JP2020020671A5 - - Google Patents

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Publication number
JP2020020671A5
JP2020020671A5 JP2018144784A JP2018144784A JP2020020671A5 JP 2020020671 A5 JP2020020671 A5 JP 2020020671A5 JP 2018144784 A JP2018144784 A JP 2018144784A JP 2018144784 A JP2018144784 A JP 2018144784A JP 2020020671 A5 JP2020020671 A5 JP 2020020671A5
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Japan
Prior art keywords
angle
encoder pattern
pattern
unit
information
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JP2018144784A
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English (en)
Japanese (ja)
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JP7078486B2 (ja
JP2020020671A (ja
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Priority claimed from JP2018144784A external-priority patent/JP7078486B2/ja
Priority to JP2018144784A priority Critical patent/JP7078486B2/ja
Priority to CN201980046327.3A priority patent/CN112469968B/zh
Priority to PCT/JP2019/029422 priority patent/WO2020026978A1/ja
Priority to EP19843095.1A priority patent/EP3832257A4/en
Priority to US17/262,164 priority patent/US20210270640A1/en
Publication of JP2020020671A publication Critical patent/JP2020020671A/ja
Publication of JP2020020671A5 publication Critical patent/JP2020020671A5/ja
Publication of JP7078486B2 publication Critical patent/JP7078486B2/ja
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JP2018144784A 2018-08-01 2018-08-01 角度検出システムおよび角度検出方法 Active JP7078486B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2018144784A JP7078486B2 (ja) 2018-08-01 2018-08-01 角度検出システムおよび角度検出方法
US17/262,164 US20210270640A1 (en) 2018-08-01 2019-07-26 Angle detection system and angle detection method
PCT/JP2019/029422 WO2020026978A1 (ja) 2018-08-01 2019-07-26 角度検出システムおよび角度検出方法
EP19843095.1A EP3832257A4 (en) 2018-08-01 2019-07-26 ANGLE DETECTION SYSTEM AND ANGLE DETECTION METHOD
CN201980046327.3A CN112469968B (zh) 2018-08-01 2019-07-26 角度检测系统以及角度检测方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2018144784A JP7078486B2 (ja) 2018-08-01 2018-08-01 角度検出システムおよび角度検出方法

Publications (3)

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JP2020020671A JP2020020671A (ja) 2020-02-06
JP2020020671A5 true JP2020020671A5 (enExample) 2021-07-26
JP7078486B2 JP7078486B2 (ja) 2022-05-31

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JP2018144784A Active JP7078486B2 (ja) 2018-08-01 2018-08-01 角度検出システムおよび角度検出方法

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US (1) US20210270640A1 (enExample)
EP (1) EP3832257A4 (enExample)
JP (1) JP7078486B2 (enExample)
CN (1) CN112469968B (enExample)
WO (1) WO2020026978A1 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12345812B2 (en) * 2020-01-02 2025-07-01 Analog Devices International Unlimited Company Angle of rotation determination in scanning LIDAR systems
DE102020201282A1 (de) * 2020-02-03 2021-08-05 Dr. Johannes Heidenhain Gesellschaft Mit Beschränkter Haftung Positionsmesseinrichtung und Verfahren zu deren Betrieb
US12392610B2 (en) * 2022-02-03 2025-08-19 Topcon Corporation Reference point indicating apparatus
EP4571248A1 (de) 2023-12-12 2025-06-18 Hilti Aktiengesellschaft Vorrichtungen und verfahren zur winkelmessung

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6080707A (ja) * 1983-10-07 1985-05-08 Toshihiro Tsumura 傾斜角度計測装置
JP3184939B2 (ja) 1991-12-26 2001-07-09 株式会社ソキア アブソリュートエンコーダ
JPH07139942A (ja) * 1993-11-12 1995-06-02 Wacom Co Ltd 測量装置
AUPP482598A0 (en) * 1998-07-24 1998-08-13 Bishop Innovation Pty Limited Angle encoder
US5900930A (en) * 1997-10-21 1999-05-04 Eaton Corporation Angle sensor using a multi-pixel optical device
JP2000081487A (ja) * 1998-05-08 2000-03-21 Osaka Gas Co Ltd 探査方法及び装置
EP1329690A1 (de) * 2002-01-22 2003-07-23 Leica Geosystems AG Verfahren und Vorrichtung zum automatischen Auffinden von Zielmarken
CN1922613A (zh) * 2004-01-14 2007-02-28 国际条形码公司 能补偿变形的可扫描虚拟条形码图像
US20090024325A1 (en) * 2007-07-19 2009-01-22 Scherzinger Bruno M AINS enhanced survey instrument
CN101964045A (zh) * 2010-09-30 2011-02-02 西北工业大学 标刻在圆柱面产品上的数据矩阵码畸变校正方法
US9222808B2 (en) * 2011-06-09 2015-12-29 Kodenshi Corporation Scale for rotary encoder, method of injection-molding same, and rotary encoder using same
US20130204574A1 (en) * 2012-02-07 2013-08-08 Amit Agrawal Method for Estimating Positions Using Absolute Encoders
CN104254755B (zh) * 2013-09-10 2017-05-10 王勇 光学测量系统、光学测量方法及光学测量标尺
JP6438311B2 (ja) 2015-01-27 2018-12-12 株式会社トプコン 測量システム、測量方法、測量機及び測量用反射ターゲット
JP6433343B2 (ja) * 2015-01-28 2018-12-05 株式会社トプコン 三次元位置計測システム
JP6054995B2 (ja) * 2015-01-29 2016-12-27 ファナック株式会社 クロストークを防止する光学式エンコーダ
US9605981B1 (en) * 2015-09-22 2017-03-28 Mitsubishi Electric Corporation Absolute encoder
JP6982424B2 (ja) * 2017-07-14 2021-12-17 株式会社トプコン 測量システム
US10247542B2 (en) * 2017-08-09 2019-04-02 Leica Geosystems Ag Handheld measuring aid with a 3-axis joint connection and a spherical encoder
JP2019105515A (ja) * 2017-12-12 2019-06-27 株式会社トプコン ターゲット装置、測量方法、測量装置およびプログラム

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