JP2020534539A5 - - Google Patents

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Publication number
JP2020534539A5
JP2020534539A5 JP2020516714A JP2020516714A JP2020534539A5 JP 2020534539 A5 JP2020534539 A5 JP 2020534539A5 JP 2020516714 A JP2020516714 A JP 2020516714A JP 2020516714 A JP2020516714 A JP 2020516714A JP 2020534539 A5 JP2020534539 A5 JP 2020534539A5
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JP
Japan
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detector
pixel configuration
dead
pixels
current
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JP2020516714A
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English (en)
Japanese (ja)
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JP7041252B2 (ja
JP7041252B6 (ja
JP2020534539A (ja
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Priority claimed from PCT/EP2018/074546 external-priority patent/WO2019057572A1/en
Publication of JP2020534539A publication Critical patent/JP2020534539A/ja
Publication of JP2020534539A5 publication Critical patent/JP2020534539A5/ja
Publication of JP7041252B2 publication Critical patent/JP7041252B2/ja
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Publication of JP7041252B6 publication Critical patent/JP7041252B6/ja
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JP2020516714A 2017-09-22 2018-09-12 デジタルポジトロン放出断層撮影における検出器ピクセルの性能変動への対処 Expired - Fee Related JP7041252B6 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201762561706P 2017-09-22 2017-09-22
US62/561,706 2017-09-22
PCT/EP2018/074546 WO2019057572A1 (en) 2017-09-22 2018-09-12 MANAGING DETECTOR PIXEL PERFORMANCE VARIATION IN DIGITAL POSITRON EMISSION TOMOGRAPHY

Publications (4)

Publication Number Publication Date
JP2020534539A JP2020534539A (ja) 2020-11-26
JP2020534539A5 true JP2020534539A5 (https=) 2021-10-14
JP7041252B2 JP7041252B2 (ja) 2022-03-23
JP7041252B6 JP7041252B6 (ja) 2022-05-31

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ID=63579346

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JP2020516714A Expired - Fee Related JP7041252B6 (ja) 2017-09-22 2018-09-12 デジタルポジトロン放出断層撮影における検出器ピクセルの性能変動への対処

Country Status (5)

Country Link
US (1) US11175418B2 (https=)
EP (1) EP3685189B1 (https=)
JP (1) JP7041252B6 (https=)
CN (1) CN111183371B (https=)
WO (1) WO2019057572A1 (https=)

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* Cited by examiner, † Cited by third party
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CN110687585B (zh) * 2019-09-23 2021-05-11 上海联影医疗科技股份有限公司 获取晶体效率的方法、装置、计算机设备和存储介质
CN111624646B (zh) * 2020-06-11 2021-07-30 北京卫星环境工程研究所 多模块辐射探测器的重复事件甄别和处理方法
CN111728631A (zh) * 2020-07-30 2020-10-02 上海联影医疗科技有限公司 Pet系统探测数据修正方法、装置和计算机设备
KR102608895B1 (ko) * 2020-09-10 2023-11-30 신춘관 상하 수직류 순환에어방식의 부상여재의 컴팩트 소형화 여과장치 및 이를 이용한 최적화여재재생시스템
JP7768682B2 (ja) * 2021-03-04 2025-11-12 キヤノンメディカルシステムズ株式会社 Ｐｅｔ装置、方法及びプログラム
US20240151838A1 (en) * 2021-03-31 2024-05-09 Exo Imaging, Inc. Processing circuitry, system and method to test pixels in an ultrasonic imaging device
JP7636263B2 (ja) * 2021-05-13 2025-02-26 キヤノンメディカルシステムズ株式会社 ポジトロン放出断層撮影装置、方法及びプログラム
US12471877B2 (en) 2022-06-07 2025-11-18 GE Precision Healthcare LLC Photon counting computed tomography (PCCT) detector sensor repair for increased sensor yield
US12502156B2 (en) * 2023-05-12 2025-12-23 Canon Medical Systems Corporation Method for detecting and handling detector pixels with intermittent behavior for a small pixelated photon counting computed tomography (CT) system

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DE10122876C2 (de) * 2000-11-24 2003-08-21 Siemens Ag Verfahren zum Betrieb eines Bildsystems einer bildgebenden medizinischen Untersuchungseinrichtung und medizinische Untersuchungseinrichtung
US6694172B1 (en) 2001-06-23 2004-02-17 Koninklijke Philips Electronics, N.V. Fault-tolerant detector for gamma ray imaging
JP4346968B2 (ja) * 2003-06-13 2009-10-21 キヤノン株式会社 放射線撮影方法、放射線撮影装置、及びコンピュータプログラム
CN101400303B (zh) * 2006-04-28 2011-08-03 株式会社日立医药 X射线图像诊断装置
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BR112014032249A2 (pt) 2012-06-27 2017-06-27 Koninklijke Philips Nv sistema para correção de energia de dados de um evento de tomografia por emissão de pósitron (pet), e método para correção de energia de dados de um evento de tomografia por emissão de pósitron (pet)
JP6542772B2 (ja) * 2013-12-04 2019-07-10 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． イメージングディテクタ自己診断回路
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