CN219143037U

CN219143037U - Vibration test equipment for integrated circuit

Info

Publication number: CN219143037U
Application number: CN202320116710.5U
Authority: CN
Inventors: 叶四华
Original assignee: Pinxin Electronics Shenzhen Co ltd
Current assignee: Pinxin Electronics Shenzhen Co ltd
Priority date: 2023-02-06
Filing date: 2023-02-06
Publication date: 2023-06-06
Anticipated expiration: 2033-02-06

Abstract

The utility model discloses vibration test equipment for an integrated circuit, which relates to the technical field of integrated circuit detection and comprises a test main body, a detection cavity arranged on the test main body, a comparison unit arranged on one side of the test main body, a display arranged on one side of the comparison unit, two pairs of control buttons and a plurality of groups of detection components arranged on the other side of the comparison unit, a transverse guide rail arranged at the top of the cavity of the detection cavity, a longitudinal guide rail vertically connected with the top of the transverse guide rail in a sliding manner, a mounting seat connected with the bottom of the longitudinal guide rail in a sliding manner, a camera arranged at the bottom of the mounting seat, wiring boards arranged on both sides of the cavity of the detection cavity, and a controller arranged on the other side of the test main body. The utility model increases the detection convenience of the vibration test equipment for detecting the voltage of each pin of the integrated circuit, improves the use effect of the vibration test equipment and has practicability.

Description

Vibration test equipment for integrated circuit

Technical Field

The utility model relates to the technical field of integrated circuit detection, in particular to vibration testing equipment for an integrated circuit.

Background

An integrated circuit is a type of microelectronic device or component. The components such as transistors, resistors, capacitors, inductors and the like required in a circuit and wiring are interconnected together by adopting a certain process, are manufactured on a small or a few small semiconductor wafers or dielectric substrates, and are then packaged in a tube shell to form a microstructure with the required circuit function; all the components are structurally integrated, so that the electronic components are greatly advanced towards microminiaturization, low power consumption, intellectualization and high reliability.

Vibration detection is generally performed during the processing of integrated circuits for quality detection of the integrated circuits. During detection, the integrated circuit board is placed in the test equipment, vibration motors in the vibration detection equipment vibrate the integrated circuit for multiple times in the directions of an X axis, a Y axis and a Z axis, the vibrated integrated circuit uses a universal meter to detect each pin of the integrated circuit, and when the detection value meets the qualified value, the quality of the integrated circuit is qualified, and further the next step of processing of the integrated circuit can be performed.

The existing vibration test equipment needs to manually detect all pins of the integrated circuit board, the detection cost is high, the detection speed is low, the use effect of the vibration test equipment of the integrated circuit is poor, and the practicability is low, so that the application provides the vibration test equipment for the integrated circuit to meet the requirements.

Disclosure of Invention

An objective of the present application is to provide a vibration testing apparatus for an integrated circuit, so as to solve the problems set forth in the background art.

In order to achieve the above purpose, the present application provides the following technical solutions:

the utility model provides a shock testing equipment for integrated circuit, includes the test main part, sets up detect the chamber in the test main part, one side of test main part is provided with the contrast unit, one side of contrast unit is provided with the display, the opposite side of contrast unit is provided with two pairs of control button and a plurality of group detection subassembly, the intracavity top in detection chamber is provided with transverse guide, transverse guide's top perpendicular sliding has longitudinal guide, longitudinal guide's bottom sliding connection has the mount pad, the camera is installed to the bottom of mount pad, the intracavity both sides in detection chamber all are provided with the wiring board.

Preferably, a controller is arranged on the other side of the test main body, a plurality of integrated circuit voltage standard cone values are arranged in the controller, and the number of the plurality of groups of detection assemblies is the same as the number of the plurality of integrated circuit voltage standard cone values.

Preferably, the transverse guide rail and the longitudinal guide rail are vertically distributed, and the display is connected with the camera through a signal line.

Preferably, the two pairs of control buttons are distributed in a cross structure, a pair of control buttons which are distributed transversely is connected with the transverse guide rail, and a pair of control buttons which are distributed longitudinally is connected with the longitudinal guide rail.

Preferably, the wiring board is electrically connected with the detection assembly, the detection assembly comprises a power button, a voltmeter and an indicator lamp, and the power button, the voltmeter and the indicator lamp are sequentially arranged from left to right.

Preferably, two positive electrode clamping ends and two negative electrode clamping ends are arranged in the wiring board, and each positive electrode clamping end and each negative electrode clamping end are adjacently distributed.

In summary, the utility model has the technical effects and advantages that:

1. according to the utility model, through the wiring board, the positive electrode clamping end, the negative electrode clamping end and the detection assembly, the voltage detection structure of the detection pins in the integrated circuit by the test main body is conveniently increased, the detection of the detection pins is conveniently carried out by the test equipment at the same time, the operation steps of the integrated circuit are reduced, the detection efficiency of the test equipment is improved, and then the qualified state of the pins is conveniently and intuitively obtained by the comparison of the display data of the voltmeter in the detection assembly and the voltage standard cone value of the integrated circuit, so that the quality detection of each pin in the integrated circuit is realized, and the detection convenience of the test equipment on each pin of the integrated circuit is increased. The use effect of the testing device is improved, and the practicability is realized;

2. according to the utility model, the image shooting structure in the detection cavity is conveniently increased through the display, the transverse guide rail, the longitudinal guide rail and the camera, the shot image is transmitted to the display, direct observation after vibration detection of the integrated circuit is convenient, an inspector can directly discard the integrated circuit of the loose or falling component through the display, detection of voltage conditions of each pin is reduced, detection efficiency of the testing equipment is improved, and further use effect of the testing equipment is improved, so that the integrated circuit vibration detection device has practicability.

Drawings

In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings that are required in the embodiments or the description of the prior art will be briefly described below, it being obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.

FIG. 1 is a schematic diagram of a shock testing apparatus for an integrated circuit;

FIG. 2 is a cross-sectional view of a test body in a shock test apparatus for an integrated circuit;

FIG. 3 is a schematic diagram of a camera and a display in a vibration testing apparatus for an integrated circuit;

FIG. 4 is a schematic diagram of the wiring board and the detecting assembly in a vibration testing apparatus for an integrated circuit;

fig. 5 is a schematic diagram of the structure of a wiring board in a shock testing apparatus for an integrated circuit.

In the figure: 1. a test body; 11. a detection chamber; 2. a comparison unit; 21. a display; 22. a control button; 3. a detection assembly; 31. a power button; 32. a voltmeter; 33. an indicator light; 4. a transverse guide rail; 41. a longitudinal guide rail; 42. a mounting base; 43. a camera; 5. a wiring board; 51. an anode wire clamping end; 52. and a negative electrode wire clamping end.

Detailed Description

The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.

Examples: referring to fig. 1-5, a vibration testing device for an integrated circuit includes a testing main body 1, a testing cavity 11 disposed on the testing main body 1, a comparison unit 2 disposed on one side of the testing main body 1, a display 21 disposed on one side of the comparison unit 2, two pairs of control buttons 22 and a plurality of groups of testing components 3 disposed on the other side of the comparison unit 2, a transverse guide 4 disposed on the top of the cavity of the testing cavity 11, a longitudinal guide 41 vertically sliding on the top of the transverse guide 4, a mounting seat 42 sliding on the bottom of the longitudinal guide 41, a camera 43 mounted on the bottom of the mounting seat 42, wiring boards 5 disposed on two sides of the cavity of the testing cavity 11, wherein the testing main body 1 and the testing cavity 11 in this embodiment are existing structures of the vibration testing device, and the testing cavity 11 is used for positioning of the integrated circuit, and the testing cavity 11 performs vibration detection on the circuit to be tested.

Referring to fig. 1, a controller is disposed on the other side of the test body 1, a plurality of integrated circuit voltage scaling values are disposed in the controller, a plurality of groups of detection assemblies 3 are the same as the plurality of integrated circuit voltage scaling values in number, the vibration detection technology of the existing integrated circuit is applied, the integrated circuit voltage scaling values are the scaling voltages of the pins on the integrated circuit, and the qualified state of the pins of the integrated circuit can be obtained by comparing the detected voltage of the pins of the integrated circuit after vibration with the voltage scaling values.

Referring to fig. 2, the transverse guide rail 4 and the longitudinal guide rail 41 are vertically distributed, the display 21 is connected with the camera 43 through a signal line, the camera 43 is used for transmitting the photographed picture to the display 21 through the signal line by applying the conventional picture transmission technology and display technology of the camera 43, and the display 21 displays the picture.

Referring to fig. 2 or 3, two pairs of control buttons 22 are distributed in a cross-shaped structure, a pair of control buttons 22 distributed transversely is connected with a transverse guide rail 4, a pair of control buttons 22 distributed longitudinally is connected with a longitudinal guide rail 41, and the two pairs of buttons are used for controlling the movement directions of the transverse guide rail 4 and the longitudinal guide rail 41 respectively by applying the conventional linear movement technology of the electric guide rail so as to adjust the position of an installation seat 42, and then adjust the shooting position of a camera 43.

Referring to fig. 4, the wiring board 5 is electrically connected with the detecting component 3, the detecting component 3 includes a power button 31, a voltmeter 32 and an indicator lamp 33, the power button 31, the voltmeter 32 and the indicator lamp 33 are sequentially arranged from left to right, the wiring board 5 is used for increasing a pin detecting structure in the vibration testing device, the wiring board 5 is connected with a detecting pin in the integrated circuit when in use, so that a detecting circuit is formed between the detecting component 3 and the wiring board 5, the power button 31 is used for turning on a power supply of a circuit of the detecting component 3, the voltmeter 32 is used for detecting a voltage in the circuit, and the indicator lamp 33 is used for displaying a power supply state on the circuit.

Referring to fig. 5, two positive electrode terminals 51 and two negative electrode terminals 52 are disposed in the wiring board 5, each positive electrode terminal 51 and each negative electrode terminal 52 are adjacently distributed, the wiring board 5 is used for adding a pin detection structure in the vibration test apparatus, the wiring board 5 is connected with a detection pin in the integrated circuit when in use, so that a detection circuit is formed between the detection assembly 3 and the wiring board 5, the power button 31 is used for turning on the power supply of the circuit of the detection assembly 3, the voltmeter 32 is used for detecting the voltage in the circuit, and the indicator lamp 33 is used for displaying the power supply state on the circuit.

The working principle of the utility model is as follows:

the vibration testing equipment applies the existing quality testing technology of the integrated circuit, firstly, the testing main body 1 is placed on the horizontal testing surface, then, the existing integrated circuit testing technology is applied, the integrated circuit is placed in the testing cavity 11, according to the testing pins of the integrated circuit to be tested, one adjacent positive electrode clamping end 51 and one adjacent negative electrode clamping end 52 are selectively used, the two clamping ends are respectively clamped with the positive electrode pins and the negative electrode pins of the testing pins, and the testing component 3 is connected with the integrated circuit through the positive electrode clamping end 51 and the negative electrode clamping end 52, so that the pin voltage can be tested; setting corresponding integrated circuit voltage standard cone values on a controller of the test main body 1 according to the qualified pin voltage values of the integrated circuit, and comparing the detected voltage values; then the test main body 1 shakes the integrated circuit, the shooting picture transmitted to the display 21 through the camera 43 is convenient for a inspector to grasp the loosening and dropping condition of each electronic component in the integrated circuit in real time, the transverse or longitudinal horizontal position of the mounting seat 42 is convenient to move through the transverse guide rail 4 and the longitudinal guide rail 41 by two pairs of control buttons 22 distributed in a cross shape, the horizontal movement in the transverse or longitudinal direction is carried out through the mounting seat 42, the shooting position of shooting is adjusted, and the omnibearing property of the shooting picture of the camera 43 is increased;

when the visual detection is error-free, the power button 31 in the detection assembly 3 is pressed, the voltmeter 32 detects and displays the voltage of the detection pin, the quality condition of the pin can be obtained through the numerical comparison of the voltage standard cone value and the detection voltage value of the integrated circuit, the vibration detection of the integrated circuit is completed, the detection steps of the integrated circuit are reduced, the detection efficiency of vibration testing equipment is improved, and the practicability is realized.

Finally, it should be noted that: the foregoing description is only illustrative of the preferred embodiments of the present utility model, and although the present utility model has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that modifications may be made to the embodiments described, or equivalents may be substituted for elements thereof, and any modifications, equivalents, improvements or changes may be made without departing from the spirit and principles of the present utility model.

Claims

1. Vibration test equipment for integrated circuits, comprising a test body (1), a detection cavity (11) arranged on the test body (1), and the vibration test equipment is characterized in that: one side of test main part (1) is provided with contrast unit (2), one side of contrast unit (2) is provided with display (21), the opposite side of contrast unit (2) is provided with two pairs of control button (22) and a plurality of group detection subassembly (3), the intracavity top of detecting chamber (11) is provided with transverse guide (4), the top perpendicular sliding connection of transverse guide (4) has longitudinal guide (41), the bottom sliding connection of longitudinal guide (41) has mount pad (42), camera (43) are installed to the bottom of mount pad (42), the intracavity both sides of detecting chamber (11) all are provided with wiring board (5).

2. The vibration testing apparatus for an integrated circuit according to claim 1, wherein: the other side of the test main body (1) is provided with a controller, a plurality of integrated circuit voltage standard cone values are arranged in the controller, and the number of the plurality of groups of detection assemblies (3) is the same as the number of the plurality of integrated circuit voltage standard cone values.

3. The vibration testing apparatus for an integrated circuit according to claim 1, wherein: the transverse guide rails (4) and the longitudinal guide rails (41) are vertically distributed, and the display (21) is connected with the camera (43) through a signal line.

4. The vibration testing apparatus for an integrated circuit according to claim 1, wherein: the two pairs of control buttons (22) are distributed in a cross structure, the pair of transversely distributed control buttons (22) are connected with the transverse guide rail (4), and the pair of longitudinally distributed control buttons (22) are connected with the longitudinal guide rail (41).

5. The vibration testing apparatus for an integrated circuit according to claim 1, wherein: the wiring board (5) is electrically connected with the detection assembly (3), the detection assembly (3) comprises a power button (31), a voltmeter (32) and an indicator lamp (33), and the power button (31), the voltmeter (32) and the indicator lamp (33) are sequentially arranged from left to right.

6. The vibration testing apparatus for an integrated circuit according to claim 1, wherein: two positive electrode clamping ends (51) and two negative electrode clamping ends (52) are arranged in the wiring board (5), and each positive electrode clamping end (51) and each negative electrode clamping end (52) are adjacently distributed.