JP2020094237A - Intermittent electroplating method - Google Patents
Intermittent electroplating method Download PDFInfo
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- JP2020094237A JP2020094237A JP2018232251A JP2018232251A JP2020094237A JP 2020094237 A JP2020094237 A JP 2020094237A JP 2018232251 A JP2018232251 A JP 2018232251A JP 2018232251 A JP2018232251 A JP 2018232251A JP 2020094237 A JP2020094237 A JP 2020094237A
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- electroplating method
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- 238000009713 electroplating Methods 0.000 title claims abstract description 75
- 238000000034 method Methods 0.000 title claims abstract description 63
- 238000007747 plating Methods 0.000 claims abstract description 106
- 238000011049 filling Methods 0.000 claims abstract description 29
- 229910021645 metal ion Inorganic materials 0.000 claims abstract description 26
- 229910052802 copper Inorganic materials 0.000 claims description 14
- 229910052751 metal Inorganic materials 0.000 claims description 7
- 239000002184 metal Substances 0.000 claims description 7
- 239000000654 additive Substances 0.000 claims description 5
- 238000007599 discharging Methods 0.000 claims description 5
- 229910052742 iron Inorganic materials 0.000 claims description 4
- 229910052759 nickel Inorganic materials 0.000 claims description 4
- 230000000996 additive effect Effects 0.000 claims description 3
- 229910052718 tin Inorganic materials 0.000 claims description 3
- 239000000243 solution Substances 0.000 description 59
- 238000012360 testing method Methods 0.000 description 18
- 239000010949 copper Substances 0.000 description 17
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 14
- XEEYBQQBJWHFJM-UHFFFAOYSA-N iron Substances [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 9
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 8
- 230000000052 comparative effect Effects 0.000 description 8
- 150000002736 metal compounds Chemical class 0.000 description 8
- 230000002378 acidificating effect Effects 0.000 description 7
- 239000011651 chromium Substances 0.000 description 7
- 239000002253 acid Substances 0.000 description 6
- 238000011156 evaluation Methods 0.000 description 5
- PXHVJJICTQNCMI-UHFFFAOYSA-N nickel Substances [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 5
- 239000010936 titanium Substances 0.000 description 5
- VEXZGXHMUGYJMC-UHFFFAOYSA-M Chloride anion Chemical compound [Cl-] VEXZGXHMUGYJMC-UHFFFAOYSA-M 0.000 description 4
- 239000005749 Copper compound Substances 0.000 description 4
- 150000001880 copper compounds Chemical class 0.000 description 4
- 150000007524 organic acids Chemical class 0.000 description 4
- 239000011347 resin Substances 0.000 description 4
- 229920005989 resin Polymers 0.000 description 4
- 238000003756 stirring Methods 0.000 description 4
- 239000000758 substrate Substances 0.000 description 4
- VZSRBBMJRBPUNF-UHFFFAOYSA-N 2-(2,3-dihydro-1H-inden-2-ylamino)-N-[3-oxo-3-(2,4,6,7-tetrahydrotriazolo[4,5-c]pyridin-5-yl)propyl]pyrimidine-5-carboxamide Chemical compound C1C(CC2=CC=CC=C12)NC1=NC=C(C=N1)C(=O)NCCC(N1CC2=C(CC1)NN=N2)=O VZSRBBMJRBPUNF-UHFFFAOYSA-N 0.000 description 3
- LSNNMFCWUKXFEE-UHFFFAOYSA-M Bisulfite Chemical compound OS([O-])=O LSNNMFCWUKXFEE-UHFFFAOYSA-M 0.000 description 3
- ZUEYPVKINKUKCB-UHFFFAOYSA-K azanium iron(3+) disulfate hydrate Chemical compound O.[NH4+].S(=O)(=O)([O-])[O-].[Fe+3].S(=O)(=O)([O-])[O-] ZUEYPVKINKUKCB-UHFFFAOYSA-K 0.000 description 3
- KRKNYBCHXYNGOX-UHFFFAOYSA-N citric acid Chemical compound OC(=O)CC(O)(C(O)=O)CC(O)=O KRKNYBCHXYNGOX-UHFFFAOYSA-N 0.000 description 3
- 239000011889 copper foil Substances 0.000 description 3
- 230000006866 deterioration Effects 0.000 description 3
- LIKBJVNGSGBSGK-UHFFFAOYSA-N iron(3+);oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Fe+3].[Fe+3] LIKBJVNGSGBSGK-UHFFFAOYSA-N 0.000 description 3
- AJVRSHNXSHMMCH-UHFFFAOYSA-K iron(III) citrate monohydrate Chemical compound O.[Fe+3].[O-]C(=O)CC(O)(CC([O-])=O)C([O-])=O AJVRSHNXSHMMCH-UHFFFAOYSA-K 0.000 description 3
- JEIPFZHSYJVQDO-UHFFFAOYSA-N iron(III) oxide Inorganic materials O=[Fe]O[Fe]=O JEIPFZHSYJVQDO-UHFFFAOYSA-N 0.000 description 3
- 150000007522 mineralic acids Chemical class 0.000 description 3
- 238000011160 research Methods 0.000 description 3
- PAJMKGZZBBTTOY-UHFFFAOYSA-N 2-[[2-hydroxy-1-(3-hydroxyoctyl)-2,3,3a,4,9,9a-hexahydro-1h-cyclopenta[g]naphthalen-5-yl]oxy]acetic acid Chemical compound C1=CC=C(OCC(O)=O)C2=C1CC1C(CCC(O)CCCCC)C(O)CC1C2 PAJMKGZZBBTTOY-UHFFFAOYSA-N 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 2
- JPVYNHNXODAKFH-UHFFFAOYSA-N Cu2+ Chemical compound [Cu+2] JPVYNHNXODAKFH-UHFFFAOYSA-N 0.000 description 2
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 2
- 229910021576 Iron(III) bromide Inorganic materials 0.000 description 2
- AFVFQIVMOAPDHO-UHFFFAOYSA-N Methanesulfonic acid Chemical compound CS(O)(=O)=O AFVFQIVMOAPDHO-UHFFFAOYSA-N 0.000 description 2
- NIPNSKYNPDTRPC-UHFFFAOYSA-N N-[2-oxo-2-(2,4,6,7-tetrahydrotriazolo[4,5-c]pyridin-5-yl)ethyl]-2-[[3-(trifluoromethoxy)phenyl]methylamino]pyrimidine-5-carboxamide Chemical compound O=C(CNC(=O)C=1C=NC(=NC=1)NCC1=CC(=CC=C1)OC(F)(F)F)N1CC2=C(CC1)NN=N2 NIPNSKYNPDTRPC-UHFFFAOYSA-N 0.000 description 2
- AFCARXCZXQIEQB-UHFFFAOYSA-N N-[3-oxo-3-(2,4,6,7-tetrahydrotriazolo[4,5-c]pyridin-5-yl)propyl]-2-[[3-(trifluoromethoxy)phenyl]methylamino]pyrimidine-5-carboxamide Chemical compound O=C(CCNC(=O)C=1C=NC(=NC=1)NCC1=CC(=CC=C1)OC(F)(F)F)N1CC2=C(CC1)NN=N2 AFCARXCZXQIEQB-UHFFFAOYSA-N 0.000 description 2
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 2
- ZLMJMSJWJFRBEC-UHFFFAOYSA-N Potassium Chemical compound [K] ZLMJMSJWJFRBEC-UHFFFAOYSA-N 0.000 description 2
- FAPWRFPIFSIZLT-UHFFFAOYSA-M Sodium chloride Chemical compound [Na+].[Cl-] FAPWRFPIFSIZLT-UHFFFAOYSA-M 0.000 description 2
- QAOWNCQODCNURD-UHFFFAOYSA-L Sulfate Chemical compound [O-]S([O-])(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-L 0.000 description 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 2
- 150000001335 aliphatic alkanes Chemical class 0.000 description 2
- PLKYGPRDCKGEJH-UHFFFAOYSA-N azane;2-hydroxypropane-1,2,3-tricarboxylic acid;iron Chemical compound N.[Fe].OC(=O)CC(O)(C(O)=O)CC(O)=O PLKYGPRDCKGEJH-UHFFFAOYSA-N 0.000 description 2
- UNTBPXHCXVWYOI-UHFFFAOYSA-O azanium;oxido(dioxo)vanadium Chemical compound [NH4+].[O-][V](=O)=O UNTBPXHCXVWYOI-UHFFFAOYSA-O 0.000 description 2
- 229910052799 carbon Inorganic materials 0.000 description 2
- 229910001431 copper ion Inorganic materials 0.000 description 2
- 229910000365 copper sulfate Inorganic materials 0.000 description 2
- ARUVKPQLZAKDPS-UHFFFAOYSA-L copper(II) sulfate Chemical compound [Cu+2].[O-][S+2]([O-])([O-])[O-] ARUVKPQLZAKDPS-UHFFFAOYSA-L 0.000 description 2
- 238000005238 degreasing Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- PEVJCYPAFCUXEZ-UHFFFAOYSA-J dicopper;phosphonato phosphate Chemical compound [Cu+2].[Cu+2].[O-]P([O-])(=O)OP([O-])([O-])=O PEVJCYPAFCUXEZ-UHFFFAOYSA-J 0.000 description 2
- VXWSFRMTBJZULV-UHFFFAOYSA-H iron(3+) sulfate hydrate Chemical compound O.[Fe+3].[Fe+3].[O-]S([O-])(=O)=O.[O-]S([O-])(=O)=O.[O-]S([O-])(=O)=O VXWSFRMTBJZULV-UHFFFAOYSA-H 0.000 description 2
- NJWYTAHMQKIIQQ-UHFFFAOYSA-N iron(3+);hydrate Chemical compound O.[Fe+3] NJWYTAHMQKIIQQ-UHFFFAOYSA-N 0.000 description 2
- SZQUEWJRBJDHSM-UHFFFAOYSA-N iron(3+);trinitrate;nonahydrate Chemical compound O.O.O.O.O.O.O.O.O.[Fe+3].[O-][N+]([O-])=O.[O-][N+]([O-])=O.[O-][N+]([O-])=O SZQUEWJRBJDHSM-UHFFFAOYSA-N 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 235000005985 organic acids Nutrition 0.000 description 2
- 239000011574 phosphorus Substances 0.000 description 2
- 229910052698 phosphorus Inorganic materials 0.000 description 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
- 229910052700 potassium Inorganic materials 0.000 description 2
- 239000011591 potassium Substances 0.000 description 2
- KMUONIBRACKNSN-UHFFFAOYSA-N potassium dichromate Chemical compound [K+].[K+].[O-][Cr](=O)(=O)O[Cr]([O-])(=O)=O KMUONIBRACKNSN-UHFFFAOYSA-N 0.000 description 2
- CMZUMMUJMWNLFH-UHFFFAOYSA-N sodium metavanadate Chemical compound [Na+].[O-][V](=O)=O CMZUMMUJMWNLFH-UHFFFAOYSA-N 0.000 description 2
- BDHFUVZGWQCTTF-UHFFFAOYSA-M sulfonate Chemical compound [O-]S(=O)=O BDHFUVZGWQCTTF-UHFFFAOYSA-M 0.000 description 2
- 239000011135 tin Substances 0.000 description 2
- 229910052719 titanium Inorganic materials 0.000 description 2
- FEONEKOZSGPOFN-UHFFFAOYSA-K tribromoiron Chemical compound Br[Fe](Br)Br FEONEKOZSGPOFN-UHFFFAOYSA-K 0.000 description 2
- JHWIEAWILPSRMU-UHFFFAOYSA-N 2-methyl-3-pyrimidin-4-ylpropanoic acid Chemical compound OC(=O)C(C)CC1=CC=NC=N1 JHWIEAWILPSRMU-UHFFFAOYSA-N 0.000 description 1
- JYLNVJYYQQXNEK-UHFFFAOYSA-N 3-amino-2-(4-chlorophenyl)-1-propanesulfonic acid Chemical compound OS(=O)(=O)CC(CN)C1=CC=C(Cl)C=C1 JYLNVJYYQQXNEK-UHFFFAOYSA-N 0.000 description 1
- QPLDLSVMHZLSFG-UHFFFAOYSA-N Copper oxide Chemical compound [Cu]=O QPLDLSVMHZLSFG-UHFFFAOYSA-N 0.000 description 1
- 239000005751 Copper oxide Substances 0.000 description 1
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 1
- MKYBYDHXWVHEJW-UHFFFAOYSA-N N-[1-oxo-1-(2,4,6,7-tetrahydrotriazolo[4,5-c]pyridin-5-yl)propan-2-yl]-2-[[3-(trifluoromethoxy)phenyl]methylamino]pyrimidine-5-carboxamide Chemical compound O=C(C(C)NC(=O)C=1C=NC(=NC=1)NCC1=CC(=CC=C1)OC(F)(F)F)N1CC2=C(CC1)NN=N2 MKYBYDHXWVHEJW-UHFFFAOYSA-N 0.000 description 1
- 229910021585 Nickel(II) bromide Inorganic materials 0.000 description 1
- 239000004642 Polyimide Substances 0.000 description 1
- 229910002855 Sn-Pd Inorganic materials 0.000 description 1
- 150000008064 anhydrides Chemical class 0.000 description 1
- 239000007864 aqueous solution Substances 0.000 description 1
- VZVHUBYZGAUXLX-UHFFFAOYSA-N azane;azanide;cobalt(3+) Chemical compound N.N.N.[NH2-].[NH2-].[NH2-].[Co+3] VZVHUBYZGAUXLX-UHFFFAOYSA-N 0.000 description 1
- VCNAMBGKEDPVGQ-UHFFFAOYSA-J azane;cerium(4+);hydrogen sulfate;dihydrate Chemical compound [NH4+].[NH4+].[NH4+].[NH4+].O.O.[Ce+4].[O-]S([O-])(=O)=O.[O-]S([O-])(=O)=O.[O-]S([O-])(=O)=O.[O-]S([O-])(=O)=O VCNAMBGKEDPVGQ-UHFFFAOYSA-J 0.000 description 1
- UMEAURNTRYCPNR-UHFFFAOYSA-N azane;iron(2+) Chemical compound N.[Fe+2] UMEAURNTRYCPNR-UHFFFAOYSA-N 0.000 description 1
- ODWXUNBKCRECNW-UHFFFAOYSA-M bromocopper(1+) Chemical compound Br[Cu+] ODWXUNBKCRECNW-UHFFFAOYSA-M 0.000 description 1
- 239000003054 catalyst Substances 0.000 description 1
- XMPZTFVPEKAKFH-UHFFFAOYSA-P ceric ammonium nitrate Chemical compound [NH4+].[NH4+].[Ce+4].[O-][N+]([O-])=O.[O-][N+]([O-])=O.[O-][N+]([O-])=O.[O-][N+]([O-])=O.[O-][N+]([O-])=O.[O-][N+]([O-])=O XMPZTFVPEKAKFH-UHFFFAOYSA-P 0.000 description 1
- KNANFSXYDCURQS-UHFFFAOYSA-J cerium(4+);disulfate;hydrate Chemical compound O.[Ce+4].[O-]S([O-])(=O)=O.[O-]S([O-])(=O)=O KNANFSXYDCURQS-UHFFFAOYSA-J 0.000 description 1
- WYYQVWLEPYFFLP-UHFFFAOYSA-K chromium(3+);triacetate Chemical compound [Cr+3].CC([O-])=O.CC([O-])=O.CC([O-])=O WYYQVWLEPYFFLP-UHFFFAOYSA-K 0.000 description 1
- KVIYQADEXNCDCB-UHFFFAOYSA-H chromium(3+);trisulfate;hydrate Chemical compound O.[Cr+3].[Cr+3].[O-]S([O-])(=O)=O.[O-]S([O-])(=O)=O.[O-]S([O-])(=O)=O KVIYQADEXNCDCB-UHFFFAOYSA-H 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 229920001940 conductive polymer Polymers 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 229940116318 copper carbonate Drugs 0.000 description 1
- 229910000431 copper oxide Inorganic materials 0.000 description 1
- ORTQZVOHEJQUHG-UHFFFAOYSA-L copper(II) chloride Chemical compound Cl[Cu]Cl ORTQZVOHEJQUHG-UHFFFAOYSA-L 0.000 description 1
- DOBRDRYODQBAMW-UHFFFAOYSA-N copper(i) cyanide Chemical compound [Cu+].N#[C-] DOBRDRYODQBAMW-UHFFFAOYSA-N 0.000 description 1
- GEZOTWYUIKXWOA-UHFFFAOYSA-L copper;carbonate Chemical compound [Cu+2].[O-]C([O-])=O GEZOTWYUIKXWOA-UHFFFAOYSA-L 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- HTXDPTMKBJXEOW-UHFFFAOYSA-N dioxoiridium Chemical compound O=[Ir]=O HTXDPTMKBJXEOW-UHFFFAOYSA-N 0.000 description 1
- XPPKVPWEQAFLFU-UHFFFAOYSA-N diphosphoric acid Chemical compound OP(O)(=O)OP(O)(O)=O XPPKVPWEQAFLFU-UHFFFAOYSA-N 0.000 description 1
- AAQNGTNRWPXMPB-UHFFFAOYSA-N dipotassium;dioxido(dioxo)tungsten Chemical compound [K+].[K+].[O-][W]([O-])(=O)=O AAQNGTNRWPXMPB-UHFFFAOYSA-N 0.000 description 1
- SFXJSNATBHJIDS-UHFFFAOYSA-N disodium;dioxido(oxo)tin;trihydrate Chemical compound O.O.O.[Na+].[Na+].[O-][Sn]([O-])=O SFXJSNATBHJIDS-UHFFFAOYSA-N 0.000 description 1
- 238000007772 electroless plating Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000014509 gene expression Effects 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 229910000457 iridium oxide Inorganic materials 0.000 description 1
- MVFCKEFYUDZOCX-UHFFFAOYSA-N iron(2+);dinitrate Chemical compound [Fe+2].[O-][N+]([O-])=O.[O-][N+]([O-])=O MVFCKEFYUDZOCX-UHFFFAOYSA-N 0.000 description 1
- RUTXIHLAWFEWGM-UHFFFAOYSA-H iron(3+) sulfate Chemical compound [Fe+3].[Fe+3].[O-]S([O-])(=O)=O.[O-]S([O-])(=O)=O.[O-]S([O-])(=O)=O RUTXIHLAWFEWGM-UHFFFAOYSA-H 0.000 description 1
- 229910000360 iron(III) sulfate Inorganic materials 0.000 description 1
- GYCHYNMREWYSKH-UHFFFAOYSA-L iron(ii) bromide Chemical compound [Fe+2].[Br-].[Br-] GYCHYNMREWYSKH-UHFFFAOYSA-L 0.000 description 1
- NMHMDUCCVHOJQI-UHFFFAOYSA-N lithium molybdate Chemical compound [Li+].[Li+].[O-][Mo]([O-])(=O)=O NMHMDUCCVHOJQI-UHFFFAOYSA-N 0.000 description 1
- 238000010907 mechanical stirring Methods 0.000 description 1
- 238000001465 metallisation Methods 0.000 description 1
- 229940098779 methanesulfonic acid Drugs 0.000 description 1
- MEFBJEMVZONFCJ-UHFFFAOYSA-N molybdate Chemical compound [O-][Mo]([O-])(=O)=O MEFBJEMVZONFCJ-UHFFFAOYSA-N 0.000 description 1
- IPLJNQFXJUCRNH-UHFFFAOYSA-L nickel(2+);dibromide Chemical compound [Ni+2].[Br-].[Br-] IPLJNQFXJUCRNH-UHFFFAOYSA-L 0.000 description 1
- KERTUBUCQCSNJU-UHFFFAOYSA-L nickel(2+);disulfamate Chemical compound [Ni+2].NS([O-])(=O)=O.NS([O-])(=O)=O KERTUBUCQCSNJU-UHFFFAOYSA-L 0.000 description 1
- 150000004690 nonahydrates Chemical class 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 238000005554 pickling Methods 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- OTYBMLCTZGSZBG-UHFFFAOYSA-L potassium sulfate Chemical compound [K+].[K+].[O-]S([O-])(=O)=O OTYBMLCTZGSZBG-UHFFFAOYSA-L 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000002203 pretreatment Methods 0.000 description 1
- 229940005657 pyrophosphoric acid Drugs 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 238000002791 soaking Methods 0.000 description 1
- 229910052708 sodium Inorganic materials 0.000 description 1
- 239000011734 sodium Substances 0.000 description 1
- 239000011780 sodium chloride Substances 0.000 description 1
- 235000015393 sodium molybdate Nutrition 0.000 description 1
- 239000011684 sodium molybdate Substances 0.000 description 1
- TVXXNOYZHKPKGW-UHFFFAOYSA-N sodium molybdate (anhydrous) Chemical compound [Na+].[Na+].[O-][Mo]([O-])(=O)=O TVXXNOYZHKPKGW-UHFFFAOYSA-N 0.000 description 1
- WZWGGYFEOBVNLA-UHFFFAOYSA-N sodium;dihydrate Chemical compound O.O.[Na] WZWGGYFEOBVNLA-UHFFFAOYSA-N 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- FZUJWWOKDIGOKH-UHFFFAOYSA-N sulfuric acid hydrochloride Chemical compound Cl.OS(O)(=O)=O FZUJWWOKDIGOKH-UHFFFAOYSA-N 0.000 description 1
- 150000004685 tetrahydrates Chemical class 0.000 description 1
- 229910000349 titanium oxysulfate Inorganic materials 0.000 description 1
- YFGRPIXHCIXTLM-UHFFFAOYSA-N tungsten(4+) Chemical compound [W+4] YFGRPIXHCIXTLM-UHFFFAOYSA-N 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Electroplating Methods And Accessories (AREA)
Abstract
Description
本発明は、断続的電気めっき方法等に関する。 The present invention relates to an intermittent electroplating method and the like.
近年、電子機器の高機能化、高速化に伴い、プリント配線板においても高密度化が要求されている。プリント配線板の高密度化にはビルドアッププロセスが不可欠であり、中でもビアフィリングは重要なめっき技術である。この様なビルドアッププロセスにおいて、従来は、非貫通のビアに均一なめっきを施し、その後絶縁樹脂や導電性ペーストを充填し、回路を形成していたが、この工法ではビアの上にビアを形成することができず、回路設計の自由度を奪うことになる。このため、近年では、ビアホール内をめっきで充填するビアフィリングを行って、配線層を積み重ねる工法が採用されている。 2. Description of the Related Art In recent years, as electronic devices have become more functional and faster, there has been a demand for higher density in printed wiring boards. A build-up process is indispensable for increasing the density of printed wiring boards, and via filling is an important plating technology. In such a build-up process, conventionally, non-penetrating vias were uniformly plated and then filled with insulating resin or conductive paste to form a circuit. It cannot be formed, and the degree of freedom in circuit design is lost. Therefore, in recent years, a method of stacking wiring layers by performing via filling to fill the via holes with plating has been adopted.
一方、電気めっきプロセスの効率化の観点、特に長尺状の被めっき物を効率的に電気めっきするという観点から、断続的電気めっき法が採用される場合がある。この断続的めっき法は、例えば図1に示すような、リールトゥリールのライン上で、複数のめっき槽を使用して行われる。 On the other hand, the intermittent electroplating method may be adopted from the viewpoint of improving the efficiency of the electroplating process, particularly from the viewpoint of efficiently electroplating a long object to be plated. This intermittent plating method is performed using a plurality of plating tanks on a reel-to-reel line as shown in FIG. 1, for example.
本発明者は、研究を進める中で、ビアホール等の微小孔を有する被めっき物に対して断続的電気めっきを行う場合、該微小孔における金属の析出の程度(フィリング性)が顕著に低いことを見出した。 In the course of research, the present inventor shows that when intermittent electroplating is performed on an object to be plated having micropores such as via holes, the degree of metal deposition (filling property) in the micropores is significantly low. Found.
そこで、本発明は、断続的電気めっきにおける微小孔のフィリング性を向上させる技術を提供することを課題とする。 Therefore, an object of the present invention is to provide a technique for improving the filling property of micropores in intermittent electroplating.
本発明者は、さらに研究を進める中で、断続的電気めっきにおけるフィリング性の低下は、断続的めっき法特有の現象、すなわちめっき槽から排出された被めっき物及びめっき槽に供給される被めっき物にわずかに付着しためっき液(図1に示される実施形態の場合であれば、めっき槽の側面からわずかに漏れるめっき液)による低電流密度の発生という問題に起因することを見出した。そして、本発明者は、一層研究を進める中で、多価金属イオンを含有するめっき液を使用することにより、上記課題が解決できることを見出した。本発明者はこれらの知見に基づいてさらに研究を進めた結果、本発明を完成させた。 While the present inventor is proceeding with further research, the deterioration of the filling property in the intermittent electroplating is a phenomenon peculiar to the intermittent plating method, that is, the plated object discharged from the plating tank and the plated object supplied to the plating tank. It has been found that the problem is caused by the problem of low current density due to the plating solution slightly adhering to the object (in the case of the embodiment shown in FIG. 1, the plating solution slightly leaking from the side surface of the plating tank). Then, the present inventor has found that the above problems can be solved by using a plating solution containing a polyvalent metal ion while further researching. The present inventor has completed the present invention as a result of further research based on these findings.
即ち、本発明は、下記の態様を包含する。 That is, the present invention includes the following aspects.
項1. 多価金属イオンを含有するめっき液を使用することを含む、微小孔を有する被めっき物に対する断続的電気めっき方法。 Item 1. An intermittent electroplating method for an object to be plated having micropores, which comprises using a plating solution containing a polyvalent metal ion.
項2. 前記多価金属イオンの価数が3以上である、項1に記載の断続的電気めっき方法。 Item 2. Item 2. The intermittent electroplating method according to Item 1, wherein the valence of the polyvalent metal ion is 3 or more.
項3. 前記多価金属イオンが、Fe3+、V5+、Mn7+、Mo6+、W6+、Ce4+、Cr3+、Cr6+、Ti4+、Sn4+、及びCo3+からなる群より選択される少なくとも1種である、項1又は2に記載の断続的電気めっき方法。 Item 3. The polyvalent metal ion is at least one selected from the group consisting of Fe 3+ , V 5+ , Mn 7+ , Mo 6+ , W 6+ , Ce 4+ , Cr 3+ , Cr 6+ , Ti 4+ , Sn 4+ , and Co 3+. The intermittent electroplating method according to Item 1 or 2, wherein
項4. 前記多価金属イオンが、Fe3+及びV5+からなる群より選択される少なくとも1種である、項1〜3のいずれかに記載の断続的電気めっき方法。 Item 4. Item 4. The intermittent electroplating method according to any one of Items 1 to 3, wherein the polyvalent metal ion is at least one selected from the group consisting of Fe 3+ and V 5+ .
項5. 長尺状の被めっき物がライン上で連続的にめっき槽に供給され、且つめっき槽からの被めっき物の排出とめっき槽への被めっき物の供給とが複数回繰り返される、項1〜4のいずれかに記載の断続的電気めっき方法。 Item 5. Item 1, wherein a long object to be plated is continuously supplied to the plating tank on the line, and discharge of the object to be plated from the plating tank and supply of the object to be plated to the plating tank are repeated a plurality of times. 4. The intermittent electroplating method according to any one of 4 above.
項6. 前記被めっき物が複数のめっき槽を通過する、項5に記載の断続的電気めっき方法。 Item 6. Item 6. The intermittent electroplating method according to Item 5, wherein the object to be plated passes through a plurality of plating baths.
項7. 前記排出及び前記供給がめっき槽の側面で行われる、項5又は6に記載の断続的電気めっき方法。 Item 7. Item 7. The intermittent electroplating method according to Item 5 or 6, wherein the discharging and the supplying are performed on a side surface of a plating tank.
項8. リールトゥリールのライン上で行う、項5〜7のいずれかに記載の断続的電気めっき方法。 Item 8. Item 8. The intermittent electroplating method according to any one of Items 5 to 7, which is performed on a reel-to-reel line.
項9. 前記微小孔がマイクロビアである、項1〜8のいずれかに記載の断続的電気めっき方法。 Item 9. Item 9. The intermittent electroplating method according to any one of Items 1 to 8, wherein the micropores are microvias.
項10. 被めっき物上に析出させる金属がCu、Ni、及びSnからなる群より選択される少なくとも1種を含む、項1〜9のいずれかに記載の断続的電気めっき方法。 Item 10. Item 10. The intermittent electroplating method according to any one of Items 1 to 9, wherein the metal to be deposited on the object to be plated contains at least one selected from the group consisting of Cu, Ni, and Sn.
項11. 前記めっき液がさらにビアフィリング用添加剤を含有する、項1〜10のいずれかに記載の断続的電気めっき方法。 Item 11. Item 11. The intermittent electroplating method according to any one of Items 1 to 10, wherein the plating solution further contains a via-filling additive.
項12. 多価金属イオンを含有する、項1〜11のいずれかに記載の断続的電気めっき方法に用いるためのめっき液。 Item 12. A plating solution containing a polyvalent metal ion for use in the intermittent electroplating method according to any one of Items 1 to 11.
本発明によれば、断続的電気めっきにおける微小孔のフィリング性を向上させる技術、具体的には、断続的電気めっき方法、微小孔の充填方法、めっき液等を提供することができる。 According to the present invention, it is possible to provide a technique for improving the filling property of micropores in intermittent electroplating, specifically, an intermittent electroplating method, a micropore filling method, a plating solution and the like.
本明細書中において、「含有」及び「含む」なる表現については、「含有」、「含む」、「実質的にからなる」及び「のみからなる」という概念を含む。 In this specification, the expressions "containing" and "including" include the concepts of "containing", "including", "consisting essentially of" and "consisting solely of".
本発明は、その一態様において、多価金属イオンを含有するめっき液を使用することを含む、微小孔を有する被めっき物に対する断続的電気めっき方法(本明細書において、「本発明の断続的電気めっき方法」と示すこともある。)に係る。 In one aspect thereof, the present invention provides an intermittent electroplating method for a plated object having micropores, which comprises using a plating solution containing a polyvalent metal ion (in the present specification, "intermittent of the present invention. "Electroplating method").
また、本発明は、その一態様において、多価金属イオンを含有する、本発明の断続的電気めっき方法に用いるためのめっき液に係る。 The present invention also relates, in one aspect thereof, to a plating solution containing a polyvalent metal ion for use in the intermittent electroplating method of the present invention.
さらに、本発明は、多価金属イオンを含有するめっき液を使用することを含む、微小孔を有する被めっき物に対する断続的電気めっきによる微小孔充填(ビアフィリング)方法に係る。 Furthermore, the present invention relates to a method for filling micropores (via filling) by intermittent electroplating on an object to be plated having micropores, which comprises using a plating solution containing polyvalent metal ions.
以下、これらについて説明する。 These will be described below.
多価金属イオンは、価数が2以上の金属イオンである限り、特に制限されない。 The polyvalent metal ion is not particularly limited as long as it has a valence of 2 or more.
多価金属イオンの価数は、3以上であることが好ましい。価数が3以上の多価金属イオンを使用することにより、微小孔のフィリング性を大幅に向上させることができる。多価金属イオンの価数の上限は、特に制限されず、例えば7、6、5、4である。 The valence of the polyvalent metal ion is preferably 3 or more. By using a polyvalent metal ion having a valence of 3 or more, the filling property of the micropores can be significantly improved. The upper limit of the valence of the polyvalent metal ion is not particularly limited and is, for example, 7, 6, 5, 4.
多価金属イオンの具体例としては、Fe3+、V5+、Mn7+、Mo6+、W6+、Ce4+、Cr3+、Cr6+、Ti4+、Sn4+、Co3+等が挙げられる。これらの中でも、微小孔のフィリング性の観点から、好ましくはFe3+、V5+、Mn7+、Mo6+、W6+、Ce4+、Cr3+等が挙げられる。中でも、微小孔のフィリング性の観点からFe3+及びV5+がとりわけ好ましく、Fe3+が特に好ましい。 Specific examples of polyvalent metal ions include Fe 3+ , V 5+ , Mn 7+ , Mo 6+ , W 6+ , Ce 4+ , Cr 3+ , Cr 6+ , Ti 4+ , Sn 4+ , Co 3+ . Of these, Fe 3+ , V 5+ , Mn 7+ , Mo 6+ , W 6+ , Ce 4+ , Cr 3+ and the like are preferable from the viewpoint of the filling property of the micropores. Among them, Fe 3+ and V 5+ are particularly preferable, and Fe 3+ is particularly preferable, from the viewpoint of the filling property of the micropores.
多価金属イオンは、1種単独であってもよいし、2種以上の組合せであってもよい。 The polyvalent metal ions may be used alone or in combination of two or more.
多価金属イオンを含有するめっき液は、めっき液を調製する際に金属化合物を添加することにより得ることができる。使用される金属化合物としては、例えば、Fe3+含有するめっき液を得る場合であれば例えば硫酸鉄(III)水和物・無水物、硝酸鉄(III)九水和物、臭化鉄(III)無水、クエン酸鉄アンモニウム、クエン酸鉄(III) 水和物、酸化鉄(III)、硫酸アンモニウム鉄(III) 水和物等が挙げられ; V5+含有するめっき液を得る場合であれば例えばメタバナジン酸ナトリウム、メタバナジン酸カリウム、メタバナジン酸アンモニウム等が挙げられ; Mn7+含有するめっき液を得る場合であれば例えば過マンガン酸カリウム、過マンガン酸ナトリウム等が挙げられ; Mo6+含有するめっき液を得る場合であれば例えばモリブデン酸ナトリウム、モリブデン酸カリウム、モリブデン酸リチウム、七モリブデン酸六アンモニウム四水和物等が挙げられ; W6+含有するめっき液を得る場合であれば例えばタングステン(IV)酸ナトリウム二水和物、メタタングステン酸ナトリウム、タングステン酸カリウム等が挙げられ; Ce4+含有するめっき液を得る場合であれば例えば硝酸セリウム(IV)アンモニウム、硫酸セリウム(IV)水和物・無水物、硫酸四アンモニウムセリウム(IV)二水和物等が挙げられ; Cr3+含有するめっき液を得る場合であれば例えば硫酸クロム水和物・無水物、酢酸クロム、硫酸クロムカリウム等が挙げられ; Cr6+含有するめっき液を得る場合であれば例えば重クロム酸ナトリウム、重クロム酸カリウム等が挙げられ; Ti4+含有するめっき液を得る場合であれば例えば硫酸チタニル等が挙げられ; Sn4+含有するめっき液を得る場合であれば例えば錫酸ナトリウム三水和物等が挙げられ; Co3+含有するめっき液を得る場合であれば例えばヘキサアンミンコバルト(III)塩化物等が挙げられる。 The plating solution containing polyvalent metal ions can be obtained by adding a metal compound when the plating solution is prepared. As a metal compound used, for example, when a plating solution containing Fe 3+ is to be obtained, for example, iron (III) sulfate hydrate/anhydrous, iron nitrate (III) nonahydrate, iron bromide (III) ) Anhydrous, ammonium iron citrate, iron(III) citrate hydrate, iron(III) oxide, iron(III) ammonium sulfate hydrate, etc. may be mentioned; if a plating solution containing V 5+ is obtained, for example: sodium metavanadate, potassium metavanadate, cited and ammonium metavanadate; Mn potassium Invite example permanganic acid in the case of obtaining a plating solution 7+ containing, sodium permanganate and the like can be mentioned are: a plating solution Mo 6+ containing If it is obtained, for example, sodium molybdate, potassium molybdate, lithium molybdate, hexaammonium heptamolybdate tetrahydrate, etc. may be mentioned; if a plating solution containing W 6+ is to be obtained, for example, tungsten (IV) acid Sodium dihydrate, sodium metatungstate, potassium tungstate, etc. may be mentioned; if a plating solution containing Ce 4+ is to be obtained, for example, cerium (IV) ammonium nitrate, cerium (IV) sulfate hydrate/anhydrate , Tetraammonium cerium (IV) sulfate dihydrate and the like; when a plating solution containing Cr 3+ is obtained, for example, chromium sulfate hydrate/anhydride, chromium acetate, potassium sulfate potassium, etc. may be mentioned; When a plating solution containing Cr 6+ is obtained, for example, sodium dichromate, potassium dichromate and the like are included; when a plating solution containing Ti 4+ is obtained, for example, titanyl sulfate is included; Sn 4+ is included In the case of obtaining a plating solution to be used, for example, sodium stannate trihydrate and the like can be mentioned; in the case of obtaining a plating solution containing Co 3+, for example, hexaamminecobalt (III) chloride and the like can be mentioned.
これらの金属化合物の中でも、微小孔のフィリング性の観点からとりわけ好ましくは、硫酸鉄(III)水和物・無水物、硝酸鉄(III)九水和物、臭化鉄(III)無水、クエン酸鉄アンモニウム、クエン酸鉄(III) 水和物、酸化鉄(III)、硫酸アンモニウム鉄(III) 水和物、メタバナジン酸ナトリウム、メタバナジン酸カリウム、メタバナジン酸アンモニウム等が挙げられ、さらにとりわけ好ましくは硫酸鉄(III)水和物・無水物、硝酸鉄(III)九水和物、臭化鉄(III)無水、クエン酸鉄アンモニウム、クエン酸鉄(III) 水和物、酸化鉄(III)、硫酸アンモニウム鉄(III) 水和物等が挙げられ、特に好ましくは硫酸鉄(III)水和物・無水物が挙げられる。 Among these metal compounds, iron(III) hydrate/anhydrous, iron(III) nitrate nonahydrate, iron(III) bromide anhydrous, and citric acid are particularly preferable from the viewpoint of micropore filling properties. Examples thereof include ammonium iron acidate, iron(III) citrate hydrate, iron(III) oxide, iron(III) ammonium sulfate hydrate, sodium metavanadate, potassium metavanadate, ammonium metavanadate, and the like, and particularly preferably sulfuric acid. Iron(III) hydrate/anhydrate, Iron(III) nitrate nonahydrate, Iron(III) bromide anhydrous, Ammonium iron citrate, Iron(III) citrate hydrate, Iron(III) oxide, Ammonium iron(III) sulfate hydrate and the like are mentioned, and particularly preferable is iron(III) sulfate hydrate/anhydrate.
めっき液に含まれる多価金属イオンは、金属化合物(上記金属化合物、或いはそれ以外の金属化合物)を添加後にめっき液中で価数が変化したものであってもよい。 The polyvalent metal ion contained in the plating solution may be one whose valence has changed in the plating solution after the addition of the metal compound (the above metal compound or another metal compound).
金属化合物は、1種単独であってもよいし、2種以上の組合せであってもよい。 The metal compounds may be used alone or in combination of two or more.
めっき液中の多価金属イオンの濃度は、特に制限されないが、例えば0.01〜20g/Lである。該濃度は、微小孔のフィリング性の観点から、好ましくは0.05〜10g/L、より好ましくは0.1〜5g/L、さらに好ましくは0.2〜3g/L、よりさらに好ましくは0.5〜3g/Lである。該濃度は、微小孔のフィリング性を大きく向上させることができるという観点から、特に好ましくは0.7〜2.5g/L(さらに好ましくは0.9〜2.2g/Lである。 The concentration of the polyvalent metal ion in the plating solution is not particularly limited, but is, for example, 0.01 to 20 g/L. The concentration is preferably 0.05 to 10 g/L, more preferably 0.1 to 5 g/L, still more preferably 0.2 to 3 g/L, and even more preferably 0 from the viewpoint of the filling property of the micropores. It is 0.5 to 3 g/L. The concentration is particularly preferably 0.7 to 2.5 g/L (more preferably 0.9 to 2.2 g/L) from the viewpoint that the filling property of the micropores can be greatly improved.
本発明の断続的めっき方法において、被めっき物上に析出させる金属は特に制限されない。該金属としては、例えばCu、Ni、Sn等が挙げられる。これらの中でも、Cuが特に好ましい。被めっき物上に析出させる金属は、1種単独であってもよいし、2種以上の組合せであってもよい。 In the intermittent plating method of the present invention, the metal deposited on the object to be plated is not particularly limited. Examples of the metal include Cu, Ni, Sn and the like. Among these, Cu is particularly preferable. The metal to be deposited on the object to be plated may be a single type or a combination of two or more types.
析出させる金属に合わせて、めっき液には、析出させる金属のイオン、必要に応じて配合される成分等の他の成分が含まれる。他の成分は、公知の電気めっき液(例えばCuめっき液(例えば硫酸銅浴、ほうふっ化銅浴、シアン化銅浴、ピロリン酸銅浴等)、Niめっき液(例えば複塩浴、普通浴、回転浴、高硫酸塩浴、ワット浴、全塩化物浴、硫酸塩−塩化物浴、全硫酸塩浴、高質浴、ストライクニッケル浴、スルファミン酸ニッケル浴、ほうふっ化ニッケル浴等)、Snめっき液(例えばアルカリ性浴、硫酸浴、スルフォン酸浴、ピロリン酸浴、ほうふっ化浴等)等)の組成に従って又は準じて、適宜設定することができる。 In accordance with the metal to be deposited, the plating solution contains ions of the metal to be deposited and other components such as components to be blended if necessary. Other components are known electroplating solutions (eg, Cu plating solution (eg, copper sulfate bath, copper bromide bath, copper cyanide bath, copper pyrophosphate bath, etc.), Ni plating solution (eg, double salt bath, ordinary bath). , Rotating bath, high sulfate bath, Watt bath, total chloride bath, sulfate-chloride bath, total sulfate bath, high quality bath, strike nickel bath, nickel sulfamate bath, nickel bromide bath, etc.), It can be appropriately set according to or in accordance with the composition of the Sn plating solution (for example, an alkaline bath, a sulfuric acid bath, a sulfonic acid bath, a pyrophosphoric acid bath, a fluorinated bath, etc.).
代表的に、Cuめっき液について以下に説明する。Cuめっき液としては、他の成分として、銅イオン、並びに有機酸及び無機酸から選ばれた少なくとも一種の酸成分を必須成分として含有する酸性銅めっき液を用いることができる。 Typically, the Cu plating solution will be described below. As the Cu plating solution, an acidic copper plating solution containing, as other components, copper ions and at least one acid component selected from organic acids and inorganic acids as essential components can be used.
酸性銅めっき液における銅イオン源としては、めっき液中に可溶性の銅化合物であれば、特に限定なく使用できる。この様な銅化合物の具体例としては、硫酸銅、酸化銅、塩化銅、炭酸銅、ピロリン酸銅、アルカンスルホン酸銅、アルカノールスルホン酸銅、有機酸銅等を挙げることができる。銅化合物は、一種単独又は二種以上混合して用いることができる。酸性銅めっき液における銅化合物濃度については、特に限定はないが、例えば、20〜280g/L程度の範囲とすることができる。該濃度は、好ましくは100〜250g/L、より好ましくは150〜230g/Lである。 As the copper ion source in the acidic copper plating solution, any copper compound soluble in the plating solution can be used without particular limitation. Specific examples of such a copper compound include copper sulfate, copper oxide, copper chloride, copper carbonate, copper pyrophosphate, copper alkane sulfonate, copper alkanol sulfonate, and organic acid copper. The copper compounds may be used alone or in combination of two or more. The copper compound concentration in the acidic copper plating solution is not particularly limited, but may be in the range of about 20 to 280 g/L, for example. The concentration is preferably 100 to 250 g/L, more preferably 150 to 230 g/L.
酸性銅めっき液における酸成分としては、有機酸及び無機酸からなる群から選ばれた少なくとも一種を用いることができる。有機酸の具体例としては、メタンスルホン酸等のアルカンスルホン酸、アルカノールスルホン酸等を挙げることができ、無機酸の具体例としては硫酸等を挙げることができる。これらの酸成分は、一種単独又は二種以上混合して用いることができる。酸性銅めっき液における酸成分の濃度については、特に限定はないが、例えば、10〜400g/L程度とすることができる。該濃度は、好ましくは40〜200g/L、より好ましくは70〜150g/Lである。 As the acid component in the acidic copper plating solution, at least one selected from the group consisting of organic acids and inorganic acids can be used. Specific examples of the organic acid include alkane sulfonic acid such as methane sulfonic acid, alkanol sulfonic acid and the like, and specific examples of the inorganic acid include sulfuric acid and the like. These acid components can be used alone or in combination of two or more. The concentration of the acid component in the acidic copper plating solution is not particularly limited, but may be, for example, about 10 to 400 g/L. The concentration is preferably 40 to 200 g/L, more preferably 70 to 150 g/L.
酸性銅めっき液は、好ましくは塩化物イオンを含有する。その濃度は、通常、10〜200mg/L程度であればよい。該濃度は、好ましくは25〜100mg/L、より好ましくは40〜70mg/Lである。この様な濃度範囲とするためには、必要に応じて、塩酸、塩化ナトリウム等を用いてめっき液中の塩化物イオン濃度を調整すればよい。 The acidic copper plating solution preferably contains chloride ions. The concentration is usually about 10 to 200 mg/L. The concentration is preferably 25 to 100 mg/L, more preferably 40 to 70 mg/L. In order to obtain such a concentration range, the chloride ion concentration in the plating solution may be adjusted using hydrochloric acid, sodium chloride or the like, if necessary.
酸性銅めっき液には、各種添加剤が含まれていてもよい。添加剤の中でも、ビアフィリング用添加剤が好ましい。 The acidic copper plating solution may contain various additives. Among the additives, the via filling additive is preferable.
被めっき物は、微小孔を有する被めっき物であって、電気めっき可能なものである限り特に限定されない。被めっき物としては、例えばビアホールを有する基板が挙げられる。 The object to be plated is not particularly limited as long as it is an object to be plated having micropores and can be electroplated. Examples of the object to be plated include a substrate having a via hole.
微小孔はマイクロビアであることが好ましい。微小孔のサイズは、例えば直径300〜5μm(好ましくは150〜30μm)、深さ150〜5μm(好ましくは100〜20μm)である。本発明の断続的電気めっき方法によれば、マイクロビアに対しても、良好なフィリング性を発揮することができる。 The micropores are preferably microvias. The size of the micropores is, for example, a diameter of 300 to 5 μm (preferably 150 to 30 μm) and a depth of 150 to 5 μm (preferably 100 to 20 μm). According to the intermittent electroplating method of the present invention, good filling properties can be exhibited even for microvias.
本発明の断続的電気めっき方法において、被めっき物は前処理されたものであることが好ましい。前処理方法については、特に限定はなく、常法に従えばよい。例えば導電化処理(例えば、無電解めっき処理、カーボン処理、スパッタリング処理、Sn-Pdコロイド系触媒処理、導電性ポリマー処理等)を施した被めっき物について、例えば脱脂処理、前工程で付着した汚れの除去処理、酸洗による酸化皮膜の除去等を経て得られたものを、被めっき物として使用することができる。 In the intermittent electroplating method of the present invention, the object to be plated is preferably pretreated. The pretreatment method is not particularly limited and may be a conventional method. For example, for the object to be plated that has been made conductive (for example, electroless plating, carbon treatment, sputtering treatment, Sn-Pd colloidal catalyst treatment, conductive polymer treatment, etc.), for example, degreasing treatment, dirt attached in the previous step The material obtained through the removal treatment of 1), the removal of the oxide film by pickling, etc. can be used as the object to be plated.
また、被めっき物は、既に、電気めっきによるめっき膜が形成されたものであってもよい。 The object to be plated may already have a plated film formed by electroplating.
本発明の断続的電気めっき方法は、電流付加サイクルが断続的に繰り返される方法であって、めっき槽から排出された被めっき物及びめっき槽に供給される被めっき物にわずかに付着しためっき液(図1に示される実施形態の場合であれば、めっき槽の側面からわずかに漏れるめっき液)による低電流密度の発生という問題が生じる方法である限り、特に制限されない。 The intermittent electroplating method of the present invention is a method in which a current addition cycle is repeated intermittently, and a plating solution slightly attached to the object to be plated discharged from the plating tank and the object to be supplied to the plating tank. In the case of the embodiment shown in FIG. 1, the method is not particularly limited as long as it is a method that causes a problem of low current density due to the plating solution slightly leaking from the side surface of the plating tank.
本発明の断続的電気めっき方法は、好ましくは長尺状の被めっき物がライン上で連続的にめっき槽に供給され、且つめっき槽からの被めっき物の排出とめっき槽への被めっき物の供給とが複数回繰り返される方法である。 The intermittent electroplating method of the present invention is preferably such that a long object to be plated is continuously supplied to a plating tank on a line, and discharge of the object to be plated from the plating tank and the object to be plated to the plating tank are performed. Is a method in which the supply of is repeated multiple times.
「長尺状の被めっき物がライン上で連続的にめっき槽に供給され」とは、複数の互いに分断された被めっき物を順番にめっき槽に供給するのではなく、一つの長尺状の被めっき物を、ローラー等で搬送しながら、被めっき物の一端側からめっき槽に供給さる態様を意味する。 "Long-sized objects to be plated are continuously supplied to the plating tank on the line" does not mean that a plurality of mutually separated objects to be plated are sequentially supplied to the plating tank, but one long object It means a mode in which the object to be plated is fed to the plating tank from one end side of the object to be plated while being transported by a roller or the like.
めっき槽からの被めっき物の排出とめっき槽への被めっき物の供給の態様は、特に制限されない。該排出及び該供給がめっき槽の側面で行われることが好ましい。この場合、めっき槽の側面壁から被めっき物が排出される際、及びめっき槽の側面壁を介して被めっき物が供給される際に、めっき槽内部のめっき液が、被めっき物を介して、めっき槽外に漏れてしまい、本発明における問題(低電流密度の発生)が生じる。 The mode of discharging the object to be plated from the plating tank and supplying the object to be plated to the plating tank is not particularly limited. It is preferable that the discharging and the supplying are performed on the side surface of the plating tank. In this case, when the object to be plated is discharged from the side wall of the plating tank and when the object to be plated is supplied through the side wall of the plating tank, the plating solution inside the plating tank passes through the object to be plated. And then leaks out of the plating tank, causing a problem in the present invention (occurrence of low current density).
めっき槽に対する被めっき物の供給と排出とが繰り返される回数は、例えば2〜30回、好ましくは5〜25回、より好ましくは10〜20回である。 The number of times that the material to be plated is supplied to and discharged from the plating tank is, for example, 2 to 30 times, preferably 5 to 25 times, and more preferably 10 to 20 times.
本発明の断続的電気めっき方法は、被めっき物が複数のめっき槽を通過する方法であることが好ましい。通過するめっき槽の数は、例えば2〜30、好ましくは5〜25、より好ましくは10〜20である。 The intermittent electroplating method of the present invention is preferably a method in which an object to be plated passes through a plurality of plating tanks. The number of plating baths to pass is, for example, 2 to 30, preferably 5 to 25, and more preferably 10 to 20.
本発明の断続的電気めっき方法は、好ましくは、リールトゥリールのライン上で行う方法である。 The intermittent electroplating method of the present invention is preferably a method performed on a reel-to-reel line.
めっき液の攪拌方法についても特に限定はなく、空気攪拌、噴流攪拌、機械的攪拌などを行うことができ、複数の攪拌方法を組み合わせてもよい。 The stirring method of the plating solution is also not particularly limited, and air stirring, jet stirring, mechanical stirring, and the like can be performed, and a plurality of stirring methods may be combined.
めっき処理を行う際に、アノードとしては、可溶性アノード及び不溶性アノードをいずれも用いることができる。例えば、可溶性アノードとしては、例えば、リン含有量0.02〜0.06%程度の含リン銅を用いることができる。また、不溶性アノードとしては、チタンに酸化イリジウムをコーティングしたもの、チタンに白金めっきしたもの等を用いることができる。アノードの形状についても特に限定はなく、棒状、球状、板状、メッシュ状等の各種形状のアノードを用いることができる。 When performing the plating treatment, both a soluble anode and an insoluble anode can be used as the anode. For example, as the soluble anode, for example, phosphorus-containing copper having a phosphorus content of about 0.02 to 0.06% can be used. The insoluble anode may be titanium coated with iridium oxide, titanium plated with platinum, or the like. The shape of the anode is also not particularly limited, and various shapes such as rod-shaped, spherical, plate-shaped, and mesh-shaped anodes can be used.
めっき処理を行う際に、カソードとしては、被めっき物を使用することができる。 An object to be plated can be used as the cathode when performing the plating treatment.
めっき液の液温については、通常、10〜50℃程度とすればよい。該温度は、好ましくは20〜35℃である。 The liquid temperature of the plating solution may be usually about 10 to 50°C. The temperature is preferably 20 to 35°C.
本発明の断続的電気めっき方法における電流密度(めっき槽内における電流密度)は、例えば2〜15A/dm2、好ましくは2〜10A/dm2である。 The current density (current density in the plating tank) in the intermittent electroplating method of the present invention is, for example, 2 to 15 A/dm 2 , and preferably 2 to 10 A/dm 2 .
本発明の断続的電気めっき方法における、電流付加1回あたりの時間(被めっき物中のある一点がめっき槽内のめっき液に浸漬してる時間)は、例えば5〜120秒間、好ましくは10〜60秒間、より好ましくは20〜40秒間である。 In the intermittent electroplating method of the present invention, the time per current addition (time when one point in the object to be plated is immersed in the plating solution in the plating tank) is, for example, 5 to 120 seconds, preferably 10 It is 60 seconds, more preferably 20-40 seconds.
本発明の断続的電気めっき方法における、電流付加サイクルの回数は、例えば2〜30回、好ましくは5〜25回、より好ましくは10〜20回である。 In the intermittent electroplating method of the present invention, the number of current application cycles is, for example, 2 to 30 times, preferably 5 to 25 times, more preferably 10 to 20 times.
以下に、実施例に基づいて本発明を詳細に説明するが、本発明はこれらの実施例によって限定されるものではない。 Hereinafter, the present invention will be described in detail based on examples, but the present invention is not limited to these examples.
試験例1.断続的電気めっき試験1
<試験例1−1.電気めっき液の調製>
下記表1に示す組成の電気めっき液を調製した。
Test Example 1. Intermittent electroplating test 1
<Test Example 1-1. Preparation of electroplating solution>
An electroplating solution having the composition shown in Table 1 below was prepared.
<試験例1−2.前処理>
厚み64μm(層構成:銅箔7μm/樹脂(ポリイミド)層50μm/銅箔7μm)の銅箔樹脂基板において、直径100μm且つ深さ57μmの多数のビアホールを有し、ビアホール樹脂内壁にカーボンのダイレクトプレーティングシステムにより導電性を持たせてなる基板(図2)を被めっき物として用い、これを脱脂液(商品名: DP−320クリーン 奥野製薬工業社製、100ml/L水溶液)に45℃で5分間浸漬した後、1分間水洗し、100g/Lの希硫酸に1分間浸漬して前処理を行った。
<Test Example 1-2. Pretreatment>
A copper foil resin substrate having a thickness of 64 μm (layer structure: copper foil 7 μm/resin (polyimide) layer 50 μm/copper foil 7 μm) has a large number of via holes with a diameter of 100 μm and a depth of 57 μm, and carbon direct play on the inner wall of the via hole resin. A substrate (FIG. 2) made conductive by a coating system is used as an object to be plated, and this is added to a degreasing liquid (trade name: DP-320 Clean, Okuno Chemical Industries Co., Ltd., 100 ml/L aqueous solution) at 45° C. After soaking for 1 minute, it was washed with water for 1 minute and then immersed in 100 g/L of dilute sulfuric acid for 1 minute for pretreatment.
<試験例1−3.電気めっき>
上記で得られた電気めっき液に前処理後の被めっき物を浸漬し、表2に示すサイクルで電気めっきを行った。めっき条件は表3の通りである。表2中の低電流密度及びその通電時間の具体的な値は、表4に示す。また、このサイクルの一例(低電流密度=0.2A/dm2、通電時間5秒)を表すグラフを図3に示す。
<Test Example 1-3. Electroplating>
The object to be plated after pretreatment was immersed in the electroplating solution obtained above, and electroplating was performed in the cycle shown in Table 2. The plating conditions are as shown in Table 3. Table 4 shows specific values of the low current density and the energization time in Table 2. A graph showing an example of this cycle (low current density=0.2 A/dm 2 , energization time 5 seconds) is shown in FIG.
<試験例1−4.フィリング性評価>
電気めっき終了後、被めっき物のビア部分の断面観察を行い、図4に示すビア部分の凹み量を測定した。測定値に基づいて、次の評価基準(○:凹み量48μm以下、△:凹み量: 48〜 53μm、×:凹み量53μm以上)によりフィリング性を評価した。
<Test Example 1-4. Filling evaluation>
After completion of the electroplating, the cross section of the via portion of the object to be plated was observed, and the amount of depression of the via portion shown in FIG. 4 was measured. Based on the measured values, the filling property was evaluated according to the following evaluation criteria (◯: dent amount 48 μm or less, Δ: dent amount: 48 to 53 μm, x: dent amount 53 μm or more).
<試験例1−5.結果>
結果を表4に示す。表4中、低電流密度は表2のサイクルにおける低電流密度を表し、通電時間は表2のサイクルにおける低電流密度の通電時間(X)を表す。
<Test Example 1-5. Result>
The results are shown in Table 4. In Table 4, the low current density represents the low current density in the cycle of Table 2, and the energization time represents the energization time (X) of the low current density in the cycle of Table 2.
表4に示されるように、低電流密度を発生させないサイクルで電気めっきを行った場合(比較例1)は、フィリング性は比較的良好であった。しかし、断続的電気めっき、特に長尺状の被めっき物がライン上で連続的にめっき槽に供給され、且つめっき槽からの被めっき物の排出とめっき槽への被めっき物の供給とが複数回繰り返される断続的電気めっき等においては、めっき槽から排出された被めっき物及びめっき槽に供給される被めっき物にわずかに付着しためっき液による低電流密度の発生が避けられないところ、このような場合を模擬的に表した場合(比較例2〜5)には、フィリング性が大きく悪化してしまうことが分かった。 As shown in Table 4, when electroplating was performed in a cycle in which a low current density was not generated (Comparative Example 1), the filling property was relatively good. However, intermittent electroplating, particularly long-sized objects to be plated are continuously supplied to the plating tank on the line, and the objects to be plated from the plating tank and the objects to be plated are supplied to the plating tank. In intermittent electroplating that is repeated multiple times, where a low current density is inevitable due to the plating solution discharged from the plating tank and the plating solution slightly attached to the plating object supplied to the plating tank, It was found that when these cases were simulated (Comparative Examples 2 to 5), the filling property was significantly deteriorated.
試験例2.断続的電気めっき試験2
電気めっき液に硫酸第二鉄n水和物を添加して、Fe3+濃度を表5に示す濃度に調整する以外は、試験例1−1と同様にして電気めっき液を調製した。その他は、試験例1と同様にして、前処理、電気めっき、及びフィリング性評価を行った。
Test example 2. Intermittent electroplating test 2
An electroplating solution was prepared in the same manner as in Test Example 1-1, except that ferric sulfate n-hydrate was added to the electroplating solution to adjust the Fe 3+ concentration to the concentration shown in Table 5. Others were the same as in Test Example 1, and pretreatment, electroplating, and filling property evaluation were performed.
結果を表5に示す。表5中、低電流密度は表2のサイクルにおける低電流密度を表し、通電時間は表2のサイクルにおける低電流密度の通電時間(X)を表す。また、実施例2及び比較例3の、電気めっき終了後の被めっき物のビア部分の断面観察図を図5に示す。 The results are shown in Table 5. In Table 5, the low current density represents the low current density in the cycle of Table 2, and the energization time represents the energization time (X) of the low current density in the cycle of Table 2. Further, FIG. 5 shows a cross-sectional observation view of the via portion of the object to be plated after completion of electroplating in Example 2 and Comparative Example 3.
表5に示されるように、低電流密度の発生によるフィリング性の悪化(比較例1と比較例2〜5との比較)が、Fe3+を含有するめっき液を使用することにより大幅に改善することが分かった。 As shown in Table 5, the deterioration of the filling property due to the occurrence of low current density (comparison between Comparative Example 1 and Comparative Examples 2 to 5) is significantly improved by using the plating solution containing Fe 3+. I found out.
試験例3.断続的電気めっき試験3
電気めっき液に各種金属化合物を添加して、多価金属イオン濃度を表6に示す濃度に調整する以外は、試験例1−1と同様にして電気めっき液を調製した。その他は、試験例1と同様にして、前処理、電気めっき、及びフィリング性評価を行った。なお、本試験における低電流密度は0.2A/dm2であり、その通電時間5秒である。
Test example 3. Intermittent electroplating test 3
An electroplating solution was prepared in the same manner as in Test Example 1-1, except that the polyvalent metal ion concentration was adjusted to the concentration shown in Table 6 by adding various metal compounds to the electroplating solution. Others were the same as in Test Example 1, and pretreatment, electroplating, and filling property evaluation were performed. The low current density in this test is 0.2 A/dm 2 , and the energization time is 5 seconds.
結果を表6に示す。 The results are shown in Table 6.
表6に示されるように、低電流密度の発生によるフィリング性の悪化(比較例1と比較例2〜5との比較)が、多価金属イオンを含有するめっき液を使用することにより大幅に改善することが分かった。 As shown in Table 6, the deterioration of the filling property due to the generation of the low current density (comparison between Comparative Example 1 and Comparative Examples 2 to 5) is significantly caused by using the plating solution containing polyvalent metal ions. It turned out to improve.
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