CN216646642U - Probe device for impedance test - Google Patents
Probe device for impedance test Download PDFInfo
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- CN216646642U CN216646642U CN202123100681.3U CN202123100681U CN216646642U CN 216646642 U CN216646642 U CN 216646642U CN 202123100681 U CN202123100681 U CN 202123100681U CN 216646642 U CN216646642 U CN 216646642U
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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Abstract
The utility model relates to the technical field of circuit board impedance test equipment, in particular to a probe device for impedance test. The probe device comprises a device body, a spacing adjusting assembly and a probe assembly; the probe assembly comprises a first probe unit, a second probe unit and a third probe unit, wherein the second probe unit and the third probe unit are fixedly arranged on the device body; the distance adjusting assembly comprises an X-axis driving mechanism and a Y-axis driving mechanism, the X-axis driving mechanism is arranged on the Y-axis driving mechanism in a sliding mode, and the first probe unit is arranged on the X-axis driving mechanism in a sliding mode; the distance adjusting assembly is used for adjusting the distance between the first probe and the second probe and the distance between the first probe and the third probe. The automatic and accurate adjustment of the probe distance is realized through the distance adjusting assembly, and the impedance testing efficiency and the testing precision of the device are improved.
Description
Technical Field
The utility model relates to the technical field of circuit board impedance test equipment, in particular to a probe device for impedance test.
Background
The conventional impedance testing apparatus for Printed Circuit Boards (PCBs) mainly includes a testing machine and a probe unit device, the probe unit device mainly includes a plurality of probe units for point-contacting conductive contacts of the PCB, each probe unit employs a coaxial pin including a core pin and a ground conductor insulated from the core pin and surrounding the core pin for high frequency impedance testing, and is electrically connected to the testing machine through a coaxial signal line, and each probe unit is arranged in a group of two by two at a fixed interval.
However, the pitch of the probe units required for the conventional pcb impedance test is very variable, so a plurality of different probe unit devices are required to meet the diversified test requirements, i.e. when the pitch of the probe units required for the pcb impedance test is different, different probe unit devices need to be replaced, and thus the cost of the test equipment is high, and thus the improvement is needed.
SUMMERY OF THE UTILITY MODEL
The utility model aims to provide a probe device for impedance testing, which can automatically and accurately adjust the distance between probe units and improve the impedance testing efficiency and testing precision.
In order to achieve the purpose, the utility model adopts the following technical scheme:
a probe device for impedance test comprises a device body, a spacing adjusting assembly and a probe assembly;
the probe assembly comprises a first probe unit, a second probe unit and a third probe unit, wherein the second probe unit and the third probe unit are fixedly arranged on the device body, the first probe unit comprises a first probe, the second probe unit comprises a second probe, and the third probe unit comprises a third probe;
the distance adjusting assembly comprises an X-axis driving mechanism and a Y-axis driving mechanism, the X-axis driving mechanism is arranged on the Y-axis driving mechanism in a sliding mode, and the first probe unit is arranged on the X-axis driving mechanism in a sliding mode;
the distance adjusting assembly is used for adjusting the distance between the first probe and the second probe and the distance between the first probe and the third probe.
Preferably, the first probe unit includes a first fastening portion on which the first probe is disposed and a first connecting portion on which the first connecting portion is fixedly disposed on the X-axis driving mechanism;
the second probe unit includes a second fastening part on which the second probe is disposed and a second connection part on which the second fastening part is disposed;
the third probe unit comprises a third fastening portion and a third connecting portion, the third probe is arranged on the third fastening portion, the third fastening portion is arranged on the third connecting portion, and the second connecting portion and the third connecting portion are fixedly arranged on the device body.
Preferably, the first probe unit includes a first cylinder provided on the first connection part, and the first fastening part is provided at an output end of the first cylinder;
the second probe unit comprises a second air cylinder, the second air cylinder is arranged on the third connecting part, the second fastening part is arranged at the output end of the second air cylinder, and the second air cylinder is used for driving the second fastening part to move in the Z-axis direction;
the third probe unit comprises a third air cylinder, the third air cylinder is arranged on the second connecting portion, the third fastening portion is arranged at the output end of the third air cylinder, and the third air cylinder is used for driving the third fastening portion to move in the Z-axis direction.
Preferably, the first fastening portion, the second fastening portion, and the third fastening portion are each inclined at a predetermined angle with respect to the Z-axis direction.
Preferably, the first probe, the second probe and the third probe are communicated with each other by a gold wire.
Preferably, the X-axis driving mechanism includes a first motor, a first sliding rail, and a first roller, the first roller is disposed at an output end of the first motor, and the first motor drives the first roller to move in the X direction;
the first probe unit comprises a first sliding block, the first roller is arranged on the first sliding block, and the first sliding block is arranged on the first sliding rail in a sliding mode.
Preferably, the Y-axis driving mechanism includes a second motor, a second sliding rail and a second roller, the second roller is disposed at an output end of the second motor, and the second motor drives the second roller to move in the Y direction;
the X-axis driving mechanism comprises a second sliding block, the second roller is arranged on the second sliding block, and the second sliding block is arranged on the second sliding rail in a sliding mode.
Preferably, the first motor and the second motor are both stepping motors.
Compared with the prior art, the embodiment of the utility model has the following beneficial effects:
specifically, in the actual test, the position of the first probe is adjusted according to the distance between the conductive contacts of the object to be tested. The Y-axis driving mechanism drives the X-axis driving mechanism to move in the Y direction, the first probe unit is arranged on the X-axis driving mechanism, and the first probe unit can also move in the Y direction. Further, the X-axis drive mechanism drives the first probe unit to move in the X direction. Therefore, the first probe unit can move in the X direction and the Y direction under the action of the spacing adjusting assembly.
In actual operation, the probes are combined and detected pairwise, and the distance between the first probe and the second probe or the distance between the first probe and the third probe is adjusted according to the distance between the conductive contacts of the object to be detected. The automatic and accurate adjustment of the probe distance is realized through the distance adjusting assembly, and the impedance testing efficiency and the testing precision of the device are improved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without inventive exercise.
Fig. 1 is a first schematic structural diagram of a probe apparatus for impedance testing according to an embodiment of the present invention;
fig. 2 is a schematic structural diagram of a probe apparatus for impedance testing according to an embodiment of the present invention;
fig. 3 is a schematic structural diagram of a probe apparatus for impedance testing according to an embodiment of the present invention.
Illustration of the drawings: a first motor 111, a first slide rail 112, a first roller 113, a second slider 114, a second motor 121, and a second slide rail 122;
a probe assembly 2, a device body 3;
a first probe unit 21, a second probe unit 22, and a third probe unit 23;
a first probe 211, a first fastening part 212, a first cylinder 213, a first slider 214, a first connecting part 215;
a second probe 221, a second fastening part 222, a second cylinder 223, a second connection part 224;
a third probe 231, a third fastening part 232, a third cylinder 233, and a third connecting part 234.
Detailed Description
In order to make the objects, features and advantages of the present invention more obvious and understandable, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is apparent that the embodiments described below are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In the description of the present invention, it is to be understood that when an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. When a component is referred to as being "disposed on" another component, it can be directly on the other component or intervening components may also be present.
Furthermore, the terms "long", "short", "inner", "outer", and the like indicate orientations or positional relationships based on those shown in the drawings, and are only for convenience of describing the present invention, but do not indicate or imply that the referred devices or elements must have the specific orientations, be configured to operate in the specific orientations, and thus are not to be construed as limitations of the present invention.
The technical scheme of the utility model is further explained by the specific implementation mode in combination with the attached drawings.
Referring to fig. 1 to 3, a probe apparatus for impedance testing includes a probe assembly 2, a spacing adjustment assembly and an apparatus body 3.
The probe assembly 2 includes a first probe unit 21, a second probe unit 22 and a third probe unit 23, the second probe unit 22 and the third probe unit 23 are both fixedly disposed on the apparatus body 3, and the second probe unit 22 and the third probe unit 23 are disposed at a certain distance.
The first probe unit 21 includes a first probe 211, the second probe unit 22 includes a second probe 221, and the third probe unit 23 includes a third probe 231.
The distance adjusting assembly comprises an X-axis driving mechanism and a Y-axis driving mechanism, the X-axis driving mechanism is arranged on the Y-axis driving mechanism in a sliding mode, and the first probe unit 21 is arranged on the X-axis driving mechanism in a sliding mode.
The spacing adjustment assembly adjusts a distance between the first probe 211 and the second probe 221 for impedance testing or adjusts a distance between the first probe 211 and the third probe 231 for impedance testing. The second probe 221 and the third probe 231 may also be used for impedance testing.
Specifically, in the actual test, the position of the first probe 211 is adjusted according to the pitch of the conductive contacts of the object to be tested. The Y-axis drive mechanism drives the X-axis drive mechanism to move in the Y direction, and the first probe unit 21 is provided on the X-axis drive mechanism, so that the first probe unit 21 can also effect movement in the Y direction. The X-axis drive mechanism may drive the first probe unit 21 to move in the X direction. The first probe unit 21 can be moved in the X direction and the Y direction by the pitch adjustment assembly.
In practical operation, the probes are combined and detected two by two, and the distance between the first probe 211 and the second probe 221, or the distance between the first probe 211 and the third probe 231 is adjusted according to the distance between the conductive contacts of the object to be detected. The automatic and accurate adjustment of the probe distance is realized through the distance adjusting assembly, and the impedance testing efficiency and the testing precision of the probe device are improved.
In an alternative embodiment, the first probe unit 21 includes a first fastening part 212 and a first connecting part 215. The first connecting portion 215 is fixedly provided on the X-axis driving mechanism, the fastening portion 212 is provided on the first connecting portion 215, and the first probe 211 is provided on the first fastening portion 212. Optionally, the first fastening portion 212 is provided with a slot for fixing the first probe 211.
The second probe unit 22 includes a second fastening portion 222 and a second connection portion 224, the second probe 221 is disposed on the second fastening portion 222, and the second fastening portion 222 is disposed on the second connection portion 224.
The third probe unit 23 includes a third fastening part 232 and a third connection part 234, the third probe 231 is disposed on the third fastening part 232, and the third fastening part 232 is disposed on the third connection part 234.
The second connecting portion 224 and the third connecting portion 234 are both fixedly provided on the apparatus body 3. Optionally, the second fastening portion 222 is provided with a slot for fixing the second probe 221, and the third fastening portion 232 is provided with a slot for fixing the third probe 231.
In an alternative embodiment, the first probe unit 21 includes a first cylinder 213, the first cylinder 213 is disposed on the first connection part 215, and the first fastening part 212 is disposed at an output end of the first cylinder 213;
the second probe unit 22 includes a second cylinder 223, the second cylinder 223 is disposed on the second connection portion 224, the second fastening portion 222 is disposed at the output end of the second cylinder 223, and the second cylinder 223 is used for driving the second fastening portion 222 to move in the Z-axis direction;
the third probe unit 23 includes a third cylinder 233, the third cylinder 233 is disposed on the third connecting portion 234, the third fastening portion 232 is disposed at an output end of the third cylinder 233, and the third cylinder 233 is used to drive the third fastening portion 232 to move in the Z-axis direction.
Adopt three cylinder and the fastening portion that corresponds, each cylinder is independent at Z axle direction up-and-down motion to drive fastening portion and the probe that links to each other and carry out the up-and-down motion at Z axle direction, make each probe independently freely go up and down, the probe that will need not to use during the measurement rises, and the two liang of combination of realization probe of being more convenient for detects, realizes the measurement of multiunit combination, and the probe unit more has the compatibility.
Optionally, the first fastening portion 212, the second fastening portion 222 and the third fastening portion 232 are inclined by a preset angle relative to the Z-axis direction, so that the minimum distance between every two combined probes can be greatly shortened, and micro-distance measurement is realized. Furthermore, an included angle exists between the second probe 221 and the third probe 231, so that the first probe 211 and the probes at different angles are combined for measurement, and the probe device can measure different objects to be measured at multiple angles.
In an alternative embodiment, the X-axis driving mechanism includes a first motor 111, a first sliding rail 112 and a first roller 113, the first roller 113 is disposed at an output end of the first motor 111, and the first motor 111 drives the first roller 113 to move in the X direction;
the first probe unit 21 includes a first slider 214, and the first slider 214 is disposed on the first connection portion 215. The first roller 113 is disposed on the first slider 214, and the first slider 214 is slidably disposed on the first sliding rail 112.
In an alternative embodiment, the Y-axis driving mechanism includes a second motor 121, a second sliding rail 122 and a second roller, the second roller is disposed at an output end of the second motor 121, and the second motor 121 drives the second roller to move in the Y direction;
the X-axis driving mechanism includes a second slider 114, a second roller is disposed on the second slider 114, and the second slider 114 is slidably disposed on a second slide rail 122.
The first probe 211 moves in the direction X, Y by adopting the X-axis driving mechanism and the Y-axis driving mechanism, so that the first probe 211 performs distance adjusting movement around the other two probes along the coordinate on the plane, thereby realizing the automatic distance adjustment of the probes. Optionally, the first motor 111 and the second motor 121 of this embodiment are both stepping motors.
The above-mentioned embodiments are only used for illustrating the technical solutions of the present invention, and not for limiting the same; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (8)
1. The probe device for the impedance test is characterized by comprising a device body (3), a spacing adjusting assembly and a probe assembly (2);
the probe assembly (2) comprises a first probe unit (21), a second probe unit (22) and a third probe unit (23), wherein the second probe unit (22) and the third probe unit (23) are fixedly arranged on the device body (3), the first probe unit (21) comprises a first probe (211), the second probe unit (22) comprises a second probe (221), and the third probe unit (23) comprises a third probe (231);
the distance adjusting assembly comprises an X-axis driving mechanism and a Y-axis driving mechanism, the X-axis driving mechanism is arranged on the Y-axis driving mechanism in a sliding mode, and the first probe unit (21) is arranged on the X-axis driving mechanism in a sliding mode;
the spacing adjustment assembly is used for adjusting the distance between the first probe (211) and the second probe (221), and the distance between the first probe (211) and the third probe (231).
2. The probe apparatus for impedance testing according to claim 1, wherein the first probe unit (21) includes a first fastening portion (212) and a first connecting portion (215), the first probe (211) is disposed on the first fastening portion (212), the fastening portion (212) is disposed on the first connecting portion (215), and the first connecting portion (215) is fixedly disposed on the X-axis driving mechanism;
the second probe unit (22) includes a second fastening portion (222) and a second connection portion (224), the second probe (221) is disposed on the second fastening portion (222), and the second fastening portion (222) is disposed on the second connection portion (224);
the third probe unit (23) includes a third fastening portion (232) and a third connecting portion (234), the third probe (231) is provided on the third fastening portion (232), the third fastening portion (232) is provided on the third connecting portion (234), and the second connecting portion (224) and the third connecting portion (234) are both fixedly provided on the apparatus body (3).
3. The probe apparatus for impedance test according to claim 2, wherein the first probe unit (21) comprises a first cylinder (213), the first cylinder (213) is disposed on the first connection portion (215), the first fastening portion (212) is disposed at an output end of the first cylinder (213);
the second probe unit (22) comprises a second air cylinder (223), the second air cylinder (223) is arranged on the second connecting part (224), the second fastening part (222) is arranged at the output end of the second air cylinder (223), and the second air cylinder (223) is used for driving the second fastening part (222) to move in the Z-axis direction;
the third probe unit (23) comprises a third air cylinder (233), the third air cylinder (233) is arranged on the third connecting portion (234), the third fastening portion (232) is arranged at the output end of the third air cylinder (233), and the third air cylinder (233) is used for driving the third fastening portion (232) to move in the Z-axis direction.
4. The probe device for impedance testing according to claim 3, wherein the first fastening portion (212), the second fastening portion (222), and the third fastening portion (232) are each inclined at a predetermined angle with respect to the Z-axis direction.
5. The probe apparatus for impedance testing according to claim 1, wherein the first probe (211), the second probe (221) and the third probe (231) are in gold wire communication with each other.
6. The probe device for the impedance test according to claim 1, wherein the X-axis driving mechanism comprises a first motor (111), a first sliding rail (112) and a first roller (113), the first roller (113) is arranged at the output end of the first motor (111), and the first motor (111) drives the first roller (113) to move in the X direction;
the first probe unit (21) comprises a first sliding block (214), the first roller (113) is arranged on the first sliding block (214), and the first sliding block (214) is arranged on the first sliding rail (112) in a sliding mode.
7. The probe device for the impedance test according to claim 6, wherein the Y-axis driving mechanism comprises a second motor (121), a second sliding rail (122) and a second roller, the second roller is arranged at the output end of the second motor (121), and the second motor (121) drives the second roller to move in the Y direction;
the X-axis driving mechanism comprises a second sliding block (114), the second roller is arranged on the second sliding block (114), and the second sliding block (114) is arranged on the second sliding rail (122) in a sliding mode.
8. The probe device for impedance testing according to claim 7, wherein the first motor (111) and the second motor (121) are both stepper motors.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202123100681.3U CN216646642U (en) | 2021-12-10 | 2021-12-10 | Probe device for impedance test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202123100681.3U CN216646642U (en) | 2021-12-10 | 2021-12-10 | Probe device for impedance test |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN216646642U true CN216646642U (en) | 2022-05-31 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202123100681.3U Active CN216646642U (en) | 2021-12-10 | 2021-12-10 | Probe device for impedance test |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN216646642U (en) |
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2021
- 2021-12-10 CN CN202123100681.3U patent/CN216646642U/en active Active
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