JP2021039013A - 壁面のひび割れ測定機および測定方法 - Google Patents
壁面のひび割れ測定機および測定方法 Download PDFInfo
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- 238000003384 imaging method Methods 0.000 claims description 43
- 230000003287 optical effect Effects 0.000 claims description 17
- 230000035945 sensitivity Effects 0.000 claims description 3
- 238000005259 measurement Methods 0.000 abstract description 40
- 238000001514 detection method Methods 0.000 description 17
- 238000003745 diagnosis Methods 0.000 description 13
- 238000012545 processing Methods 0.000 description 7
- 238000002059 diagnostic imaging Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 6
- 230000006870 function Effects 0.000 description 4
- 238000007689 inspection Methods 0.000 description 3
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- 238000011960 computer-aided design Methods 0.000 description 2
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- 238000010276 construction Methods 0.000 description 1
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- 229910052742 iron Inorganic materials 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/45—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from two or more image sensors being of different type or operating in different modes, e.g. with a CMOS sensor for moving images in combination with a charge-coupled device [CCD] for still images
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C1/00—Measuring angles
- G01C1/02—Theodolites
- G01C1/04—Theodolites combined with cameras
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/14—Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02041—Interferometers characterised by particular imaging or detection techniques
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C15/00—Surveying instruments or accessories not provided for in groups G01C1/00 - G01C13/00
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- G—PHYSICS
- G01—MEASURING; TESTING
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- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
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- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
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- H—ELECTRICITY
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- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/20—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from infrared radiation only
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
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- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/08—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness
- G01B21/085—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness using thermal means
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
- G01N2021/8861—Determining coordinates of flaws
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/954—Inspecting the inner surface of hollow bodies, e.g. bores
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- G—PHYSICS
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- G06T2207/00—Indexing scheme for image analysis or image enhancement
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- Quality & Reliability (AREA)
- Theoretical Computer Science (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Human Computer Interaction (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Abstract
Description
上記態様において、前記測距部と,前記測角部と,前記画像撮像部と,前記赤外画像撮像部が、一の装置に統合されるのも好ましい。
11 水平角検出器(測角部)
12 鉛直角検出器(測角部)
13 水平回転駆動部
14 鉛直回転駆動部
15 表示部
16 操作部
17 記憶部
18 演算制御部
19 測距光出射部(測距部)
20 測距光受光部(測距部)
21 画像撮像部
22 赤外画像撮像部
23 赤外画像診断部
24 ひび割れ画像診断部
Claims (7)
- ターゲットに向けて測距光を出射し反射測距光を受光して前記ターゲットまでの距離を測定する測距部と、
各画素が画像素子上で位置特定される画像撮像部と、
各画素が画像素子上で位置特定され、赤外線に感度を有する赤外画像撮像部と、
前記測距部,画像撮像部,および赤外画像撮像部を水平方向および鉛直方向に旋回させる駆動部と、
前記測距部,画像撮像部,および赤外画像撮像部の水平方向の回転角と鉛直方向の回転角を測定する測角部と、
前記測距部,測角部,画像撮像部,赤外画像撮像部,および駆動部を制御する演算制御部と、を備え、
前記演算制御部は、
前記赤外画像撮像部を旋回して、赤外画像の温度差からひび割れ部の探索を行い、
前記ひび割れ部を前記画像撮像部で撮影し、撮影画像の濃度差から前記ひび割れ部の位置を特定し、
前記ひび割れ部の位置を前記測距部および前記測角部で測定し、前記ひび割れ部の三次元絶対座標を取得する
ことを特徴とするひび割れ測定機。
- 前記画像撮像部および前記赤外画像撮像部は、前記測距光の光軸を原点とした直交座標系を有する
ことを特徴とする請求項1に記載のひび割れ測定機。
- 前記演算制御部は、前記赤外画像撮像部の前記温度差を段階的に狭めながら、複数回探索を行う
ことを特徴とする請求項1または2に記載のひび割れ測定機。
- 前記演算制御部は、前記ひび割れ部の開始点,折れ点,終点に対してそれぞれ三次元絶対座標を取得する
ことを特徴とする請求項1〜3のいずれかに記載のひび割れ測定機。
- 前記演算制御部は、前記ひび割れ部の三次元絶対座標を基にひびの長さと形状を測定し、前記画像撮像部の画素数からひびの太さを測定する
ことを特徴とする請求項1〜4のいずれかに記載のひび割れ測定機。
- 前記測距部と,前記測角部と,前記画像撮像部と,前記赤外画像撮像部が、一の装置に統合された
ことを特徴とする請求項1〜5のいずれかに記載のひび割れ測定機。
- (a)赤外画像撮像部を旋回して、赤外画像の温度差からひび割れ部を探索するステップと、
(b)画像撮像部で(a)のステップで探索された前記ひび割れ部を撮影し、撮影画像の濃度差から前記ひび割れ部の位置を特定するステップと、
(c)測距部および測角部で(b)のステップで特定された前記ひび割れ部の位置を測距・測角し、三次元絶対座標を取得するステップと、
を有することを特徴とするひび割れ測定方法。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019160880A JP7285174B2 (ja) | 2019-09-04 | 2019-09-04 | 壁面のひび割れ測定機および測定方法 |
CN202010748330.4A CN112444520A (zh) | 2019-09-04 | 2020-07-30 | 壁面的裂纹测定机及测定方法 |
US16/990,582 US11595558B2 (en) | 2019-09-04 | 2020-08-11 | Apparatus and method for measuring cracks in wall surface |
EP20193522.8A EP3789731B1 (en) | 2019-09-04 | 2020-08-31 | Apparatus and method for measuring cracks in wall surface |
Applications Claiming Priority (1)
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JP2019160880A JP7285174B2 (ja) | 2019-09-04 | 2019-09-04 | 壁面のひび割れ測定機および測定方法 |
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JP2021039013A true JP2021039013A (ja) | 2021-03-11 |
JP7285174B2 JP7285174B2 (ja) | 2023-06-01 |
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US (1) | US11595558B2 (ja) |
EP (1) | EP3789731B1 (ja) |
JP (1) | JP7285174B2 (ja) |
CN (1) | CN112444520A (ja) |
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CN113379745B (zh) * | 2021-08-13 | 2021-11-30 | 深圳市信润富联数字科技有限公司 | 产品缺陷识别方法、装置、电子设备和存储介质 |
CN114384073B (zh) * | 2021-11-30 | 2023-08-04 | 杭州申昊科技股份有限公司 | 一种地铁隧道裂纹检测方法及系统 |
CN115330726B (zh) * | 2022-08-16 | 2023-06-09 | 广东中鉴检测技术有限公司 | 一种钢筋保护层质量及墙体质量快速评定系统 |
Citations (4)
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JPH1078319A (ja) * | 1996-09-03 | 1998-03-24 | Mitsubishi Heavy Ind Ltd | 路面3次元計測データ解析方法 |
JP2004347585A (ja) * | 2003-02-21 | 2004-12-09 | Fast:Kk | 建築および土木構造物計測・解析システム |
JP2005300179A (ja) * | 2004-04-06 | 2005-10-27 | Constec Engi Co | 赤外線構造物診断システム |
WO2017103982A1 (ja) * | 2015-12-14 | 2017-06-22 | 株式会社 ニコン・トリンブル | 欠陥検出装置及びプログラム |
Family Cites Families (8)
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JP3996946B2 (ja) * | 2005-09-15 | 2007-10-24 | 関西工事測量株式会社 | 光学装置、および光学装置を用いて物体の寸法を測定する方法 |
JP5218849B2 (ja) | 2009-03-13 | 2013-06-26 | 株式会社コンステック | 欠陥検査装置 |
EP2474808A1 (de) | 2011-01-10 | 2012-07-11 | Leica Geosystems AG | Geodätisches Vermessungsgerät mit thermographischer Kamera |
US10398361B2 (en) | 2012-01-10 | 2019-09-03 | Becton, Dickinson And Company | Low cost blood collection set using blister package |
US20180095174A1 (en) * | 2016-09-30 | 2018-04-05 | Faro Technologies, Inc. | Three-dimensional coordinate measuring device |
CN109804119B (zh) * | 2016-12-30 | 2021-03-19 | 同济大学 | 基于红外热像图分析的沥青路面裂缝发育程度检测方法 |
JP7084705B2 (ja) | 2017-09-13 | 2022-06-15 | 株式会社トプコン | 測量装置 |
WO2020055991A1 (en) * | 2018-09-13 | 2020-03-19 | Heliae Development, Llc | Compositions and methods for indirectly reducing incidence of fungal pathogen activity in plants |
-
2019
- 2019-09-04 JP JP2019160880A patent/JP7285174B2/ja active Active
-
2020
- 2020-07-30 CN CN202010748330.4A patent/CN112444520A/zh active Pending
- 2020-08-11 US US16/990,582 patent/US11595558B2/en active Active
- 2020-08-31 EP EP20193522.8A patent/EP3789731B1/en active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH1078319A (ja) * | 1996-09-03 | 1998-03-24 | Mitsubishi Heavy Ind Ltd | 路面3次元計測データ解析方法 |
JP2004347585A (ja) * | 2003-02-21 | 2004-12-09 | Fast:Kk | 建築および土木構造物計測・解析システム |
JP2005300179A (ja) * | 2004-04-06 | 2005-10-27 | Constec Engi Co | 赤外線構造物診断システム |
WO2017103982A1 (ja) * | 2015-12-14 | 2017-06-22 | 株式会社 ニコン・トリンブル | 欠陥検出装置及びプログラム |
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EP3789731B1 (en) | 2023-10-11 |
US20210067670A1 (en) | 2021-03-04 |
US11595558B2 (en) | 2023-02-28 |
CN112444520A (zh) | 2021-03-05 |
EP3789731A1 (en) | 2021-03-10 |
JP7285174B2 (ja) | 2023-06-01 |
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