JP2021026021A - Optical device, projection optics system, and manufacturing method of exposure apparatus and article - Google Patents

Optical device, projection optics system, and manufacturing method of exposure apparatus and article Download PDF

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JP2021026021A
JP2021026021A JP2019140817A JP2019140817A JP2021026021A JP 2021026021 A JP2021026021 A JP 2021026021A JP 2019140817 A JP2019140817 A JP 2019140817A JP 2019140817 A JP2019140817 A JP 2019140817A JP 2021026021 A JP2021026021 A JP 2021026021A
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gas
optical element
optical
optical device
unit
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JP7358106B2 (en
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朋史 西川原
Tomofumi Nishigawara
朋史 西川原
美津留 関
Mitsuru Seki
美津留 関
裕紀 矢田
Hironori Yada
裕紀 矢田
淳生 遠藤
Atsuo Endo
淳生 遠藤
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Canon Inc
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Canon Inc
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    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/708Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70858Environment aspects, e.g. pressure of beam-path gas, temperature
    • G03F7/70883Environment aspects, e.g. pressure of beam-path gas, temperature of optical system
    • G03F7/70891Temperature
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/0006Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 with means to keep optical surfaces clean, e.g. by preventing or removing dirt, stains, contamination, condensation
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216Mask projection systems
    • G03F7/70225Optical aspects of catadioptric systems, i.e. comprising reflective and refractive elements
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216Mask projection systems
    • G03F7/70233Optical aspects of catoptric systems, i.e. comprising only reflective elements, e.g. extreme ultraviolet [EUV] projection systems
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216Mask projection systems
    • G03F7/70316Details of optical elements, e.g. of Bragg reflectors, extreme ultraviolet [EUV] multilayer or bilayer mirrors or diffractive optical elements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34

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  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
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  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Mounting And Adjusting Of Optical Elements (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Abstract

To provide an optical device equipped with a gas supply mechanism that reduces a risk that light to an optical element is shaded.SOLUTION: An optical device includes a first optical element, a second optical element, a holding unit for holding the first optical element and the second optical element, a gas supply unit for supplying a temperature-controlled gas toward a flow channel formed in the holding unit, and a gas discharge unit for discharging the gas supplied by the gas supply unit. The gas discharging unit is installed along the arranging direction of the first optical element and the second optical element.SELECTED DRAWING: Figure 2

Description

本発明は、光学装置、投影光学系、露光装置及び物品の製造方法に関する。 The present invention relates to an optical device, a projection optical system, an exposure device, and a method for manufacturing an article.

レンズやミラー等の光学素子を用いた光学装置において、光学素子や光路中の空間の温度が変化することによって、光学装置の光学性能に影響を与え得ることが知られている。これは、光学素子の面形状の変化や、光学素子の保持部における熱変形、空気の屈折率変化によって生じ得るものである。 It is known that in an optical device using an optical element such as a lens or a mirror, the optical performance of the optical device can be affected by a change in the temperature of the optical element or the space in the optical path. This can occur due to a change in the surface shape of the optical element, thermal deformation in the holding portion of the optical element, or a change in the refractive index of air.

上述したような光学素子や光路中の空間の温度変化の一要因として、光学素子に入射する光が挙げられる。光が光学素子を透過する際や、光学素子において反射される際に、光の一部が光学素子に吸収されることによって熱が発生する。発生した熱の一部は、光学素子の保持部や光学素子の周囲の空間に伝達される。特に、保持部の近くに光路が存在する場合には、保持部の温度上昇に伴い、自然対流が発生し、保持部から光路を含む空間に熱が伝達されることがある。これにより、光路中の気体の屈折率が変化し、光学装置の光学性能の低下につながり得る。 As one of the factors of the temperature change of the optical element and the space in the optical path as described above, the light incident on the optical element can be mentioned. When light passes through an optical element or is reflected by the optical element, heat is generated by absorbing a part of the light by the optical element. Part of the generated heat is transferred to the holding portion of the optical element and the space around the optical element. In particular, when an optical path exists near the holding portion, natural convection may occur as the temperature of the holding portion rises, and heat may be transferred from the holding portion to the space including the optical path. As a result, the refractive index of the gas in the optical path changes, which may lead to deterioration of the optical performance of the optical device.

光学装置における光学性能の低下を抑制するために、光学素子及びその近傍の空間を冷却する冷却機構が知られている。特許文献1は、2枚の光学素子の間の空間に温度調節のための気体を供給及び排出する気体供給機構を開示している。 A cooling mechanism for cooling an optical element and a space in the vicinity thereof is known in order to suppress a decrease in optical performance in an optical device. Patent Document 1 discloses a gas supply mechanism that supplies and discharges a gas for temperature control to a space between two optical elements.

特開2018−91919号公報JP-A-2018-91919

特許文献1の気体供給機構においては、2枚の光学素子の上下方向に気体供給機構を配置しているため、各光学素子に至る光の光路によっては、気体供給機構により光が遮光されてしまうおそれがある。気体供給機構の配置を工夫することにより、光学素子に至る光が遮光されるリスクを低減させることができる。 In the gas supply mechanism of Patent Document 1, since the gas supply mechanism is arranged in the vertical direction of the two optical elements, the light is blocked by the gas supply mechanism depending on the optical path of the light reaching each optical element. There is a risk. By devising the arrangement of the gas supply mechanism, it is possible to reduce the risk that the light reaching the optical element is blocked.

本発明は、光学素子に至る光が遮光されるリスクを低減させた気体供給機構を備える光学装置を提供することを例示的な目的としている。 It is an exemplary object of the present invention to provide an optical device provided with a gas supply mechanism that reduces the risk that light reaching an optical element is blocked.

本発明の光学装置は、第1の光学素子及び第2の光学素子と、前記第1の光学素子及び前記第2の光学素子を保持する保持部と、前記保持部に設けられた流路に向けて温度制御された気体を供給する気体供給部と、前記気体供給部によって供給された気体を排出する気体排出部と、を備え、前記気体排出部は、前記第1の光学素子と前記第2の光学素子の配列方向に並んで配置されていることを特徴とする。 The optical device of the present invention has a first optical element and a second optical element, a holding portion for holding the first optical element and the second optical element, and a flow path provided in the holding portion. A gas supply unit that supplies a gas whose temperature is controlled toward the surface and a gas discharge unit that discharges the gas supplied by the gas supply unit are provided, and the gas discharge unit includes the first optical element and the first optical element. It is characterized in that the two optical elements are arranged side by side in the arrangement direction.

本発明によれば、光学素子に至る光が遮光されるリスクを低減させた気体供給機構を備える光学装置を提供することができる。 According to the present invention, it is possible to provide an optical device provided with a gas supply mechanism that reduces the risk that light reaching the optical element is blocked.

露光装置の全体構成を示す概略図である。It is the schematic which shows the whole structure of the exposure apparatus. 実施例1の光学装置の構成を示す図である。It is a figure which shows the structure of the optical apparatus of Example 1. FIG. 光学装置をY軸方向から見た図である。It is a figure which looked at the optical apparatus from the Y-axis direction. 実施例2の光学装置の構成を示す図である。It is a figure which shows the structure of the optical apparatus of Example 2. 実施例3の光学装置の構成を示す図である。It is a figure which shows the structure of the optical apparatus of Example 3. 比較例としての光学装置の構成を示す図である。It is a figure which shows the structure of the optical apparatus as a comparative example.

以下、添付図面を参照して、本発明の好適な実施の形態について説明する。なお、各図において、同一の部材については同一の参照番号を付し、重複する説明は省略する。 Hereinafter, preferred embodiments of the present invention will be described with reference to the accompanying drawings. In each figure, the same members are assigned the same reference numbers, and duplicate description will be omitted.

図1は、本発明の光学装置を搭載した投影光学系を含む露光装置1の構成を示す概略図である。露光装置1は、半導体デバイスや液晶表示デバイスなどのデバイスの製造工程であるフォトリソグラフィ工程に用いられる。露光装置1では、光強度の強い露光光を用いて、マスクのパターンを基板上の感光材に投影するため、露光装置1に含まれるレンズやミラー等の光学素子が露光光を吸収することで温められやすい。 FIG. 1 is a schematic view showing the configuration of an exposure apparatus 1 including a projection optical system equipped with the optical apparatus of the present invention. The exposure apparatus 1 is used in a photolithography process, which is a manufacturing process for devices such as semiconductor devices and liquid crystal display devices. In the exposure apparatus 1, the mask pattern is projected onto the photosensitive material on the substrate by using the exposure light having a high light intensity. Therefore, the optical elements such as the lens and the mirror included in the exposure apparatus 1 absorb the exposure light. Easy to get warm.

露光装置1は、照明光学系ILと、投影光学系POと、マスクMを保持して移動可能なマスクステージMSと、基板Wを保持して移動可能な基板ステージWSを含む。また、露光装置1は、基板Wに対する露光処理を制御する制御部Cを含み、基板上のレジスト膜(感光剤)に、投影光学系POを介してマスクMのパターンを投影して潜像(潜像パターン)を形成する露光処理を行う。 The exposure apparatus 1 includes an illumination optical system IL, a projection optical system PO, a mask stage MS that holds and moves the mask M, and a substrate stage WS that holds and moves the substrate W. Further, the exposure apparatus 1 includes a control unit C that controls an exposure process on the substrate W, and projects a pattern of the mask M onto a resist film (photosensitive agent) on the substrate via a projection optical system PO to obtain a latent image (a latent image). An exposure process for forming a latent image pattern) is performed.

不図示の光源から射出された光は、照明光学系ILに含まれる不図示のスリットによって、例えば、X方向に長い円弧状の光に整形される。マスクM及び基板Wは、マスクステージMS及び基板ステージWSによってそれぞれ保持されており、投影光学系POを介して光学的にほぼ共役な位置に配置される。マスクMは投影光学系POの物体面に位置し、基板Wは投影光学系の像面に位置する。 The light emitted from a light source (not shown) is shaped into, for example, arc-shaped light long in the X direction by a slit (not shown) included in the illumination optical system IL. The mask M and the substrate W are held by the mask stage MS and the substrate stage WS, respectively, and are arranged at positions substantially conjugate with each other via the projection optical system PO. The mask M is located on the object surface of the projection optical system PO, and the substrate W is located on the image plane of the projection optical system.

投影光学系POは、所定の投影倍率で、マスクMに形成されたパターンを基板W上に投影する。投影光学系POの投影倍率に応じた速度比で、マスクステージMS及び基板ステージWSを、投影光学系POの物体面と平行な方向に走査しながら露光処理を行うことで、マスクMに形成されたパターンを基板W上に順次転写することができる。 The projection optical system PO projects the pattern formed on the mask M onto the substrate W at a predetermined projection magnification. The mask M is formed by performing exposure processing while scanning the mask stage MS and the substrate stage WS in a direction parallel to the object surface of the projection optical system PO at a speed ratio corresponding to the projection magnification of the projection optical system PO. The patterns can be sequentially transferred onto the substrate W.

投影光学系POは、台形ミラーG1と、凹面ミラーG2と、凸形状のメニスカスレンズG3と、凸面ミラーG4を含む。照明光学系ILから射出され、マスクMを透過した露光光Lは、台形ミラーG1の第1面G1aにより光路を折り曲げられ、凹面ミラーG2の第1凹反射面G2aに入射する。第1凹反射面G2aにおいて反射された露光光Lは、メニスカスレンズG3を透過した後に凸面ミラーG4の凸反射面において反射され、凹面ミラーG2の第2凹反射面G2bに入射する。第2凹反射面G2bにおいて反射された露光光Lは、台形ミラーG1の第2面G1bにより光路を折り曲げられ、基板W上に結像する。 The projection optical system PO includes a trapezoidal mirror G1, a concave mirror G2, a convex meniscus lens G3, and a convex mirror G4. The exposure light L emitted from the illumination optical system IL and transmitted through the mask M has an optical path bent by the first surface G1a of the trapezoidal mirror G1 and is incident on the first concave reflection surface G2a of the concave mirror G2. The exposure light L reflected by the first concave reflection surface G2a is reflected on the convex reflection surface of the convex mirror G4 after passing through the meniscus lens G3, and is incident on the second concave reflection surface G2b of the concave mirror G2. The exposure light L reflected by the second concave reflecting surface G2b has an optical path bent by the second surface G1b of the trapezoidal mirror G1 and is imaged on the substrate W.

図1においては、凹面ミラーG2を1枚のミラーとし、第1凹反射面G2aと第2凹反射面G2bは同一の面としている。別の構成例として、凹面ミラーG2を分割して、第1凹反射面G2aを有する第1の凹面ミラー、及び第2凹反射面G2bを有する第2の凹面ミラーとしても良い。 In FIG. 1, the concave mirror G2 is a single mirror, and the first concave reflection surface G2a and the second concave reflection surface G2b are the same surface. As another configuration example, the concave mirror G2 may be divided into a first concave mirror having a first concave reflection surface G2a and a second concave mirror having a second concave reflection surface G2b.

図1における投影光学系POでは、凸面鏡G4の反射面が光学的な瞳となる。露光光Lの光径は、メニスカスレンズG3と凸面鏡G4の付近で小さくなるので、メニスカスレンズG3を透過する光や、凸面鏡G4で反射される光の光強度は強くなる。それゆえ、メニスカスレンズG3及び凸面ミラーG4は温められやすく、また、これらを保持する保持部としての鏡筒も温められやすい。 In the projection optical system PO in FIG. 1, the reflecting surface of the convex mirror G4 is an optical pupil. Since the light diameter of the exposure light L becomes smaller near the meniscus lens G3 and the convex mirror G4, the light intensity of the light transmitted through the meniscus lens G3 and the light reflected by the convex mirror G4 becomes stronger. Therefore, the meniscus lens G3 and the convex mirror G4 are easily warmed, and the lens barrel as a holding portion for holding them is also easily warmed.

鏡筒に熱が伝導されると、自然対流が生じて、鏡筒103、104の周囲に熱が広がりやすい。ここで、鏡筒103、104付近には、台形ミラーG1から凹面ミラーG2に向かう露光光Lや、凹面ミラーG2から台形ミラーG1に向かう露光光Lの光路が存在する。鏡筒の周囲に熱が広がると、露光光Lの光路中の空間の屈折率が変化してしまい、投影光学系POの結像性能の低下を招きやすい。 When heat is conducted to the lens barrel, natural convection occurs and the heat tends to spread around the lens barrels 103 and 104. Here, in the vicinity of the lens barrels 103 and 104, there are optical paths of the exposure light L from the trapezoidal mirror G1 to the concave mirror G2 and the optical path of the exposure light L from the concave mirror G2 to the trapezoidal mirror G1. When heat spreads around the lens barrel, the refractive index of the space in the optical path of the exposure light L changes, which tends to cause deterioration of the imaging performance of the projection optical system PO.

本発明は、レンズやミラー等の光学素子の保持部である鏡筒や当該光学素子を効率的に冷却することにより、鏡筒の周囲への熱の拡散を低減することが可能な光学装置に関するものである。以下、当該光学装置の詳細な構成について説明する。 The present invention relates to an optical device capable of reducing heat diffusion around the lens barrel by efficiently cooling the lens barrel, which is a holding portion of an optical element such as a lens or a mirror, and the optical element. It is a thing. Hereinafter, the detailed configuration of the optical device will be described.

(実施例1)
図2を用いて、実施例1の光学装置100について説明する。光学装置100は、第1の光学素子としてのメニスカスレンズ101、第2の光学素子としての凸面ミラー102、メニスカスレンズ101を保持する保持部としての鏡筒103、凸面ミラー102を保持する保持部としての鏡筒104を有する。図2では、鏡筒103と鏡筒104を別個の構成としているが、鏡筒103と鏡筒104を一体として、1つの鏡筒を構成しても良い。
(Example 1)
The optical device 100 of the first embodiment will be described with reference to FIG. The optical device 100 includes a meniscus lens 101 as a first optical element, a convex mirror 102 as a second optical element, a lens barrel 103 as a holding portion for holding the meniscus lens 101, and a holding portion for holding the convex mirror 102. Has a lens barrel 104 of. In FIG. 2, the lens barrel 103 and the lens barrel 104 have separate configurations, but the lens barrel 103 and the lens barrel 104 may be integrated into one lens barrel.

また、第1の光学素子はメニスカスレンズに限定されず、その他の形状のレンズであっても良いし、ミラーであっても良い。同様に、第2の光学素子は凸面ミラーに限定されず、その他の形状のミラーであっても良いし、レンズ等であっても良い。また、光学素子の数は2つに限られず、光学装置100として3つ以上の光学素子を含んでも良い。 Further, the first optical element is not limited to the meniscus lens, and may be a lens having another shape or a mirror. Similarly, the second optical element is not limited to the convex mirror, and may be a mirror having another shape, a lens, or the like. Further, the number of optical elements is not limited to two, and the optical device 100 may include three or more optical elements.

図2の光学装置100は、図1におけるメニスカスレンズG3及び凸面ミラーG4付近の具体的な構成を表したものである。鏡筒103、104付近を露光光Lが通過し、メニスカスレンズ101を透過した露光光Lが凸面ミラー102の反射面102aにて反射され、反射面102aにて反射された露光光Lが再びメニスカスレンズ101を透過する様子が表されている。 The optical device 100 of FIG. 2 shows a specific configuration in the vicinity of the meniscus lens G3 and the convex mirror G4 in FIG. The exposure light L passes near the lens barrels 103 and 104, the exposure light L transmitted through the meniscus lens 101 is reflected by the reflection surface 102a of the convex mirror 102, and the exposure light L reflected by the reflection surface 102a is again meniscus. The state of transmitting through the lens 101 is shown.

光学装置100は、鏡筒103、104の内部空間に温度制御された気体を供給する気体供給部105を含む。気体供給部105は、凸面ミラー102の保持部104に設けられた流路106に向けて気体を供給する。つまり、気体供給部105は、メニスカスレンズ101と凸面ミラー102の配列方向であるY方向に向かって気体を供給する。流路106に向けて温度制御された気体を直接供給することで、鏡筒103、104の内部空間に効率的に気体を供給することができ、結果としてメニスカスレンズ101や凸面ミラー102等を効率的に冷却することができる。 The optical device 100 includes a gas supply unit 105 that supplies a temperature-controlled gas to the internal spaces of the lens barrels 103 and 104. The gas supply unit 105 supplies gas to the flow path 106 provided in the holding unit 104 of the convex mirror 102. That is, the gas supply unit 105 supplies gas in the Y direction, which is the arrangement direction of the meniscus lens 101 and the convex mirror 102. By directly supplying the temperature-controlled gas toward the flow path 106, the gas can be efficiently supplied to the internal spaces of the lens barrels 103 and 104, and as a result, the meniscus lens 101, the convex mirror 102, etc. are efficiently supplied. Can be cooled.

露光光Lの光路を遮らないように、気体供給部105は、露光光Lの光路外に配置される。図2では、気体供給部105は、凸面ミラー102に対してメニスカスレンズ101とは反対側に配置されている。 The gas supply unit 105 is arranged outside the optical path of the exposure light L so as not to block the optical path of the exposure light L. In FIG. 2, the gas supply unit 105 is arranged on the side opposite to the meniscus lens 101 with respect to the convex mirror 102.

光学装置100は、鏡筒103、104の内部空間から気体を排出する気体排出部107を含む。気体排出部107は、板状部材108に設けられた開口を介して気体の排出を行う。板状部材108は、アルミニウム等から構成され、鏡筒104に固定されている。板状部材108により、鏡筒103、104の内部空間とその外部空間が隔てられており、板状部材108に設けられた開口は、鏡筒103、104の内部空間と外部空間を連通している。気体排出部107は、板状部材108と接続された接続部107aと、配管107bと、排気機構107cを含み、排気機構107cの排気作用によって、鏡筒103、104の内部空間から配管107bを介して気体が排出される。 The optical device 100 includes a gas discharge unit 107 that discharges gas from the internal spaces of the lens barrels 103 and 104. The gas discharge unit 107 discharges gas through an opening provided in the plate-shaped member 108. The plate-shaped member 108 is made of aluminum or the like and is fixed to the lens barrel 104. The plate-shaped member 108 separates the internal space of the lens barrels 103 and 104 from the external space thereof, and the opening provided in the plate-shaped member 108 communicates the internal space and the external space of the lens barrels 103 and 104. There is. The gas discharge portion 107 includes a connection portion 107a connected to the plate-shaped member 108, a pipe 107b, and an exhaust mechanism 107c, and the exhaust action of the exhaust mechanism 107c causes the internal space of the lens barrels 103 and 104 to pass through the pipe 107b. Gas is discharged.

図3(a)は、図2で示した光学装置100をY軸の負方向から見た図である。鏡筒104に対して複数の気体供給部105が設けられ、各気体供給部105から鏡筒103、104の内部空間に温度制御された気体が供給される。なお、図3(a)では、5つの気体供給部105が設けられているが、気体供給部105の数はこれに限られず、少なくとも1つの気体供給部105が設けられれば良い。また、板状部材108に対して2つの気体排出部107が設けられている。気体排出部107の数に関しても、少なくとも1つの気体排出部107が設けられれば良い。 FIG. 3A is a view of the optical device 100 shown in FIG. 2 as viewed from the negative direction of the Y-axis. A plurality of gas supply units 105 are provided for the lens barrel 104, and temperature-controlled gas is supplied from each gas supply unit 105 to the internal spaces of the lens barrels 103 and 104. Although five gas supply units 105 are provided in FIG. 3A, the number of gas supply units 105 is not limited to this, and at least one gas supply unit 105 may be provided. Further, two gas discharge portions 107 are provided for the plate-shaped member 108. Regarding the number of gas discharge units 107, it is sufficient that at least one gas discharge unit 107 is provided.

鏡筒104には複数の突起部が設けられており、これらの突起部に凸面ミラー102を押し当てることにより、凸面ミラー102が鏡筒104によって保持される。突起部が存在しない領域に関しては、鏡筒104と凸面ミラー102の間に隙間が生じている。当該隙間は気体の流路として機能する。 The lens barrel 104 is provided with a plurality of protrusions, and the convex mirror 102 is held by the lens barrel 104 by pressing the convex mirror 102 against these protrusions. With respect to the region where the protrusion does not exist, a gap is formed between the lens barrel 104 and the convex mirror 102. The gap functions as a gas flow path.

気体供給部105から供給された気体は、流路106を介して、鏡筒103、104の内部空間に移動する。そして、供給された気体は、気体排出部107による排気作用によって、メニスカスレンズ101と凸面ミラー102の間の空間や鏡筒104と凸面ミラー102の間の隙間を通過した後に、板状部材108に設けられた開口から外部空間に排出される。 The gas supplied from the gas supply unit 105 moves to the internal space of the lens barrels 103 and 104 via the flow path 106. Then, the supplied gas passes through the space between the meniscus lens 101 and the convex mirror 102 and the gap between the lens barrel 104 and the convex mirror 102 by the exhaust action of the gas discharge unit 107, and then passes through the plate-shaped member 108. It is discharged to the external space through the provided opening.

図3(b)は、図2で示した光学装置100をY軸の正方向から見た図であり、メニスカスレンズ101は図示していない。図2における面103aに形成された3つの突起部110が、Y軸の正方向に突き出ており、メニスカスレンズ101に設けられた面101aを位置決めしている。図3(b)における突起部111は、鏡筒103の面103bに固定されており、突起部111はメニスカスレンズ101を支持している。なお、鏡筒103の面103aとメニスカスレンズ101の面101aとの間、及び鏡筒103の面103bとメニスカスレンズ101の面101bとの間にはそれぞれ隙間が形成されている。 FIG. 3B is a view of the optical device 100 shown in FIG. 2 viewed from the positive direction of the Y-axis, and the meniscus lens 101 is not shown. The three protrusions 110 formed on the surface 103a in FIG. 2 project in the positive direction of the Y-axis and position the surface 101a provided on the meniscus lens 101. The protrusion 111 in FIG. 3B is fixed to the surface 103b of the lens barrel 103, and the protrusion 111 supports the meniscus lens 101. A gap is formed between the surface 103a of the lens barrel 103 and the surface 101a of the meniscus lens 101, and between the surface 103b of the lens barrel 103 and the surface 101b of the meniscus lens 101, respectively.

続いて、比較例と比較して、本実施例の光学装置100の作用効果について説明する。図6は、比較例としての光学装置600を示している。図2で示した光学装置100と共通の構成に関しては同一の参照番号を付している。図6では、露光光Lに起因してメニスカスレンズ101や凸面ミラー102で発生した熱が、鏡筒103、104に伝達し、自然対流として鏡筒103、104の周囲に広がる様子を示している。光学装置600では、鏡筒103、104の上部にカバー601を設けることで、鏡筒103、104の周囲への熱の拡散を低減している。 Subsequently, the operation and effect of the optical device 100 of this embodiment will be described as compared with the comparative example. FIG. 6 shows an optical device 600 as a comparative example. The same reference numbers are assigned to the configurations common to the optical device 100 shown in FIG. FIG. 6 shows how the heat generated by the meniscus lens 101 and the convex mirror 102 due to the exposure light L is transferred to the lens barrels 103 and 104 and spreads around the lens barrels 103 and 104 as natural convection. .. In the optical device 600, the cover 601 is provided on the upper portions of the lens barrels 103 and 104 to reduce the diffusion of heat to the surroundings of the lens barrels 103 and 104.

カバー601に気体排出部602を設けることで、鏡筒103、104の周囲への熱の拡散をより効果的に低減させることができる。気体排出部602は、配管を介して排気機構と接続されている。排気機構の排気作用によって、カバー601の内部空間から気体が排出される。 By providing the gas discharge portion 602 on the cover 601, it is possible to more effectively reduce the diffusion of heat around the lens barrels 103 and 104. The gas discharge unit 602 is connected to the exhaust mechanism via a pipe. Gas is discharged from the internal space of the cover 601 by the exhaust action of the exhaust mechanism.

図6に示したように、鏡筒103、104の周囲にカバー601を配置することで、鏡筒103、104の周囲への熱の拡散を低減し得るが、鏡筒の周囲にはスペース上の制約が設けられていることが多い。例えば、図1で示したように、鏡筒の周囲には露光光Lの光路があり、カバー601を配置することで、露光光Lの少なくとも一部が遮られてしまう等のおそれがある。 As shown in FIG. 6, by arranging the cover 601 around the lens barrels 103 and 104, heat diffusion to the surroundings of the lens barrels 103 and 104 can be reduced, but there is a space around the lens barrels. Often there are restrictions. For example, as shown in FIG. 1, there is an optical path of the exposure light L around the lens barrel, and by arranging the cover 601 there is a possibility that at least a part of the exposure light L is blocked.

本実施例では、鏡筒103、104の上部ではなく、鏡筒によって保持される光学素子の配列方向に気体排出部107を配置している。それゆえ、露光光Lを遮ることなく、光学素子の径方向における大型化を回避することができる。 In this embodiment, the gas discharge unit 107 is arranged not in the upper part of the lens barrels 103 and 104 but in the arrangement direction of the optical elements held by the lens barrels. Therefore, it is possible to avoid increasing the size of the optical element in the radial direction without blocking the exposure light L.

図2に戻り、光学装置100のその他の構成について説明する。鏡筒103には、鏡筒103の外部空間からの気体を吸引するための開口が設けられている。上述したように、気体排出部107は、配管107bを介して排気機構107cと接続されており、排気機構107cの排気作用によって、鏡筒103、104の内部空間から気体を排出している。このとき、鏡筒の内部空間は外部空間に関して負圧の状態となっている。そのため、図2に矢印で示すように、鏡筒103の外部空間の気体が鏡筒103に設けられた開口を通して、鏡筒103の内部空間に吸引される。 Returning to FIG. 2, other configurations of the optical device 100 will be described. The lens barrel 103 is provided with an opening for sucking gas from the external space of the lens barrel 103. As described above, the gas discharge unit 107 is connected to the exhaust mechanism 107c via the pipe 107b, and the gas is discharged from the internal spaces of the lens barrels 103 and 104 by the exhaust action of the exhaust mechanism 107c. At this time, the internal space of the lens barrel is in a negative pressure state with respect to the external space. Therefore, as shown by an arrow in FIG. 2, the gas in the external space of the lens barrel 103 is sucked into the internal space of the lens barrel 103 through the opening provided in the lens barrel 103.

鏡筒103の内部空間に吸引された気体は、鏡筒103とメニスカスレンズ101の間に設けられた隙間を通って、気体排出部107に向かって移動する。これにより、鏡筒103及びメニスカスレンズ101の冷却力を強化することができる。なお、鏡筒103の外部空間の気体は、不図示の温度調整機構によって温度制御された気体であることが好ましい。鏡筒103の外部空間における気体は、気体供給部105から供給される気体の温度と同一の温度となるように制御された気体であることが好ましい。 The gas sucked into the internal space of the lens barrel 103 moves toward the gas discharge unit 107 through the gap provided between the lens barrel 103 and the meniscus lens 101. As a result, the cooling power of the lens barrel 103 and the meniscus lens 101 can be strengthened. The gas in the external space of the lens barrel 103 is preferably a gas whose temperature is controlled by a temperature adjusting mechanism (not shown). The gas in the external space of the lens barrel 103 is preferably a gas controlled so as to have the same temperature as the gas supplied from the gas supply unit 105.

また、各気体排出部107によって排出される気体の流量の合計が、各気体供給部105から供給される気体の流量の合計よりも多くなるように、各排気機構107cにおける排気力及び各気体供給部105における気体の供給量が制御される。各気体排出部107によって排出される気体の流量の合計と、各気体供給部105によって供給される気体の流量の合計との差分に相当する量の気体が、鏡筒103に設けられた開口から鏡筒103の内部空間に吸引される。 Further, the exhaust force in each exhaust mechanism 107c and each gas supply so that the total flow rate of the gas discharged by each gas discharge unit 107 is larger than the total flow rate of the gas supplied from each gas supply unit 105. The amount of gas supplied in unit 105 is controlled. An amount of gas corresponding to the difference between the total flow rate of the gas discharged by each gas discharge unit 107 and the total flow rate of the gas supplied by each gas supply unit 105 is discharged from the opening provided in the lens barrel 103. It is sucked into the internal space of the lens barrel 103.

鏡筒に設けられた開口から鏡筒内に気体が供給される構成とすることで、鏡筒103、104の昇温を低減可能であることを熱流体解析によって確認している。我々の解析結果においては、当該開口を設けない場合と比較して、上昇温度を5割程度に抑えることができる。 It has been confirmed by thermo-fluid analysis that the temperature rise of the lens barrels 103 and 104 can be reduced by configuring the gas to be supplied into the lens barrel through the opening provided in the lens barrel. In our analysis results, the temperature rise can be suppressed to about 50% as compared with the case where the opening is not provided.

(実施例2)
次に、図4を用いて、実施例2の光学装置400の構成について説明する。実施例2の光学装置400では、実施例1の光学装置100と比較して、鏡筒103に設けた開口の数を増やしている。具体的には、鏡筒103の上下方向(Z軸方向)にも開口115を設けている。これにより、鏡筒103、104の外部空間から内部空間に吸引される気体の量が増えるため、鏡筒103、104、メニスカスレンズ101及び凸面ミラー102の冷却力をさらに強化することができる。
(Example 2)
Next, the configuration of the optical device 400 of the second embodiment will be described with reference to FIG. In the optical device 400 of the second embodiment, the number of openings provided in the lens barrel 103 is increased as compared with the optical device 100 of the first embodiment. Specifically, the opening 115 is also provided in the vertical direction (Z-axis direction) of the lens barrel 103. As a result, the amount of gas sucked from the external space of the lens barrels 103 and 104 into the internal space increases, so that the cooling power of the lens barrels 103 and 104, the meniscus lens 101 and the convex mirror 102 can be further strengthened.

(実施例3)
次に、図5を用いて、実施例3の光学装置500の構成について説明する。実施例3の光学装置500では、実施例1の光学装置100と比較して、気体排出部の配置を変更している。具体的には、気体排出部501を凸面ミラー102の上部に配置している。
(Example 3)
Next, the configuration of the optical device 500 of the third embodiment will be described with reference to FIG. In the optical device 500 of the third embodiment, the arrangement of the gas discharge unit is changed as compared with the optical device 100 of the first embodiment. Specifically, the gas discharge unit 501 is arranged above the convex mirror 102.

気体排出部501は、鏡筒104に対してY軸負方向の位置に配置され、鏡筒104に設けられた開口を介して気体の排出を行う。気体排出部501は、鏡筒104と接続された接続部501aと、配管501bと、排気機構501cを含み、排気機構501cの排気作用によって、鏡筒103、104の内部空間から配管501bを介して気体が排出される。鏡筒104に対してZ軸方向ではなく、Y軸方向に気体排出部401を配置することで、光学装置500のZ軸方向における大型化を緩和することができる。 The gas discharge unit 501 is arranged at a position in the negative direction of the Y-axis with respect to the lens barrel 104, and discharges gas through an opening provided in the lens barrel 104. The gas discharge unit 501 includes a connection unit 501a connected to the lens barrel 104, a pipe 501b, and an exhaust mechanism 501c, and the exhaust action of the exhaust mechanism 501c causes the internal space of the lens barrels 103 and 104 to pass through the pipe 501b. The gas is exhausted. By arranging the gas discharge unit 401 not in the Z-axis direction but in the Y-axis direction with respect to the lens barrel 104, it is possible to alleviate the increase in size of the optical device 500 in the Z-axis direction.

このような構成は、例えば、第1の光学素子101と第2の光学素子102がともにレンズで構成され、図5で示したように、光学素子101の右側から光学素子102の左側に向かって露光光Lが透過する場合に好適である。 In such a configuration, for example, the first optical element 101 and the second optical element 102 are both composed of a lens, and as shown in FIG. 5, from the right side of the optical element 101 toward the left side of the optical element 102. It is suitable when the exposure light L is transmitted.

(物品の製造方法)
本発明の実施形態にかかる物品の製造方法は、例えば、半導体デバイス等のマイクロデバイスや微細構造を有する素子、フラットパネルディスプレイ等の物品を製造するのに好適である。本実施形態の物品の製造方法は、基板に塗布された感光剤に上記の露光装置を用いて潜像パターンを形成する工程(基板を露光する工程)と、かかる工程で潜像パターンが形成された基板を現像(加工)する工程とを含む。更に、かかる製造方法は、他の周知の工程(酸化、成膜、蒸着、ドーピング、平坦化、エッチング、レジスト剥離、ダイシング、ボンディング、パッケージング等)を含む。本実施形態の物品の製造方法は、従来の方法に比べて、物品の性能・品質・生産性・生産コストの少なくとも1つにおいて有利である。
(Manufacturing method of goods)
The method for manufacturing an article according to the embodiment of the present invention is suitable for producing an article such as a microdevice such as a semiconductor device, an element having a fine structure, or a flat panel display. The method for manufacturing an article of the present embodiment includes a step of forming a latent image pattern on a photosensitive agent applied to a substrate (a step of exposing the substrate) using the above-mentioned exposure apparatus, and a step of forming a latent image pattern in such a step. It includes a process of developing (processing) the substrate. Further, such a manufacturing method includes other well-known steps (oxidation, film formation, vapor deposition, doping, flattening, etching, resist peeling, dicing, bonding, packaging, etc.). The method for producing an article of the present embodiment is advantageous in at least one of the performance, quality, productivity, and production cost of the article as compared with the conventional method.

(その他の実施例)
以上、本発明の好ましい実施形態について説明したが、本発明はこれらの実施形態に限定されないことはいうまでもなく、その要旨の範囲内で種々の変形及び変更が可能である。
(Other Examples)
Although the preferred embodiments of the present invention have been described above, it goes without saying that the present invention is not limited to these embodiments, and various modifications and modifications can be made within the scope of the gist thereof.

101 第1の光学素子
102 第2の光学素子
103、104 保持部
105 気体供給部
107 気体排出部
101 First optical element 102 Second optical element 103, 104 Holding unit 105 Gas supply unit 107 Gas discharge unit

Claims (13)

第1の光学素子及び第2の光学素子と、
前記第1の光学素子及び前記第2の光学素子を保持する保持部と、
前記保持部に設けられた流路に向けて温度制御された気体を供給する気体供給部と、
前記気体供給部によって供給された気体を排出する気体排出部と、
を備え、
前記気体排出部は、前記第1の光学素子と前記第2の光学素子の配列方向に並んで配置されていることを特徴とする光学装置。
The first optical element and the second optical element,
A holding portion for holding the first optical element and the second optical element,
A gas supply unit that supplies a temperature-controlled gas toward a flow path provided in the holding unit, and a gas supply unit.
A gas discharge unit that discharges the gas supplied by the gas supply unit,
With
An optical device characterized in that the gas discharge unit is arranged side by side in the arrangement direction of the first optical element and the second optical element.
前記気体排出部は、前記保持部の内部の空間から気体を排気する排気機構を含むことを特徴とする請求項1に記載の光学装置。 The optical device according to claim 1, wherein the gas discharging unit includes an exhaust mechanism for exhausting gas from a space inside the holding unit. 前記気体排出部は、前記第1の光学素子及び前記第2の光学素子に入射する光路外に設けられていることを特徴とする請求項1または2に記載の光学装置。 The optical device according to claim 1 or 2, wherein the gas discharging unit is provided outside the optical path incident on the first optical element and the second optical element. 前記保持部の内部の空間と外部の空間を隔てる部材をさらに有し、
前記気体排出部は、前記部材に設けられた開口を介して気体を排出することを特徴とする請求項1乃至3のいずれか1項に記載の光学装置。
Further having a member that separates the internal space and the external space of the holding portion,
The optical device according to any one of claims 1 to 3, wherein the gas discharging unit discharges gas through an opening provided in the member.
前記保持部は、前記保持部の内部の空間と外部の空間とを連通する開口を有し、
前記気体排出部によって気体が排出されることに応じて、前記保持部に設けられた開口を介して、前記保持部の外部の空間から内部の空間に気体が供給されることを特徴とする請求項1乃至4のいずれか1項に記載の光学装置。
The holding portion has an opening that communicates the space inside the holding portion with the space outside.
A claim characterized in that, in response to the gas being discharged by the gas discharging portion, the gas is supplied from the space outside the holding portion to the space inside the holding portion through an opening provided in the holding portion. The optical device according to any one of Items 1 to 4.
前記気体排出部によって排出される気体の流量は、前記気体供給部によって供給される気体の流量よりも多いことを特徴とする請求項5に記載の光学装置。 The optical device according to claim 5, wherein the flow rate of the gas discharged by the gas discharge unit is larger than the flow rate of the gas supplied by the gas supply unit. 前記気体排出部によって排出される気体の流量と、前記気体供給部によって供給される気体の流量との差分に相当する量の気体が、前記開口から供給されることを特徴とする請求項6に記載の光学装置。 The sixth aspect of claim 6 is characterized in that an amount of gas corresponding to the difference between the flow rate of the gas discharged by the gas discharge unit and the flow rate of the gas supplied by the gas supply unit is supplied from the opening. The optical device described. 前記気体排出部は、前記気体供給部によって供給された気体であって、前記第1の光学素子と前記第2の光学素子の間の空間を通過した気体を排出することを特徴とする請求項1乃至7のいずれか1項に記載の光学装置。 The gas discharge unit is a gas supplied by the gas supply unit, and is characterized in that the gas that has passed through the space between the first optical element and the second optical element is discharged. The optical device according to any one of 1 to 7. 前記第1の光学素子はレンズであり、前記第2の光学素子は、前記第1の光学素子を透過した光を反射するミラーであることを特徴とする請求項1乃至8のいずれか1項に記載の光学装置。 Any one of claims 1 to 8, wherein the first optical element is a lens, and the second optical element is a mirror that reflects light transmitted through the first optical element. The optical device described in. 前記気体排出部は、前記ミラーに対して前記レンズとは反対側に配置されていることを特徴とする請求項9に記載の光学装置。 The optical device according to claim 9, wherein the gas discharging unit is arranged on the side opposite to the lens with respect to the mirror. 第1凹反射面と第2凹反射面と、請求項1乃至10のいずれか1項に記載の光学装置を備える投影光学系であって、
物体面からの光が、前記第1凹反射面、前記光学装置に含まれるミラーの凸反射面、前記第2凹反射面の順に反射して像面に結像することを特徴とする投影光学系。
A projection optical system including a first concave reflecting surface, a second concave reflecting surface, and an optical device according to any one of claims 1 to 10.
Projection optics characterized in that light from an object surface is reflected in the order of the first concave reflection surface, the convex reflection surface of the mirror included in the optical device, and the second concave reflection surface to form an image on the image plane. system.
光源からの光でマスクを照明する照明光学系と、
前記マスクのパターンの像を基板に投影する請求項11に記載の投影光学系と、
を有することを特徴とする露光装置。
An illumination optical system that illuminates the mask with the light from the light source,
The projection optical system according to claim 11, which projects an image of the mask pattern onto a substrate.
An exposure device characterized by having.
請求項12に記載の露光装置を用いて基板上にパターンを形成する形成工程と、
前記形成工程でパターンが形成された前記基板を加工する加工工程と、を含み、
前記加工工程で加工された前記基板から物品を製造することを特徴とする物品の製造方法。
A forming step of forming a pattern on a substrate by using the exposure apparatus according to claim 12.
Including a processing step of processing the substrate on which a pattern is formed in the forming step.
A method for producing an article, which comprises producing an article from the substrate processed in the processing step.
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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014157892A (en) * 2013-02-15 2014-08-28 Canon Inc Exposure apparatus and process of manufacturing device using the same
JP2016095412A (en) * 2014-11-14 2016-05-26 キヤノン株式会社 Exposure equipment, and manufacturing method of article
JP2016161923A (en) * 2015-03-05 2016-09-05 キヤノン株式会社 Exposure device, and method for manufacturing article
JP2017068088A (en) * 2015-09-30 2017-04-06 キヤノン株式会社 Exposure device, temperature controller, and article manufacturing method

Family Cites Families (4)

* Cited by examiner, † Cited by third party
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JP4409389B2 (en) * 2004-08-20 2010-02-03 株式会社リコー Image forming apparatus cooling apparatus and image forming apparatus
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CN206684477U (en) * 2017-03-17 2017-11-28 东莞市川佳电子五金科技有限公司 A kind of optical tubes high-efficiency cooling device
JP7108967B2 (en) * 2017-12-27 2022-07-29 株式会社リコー Electronic equipment and image forming equipment

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014157892A (en) * 2013-02-15 2014-08-28 Canon Inc Exposure apparatus and process of manufacturing device using the same
JP2016095412A (en) * 2014-11-14 2016-05-26 キヤノン株式会社 Exposure equipment, and manufacturing method of article
JP2016161923A (en) * 2015-03-05 2016-09-05 キヤノン株式会社 Exposure device, and method for manufacturing article
JP2017068088A (en) * 2015-09-30 2017-04-06 キヤノン株式会社 Exposure device, temperature controller, and article manufacturing method

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