hereinafter, also referred to as a sample) dispersed in a dispersion medium with measurement light such as laser light to obtain diffracted light and / or light intensity for each angle of scattered light. Information processing that calculates and outputs information related to particle size distribution (hereinafter, also referred to as particle size distribution information), which is one of the particle information, based on an optical sensor that measures the distribution of It is equipped with a mechanism (which does not have to be physically integrated). The particle size distribution information here includes several types such as volume-based number distribution information, number-based number distribution information, and density information.

The first particle measuring device 1 for measuring the particle size distribution may be not only the static light scattering type described above but also a dynamic light scattering type. According to this dynamic light scattering type particle size distribution device, a zeta potential indicating the degree of cohesion can also be obtained as particle morphology information described later. In addition, a particle size distribution measuring device such as a centrifugal sedimentation type, a counter type, a sieve, or a differential electrostatic classifier (DMA) may be used.

The second particle measuring device 2 is an image analysis type particle size distribution measuring device here, and has a function as a particle morphology measuring device. The second particle measuring device 2 measures the same sample as the sample measured by the first particle measuring device 1 (strictly speaking, not only the same sample but also a sample of the same origin is included), for example. It includes an image sensor such as a light source and a CCD arranged opposite to each other with a sample in between, a telecentric lens optical system, and an information processing mechanism (which does not have to be physically integrated). Then, the transmitted light emitted from the light source and passed through the sample is projected onto the image pickup sensor via a telecentric lens system or the like, and the information processing mechanism acquires contour images of individual particles from the image pickup sensor. Then, based on the particle size distribution information, other particle information such as particle morphology information (hereinafter, also referred to as particle morphology information) is calculated and output.

By the way, the particle morphology referred to here refers to the shape, color, pattern and combination thereof of particles. Further, the particle morphology information includes a major axis length, a minor axis length, an aspect ratio, a circularity, and an unevenness of each particle.

The second particle measuring device 2 for measuring the particle morphology is not limited to the type of capturing the transmitted light of the particles to obtain the outline thereof as described above, but also capturing the reflected light from the particles to obtain the image. It may be of a type. In that case, the color and surface shape can be obtained as the particle morphology information.

Further, the particle measuring device is not limited to this, and SEM, TEM, an optical microscope, a Raman microscope and the like may be used. In that case, by measuring secondary electrons, backscattered electrons, transmitted electrons, fluorescent X-rays, cathode luminescence, Raman light, etc., other physical property information on materials, crystallinity, elements, composition, molecular structure, etc. can be obtained as particle information. be able to.

The particle image display device 3 is a so-called computer equipped with a CPU, a memory, various drivers, and the like, and the CPU and its peripheral devices cooperate with each other according to a predetermined program stored in the memory to acquire particle information, which will be described later. It functions as a unit 31, a setting information acquisition unit 32, a deformed image generation unit 33, a deformation rule storage unit 34, a particle model storage unit 35, and the like.

Next, each part will be described in detail with a description of the operation of the particle image display device 3.

First, the particle information acquisition unit 31 acquires the particle information of the sample output from the first particle measuring device 1 and the second particle measuring device 2, that is, the particle size distribution information and the particle morphology information, respectively.

On the other hand, the setting information acquisition unit 32 receives the setting information regarding the sample, that is, the dispersion medium and the particles. The setting information is peripheral information different from the particle information, and is information on the dispersion medium or known information about the particles (for example, the flow state of the dispersion medium, the temperature, the viscosity of the dispersion medium, the specific gravity of the particles and the dispersion medium, etc.). In addition, there is image setting information (for example, 2D / 3D display, still image / moving image, etc.) which is information related to image display. These may be input by the operator or may be transmitted from the particle measuring device.

Next, the deformed image generation unit 33 identifies the correlation between the particle information and the setting information, and takes the correlation into consideration to obtain the actual dispersed particle mode (hereinafter, actual particle) from the particle information and the setting information. (Also referred to as a dispersion mode) is estimated and calculated. Then, from the actual dispersed particle mode or from the particle information and the setting information, the deformed rule storage unit 34 and the particle model storage unit 35 are referred to to generate a deformed image different from the actual image obtained by actually capturing the sample.

This will be described in detail.

One or more deformation rules used when generating a deformed image are stored in advance in the deformation rule storage unit 34, and predetermined display highlighting items are emphasized according to each of these deformation rules.

In this embodiment, the size deformation rule, the distance deformation rule, and the movement deformation rule are provided in the deformation rule storage unit 34.

The size deformation rule is a rule used when deforming a particle size such as a particle size or a particle length. According to this size deformation rule, for example, when two particles having different particle diameters exist, the larger the ratio of the diameter of the large particle to the diameter of the small particle, the larger the diameter of the large particle represented by the deformed image actually becomes. Smaller than (or the diameter of the small particles represented by the deformed image is larger than it really is). As a specific example, there is a rule of logarithmic compression conversion. In this case, for example, even if the ratio of the actual diameters of the two particles is 1000 times, it is converted to 3 times in the deformed image.

The distance deformation rule is a rule for deforming the distance between particles in relation to the density and particle size such as particle size. According to this distance deformation rule, for example, the larger the inter-particle distance calculated from the density is larger than the particle size, the smaller the inter-particle distance represented by the deformed image is deformed. Specifically, for example, as described above, it is a rule for logarithmic compression conversion. In this case, for example, even if the inter-particle distance is 1000 times the particle size, the inter-particle distance in the deformed image is converted to 3 times the particle size.

In addition, for example, predetermined movement deformation rules are defined for the movement of particles (Brownian motion, flow movement speed, etc.).

The operator can also access the deformation rule storage unit 34 to change, add, or delete the deformation rule.

The particle model storage unit 35 stores a plurality of predetermined types of particle models (in this example, four types of sphere, rod, disk, and bubble, as shown in FIG. 2) used in the deformed image. There is.

The operator can also access the particle model storage unit 35 to change, add, or delete the particle model.

Next, an example of the step of generating the deformed image by the deformed image generation unit 33 will be described. The order of each of the following steps may be changed, or the steps may be omitted or added.

First, the deformed image generation unit 33 sets the type of model particles displayed in the deformed image (step S1 in FIG. 3), and transforms the form of the model particles stored in the particle model storage unit 35 (step 3 in FIG. 3). S2).

Therefore, the deformed image generation unit 33 acquires and refers to the setting information and particle information (particle morphology) from the second particle measuring device 2 (image analysis type particle size distribution measuring device).

Specifically, for example, when the aspect ratio is acquired as the particle morphology information from the second particle measuring device 2, the deformed image generation unit 33 determines the particle model according to the aspect ratio. For example, if the aspect ratio is close to 1, the particle model is set as a sphere, and if the aspect ratio is a value separated from 1 by a predetermined value or more, the particle model is set as a bar.

On the other hand, for example, if the particle shape is set to be a plate shape or the like in the sample setting information, the deformed image generation unit 33 sets a disk as a particle model.

Next, the deformed image generation unit 33 deforms the shape of the particle model set as described above according to the particle morphology information from the second particle measuring device 2. For example, if a bar is set in the particle model and the aspect ratio is 10, the default bar shape in the display model storage unit is transformed into a bar shape having an aspect ratio of 10. If it is a disk, the ratio of thickness to diameter is changed according to the aspect ratio.

Next, the deformed image generation unit 33 determines the size of the particles displayed in the deformed image (step S3 in FIG. 3).

Specifically, the actual size of the particles is calculated based on the particle size distribution information obtained from the first particle measuring device 1, and then according to the diameter deformation rule stored in the deformation rule storage unit 34. Determines the size of the particles displayed in the deformed image.

For example, as described above, the deformed image generation unit 33 determines that the particle size distribution obtained from the first particle measuring device 1 has two peaks and that there are two types of particles having different representative diameters from the shape of the distribution graph. If there is a difference of 1000 times in the representative diameter, the deformed image generation unit 33 converts this into a logarithm, and the difference in the size of the particles displayed in the deformed image is based on one of the particle diameters. Set so that it is tripled.

Further, the deformed image generation unit 33 determines the inter-particle distance displayed in the deformed image (step S4 in FIG. 3).

Specifically, the actual inter-particle distance is calculated based on the frequency and density obtained from the first particle measuring device 1, and this is compared with the particle size to deform the distance stored in the deformation rule storage unit 34. According to the rules, the interparticle distance displayed in the deformed image is determined.

Regarding the frequency and density, in this embodiment, it is estimated that the deformed image generation unit 33 has an aspect ratio close to 1 and a particle morphology close to a sphere from, for example, particle morphology information and setting information. In this case, as the particle size distribution, it is estimated that the particles are dispersed in the dispersion medium at the frequency according to the particle size distribution information, and the density of the particles of each diameter is calculated from the frequency. Further, for example, when it is estimated from the particle morphology information that the particles have a longitudinal direction, in the particle size distribution information, there are two peaks in the longitudinal length and the lateral length of the particles. Therefore, the particle size distribution information is converted, the frequency of the actual particle distribution is calculated based on the converted particle size distribution, and the density of the particles of each diameter is calculated based on the frequency.

Here, for example, when the inter-particle distance is 1000 times the particle size, the inter-particle distance is set to be 3 times the particle size in logarithmic conversion.

In addition, the deformed image generation unit 33 determines the movement of the particles displayed in the deformed image with reference to the setting information (step S5 in FIG. 3). For example, when the flow state of the dispersion medium is a stationary state, a convection state, a stirring state, a flow state, or the like from the sample setting information, the particles are set to move according to the flow state of the dispersion medium. At this time, if the moving speed of the particles is visually too fast or too slow, the moving speed of the particles on the virtual image is set to the actual speed according to the movement deformation rule stored in the deformation rule storage unit 34. Change from. In addition, for example, the sedimentation or ascending motion of each particle due to the difference in specific gravity, the Brownian motion, and the like are also set according to the motion deformation rule.

As shown in FIG. 1, the deformed image generated by the deformed image generation unit 33 is transmitted to the display 4 as image data and displayed in this way (step S6 in FIG. 3).

Further, in this embodiment, as a display mode on the display 4, for example, it is possible to switch to 2D / 3D, a still image / moving image, or the like according to the image setting information set by the operator.

Further, in this embodiment, in addition to the deformed image, particle information is also transmitted to the display 4, and measurement data such as particle size distribution information and aspect ratio indicated by the particle information is numerically or graphed with the deformed image. It is also designed so that it can be displayed on the display 4 at the same time or by switching. This is so that the correct measurement data can be confirmed at the same time while viewing the deformed image.

Therefore, according to the above-described embodiment, it is possible to generate, for example, a deformed image in which the required features and the like are emphasized from the measurement result, instead of representing the image of the faithful particle dispersion mode obtained from the measurement result. Therefore, an intuitive image of the dispersed state of particles can be easily generated.

As a result, the operator can feel familiar and easy to use.

The present invention is not limited to the above embodiment.

For example, when specific particles such as abnormal particles or particles that are not abnormal but whose existence is to be confirmed are detected from the particle information, even if the number is small, the existence probability and display priority are always increased to deform the particles. It may be present on the image, or it may be emphasized and displayed by changing the color or shape.

Here is an example.
In the deformed image generation unit, for example, in a sample in which the value of the particle information is out of the predetermined range, the particles in the predetermined range are extracted, or the sample is the measurement target, the particle information is obtained. Specific particles are extracted by extracting those whose values are statistically out of the predetermined range or within the predetermined range.

More specifically, for example, in particle morphology information, the circularity, unevenness, aspect ratio, etc. are outside the preset range, such as extremely elongated particles or large particles, or in the particle size distribution information. Particles whose particle size deviates from a certain statistic compared to other particle sizes are extracted as specific particles.

In the above, specific particles were extracted based on one type of particle information, but in addition, multivariate values calculated from a plurality of types of particle information using a predetermined relational expression, table, etc. are out of specification, and statistics. Those having a value deviating from the above may be extracted as specific particles. Further, specific particles may be extracted by image recognition such as pattern matching.

Then, the specific particles extracted in this way are displayed in addition to the deformed image. At that time, in this example, as shown in FIG. 4, the specific particles having a different shape and color from the other particles are specified. The particle model is stored, and the specific particle model is displayed in addition to the deformed image as shown in FIG.

By doing so, the operator can recognize the abnormality and grasp the existence and frequency of predetermined particles just by looking at this deformed image, so that the efficiency of checking the measurement result data in quality control etc. is improved. It will be possible to greatly contribute to the reduction of omissions and checks.

Further, the presence or absence of aggregation may be provided as the setting information. In this case, for example, when particles having a large diameter are grasped from the particle size distribution information, and if there is aggregation in the setting information, the deformed image generation unit 33 is not a large diameter particle but a deformed image in which a plurality of particles are aggregated. Should be generated. Further, when a particle measuring device capable of measuring the agglomeration degree of dispersed particles is used as particle information such as a dynamic light scattering type dragon diameter distribution device, a deformed image may be generated based on the agglomeration degree.

Further, in the above-described embodiment, the shape model is used as the deformed image, but the actual image may be used as the shape model, or the deformed image is obtained by using the shape of the particles obtained from the image analysis type particle size distribution measuring device. May be generated.

Each deformed image generated based on the particle information measured at each time may be displayed on the display 4 in the order of measurement time, or may be displayed side by side on the same screen. In this way, the movement of particles and changes in their morphology can be grasped more intuitively.

At that time, a time deformation rule may be added as a deformation rule. For example, it is a rule that the actual 1us is expanded and displayed at 1s intervals, and the actual 10s is shortened and displayed at 1s intervals.

In addition, as a deformation rule, a deformation rule that changes over time can be considered. The time-varying deformation rule is a rule that defines how the morphology and number of particles change with the passage of time. Changes in the morphology and number of particles include, for example, dispersion of agglomerated particles over time, destruction of a single particle, reduction, increase, reduction, and expansion of bubbles.

The time-dependent deformation rule may be a rule that determines the morphological change between two different times (first time and second time) when the morphology of the particles is given. When the morphology of the particles is given only by the time, the rule may be such that the change with time of the particles before or after that is determined by referring to other particle information and setting information.

The former time-varying deformation rule is, for example, a moving image format so as to supplement when particles are measured at different times in a particle measuring device and deformed images are generated from the particle information acquired at each time. Deformed images can be generated. For example, if the particles acquired at the first time and the particles acquired at the second time correspond to each other and their morphology or the like has changed, the time-varying deformation rule is applied between them. The mode in which the particles gradually change can be continuously and smoothly displayed in the deformed image of the moving image. It is also possible to generate a deformed image (still image) at a certain time that has not been measured between the first time and the second time.

Further, the latter time-varying deformation rule requires only one measurement, and it is not necessary to deal with particles at different times, so that a deformed image can be easily generated.

A single particle measuring device may be used. If the particle measuring device is a single light scattering type, the operator may specify the particle shape. For example, when it is determined from the particle size distribution information that there are two representative diameters, if the operator specifies the particle shape as a spherical shape, the size, distance, movement, etc. of the spherical particles with the two diameters are deformed. It is displayed as a deformed image. On the other hand, if the operator specifies the particle shape as a different shape (for example, rod shape or disk shape), only one type of particle having the same aspect ratio as the ratio of the two representative diameters is deformed in size, distance, movement, etc. It is displayed as a deformed image.

Further, the particle information measured by the particle measuring device may be associated with each particle displayed in the deformed image. In this way, for example, by clicking and selecting any particle in the deformed image, the measurement data of the particle can be displayed. More specifically, when any particle is clicked in the deformed image, the actual captured image including the particle obtained by the second particle measuring device 2 is displayed on the display 4. Alternatively, the position of the particle is shown on the particle size distribution graph obtained by the first particle measuring device, or the actual particle size, aspect ratio, color and other forms, materials, refractive index, etc. Physical properties may be displayed numerically or in text.

In this way, the operator can easily refer to only the characteristic actual data selected from a large amount of actual data, which leads to improvement in check efficiency and reduction in check omission.

Further, the particles to be measured may be not only the particles dispersed in the dispersion medium but also the dispersed particles in which the dispersion medium is evaporated and fixed to the preparation or the like.

In addition, the present invention is not limited to the above-described embodiment, and it goes without saying that various modifications can be made without departing from the spirit of the present invention.

100 ... Particle measurement system 1 ... First particle measurement device (light scattering type particle size distribution measurement device)
2 ... Second particle measuring device (image analysis type particle size distribution measuring device, particle morphology measuring device)
3 ... Particle image display device 3
31 ... Particle information acquisition unit 32 ... Setting information acquisition unit 33 ... Deformed image generation unit 34 ... Deformation rule storage unit 35 ... Particle model storage unit

Claims (9)

A particle information acquisition unit that acquires the particle information from one or more types of particle measuring devices that measure particle information, which is information about dispersed particles, and a particle information acquisition unit.
A deformation rule storage unit that stores a predetermined deformation rule, and
A particle image display device comprising: a deformed image generation unit that generates a deformed image showing a deformed particle dispersion mode by applying the deformed rule to the particle information and converting the particles. It also has a particle model storage unit that stores particle models that show multiple types of modeled particle morphologies.
A claim that the deformed image generation unit extracts one or a plurality of types of the particle model from the particle model storage unit based on the particle information, and generates the deformed image using the extracted particle model. Item 1. The particle image display device according to Item 1. The deformation rule defines predetermined display highlighting items.
The particle image display device according to claim 1 or 2, wherein the deformed image generation unit generates a deformed image in which the display emphasis items are emphasized. The particle image according to any one of claims 1 to 3, wherein the deformed image generation unit receives setting information which is peripheral information different from the particle information and generates the deformed image in consideration of the setting information. Display device. The particle image display device according to any one of claims 1 to 4, wherein the deformed image generation unit outputs an image signal for simultaneously displaying the measurement data of the particle measuring device and the deformed image on the same screen. A particle size distribution measuring device that measures a particle size distribution, which is one of the particle information, based on the intensity of scattered light or diffracted light obtained by irradiating the particles with light, and an image of the particles to obtain particle information. A particle morphology measuring device for measuring one individual particle morphology is provided as the particle measuring device.
The particle image display device according to any one of claims 1 to 5, wherein the particle information acquisition unit acquires particle size distribution information which is information about the particle size distribution and particle morphology information which is information about particle morphology. One or more types of particle measuring devices that measure dispersed particles, and
A particle image display device connected to the particle measuring device is provided.
The particle image display device
A particle information acquisition unit that acquires particle information, which is information about the particles, from the particle measuring device, and
A deformation rule storage unit that stores a predetermined deformation rule, and
A particle measurement system including a deformed image generation unit that generates a deformed image showing a deformed particle dispersion mode by applying the deformed rule to the particle information and converting the particles. A particle information acquisition unit that acquires particle information from one or more types of particle measuring devices that measures particle information that is information about dispersed particles, and a particle information acquisition unit.
A deformation rule storage unit that stores a predetermined deformation rule, and
A particle image display program characterized in that a computer functions as a deformed image generator that generates a deformed image showing a deformed particle dispersion mode by applying the deformed rule to the particle information and converting the particle information. The particle information is acquired from one or a plurality of types of particle measuring devices that measure dispersed particles and output particle information which is information about the measured particles.
A particle image display method comprising applying a predetermined deformation rule to the particle information and converting the particle information to generate a deformed image showing a deformed particle dispersion mode.

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