JP2020021602A5 - - Google Patents

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JP2020021602A5
JP2020021602A5 JP2018143927A JP2018143927A JP2020021602A5 JP 2020021602 A5 JP2020021602 A5 JP 2020021602A5 JP 2018143927 A JP2018143927 A JP 2018143927A JP 2018143927 A JP2018143927 A JP 2018143927A JP 2020021602 A5 JP2020021602 A5 JP 2020021602A5
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Japan
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ion
mass
ions
ion trap
measurement
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JP2018143927A
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Japanese (ja)
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JP7021612B2 (ja
JP2020021602A (ja
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JP2018143927A 2018-07-31 2018-07-31 質量分析装置及び質量分析方法 Active JP7021612B2 (ja)

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JP2018143927A JP7021612B2 (ja) 2018-07-31 2018-07-31 質量分析装置及び質量分析方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2018143927A JP7021612B2 (ja) 2018-07-31 2018-07-31 質量分析装置及び質量分析方法

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JP2020021602A JP2020021602A (ja) 2020-02-06
JP2020021602A5 true JP2020021602A5 (zh) 2020-12-17
JP7021612B2 JP7021612B2 (ja) 2022-02-17

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Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2740604C1 (ru) * 2020-07-14 2021-01-15 Федеральное государственное бюджетное образовательное учреждение высшего образования "Рязанский государственный радиотехнический университет имени В.Ф. Уткина" Способ масс-анализа ионов в квадрупольных полях с возбуждением колебаний на границы устойчивости
RU2749549C1 (ru) * 2020-07-14 2021-06-15 Федеральное государственное бюджетное образовательное учреждение высшего образования "Рязанский государственный радиотехнический университет имени В.Ф. Уткина" Устройство масс-анализа ионов с квадрупольными полями с возбуждением колебаний на границе устойчивости

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1183803A (ja) * 1997-09-01 1999-03-26 Hitachi Ltd マスマーカーの補正方法
JP4332482B2 (ja) * 2004-09-21 2009-09-16 株式会社日立ハイテクノロジーズ イオントラップ質量分析方法および装置
JP4701720B2 (ja) * 2005-01-11 2011-06-15 株式会社島津製作所 Maldiイオントラップ型質量分析装置及び分析方法
CA2696167A1 (en) * 2007-08-21 2009-02-26 Mds Analytical Technologies, A Business Unit Of Mds Inc., Doing Business Through Its Sciex Division Method for enhancing mass assignment accuracy
JP2010205460A (ja) * 2009-03-02 2010-09-16 Shimadzu Corp レーザ脱離イオン化飛行時間型質量分析装置
JP6285735B2 (ja) * 2014-02-04 2018-02-28 日本電子株式会社 質量分析装置

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