JP2021015688A - 質量分析装置 - Google Patents

質量分析装置 Download PDF

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Publication number
JP2021015688A
JP2021015688A JP2019128722A JP2019128722A JP2021015688A JP 2021015688 A JP2021015688 A JP 2021015688A JP 2019128722 A JP2019128722 A JP 2019128722A JP 2019128722 A JP2019128722 A JP 2019128722A JP 2021015688 A JP2021015688 A JP 2021015688A
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JP
Japan
Prior art keywords
ion trap
ions
ion
voltage
mass spectrometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2019128722A
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English (en)
Japanese (ja)
Other versions
JP2021015688A5 (enExample
Inventor
勇介 立石
Yusuke Tateishi
勇介 立石
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP2019128722A priority Critical patent/JP2021015688A/ja
Priority to US16/881,131 priority patent/US20210013022A1/en
Priority to DE102020003312.1A priority patent/DE102020003312A1/de
Priority to CN202010567636.XA priority patent/CN112216594A/zh
Publication of JP2021015688A publication Critical patent/JP2021015688A/ja
Publication of JP2021015688A5 publication Critical patent/JP2021015688A5/ja
Withdrawn legal-status Critical Current

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
    • H01J49/427—Ejection and selection methods
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • H01J49/408—Time-of-flight spectrometers with multiple changes of direction, e.g. by using electric or magnetic sectors, closed-loop time-of-flight
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/062—Ion guides
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G01N30/7233—Mass spectrometers interfaced to liquid or supercritical fluid chromatograph
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0036—Step by step routines describing the handling of the data generated during a measurement
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/022—Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/062—Ion guides
    • H01J49/063—Multipole ion guides, e.g. quadrupoles, hexapoles
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/422—Two-dimensional RF ion traps
    • H01J49/4225—Multipole linear ion traps, e.g. quadrupoles, hexapoles
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/422—Two-dimensional RF ion traps
    • H01J49/423—Two-dimensional RF ion traps with radial ejection

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2019128722A 2019-07-10 2019-07-10 質量分析装置 Withdrawn JP2021015688A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2019128722A JP2021015688A (ja) 2019-07-10 2019-07-10 質量分析装置
US16/881,131 US20210013022A1 (en) 2019-07-10 2020-05-22 Mass spectrometer
DE102020003312.1A DE102020003312A1 (de) 2019-07-10 2020-06-02 Massenspektrometer
CN202010567636.XA CN112216594A (zh) 2019-07-10 2020-06-19 质谱分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2019128722A JP2021015688A (ja) 2019-07-10 2019-07-10 質量分析装置

Publications (2)

Publication Number Publication Date
JP2021015688A true JP2021015688A (ja) 2021-02-12
JP2021015688A5 JP2021015688A5 (enExample) 2021-12-23

Family

ID=74058608

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2019128722A Withdrawn JP2021015688A (ja) 2019-07-10 2019-07-10 質量分析装置

Country Status (4)

Country Link
US (1) US20210013022A1 (enExample)
JP (1) JP2021015688A (enExample)
CN (1) CN112216594A (enExample)
DE (1) DE102020003312A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12027360B2 (en) 2021-06-16 2024-07-02 Shimadzu Corporation Mass spectrometer

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB201802917D0 (en) 2018-02-22 2018-04-11 Micromass Ltd Charge detection mass spectrometry
US11380531B2 (en) * 2019-11-08 2022-07-05 Thermo Finnigan Llc Methods and apparatus for high speed mass spectrometry
US11842891B2 (en) 2020-04-09 2023-12-12 Waters Technologies Corporation Ion detector
CN113725062B (zh) * 2021-09-07 2023-07-07 国开启科量子技术(北京)有限公司 离子阱射频装置
CN117981048A (zh) * 2021-09-23 2024-05-03 Dh科技发展私人贸易有限公司 用于非接触式样品喷射的信号解卷积的系统和方法
WO2023111707A1 (en) 2021-12-15 2023-06-22 Waters Technologies Corporation An inductive detector with integrated amplifier
KR20230135421A (ko) * 2022-03-16 2023-09-25 에이치비솔루션㈜ Tof-meis 신호 개선 시스템

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12027360B2 (en) 2021-06-16 2024-07-02 Shimadzu Corporation Mass spectrometer

Also Published As

Publication number Publication date
CN112216594A (zh) 2021-01-12
DE102020003312A1 (de) 2021-01-14
US20210013022A1 (en) 2021-01-14

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