JP2020017861A5 - - Google Patents

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JP2020017861A5
JP2020017861A5 JP2018139621A JP2018139621A JP2020017861A5 JP 2020017861 A5 JP2020017861 A5 JP 2020017861A5 JP 2018139621 A JP2018139621 A JP 2018139621A JP 2018139621 A JP2018139621 A JP 2018139621A JP 2020017861 A5 JP2020017861 A5 JP 2020017861A5
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Japan
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reference voltage
voltage
output voltage
output
pixels
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JP2018139621A
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Japanese (ja)
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JP7170448B2 (ja
JP2020017861A (ja
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Priority to US16/519,702 priority patent/US11105935B2/en
Publication of JP2020017861A publication Critical patent/JP2020017861A/ja
Publication of JP2020017861A5 publication Critical patent/JP2020017861A5/ja
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JP2018139621A 2018-07-25 2018-07-25 撮像素子、撮像装置及び信号処理方法 Active JP7170448B2 (ja)

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Application Number Priority Date Filing Date Title
JP2018139621A JP7170448B2 (ja) 2018-07-25 2018-07-25 撮像素子、撮像装置及び信号処理方法
US16/519,702 US11105935B2 (en) 2018-07-25 2019-07-23 Image sensor and image capturing apparatus

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JP2018139621A JP7170448B2 (ja) 2018-07-25 2018-07-25 撮像素子、撮像装置及び信号処理方法

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JP2020017861A JP2020017861A (ja) 2020-01-30
JP2020017861A5 true JP2020017861A5 (https=) 2021-09-02
JP7170448B2 JP7170448B2 (ja) 2022-11-14

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JP (1) JP7170448B2 (https=)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7679169B2 (ja) 2019-08-08 2025-05-19 キヤノン株式会社 光電変換装置、光電変換システム
JP7527853B2 (ja) * 2020-06-11 2024-08-05 キヤノン株式会社 光電変換装置
TWI893115B (zh) * 2020-06-12 2025-08-11 日商索尼半導體解決方案公司 光檢測電路及測距裝置
JP7572811B2 (ja) * 2020-08-18 2024-10-24 キヤノン株式会社 画像符号化装置及びその制御方法及びプログラム
CN112284554B (zh) * 2020-10-29 2022-01-04 湘潭大学 具有阈值电压自动设定和控制功能的光子计数电路
JP7604204B2 (ja) 2020-12-10 2024-12-23 キヤノン株式会社 光電変換装置、撮像システム、移動体
JP7630985B2 (ja) * 2020-12-17 2025-02-18 キヤノン株式会社 光電変換装置及びその駆動方法
JP7643956B2 (ja) * 2021-06-30 2025-03-11 アズビル株式会社 光検出システムおよび光子数算出方法
JPWO2023149382A1 (https=) * 2022-02-01 2023-08-10
JP2023173218A (ja) 2022-05-25 2023-12-07 キヤノン株式会社 光電変換装置及び光検出システム
JP2025532299A (ja) * 2022-10-06 2025-09-29 ソニーセミコンダクタソリューションズ株式会社 計数モード決定回路及び計数モード決定方法
JP2024085815A (ja) * 2022-12-15 2024-06-27 キヤノン株式会社 放射線検出器、放射線検出器の駆動方法、および放射線撮像システム
JPWO2024203275A1 (https=) * 2023-03-28 2024-10-03

Family Cites Families (9)

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Publication number Priority date Publication date Assignee Title
US9000385B2 (en) * 2009-12-30 2015-04-07 General Electric Company Method and apparatus for acquiring radiation data
JP6017916B2 (ja) 2012-10-16 2016-11-02 株式会社豊田中央研究所 光検出器
KR20140132098A (ko) * 2013-05-07 2014-11-17 삼성전자주식회사 엑스선 검출기, 이를 포함하는 엑스선 영상 장치 및 그 제어 방법
JP6178272B2 (ja) * 2014-03-24 2017-08-09 株式会社東芝 放射線計測装置、および放射線計測プログラム
EP3281041B1 (en) * 2015-04-07 2020-06-10 Shenzhen Xpectvision Technology Co., Ltd. Methods of making semiconductor x-ray detector
EP3281039B1 (en) * 2015-04-07 2020-03-11 Shenzhen Xpectvision Technology Co., Ltd. Semiconductor x-ray detector
US10641911B2 (en) * 2015-12-02 2020-05-05 Shenzhen Xpectvision Technology Co., Ltd. Packaging methods of semiconductor X-ray detectors
US10126167B2 (en) * 2016-01-20 2018-11-13 Brookhaven Science Associates, Llc Photon counter with pile-up rejection
US10473798B2 (en) * 2017-06-16 2019-11-12 Varex Imaging Corporation Counting and integrating pixels, detectors, and methods

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