JP7170448B2 - 撮像素子、撮像装置及び信号処理方法 - Google Patents

撮像素子、撮像装置及び信号処理方法 Download PDF

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JP7170448B2
JP7170448B2 JP2018139621A JP2018139621A JP7170448B2 JP 7170448 B2 JP7170448 B2 JP 7170448B2 JP 2018139621 A JP2018139621 A JP 2018139621A JP 2018139621 A JP2018139621 A JP 2018139621A JP 7170448 B2 JP7170448 B2 JP 7170448B2
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voltage
reference voltage
output
pixel
comparing
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JP2020017861A5 (https=
JP2020017861A (ja
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典央 根岸
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Canon Inc
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Canon Inc
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Priority to JP2018139621A priority Critical patent/JP7170448B2/ja
Priority to US16/519,702 priority patent/US11105935B2/en
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4228—Photometry, e.g. photographic exposure meter using electric radiation detectors arrangements with two or more detectors, e.g. for sensitivity compensation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/17—Circuit arrangements not adapted to a particular type of detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/0228—Control of working procedures; Failure detection; Spectral bandwidth calculation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0488—Optical or mechanical part supplementary adjustable parts with spectral filtering
    • G01J1/0492—Optical or mechanical part supplementary adjustable parts with spectral filtering using at least two different filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/16—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors
    • G01J1/18—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors using comparison with a reference electric value
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/247—Detector read-out circuitry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G01T1/2928—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
    • H04N25/44—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array
    • H04N25/445—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array by skipping some contiguous pixels within the read portion of the array
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • H04N25/772—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters
    • H04N25/773—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters comprising photon counting circuits, e.g. single photon detection [SPD] or single photon avalanche diodes [SPAD]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J2001/4413—Type
    • G01J2001/442—Single-photon detection or photon counting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J2001/4446—Type of detector
    • G01J2001/446—Photodiode
    • G01J2001/4466—Avalanche
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G01J3/51—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors using colour filters
    • G01J3/513—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors using colour filters having fixed filter-detector pairs

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Molecular Biology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Engineering & Computer Science (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Light Receiving Elements (AREA)
JP2018139621A 2018-07-25 2018-07-25 撮像素子、撮像装置及び信号処理方法 Active JP7170448B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2018139621A JP7170448B2 (ja) 2018-07-25 2018-07-25 撮像素子、撮像装置及び信号処理方法
US16/519,702 US11105935B2 (en) 2018-07-25 2019-07-23 Image sensor and image capturing apparatus

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Application Number Priority Date Filing Date Title
JP2018139621A JP7170448B2 (ja) 2018-07-25 2018-07-25 撮像素子、撮像装置及び信号処理方法

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JP2020017861A JP2020017861A (ja) 2020-01-30
JP2020017861A5 JP2020017861A5 (https=) 2021-09-02
JP7170448B2 true JP7170448B2 (ja) 2022-11-14

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Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7679169B2 (ja) 2019-08-08 2025-05-19 キヤノン株式会社 光電変換装置、光電変換システム
JP7527853B2 (ja) * 2020-06-11 2024-08-05 キヤノン株式会社 光電変換装置
TWI893115B (zh) * 2020-06-12 2025-08-11 日商索尼半導體解決方案公司 光檢測電路及測距裝置
JP7572811B2 (ja) * 2020-08-18 2024-10-24 キヤノン株式会社 画像符号化装置及びその制御方法及びプログラム
CN112284554B (zh) * 2020-10-29 2022-01-04 湘潭大学 具有阈值电压自动设定和控制功能的光子计数电路
JP7604204B2 (ja) 2020-12-10 2024-12-23 キヤノン株式会社 光電変換装置、撮像システム、移動体
JP7630985B2 (ja) * 2020-12-17 2025-02-18 キヤノン株式会社 光電変換装置及びその駆動方法
JP7643956B2 (ja) * 2021-06-30 2025-03-11 アズビル株式会社 光検出システムおよび光子数算出方法
JPWO2023149382A1 (https=) * 2022-02-01 2023-08-10
JP2023173218A (ja) 2022-05-25 2023-12-07 キヤノン株式会社 光電変換装置及び光検出システム
JP2025532299A (ja) * 2022-10-06 2025-09-29 ソニーセミコンダクタソリューションズ株式会社 計数モード決定回路及び計数モード決定方法
JP2024085815A (ja) * 2022-12-15 2024-06-27 キヤノン株式会社 放射線検出器、放射線検出器の駆動方法、および放射線撮像システム
JPWO2024203275A1 (https=) * 2023-03-28 2024-10-03

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Publication number Priority date Publication date Assignee Title
JP2013516610A (ja) 2009-12-30 2013-05-13 ゼネラル・エレクトリック・カンパニイ 放射線データを取得する方法及び装置
JP2015184119A (ja) 2014-03-24 2015-10-22 株式会社東芝 放射線計測装置、および放射線計測プログラム

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JP6017916B2 (ja) 2012-10-16 2016-11-02 株式会社豊田中央研究所 光検出器
KR20140132098A (ko) * 2013-05-07 2014-11-17 삼성전자주식회사 엑스선 검출기, 이를 포함하는 엑스선 영상 장치 및 그 제어 방법
EP3281041B1 (en) * 2015-04-07 2020-06-10 Shenzhen Xpectvision Technology Co., Ltd. Methods of making semiconductor x-ray detector
EP3281039B1 (en) * 2015-04-07 2020-03-11 Shenzhen Xpectvision Technology Co., Ltd. Semiconductor x-ray detector
US10641911B2 (en) * 2015-12-02 2020-05-05 Shenzhen Xpectvision Technology Co., Ltd. Packaging methods of semiconductor X-ray detectors
US10126167B2 (en) * 2016-01-20 2018-11-13 Brookhaven Science Associates, Llc Photon counter with pile-up rejection
US10473798B2 (en) * 2017-06-16 2019-11-12 Varex Imaging Corporation Counting and integrating pixels, detectors, and methods

Patent Citations (2)

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JP2013516610A (ja) 2009-12-30 2013-05-13 ゼネラル・エレクトリック・カンパニイ 放射線データを取得する方法及び装置
JP2015184119A (ja) 2014-03-24 2015-10-22 株式会社東芝 放射線計測装置、および放射線計測プログラム

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