JP2020118608A - measuring device - Google Patents

Abstract

To provide a measuring device with which a shake occurring in a cable is lightened.SOLUTION: The measuring device comprises: a measurement table on which a measurement object equipped with a connector is removably placed; a movable block having a first contact part electrically connected at one end to the connector in contact therewith and a second contact part electrically connected to the first contact part; a movement mechanism for moving the movable block to a measurement position and a retreat position; a fixed contact part connected to one end of the second contact part and fixed to the measurement table when the movable block is located at the measurement position at least; and a cable connected at one end to the fixed contact part and connected at other end to an external apparatus. The movable block has its first contact part connected to the connector of the measurement object when at the measurement position and has its first contact part disconnected from the connector of the measurement object when at the retreat position.SELECTED DRAWING: Figure 1

Description

The present invention relates to a measuring device, and more particularly to a measuring device that measures the characteristics of a module having a communication circuit.

Conventionally, before shipment of a module having a manufactured communication circuit from a factory, a characteristic value required by a measuring device is measured by a measuring device in order to inspect whether or not the module can exhibit a performance determined by specifications.

For example, in the circuit board inspection device of Patent Document 1, a cable connecting the upper fixture and the personal computer is fixedly held by a clamper. This reduces vibration stress to each connection point between the upper fixture and the cable when the upper fixture moves up and down.

JP 2001-59857 A

However, in the conventional measuring apparatus, as the upper fixture moves, the cable connecting the upper fixture to the clamper and the cable from the clamper to the PC still sway in the vertical direction following the vertical movement of the fixture. As a result, the measurement signal transmitted through the cable may be disturbed due to the sway of the cable, which may cause a large measurement error or damage.

Therefore, an object of the present invention is to provide a measuring device in which the sway generated in the cable is reduced.

In order to achieve the above object, according to one aspect of the present invention,
A measuring table on which a measuring object having a connector is detachably mounted,
A movable block having a first contact portion whose one end is in contact with and electrically connected to the connector, and a second contact portion which is electrically connected to the first contact portion;
A moving mechanism for moving the movable block to a measurement position and a retracted position,
A fixed contact portion that is connected to one end of the second contact portion and is fixed to the measurement table when at least the movable block is at the measurement position;
A cable having one end connected to the fixed contact portion and the other end connected to an external device,
In the movable block, at the measurement position, the connector of the measurement object and the first contact portion are connected,
In the movable block, the connector of the measuring object and the first contact portion are removed in the retracted position.
It is a measuring device.

According to the measuring device of the present invention, it is possible to provide the measuring device in which the vibration generated in the cable is reduced.

1 is a schematic side view of a measuring device according to a first embodiment. Schematic top view of the measuring jig of the measuring apparatus in Embodiment 1. Schematic diagram for explaining the movement of the movable block in the measuring device 1. Diagram showing an example of the measurement object Schematic side view of the measuring apparatus in the modification of Embodiment 1. Schematic top view of the measuring jig of the measuring device in the modification of Embodiment 1. Schematic side view of the measuring device in the second embodiment Diagram showing an example of the measurement object Schematic side view of the measuring device in the third embodiment Schematic side view of the measuring apparatus in the fourth embodiment Schematic side view of the measuring apparatus in the fifth embodiment Schematic side view of the measuring device in the sixth embodiment Schematic side view of the measuring device in the seventh embodiment

A measuring device according to one aspect of the present invention includes a measuring table on which a measuring object including a connector is detachably mounted, a first contact portion whose one end is in contact with and electrically connected to the connector, A movable block having a second contact portion electrically connected to the first contact portion, a moving mechanism for moving the movable block between a measurement position and a retracted position, and at least when the movable block is at the measurement position. A fixed contact portion connected to one end of the second contact portion and fixed to the measuring table; and a cable having one end connected to the fixed contact portion and the other end connected to an external device, The movable block is connected to the connector of the measurement object and the first contact portion at the measurement position, and the movable block is disconnected from the connector of the measurement object and the first contact portion at the retracted position. It is a measuring device.

According to such a configuration, the cable connected to the external device is connected to the fixed contact portion fixed to the measuring table, and is directly connected to the movable block having the first contact portion connected to the connector of the measurement object. Not connected. Therefore, since the movable block and the cable are not interlocked with each other, it is possible to reduce the sway of the cable during the measurement of the measurement object.

The fixed contact portion may be in contact with and separable from one end of the second contact portion.

Further, a jig substrate that supports the fixed contact portion may be provided, and the jig substrate may be fixed to the measurement table.

The first contact portion and the second contact portion may be probes, respectively, and the fixed contact portion may be a connector.

The first contact portion and the fixed contact portion may be probes, respectively, and the second contact portion may be a connector.

Further, the probe may be a high frequency probe and the connector may be a high frequency connector.

Further, a conductor may be provided that connects the other end of the first contact portion and the other end of the second contact portion and is fixed to the movable block.

Further, the moving mechanism may include a transport unit that moves the movable block toward and away from the object to be measured in a vertical direction and a horizontal direction.

Further, the moving mechanism may include a slider that vertically moves the movable block toward and away from the measurement target.

Further, the moving mechanism may include a rotary joint that moves the movable block toward and away from the measurement target in the rotation direction.

The moving mechanism may include a slider that diagonally moves the movable block toward and away from the measurement target.

Further, the measurement object may be a high frequency circuit module.

Hereinafter, the measuring apparatus according to the present invention will be described with reference to the drawings. In the drawings, members having substantially the same function and configuration are denoted by the same reference numerals, and the description thereof may be omitted in some cases. In addition, the drawings schematically show the respective constituent elements mainly for the sake of easy understanding.

It should be noted that each of the embodiments described below shows one specific example of the present invention, and the present invention is not limited to this configuration. In addition, numerical values, shapes, configurations, steps, order of steps, and the like specifically shown in the following embodiments are examples and do not limit the present invention. Among the constituent elements in the following embodiments, constituent elements that are not described in the independent claims showing the highest concept are described as arbitrary constituent elements. In addition, in all of the embodiments, the configurations in the modified examples are the same, and the configurations described in the modified examples may be combined with each other.

(Embodiment 1)
The measuring apparatus 1 according to the first embodiment of the present invention will be described below. FIG. 1 is a schematic side view showing a measuring device 1 according to the first embodiment. FIG. 2 is a schematic top view showing the measuring device 1 according to the first embodiment.

The measurement device 1 includes a measurement jig 5 on which a measurement target 3 as a measurement target is placed, a signal supply unit 7 that supplies a measurement signal to the measurement target 3, and an output signal from the measurement target 3. And a measuring device 9 for measuring.

The signal supply unit 7 supplies signals for controlling the module and power to the module.

The measuring instrument 9 measures a signal output from the measuring object 3, for example, a high frequency signal of 10 GHz or higher. The signal for measurement is not limited to the high frequency signal and may be various signals. Thereby, it is possible to determine whether or not the performance of the measuring object 3 is within the specification standard.

The measurement jig 5 includes a jig substrate 11 electrically connected to the measurement object 3, a measurement table 13 on which the measurement object 3 is removably mounted, and the jig substrate 11 is fixed, and a measurement object. A movable block 15 for connecting and disconnecting the object 3 and the jig substrate 11 is provided, and a transport unit 17 as a moving mechanism for moving the movable block 15 as a measurement position and a retracted position. The transport unit 17 transports the movable block 15 vertically and horizontally.

The movable block 15 has a first contact portion 21 whose one end 21k (see FIG. 3) contacts the connector 19 of the measurement target 3 and is electrically connected thereto. In addition, the movable block 15 has a second contact portion having one end 23k connected to the other end 21m of the first contact portion 21 and the other end 25k connected to one end 25m and the other end 23m of the conductor 23. 25. The movable block 15 is movable so as to be close to and away from the measurement target 3. The measuring jig 5 is further connected to one end 25m of the second contact portion 25 so as to be in contact with and separable from the one end, and a fixed contact portion 27 fixed to the measuring table 13 via the jig substrate 11 and one fixed contact portion. A cable 29 that is electrically connected to the external terminal 27 and has the other end connected to the signal supply unit 7 or the measuring device 9 and an external device such as a power supply.

The measuring table 13 is fixed to, for example, the floor or another table fixed to the floor. The measuring table 13 is made of an industrial resin material. A work pocket 14 that is a region that is recessed downward is formed on the upper surface of the measurement table 13. The work pocket 14 has a total size of the size of the measurement object 3, the tolerance of the measurement object 3, and the clearance.

The movable block 15 is made of an industrial resin material like the measuring table 13. The first contact portion 21 of the movable block 15 includes a probe 21a and a multi-pin probe 21b, respectively. Both the probe 21a and the multi-pin probe 21b are conductors made of metal. The probe 21a and the probe 25a are connected to each other by a conductor 23a. As described above, the first contact portion 21 may have a plurality of probes or may have only one probe.

The second contact portion 25 of the movable block 15 includes a probe 25a and a multi-pin probe 25b, respectively. Both the probe 25a and the multi-pin probe 25b are conductors made of metal. The multi-pin probe 21b and the multi-pin probe 25b are connected to each other by a conductor 23b. As described above, the second contact portion 25 may have a plurality of probes or may have only one probe. The probes 21a and 25a are, for example, high frequency probes having a signal line and a ground line.

The conductor 23 (23a, 23b) that connects the first contact portion 21 and the second contact portion 25 may be a metal wire arranged in the movable block 15 or a cable. One end of the conductor 23 is fixed to the movable block 15 via the first contact portion 21, and the other end of the conductor 23 is fixed to the movable block 15 via the second contact portion 25. The cable as the conductor 23 may be hard or soft. Since the length of the conductor 23 is short and both ends of the conductor 23 are fixed to the movable block 15, the conductor 23 has a structure in which a large swing does not occur.

A fixed contact portion 27 that can contact and separate from the second contact portion 25 is attached to the jig substrate 11. The fixed contact portion 27 is connected to the connection connector 31 via the conductor 33. The fixed contact portion 27 may be, for example, a connector or a land having electrodes formed on the surface of the jig substrate 11. The height of the upper surface of the fixed contact portion 27 may be different from the height of the measuring object. Further, the connection direction between the fixed contact portion 27 and the second contact portion 25 is not limited to the upward direction and may be an oblique direction or a lateral direction. The connector 31 is fixed to the jig substrate 11 and connected to the cable 29. The cable 29 connected to the signal supply unit 7 and the measuring instrument 9 is connected to the fixed contact unit 27 that does not move during measurement, via the connection connector 31 and the conductor 33.

The fixed contact portion 27 has a high frequency connector 27a and a multi-pin connector 27b. The high frequency connector 27a can contact and separate from the probe 25a, and the multi-pin connector 27b can contact and separate from the multi-pin probe 25b. The fixed contact portion 27 is, for example, a high frequency connector having a signal line and a ground line.

The connection connector 31 has a high-frequency connection connector 31 a connected to the measuring instrument 9 via the cable 29, and a multi-pin connection connector 31 b connected to the signal supply unit 7 via the cable 29. The high frequency connector 31a is a relay device that connects the cable 29 connected to the measuring instrument 9 and the high frequency connector 27a. The multi-pin connector 31b is a relay device that connects the cable 29 connected to the signal supply unit 7 and the multi-pin connector 27b.

FIG. 3 is a schematic diagram for explaining the movement of the movable block 15 in the measuring device 1. Before the measuring object 3 is placed in the work pocket 14, the movable block 15 is located at the retracted position retracted above and to the side of the measuring table 13. Therefore, the upper portion of the work pocket 14 is open and visible. In this way, the measurement object 3 is placed in the work pocket 14 of the measurement table 13 in a state where the movable block 15 is separated from the measurement object 3. After that, the movable block 15 is moved in the vertical direction (Z direction) and the horizontal direction (X axis direction) by the transport unit 17, and is transported so as to approach the measurement target 3 and the jig substrate 11. Then, at the measurement position, the first contact portion 21 of the movable block 15 and the connector 19 of the measurement object 3 are electrically connected, and the second contact portion 25 and the fixed contact portion 27 of the movable block 15 are electrically connected. It

FIG. 4 is a diagram showing an example of the measurement object 3. The measurement object 3 is, for example, a module having a communication circuit including a plurality of electronic components. The measuring object 3 includes a high-frequency connector 19a and a multi-pin connector 19b as the connector 19. The high frequency connector 19a is electrically connected to the measuring instrument 9. The multi-pin connector 19b is electrically connected to the signal supply unit 7, and a control signal is supplied to the measurement object 3 via the multi-pin connector 19b. In addition, the power from the external power supply is supplied to the communication circuit of the measurement target of the measurement target 3 through the multi-pin connector 19b. The output value of the measuring object 3 is sent from the high frequency connector 19a to the measuring instrument 9. In this way, various measurements are performed on the measuring object 3.

When the measurement of the measuring object 3 is completed, the movable block 15 is separated upward and horizontally in the horizontal direction by the conveying unit 17, and is conveyed to the retracted position. As a result, the first contact portion 21 of the movable block 15 and the connector 19 of the measuring object 3 are disconnected, and the second contact portion 25 of the movable block 15 and the fixed contact portion 27 are disconnected. When the movable block 15 moves away from the measurement target 3, the measurement target 3 becomes visible from above. After that, the measuring object 3 is taken out from the work pocket 14 of the measuring table 13 and is replaced with another measuring object 3.

According to the measuring device 1 of the first embodiment, the measurement table 13 on which the measurement object 3 including the connector 19 is detachably mounted, and the first contact where one end 21k contacts the connector 19 and is electrically connected thereto. A movable block 15 having a part 21 and a second contact part 25 electrically connected to the first contact part 21, a transport unit 17 for moving the movable block 15 to a measurement position and a retracted position, and at least a movable part When the block 15 is at the measurement position, it is connected to the one end 25m of the second contact part 25 and is fixed to the measuring stand 13, and one end is connected to the fixed contact part 27 and the other end is an external device. And the cable 29 connected to the measuring device 9 and the movable block 15 is connected to the connector 19 of the measurement object 3 and the first contact portion 21 at the measurement position, and the movable block 15 is connected to the movable block 15. In the retracted position 15, the connector 19 and the first contact portion 21 of the measuring object 3 are removed. With this configuration alone, the cable 29 connected to the signal supply unit 7 and the measuring instrument 9 is connected to the fixed contact unit 27, which does not move much during measurement. That is, the movement of the movable block 15 having the first contact portion 21 is not followed by the cable 29 connected to the signal supply portion 7 or the cable 29 connected to the measuring instrument 9. Therefore, when the movable block 15 is moved, the cable 29 is prevented from swaying, and no stress load is applied to the cable 29.

Further, in the conventional measuring device, a load is applied to the cable from which the measurement value is output from the movable measurement fixture. In particular, when the upper fixture moves up and down, a swaying stress due to the cable load is applied to the connector portion of the cable connected from the upper fixture to the clamper and from the clamper to the PC. Further, in the cable as well, since the extension and bending are repeated as the measurement fixture moves up and down, the conductor wire in the cable may be fatigued and the cable may be broken. Therefore, as the cable of the measuring device, a cable that is resistant to fatigue breakage and durable is selected. Since the cable 29 of the first embodiment is fixed, a normal cable can be used and the cost of the cable can be reduced. Further, since the cable load such as bending is alleviated, for example, a high frequency coaxial cable, a very thick cable, a waveguide or the like can be used as the cable 29.

Further, since it is not necessary to evaluate the fatigue breakage limit of the cable 29, it is possible to accelerate the development speed of the measuring device 1. Further, in the conventional measuring apparatus, the signal characteristic may change depending on the bending degree of the cable, but in the measuring apparatus of the first embodiment, the cable 29 is fixed, so that the signal characteristic deterioration is significantly reduced.

Further, in the conventional measuring device, the cable is easily damaged, so that the cable has to be selected as a consumable item for quality control, and the cable exchange must be managed. Since the frequency of exchanging the cable is about 10 times as high as that of the contact probe, maintenance work and work cost were required, but this management and cost can be eliminated.

Further, in the conventional measuring device, since the signal transmission performance such as signal loss differs for each individual cable, the signal loss performance of each cable is checked and the setting of the measurement system is changed every time the cable is replaced. In the measuring apparatus 1 of the first embodiment, the damage of the cable is significantly reduced, so that such work can be significantly reduced and the jig maintenance work amount can be reduced.

When the signal supply unit 7 supplies a direct current to the measurement target 3 instead of a high frequency signal, if the measured current consumption value of the measurement target 3 is, for example, in the order of μA, the cable shakes. The output value may fluctuate. Therefore, by using the measuring apparatus 1 of the first embodiment, it is possible to reduce the sway of the cable, which is also useful for the measurement of the low current consumption module.

Although the fixed contact portion 27 is attached to the jig substrate 11 in the above-described first embodiment, the fixed contact portion 27 may be attached directly to the measurement table 13 as shown in FIGS. 5 and 6. FIG. 5 is a schematic side view of the measuring apparatus according to the modification of the first embodiment, and FIG. 6 is a schematic top view of the measuring jig of the measuring apparatus according to the modification of the first embodiment.

Further, as shown in FIGS. 5 and 6, the conductor 33 and the connector 31 may be omitted and the cable 29 may be directly connected to the fixed contact portion 27. According to this configuration, the number of parts can be reduced, so that the cost can be reduced.

(Embodiment 2)
Next, the measuring device 1B according to the second embodiment of the present invention will be described with reference to FIGS. 7 and 8. FIG. 7 is a schematic side view of the measuring device 1B according to the second embodiment. FIG. 8 is a diagram showing an example of the measurement object 3B. The configurations other than those described below are common to the measuring apparatus 1 of the first embodiment and the measuring apparatus 1B of the second embodiment.

The measurement object 3B in the second embodiment is, for example, an antenna module having an antenna circuit 45. Further, the high frequency connector 27a of the fixed contact portion 27 in the second embodiment is externally measured via the conductor 33a, the high frequency connection connector 31a, and the coaxial high frequency cable 29 for inputting and outputting a high frequency signal. It is electrically connected to the container 9B. The multi-pin connector 27b of the fixed contact portion 27 is electrically connected, via the conductor 33b, the multi-pin connection connector 31b, and the cable 29, to the control unit 39 that sends a control signal and the power supply that supplies electric power. .. The control unit 39 is, for example, a personal computer.

The measuring apparatus 1B according to the second embodiment supplies a high frequency signal from the signal supply unit 7 to the high frequency connector 19a of the measuring object 3B via the cable 29 and the movable block 15. In addition, the measuring apparatus 1B supplies a control signal and power for specifying the antenna circuit 45 of the measurement object to the multi-pin connector 19b of the measurement object 3B from the control unit 39 and the power supply via the cable 29 and the movable block 15. To do. The control signal activates the module of the measurement object 3, switches to the measurement mode, and selects the antenna circuit 45 that radiates a radio signal.

The measuring apparatus 1B includes an antenna 43 that transmits and receives radio signals to and from each antenna circuit 45. The antenna 43 is connected to the measuring device 9B. The measuring instrument 9B measures the radio signal received from each antenna circuit 45 by the antenna 43. On the contrary, the signal supply unit 7 supplies the high frequency signal to the antenna 43, and the radio signal is transmitted from the antenna 43 to the measurement object 3B. Each antenna circuit 45 of the measuring object 3B outputs the radio signal received by the selected antenna circuit 45 from the high frequency connector 19a according to the control signal received from the multi-pin connector 19b, and is measured by the measuring instrument 9B. ..

As described above, according to the measuring apparatus 1B of the second embodiment, the sway of the cable 29 to which the high frequency signal is sent is reduced, so that the transmission/reception characteristics and the attenuation characteristics of the antenna module as the measurement object 3 are measured with high accuracy. can do.

(Embodiment 3)
Next, a measuring device according to a third embodiment of the present invention will be described with reference to FIG. FIG. 9 is a side view of the measuring apparatus 1C according to the second embodiment. The configuration other than the matters described below is common to the measuring apparatus 1 of the first embodiment and the measuring apparatus 1C of the second embodiment.

The measuring device 1C of the third embodiment uses the fixed contact portion 27C for the probe, which has a larger tolerance for the amount of deviation than the measuring device 1 of the first embodiment. The tip of the probe 25a of the second contact portion 25 is tapered. According to the measuring apparatus 1C of the third embodiment, since the measurement object 3 and the jig substrate 11 are separated, the probe 25a connected to the fixed contact portion 27C attached to the jig substrate 11 has a special small connector. Since it is possible to use a general-purpose connector instead of a general-purpose connector, it becomes inexpensive.

Generally, fitting to multiple connectors makes the jig design more difficult due to the problem of misalignment, but using one of the probes with a connector that has a large tolerance for misalignment makes the jig design more difficult. Can be suppressed. Further, since it is not necessary to use a probe for a small connector as the second contact portion 25, it is possible to use a probe or a contact terminal that has a large contact area with the fixed contact portion 27C and a small electrical loss, and the measurement characteristics are improves.

(Embodiment 4)
Next, a measuring device 1D of Embodiment 4 of the present invention will be described with reference to FIG. FIG. 10 is a schematic side view of the measuring device 1D according to the fourth embodiment. The configuration other than the matters described below is common to the measuring apparatus 1 of the first embodiment and the measuring apparatus 1D of the fourth embodiment.

The measuring device 1D of the fourth embodiment is configured such that the fixed contact portion 27D is the probe 25a and the multi-pin probe 25b, and the second contact portion 25 of the movable block 15 is the connector 26. The probe 25a and the multi-pin probe 25b and the connector 26 can be contacted and separated. Since the probe 25a and the multi-pin probe 25b are fixed to the measurement table 13 or the jig substrate 11 and removed from the movable block 15 that moves, care is taken about the tension of the cables connected to the probe 25a and the multi-pin probe 25b. No need. It is possible to reduce the size and weight of the movable block 15. Thereby, the design of the movable block 15 can be further simplified.

(Embodiment 5)
Next, a measuring device 1E according to the fifth embodiment of the present invention will be described with reference to FIG. FIG. 11 is a schematic side view of the measuring apparatus according to the fifth embodiment. The configurations other than those described below are common to the measuring apparatus 1 of the first embodiment and the measuring apparatus 1E of the fifth embodiment.

The measuring jig 5E in the fifth embodiment includes a rotary joint 61 that moves the movable block 15 toward and away from the movable block 15 as a moving mechanism. The movable block 15 rotates around the rotary shaft of the rotary joint 61. By this rotation, the movable block 15 moves between the measurement position and the retracted position, and the first contact portion 21 of the movable block 15 and the connector 19 of the measurement object 3 can be brought into contact with and separated from each other.

According to the measuring apparatus 1E of the fifth embodiment, since the movable block 15 does not have to move in two axes of the vertical direction (Z direction) and the horizontal direction (X direction), the first contact portion 21 can be accurately moved to the measurement target 3 Can be connected to the connector 19. Thereby, the measurement error can be reduced. Moreover, since the movement of the movable block 15 is a uniaxial movement in the rotation direction, the movement time of the movable block 15 can be shortened. As a result, the waiting time (non-measurement time) at the time of measurement can be shortened, and the efficiency of measurement can be improved.

(Embodiment 6)
Next, a measuring device 1F according to a sixth embodiment of the present invention will be described with reference to FIG. FIG. 12 is a schematic side view of the measuring device according to the sixth embodiment. The configurations other than those described below are common to the measuring apparatus 1 of the first embodiment and the measuring apparatus 1F of the sixth embodiment.

The measurement jig 5F according to the sixth embodiment includes a slider joint 65 that moves up and down the movable block 15F in the vertical direction (Z direction) as a moving mechanism. That is, the conductor 23F of the movable block 15F and the cable 29 are always electrically connected via the slider joint 65 instead of the second contact portion 25. The movable block 15F moves between the measurement position and the retracted position by moving in the vertical direction, so that the first contact portion 21 of the movable block 15F and the connector 19 of the measurement target 3 can be brought into contact with each other and separated from each other.

According to the measuring apparatus 1F of the sixth embodiment, since the movable block 15F does not have to move in the two axes of the vertical direction and the horizontal direction, the first contact portion 21 can be accurately connected to the connector 19 of the measurement object 3. .. Thereby, the measurement error can be reduced. Moreover, since the movement of the movable block 15F is a vertical uniaxial movement, the movement time of the movable block 15F can be shortened. Thereby, the waiting time (non-measurement time) at the time of measurement can be shortened, and the efficiency of measurement can be improved.

(Embodiment 7)
Next, a measuring device 1G according to a seventh embodiment of the present invention will be described with reference to FIG. FIG. 13 is a schematic side view of the measuring device according to the seventh embodiment. The configurations other than those described below are common to the measuring apparatus 1 of the first embodiment and the measuring apparatus 1G of the seventh embodiment.

The measurement jig 5G of the seventh embodiment includes a support portion 71 that slidably supports the movable block 15G. The support portion 71 has a guide groove 71a extending in an oblique direction. The guide groove 71a extends obliquely downward so as to approach the measurement target 3 from the upper end, and extends downward at the lower part.

The movable block 15G has a guide pin 73 fitted into the guide groove 71a of the support portion 71 in addition to the configuration of the movable block 15 of the first embodiment. The guide pin 73 of the movable block 15G slides obliquely along the guide groove 71a provided in the support portion 71 and descends. The support portion 71 having the guide pin 73 and the guide groove 71a constitutes a slider as a moving mechanism. The movable block 15G moves between the measurement position and the retracted position by moving in an oblique direction, so that the first contact portion 21 of the movable block 15G and the connector 19 of the measurement object 3 can be brought into contact with and separated from each other.

According to the measuring apparatus 1G of the seventh embodiment, since the movable block 15G does not have to move in the two axes of the vertical direction and the horizontal direction, the first contact portion 21 can be accurately connected to the connector 19 of the measurement target object 3. .. Thereby, the measurement error can be reduced. Further, since the movement of the movable block 15G is a uniaxial movement in the direction along the slide groove, the movement time of the movable block 15G can be shortened. As a result, the waiting time (non-measurement time) at the time of measurement can be shortened, and the efficiency of measurement can be improved.

The present invention is not limited to the above embodiment, but can be modified as follows.

(1) In each of the above-described embodiments, the movable block 15 is moved by the moving mechanism, but the moving mechanism may have a driving power source, or a moving mechanism in which an operator manually moves the movable block 15. But it's okay.

(2) In each of the above embodiments, the probe is used as the first contact portion 21 and the second contact portion 25, but the present invention is not limited to this. As the first contact portion 21 and the second contact portion 25, for example, a test pad or a pin probe may be used.

INDUSTRIAL APPLICATION This invention is applicable to the measuring device provided with a cable.

1-1E Measuring device 3, 3B Measuring object 5-5F Measuring jig 7 Signal supply unit 9 Measuring instrument 11 Jig board 13 Measuring stand 14 Work pocket 15, 15F, 15G Movable block 17 Transport unit 19 Connector 19a High frequency connector 19b Multi-pin connector 21 First contact part 21a Probe 21b Multi-pin probe 21k One end 21m Other end 23 Conductor 23k One end 23m Other end 25 Second contact part 25a Probe 25b Multi-pin probe 25m One end 25k Other end 26 Connector 27, 27C Fixed contact part 27a High-frequency connector 27b Multi-pin connector 29 Cable 31 Connection connector 31a High-frequency connection connector 31b Multi-pin connection connector 33 Conductor 33a Conductor 33b Conductor 39 Control unit 41 Antenna circuit 43 Antenna

Claims (12)

A measuring table on which a measuring object having a connector is detachably mounted,
A movable block having a first contact portion whose one end is in contact with and electrically connected to the connector, and a second contact portion which is electrically connected to the first contact portion;
A moving mechanism for moving the movable block to a measurement position and a retracted position,
A fixed contact portion that is connected to one end of the second contact portion and is fixed to the measurement table when at least the movable block is at the measurement position;
A cable having one end connected to the fixed contact portion and the other end connected to an external device,
In the movable block, at the measurement position, the connector of the measurement object and the first contact portion are connected,
In the retracted position of the movable block, the connector of the measurement object and the first contact portion are removed.
measuring device. The fixed contact portion is capable of contacting and separating from one end of the second contact portion,
The measuring device according to claim 1. A jig substrate for supporting the fixed contact portion,
The jig substrate is fixed to the measuring table,
The measuring device according to claim 2. Each of the first contact portion and the second contact portion is a probe,
The fixed contact portion is a connector,
The measuring device according to any one of claims 1 to 3. Each of the first contact portion and the fixed contact portion is a probe,
The second contact portion is a connector,
The measuring device according to any one of claims 1 to 3. The probe is a high frequency probe,
The connector is a high frequency connector,
The measuring device according to claim 4 or 5. The measuring device according to claim 1, further comprising a conductor that connects the other end of the first contact portion and the other end of the second contact portion and is fixed to the movable block. The moving mechanism includes a transport unit that moves the movable block toward and away from the object to be measured in the vertical and horizontal directions.
The measuring device according to any one of claims 1 to 7. The moving mechanism includes a slider that vertically moves the movable block toward and away from the measurement target.
The measuring device according to any one of claims 1 to 7. The moving mechanism includes a rotary joint that moves the movable block toward and away from the object to be measured in a rotational direction.
The measuring device according to any one of claims 1 to 7. The moving mechanism includes a slider that diagonally approaches and separates the movable block with respect to the measurement object.
The measuring device according to any one of claims 1 to 7. The measurement object is a high frequency circuit module,
The measuring device according to any one of claims 1 to 11.

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