JP2020525151A5 - - Google Patents

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Publication number
JP2020525151A5
JP2020525151A5 JP2019571694A JP2019571694A JP2020525151A5 JP 2020525151 A5 JP2020525151 A5 JP 2020525151A5 JP 2019571694 A JP2019571694 A JP 2019571694A JP 2019571694 A JP2019571694 A JP 2019571694A JP 2020525151 A5 JP2020525151 A5 JP 2020525151A5
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JP
Japan
Prior art keywords
ray
imager
imaging
scattering
predictor
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JP2019571694A
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English (en)
Japanese (ja)
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JP2020525151A (ja
JP6991252B2 (ja
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Priority claimed from EP17178015.8A external-priority patent/EP3420908A1/en
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Publication of JP2020525151A publication Critical patent/JP2020525151A/ja
Publication of JP2020525151A5 publication Critical patent/JP2020525151A5/ja
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Publication of JP6991252B2 publication Critical patent/JP6991252B2/ja
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JP2019571694A 2017-06-27 2018-06-26 誤使用を検出し及び傷害を防止するための散乱ｘ線検出 Active JP6991252B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP17178015.8A EP3420908A1 (en) 2017-06-27 2017-06-27 Scattered x-ray detection to detect misuse and prevent harm
EP17178015.8 2017-06-27
PCT/EP2018/067053 WO2019002257A1 (en) 2017-06-27 2018-06-26 DETECTION OF DISPERSED X-RAYS TO DETECT MISUSE AND PREVENT DAMAGE

Publications (3)

Publication Number Publication Date
JP2020525151A JP2020525151A (ja) 2020-08-27
JP2020525151A5 true JP2020525151A5 (enExample) 2021-07-26
JP6991252B2 JP6991252B2 (ja) 2022-01-12

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ID=59284993

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2019571694A Active JP6991252B2 (ja) 2017-06-27 2018-06-26 誤使用を検出し及び傷害を防止するための散乱ｘ線検出

Country Status (5)

Country Link
US (1) US11191496B2 (enExample)
EP (2) EP3420908A1 (enExample)
JP (1) JP6991252B2 (enExample)
CN (1) CN110809431B (enExample)
WO (1) WO2019002257A1 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3420909A1 (en) * 2017-06-27 2019-01-02 Koninklijke Philips N.V. X-ray misuse protection
JP7322501B2 (ja) * 2019-05-21 2023-08-08 株式会社島津製作所 Ｘ線撮影装置
JP2022026261A (ja) * 2020-07-30 2022-02-10 キヤノンメディカルシステムズ株式会社 Ｘ線ｃｔ装置
CN112258597B (zh) * 2020-12-18 2021-04-20 成都理工大学 基于神经网络定位算法的快速成像方法及装置
DE102021202662A1 (de) * 2021-03-18 2022-09-22 Siemens Healthcare Gmbh Mobiles Röntgengerät und Verfahren zum Betreiben eines mobilen Röntgengeräts
FR3148114A1 (fr) * 2023-04-24 2024-10-25 Cirra+ Systeme et procede de signalisation du statut d'un appareil a emission radioelectrique
US20240361471A1 (en) * 2023-04-28 2024-10-31 Canon Kabushiki Kaisha Radiation imaging apparatus and radiation imaging system
JP2024159475A (ja) * 2023-04-28 2024-11-08 キヤノン株式会社 放射線撮像装置及び放射線撮像システム
DE102023211326A1 (de) * 2023-11-14 2025-05-15 Siemens Healthineers Ag Verfahren zum Betrieb einer bildgebenden Röntgeneinrichtung und bildgebende Röntgeneinrichtung

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US4340818A (en) * 1980-05-14 1982-07-20 The Board Of Trustees Of The University Of Alabama Scanning grid apparatus for suppressing scatter in radiographic imaging
JP4016614B2 (ja) 2000-11-22 2007-12-05 株式会社島津製作所 Ｘ線透視撮影装置
DE10204543A1 (de) * 2002-02-05 2003-08-14 Philips Intellectual Property Verfahren und Einrichtung zur automatischen Überprüfung eines Röntgensystems
DE10232429B3 (de) 2002-07-17 2004-01-22 Siemens Ag Verfahren für eine Röntgenanordnung zur Kompensation von Streustrahlung und Röntgeneinrichtung
JP2004136021A (ja) 2002-10-21 2004-05-13 Toshiba Corp 集中照射型放射線治療装置
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CN101044980B (zh) * 2006-03-31 2011-07-06 株式会社东芝 磁场吸引防止装置
EP2117649B1 (en) * 2007-02-27 2012-10-24 Philips Intellectual Property & Standards GmbH Simulation and visualization of scattered radiation
US8712121B2 (en) * 2008-06-25 2014-04-29 Koninklijke Philips N.V. Image generation device with optimized dose control
WO2010028208A1 (en) * 2008-09-04 2010-03-11 Hologic, Inc. Integrated multi-mode mammography/tomosynthesis x-ray system and method
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US9724055B2 (en) 2014-03-07 2017-08-08 Elwha Llc Systems, devices, and methods for lowering dental x-ray dosage including feedback sensors
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JP7322501B2 (ja) * 2019-05-21 2023-08-08 株式会社島津製作所 Ｘ線撮影装置

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