JP2020003392A - Test lead and measuring device - Google Patents

Abstract

To provide a test lead in which an exposed length of a test pin can be reliably and easily changed, and which can prevent the exposed length of the test pin from unintentionally varying during use.SOLUTION: A test lead includes: a test pin 21 formed of a conductive material; a grip 22 in which a cylindrical grip part 31, and a holding part 32 for holding the pin 21 in a state that a tip 21a protrudes from a cylinder tip of the grip part 31, are integrally formed with a first insulating material; and a pin cover 23 cylindrically formed of a second insulating material. The cover 23 includes: a knob 42; and a cover body 41 disposed between the grip part 31 and the pin 21 so as to be slidable between a first position at which an exposed length of the tip 21a is a first length, and a second position at which the exposed length is a second length. On the grip part 31, a slit 31b is formed which has an oblong hole shape in a longitudinal direction of the pin 21 and with which the knob 42 is engaged, and thereby allowing movement of the knob 42 in the longitudinal direction, and regulating turning with respect to the grip 22.SELECTED DRAWING: Figure 2

Description

  The present invention relates to a test lead including a test pin formed of a conductive material and a grip formed of an insulating material, and a measuring device including the test lead.

  In the field of measurement devices that measure various electrical parameters via a pair of test leads that are in contact with the object to be measured, metal parts such as test pins on the test leads are used to avoid the occurrence of electric shock or short circuit. Is defined for each measurement category. Specifically, the "measurement category: CATII" specifies that the exposed length of the metal part is 19 mm or less, and the "measurement category: CATIII" specifies that the exposed length of the metal part is 4 mm or less. .

  In this case, as disclosed in “BACKGROUND OF THE INVENTION” in the following patent document, conventionally, a test lead in which the probe tip (test pin) has a long exposure length from the insulator (grip) and a Test leads with a short exposure length of the probe tip are prepared, and the test lead is exchanged according to the measurement category to which the measurement target belongs, and the measurement operation is performed. In addition, by using a test lead that can easily shorten the exposed length of the probe tip by attaching a cylindrical cap to the test lead that has a long exposed length of the probe tip from the insulator, In some cases, the measurement operation was performed by changing the exposure length of the probe tip according to the conditions.

  However, when two types of test leads having different exposed lengths of the probe tip are used properly, it is troublesome to replace the test leads when performing a measurement operation having different measurement categories, and the test leads can be fitted with a cylindrical cap. When using, there is a risk that the cap may be lost during a measurement operation in a measurement category where it is not necessary to attach the cap.

  On the other hand, a test lead probe (test lead) of the invention disclosed in the following patent document is configured to include a probe tip formed of a conductive metal material and a probe body formed of an insulating material. I have. In this test lead probe, the probe body includes three members: a handle portion, a top portion, and an insulating sleeve.

  In this case, in this test lead probe, the probe tip is positioned with respect to the handle portion of the probe body. In this test lead probe, the top of the probe body is rotatably attached to the tip of the handle. Further, in this test lead probe, by performing an operation of rotating the top portion with respect to the handle portion, the insulating sleeve of the probe body is slid along the longitudinal direction of the probe tip with respect to the handle portion and the probe tip. A configuration is employed.

  Specifically, in this test lead probe, a spiral (spiral groove: hereinafter also referred to as “spiral groove”) is provided on the outer peripheral portion of the insulating sleeve, and a spiral groove is formed on the inner peripheral surface of the top portion. A protrusion that can be fitted is provided. Thus, in this test lead probe, by rotating the top portion with respect to the handle portion, the insulating sleeve is slid with respect to the probe tip, the handle portion and the top portion, and protrudes from the top at the probe tip. The length covered by the insulating sleeve, that is, the exposed length of the probe tip from the insulating sleeve is changed.

  Therefore, in this test lead probe, the probe tip is exposed by rotating the top with respect to the handle, without replacing the test lead probe according to the measurement category or attaching / detaching the cap to / from the test lead probe. The length can be any length.

US Patent Application Publication No. 2010/0182027 (pages 1-4, FIG. 1-5)

  However, the test lead probe disclosed in the above patent document has the following problems. Specifically, in the test lead probe (test lead) disclosed in the above-mentioned patent document, the operation of rotating the top portion with respect to the handle portion (grip portion) of the probe body (grip) is performed, so that the insulation is performed. A configuration is employed in which the sleeve (pin cover) is slid to change the exposure length of the probe tip (test pin).

  In this case, in this test lead probe, the top is fitted to the tip of the handle in a state where the rotation of the top with respect to the handle is allowed, and the top is integrated with the handle. Therefore, a person who does not know how to use the test lead probe does not know that the top part is rotatable with respect to the handle part, so that the exposed length of the probe tip is set to a length corresponding to the measurement category. Even if it is necessary, the top portion is not even rotated with respect to the handle portion. As a result, the exposed length of the probe tip cannot be changed by operating the top portion.

  Also, even if someone who knows how to use this test lead probe, when pulling out the insulating sleeve from the handle and shortening the exposed length of the probe tip, the top should be oriented in any direction with respect to the handle. It is correctly stored whether the top should be turned with respect to the handle when it is necessary to extend the exposed length of the probe tip by pulling the insulating sleeve into the handle. It is difficult to keep doing. For this reason, when changing the exposure length of the probe tip prior to the measurement operation, the top portion may be rotated in the opposite direction to the correct direction, and the measurement operation may not be able to be started quickly. Further, when the force for rotating the top portion in the opposite direction to the correct direction is too strong, there is a possibility that the protrusion of the top portion or the spiral groove of the insulating sleeve may be damaged.

  Further, in this test lead probe, the top portion needs to be largely rotated with respect to the handle portion in order to slide the insulating sleeve to a position where the exposed length of the probe tip is a length corresponding to the measurement category. Therefore, when changing the exposed length of the probe tip (sliding the insulating sleeve), hold the handle portion with one hand and hold the top portion with the other hand while holding the top portion with the other hand. Need to be rotated. For this reason, it is difficult to simultaneously change the exposure length of the probe tip for the two test lead probes used in the measurement operation, and thus it is difficult to quickly start the measurement operation.

  In addition, in this test lead probe, the top part functioning as an operation part for sliding the insulating sleeve with respect to the probe tip and the handle part is a part where the user grips the test lead probe during the measurement work. For this reason, it is difficult to grip the test lead probe without touching the top part, and the top part rotates relatively to the handle part while performing the measurement work while holding the top part. Will move. In such a case, the insulating sleeve slides unintentionally and the exposed length of the probe tip changes.

  The present invention has been made in view of such a problem, and it is possible to reliably and easily change the exposed length of a test pin to a desired length, and to unintentionally change the exposed length of a test pin during use. It is a main object of the present invention to provide a test lead capable of suitably avoiding such a situation and a measuring device provided with such a test lead.

  In order to achieve the above object, a test lead according to claim 1 has a test pin formed of a conductive material, a cylindrical grip portion capable of gripping an outer peripheral portion, and a tip portion protruding from a tube tip of the grip portion. A grip for holding the test pin in a folded state is integrally formed of a first insulating material, and a pin cover formed of a second insulating material and formed in a cylindrical shape through which the test pin can be inserted. The pin cover includes a knob for sliding operation on the test pin and the grip, and a first length in which an exposed length of the test pin from the pin cover is a first length defined in advance. The group is slidably movable between a position and a second position where the exposed length of the distal end of the test pin from the pin cover is a second predetermined length shorter than the first length. And a cover body disposed between the grip and the test pin, and the knob is fitted into the grip and formed into a long hole along the longitudinal direction of the test pin. In addition, a knob guide is provided to allow the knob to move along the longitudinal direction and to restrict the knob from rotating with respect to the grip.

  In the test lead according to a second aspect, in the test lead according to the first aspect, the knob is formed separately from the cover body and is fitted to the cover body.

  Furthermore, the test lead according to claim 3 is the test lead according to claim 1 or 2, wherein the grip portion of the grip is provided with the knob when the pin cover is slid to the first position. On the other hand, a first indication is provided at a position adjacent to the test pin in the circumferential direction so as to specify that the exposed length of the test pin from the pin cover is the first length, and the pin cover is attached to the first cover. A second position in which the exposed length of the test pin from the pin cover at the position adjacent to the knob in the circumferential direction when slid to the position 2 is the second length. Is provided.

  According to a fourth aspect of the present invention, in the test lead according to any one of the first to third aspects, a first slide regulating member for regulating a slide of the pin cover slid to the first position. One of the convex portion and the first slide regulating concave portion is formed in the grip, and the other of the first slide regulating convex portion and the first slide regulating concave portion is formed in the pin cover. ing.

  Further, the test lead according to claim 5 is the test lead according to any one of claims 1 to 4, wherein a second slide regulating member for regulating the slide of the pin cover slid to the second position. One of the convex portion and the second slide regulating concave portion is formed on the grip, and the other of the second slide regulating convex portion and the second slide regulating concave portion is formed on the pin cover. ing.

  According to a sixth aspect of the present invention, in the test lead according to any one of the first to third aspects, the pin cover is configured such that a force required to slide the pin cover corresponds to the first position and the second position. 2 is provided between the grip portion of the grip and the test pin so as to be constant between the two positions.

  The configuration that “the force required to slide the pin cover is constant between the first position and the second position” is based on the “design concept in which the force required to slide the pin cover is constant”. Intended for manufactured configurations. Therefore, due to a manufacturing error or aging, "the force required to slide the pin cover may be slightly larger at any position between the first position and the second position than at the other position. The “reduced state” is also included in the configuration that “the force required to slide the pin cover is constant between the first position and the second position”.

  A test lead according to a seventh aspect is the test lead according to any one of the first to fifth aspects, wherein the pin cover is urged in a direction from the first position to the second position. A spring is housed in the grip portion of the grip together with the pin cover.

  The test lead according to claim 8 is the test lead according to any one of claims 1 to 7, wherein the pin cover is such that the tip of the test pin is housed in the pin cover. Is slidably disposed between the grip portion of the grip and the test pin at a third position where the pin is not exposed from the pin cover.

  According to a ninth aspect of the present invention, there is provided a measurement apparatus including the test lead according to any one of the first to eighth aspects, and a measurement apparatus main body capable of executing an electrical measurement process via the test lead.

  The test lead according to claim 1, wherein the cover main body of the pin cover including a cover main body formed in a cylindrical shape through which the test pin can be inserted and a knob for sliding operation with respect to the test pin and the grip is provided at a tip end of the test pin. A first position where the exposed length of the pin cover from the pin cover is a first predetermined length, and a second predetermined position where the exposed length of the test pin from the pin cover is shorter than the first length. Is slidably disposed between the gripping portion of the grip and the test pin at a second position having a length, and allows movement of the knob in the longitudinal direction and restricts rotation of the knob with respect to the grip. A knob guide is provided on the grip of the grip. According to a ninth aspect of the present invention, there is provided a measuring apparatus including the above test lead and a measuring apparatus main body capable of executing an electrical measurement process via the test lead.

  Therefore, according to the test lead according to the first aspect and the measuring device according to the ninth aspect, even if a person who does not know the operation method of the test lead, the existence of the knob guide and the knob can be reliably and easily recognized. By trying to operate the knob, it is possible to reliably and easily recognize that the pin cover slides with respect to the test pin and the grip to change the exposed length of the test pin. Also, when the exposed length of the test pin is set to the first length, that is, when the pin cover is slid in the direction to retract the test pin and the grip, a very simple operation of operating the knob in that direction is desired. When the pin cover is positioned at the first position, the exposed length of the test pin can be set to the first length. When the exposed length of the test pin is set to the second length, that is, when the test pin and the grip are When it is desired to slide the pin cover forward, the knob is moved in that direction by a very simple operation to place the pin cover at the second position and the exposed length of the test pin is set to the second length. Therefore, the exposure length of the test pin can be reliably and easily changed to an arbitrary length without memorizing the operation method. Further, since there is no possibility that the knob is operated in the wrong direction, it is possible to suitably avoid a situation in which the grip (knob guide portion) or the pin cover (knob) is damaged by an operation for changing the exposure length of the test pin. Also, during the measurement work using the test lead, the exposed length of the test pin is set to the intended length simply by gripping the grip part of the grip so as not to touch the knob, without inadvertent sliding of the pin cover. State can be maintained.

  In the test lead according to the second aspect, the knob is formed separately from the cover main body and is fitted to the cover main body. Therefore, according to the test lead described in claim 2 and the measuring device provided with such a test lead, when the pin cover in which the knob is formed integrally with the cover main body is employed, the test pin and the test pin of such a pin cover are used. When the knob is inserted into the knob guide section when attaching to the grip, the grip and the pin cover need to be greatly deformed, which may cause damage during manufacturing. It is necessary to form the knob with a low profile so that the knob can be inserted into the knob guide portion without significant deformation, and it may be difficult to operate the knob.On the other hand, the knob is formed separately from the cover body. By adopting a configuration that fits the knob, by attaching the cover body to the test pin and grip, then fitting the knob to the cover body, Even employing the knob of the real and easily operable sufficient height, it can be suitably avoided that grips and pin cover may be damaged during production.

  In the test lead according to the third aspect, when the pin cover is slid to the first position in the gripping portion of the grip, the exposed length of the test pin from the pin cover is set to a position adjacent to the knob in the circumferential direction. A first indication that can be specified to be one length, and a position adjacent to the knob in the circumferential direction when the pin cover is slid to the second position at the grip of the grip. Is provided with a second display capable of specifying that the exposed length of the test pin from the pin cover is the second length. Therefore, according to the test lead according to the third aspect and the measuring device having such a test lead, it is possible to determine the length of the exposed portion of the metal portion such as the test pin with a very simple structure. For example, even when the test pin is inserted into the hole and the measurement is performed, that is, even when the test pin is difficult to be visually observed, the exposed length of the test pin is the first length. Or the second length can be reliably and easily recognized.

  In the test lead according to the fourth aspect, one of the first slide restricting convex portion and the first slide restricting concave portion for restricting the slide of the pin cover slid to the first position is formed on the grip. In addition, the other of the first slide regulating protrusion and the first slide regulating recess is formed on the pin cover. Therefore, according to the test lead according to claim 4 and the measuring device provided with such a test lead, even if the finger is released from the knob after the operation of sliding the pin cover to the first position by operating the knob, Does not slide unintentionally with respect to the test pin or the grip, so that the state in which the exposed length of the test pin is the first length can be suitably maintained, and the measurement operation can be performed safely.

  In the test lead according to the fifth aspect, one of the second slide restricting convex portion and the second slide restrictive concave portion for restricting the slide of the pin cover slid to the second position is formed on the grip. In addition, the other of the second slide regulating protrusion and the second slide regulating recess is formed on the pin cover. Therefore, according to the test lead according to claim 5 and the measuring device provided with such a test lead, even if the finger is released from the knob after the operation of sliding the pin cover to the second position by operating the knob, Does not slide unintentionally with respect to the test pin and the grip, so that the state in which the exposed length of the test pin is the second length can be suitably maintained, and the measurement operation can be performed safely.

  In the test lead according to the sixth aspect, the pin cover is provided between the gripping portion of the grip and the test pin such that the force required to slide the pin cover is constant between the first position and the second position. It is arranged. Therefore, according to the test lead described in claim 6 and the measuring device provided with such a test lead, for example, the measurement of the measurement object of the measurement category in which the exposed length of the test pin should be the first length When the work and the measurement work on the measurement target of the measurement category where the exposed length of the test pin should be the second length are alternately performed in a short time, the pin cover is smoothly applied to the test pin and the grip. Each measurement process can be performed quickly because it can be slid

  In the test lead according to the seventh aspect, a spring for urging the pin cover along the direction from the first position to the second position is housed in the grip portion of the grip together with the pin cover. Therefore, according to the test lead and the measuring device having such a test lead, the pin cover slides with respect to the test pin and the grip by the biasing force of the spring without operating the knob or the like. And the exposed length of the test pin becomes the second length in which the possibility of electric shock accident or short circuit accident is low, so that the exposed length is the second length. Even if the user forgets to slide the pin cover during the measurement work to be performed in the state described above, the operation can be performed in a sufficiently safe state. Also, for example, when a test pin is inserted into an outlet (insertion hole of a blade) to perform a measurement operation, the operation of inserting the test pin into the outlet causes the pin cover to resist the urging force of the spring so that the test pin or the grip may be pressed. Therefore, the test pin can be easily brought into contact with a measurement object (contact fitting or the like) in the outlet.

  The test lead according to claim 8, wherein the tip of the test pin is housed in the pin cover and the tip is slidable to a third position where the tip is not exposed from the pin cover. A pin cover is provided on the vehicle. Therefore, according to the test lead of claim 8 and the measuring device provided with such a test lead, when the test lead is not used, the pin cover is slid to the third position and the test pin is inserted into the pin cover. By being in the housed state, it is possible to preferably prevent the test pin from being damaged or bent, and to house the test lead (a measuring device provided with the test lead) in a bag or a clothing pocket, for example. Sometimes, the tip of the test pin does not get caught in the bag or pocket, so that damage to the bag or pocket can be suitably avoided.

FIG. 2 is an external view of a measurement device main body 2 and test leads 3 and 3 in the measurement device 1. FIG. 4 is an external perspective view of the test lead 3 in a state where an exposed length of a test pin 21 from a pin cover 23 is a length L1. FIG. 4 is an external perspective view of the test lead 3 in a state where an exposed length of a test pin 21 from a pin cover 23 is a length L2. FIG. 3 is an exploded perspective view of a test lead 3. FIG. 4 is an external view of a portion where a slit 31b and a guide groove 32a are formed in a grip 22 of a test lead 3; The left diagram is a cross-sectional view of the test lead 3 in which the exposed length of the test pin 21 from the pin cover 23 is the length L1, and the right diagram shows that the exposed length of the test pin 21 from the pin cover 23 is It is sectional drawing of the test lead 3 in the state of length L2. The upper figure is an external view of the vicinity of the knob 42 and the category displays 34a and 34b in the test lead 3 in which the test pins 21 are exposed to the length L1 from the pin cover 23, and the lower figure is the pin cover 23. FIG. 13 is an external view of the vicinity of the knob 42 and the category displays 34a and 34b in the test lead 3 in which the length of the test pin 21 exposed from the test lead 3 is L2. It is an external view of the test lead 3A. The left diagram is a cross-sectional view of the test lead 3B in which the exposed length of the test pin 21 from the pin cover 23 is the length L2, and the right diagram is the cross sectional view of the test pin 21 from the pin cover 23. It is sectional drawing of the test lead 3B in the state of length L1. The upper figure is an external view of the vicinity of the knob 42 and the category displays 34a, 34b in the test lead 3C in which the exposed length of the test pin 21 from the pin cover 23C is the length L1. FIG. 14 is an external view of the vicinity of the knob 42 and the category displays 34a and 34b of the test lead 3C in which the exposed length of the test pin 21 from the test pin 23C is the length L2. FIG. 14 is an external view of the vicinity of the knob 42 and the category displays 34a and 34b in the test lead 3C in a housed state.

  Hereinafter, embodiments of a test lead and a measuring device will be described with reference to the accompanying drawings.

  The measuring device 1 shown in FIG. 1 is a card-type digital multimeter, which is an example of a “measuring device”, and includes a measuring device main body 2 and a pair of test leads 3, and has a voltage value, a current value, and a resistance. Various electrical parameters such as values can be measured. In this case, the measurement device main body 2 is an example of a “measurement device main body”, and includes a casing 11 that houses a measurement circuit (not shown), an operation unit 12 and a display unit 13 that are disposed on one front surface of the casing 11. , And is configured to be able to execute an electrical measurement process via both test leads 3.

  The test lead 3 is an example of a “test lead”, and includes a test pin 21, a grip 22, a pin cover 23, and a signal cable 24, as shown in FIGS. The test pin (probe tip: contact) 21 corresponds to a “test pin”. As an example, the tip 21 a is formed of a conductive material such as a metal into a long and thin rod shape (pin shape: see FIG. 4). I have. In this case, in the test lead 3 of the present embodiment, as an example, the grip 22 is manufactured in a state of being integrated with the test pin 21 and the signal cable 24 by insert molding. Inside, the signal cable 24 is electrically connected.

  The grip 22 is an example of a “grip”, and as shown in FIGS. 4 to 6, the grip part 31 (an example of the “grip”) that the user grips during the measurement operation by the measuring device 1, and the test pin 21. Is formed integrally with an insulating material (an example of a “first insulating material”) such as polycarbonate or ABS.

  The grip portion 31 is formed in a cylindrical shape whose inner diameter is larger than the outer diameter of the pin cover 23. The grip portion 31 is provided with a flange portion 31a for preventing a finger of a user holding the test lead 3 (grip portion 31) from touching the test pin 21 or the measurement target. Further, the grip 31 is provided with a slit 31b which is an example of a “knob guide”. The slit 31b is formed in a long hole shape along the longitudinal direction of the test pin 21 held by the holding portion 32 (the direction of arrows A1 and A2 in FIGS. 2 to 7). Of the knob 42 is fitted, the knob 42 is allowed to move in the directions of arrows A1 and A2, and the rotation of the knob 42 with respect to the grip 22 is restricted.

  The holding portion 32 is formed in a cylindrical shape whose outer diameter is smaller than the inner diameter of the pin cover 23. In this case, in the test lead 3 of the present example in which the grip 22 is integrated with the test pin 21 by insert molding, the inner diameter of the holding portion 32 is equal to the outer diameter of the test pin 21. As shown in FIGS. 5 and 6, the holding portion 32 holds the test pin 21 in a state where the tip portion 21 a protrudes from the cylinder tip of the grip portion 31, and thereby the test pin 21 with respect to the grip portion 31 (grip 22). Regulates the movement of people.

  In this case, the “holding portion” only needs to be able to partially hold the base end portion 21 b and the intermediate portion of the test pin 21, but the test lead 3 of this example holds the test pin 21 more reliably and In order to improve the insulating properties of the test pins 21 that do not need to be brought into contact with the object to be measured, a configuration is adopted in which the entirety of the test pins 21 except for the portion on the tip 21a side is covered and held by the holding portion 32. . The holding portion 32 is provided with a guide groove 32a as shown in FIGS. The guide groove 32a is formed in a straight line along the longitudinal direction (the direction of arrows A1 and A2) of the test pin 21 in the holding state, and is combined with the aforementioned slit 31b formed in the grip portion 31. The movement of the knob 42 in the directions of the arrows A1 and A2 is allowed, and the rotation of the knob 42 with respect to the grip 22 is restricted.

  The pin cover 23 is an example of a “pin cover”, and as shown in FIGS. 2 to 4 and 6, a cover body 41 (an example of the “cover body”) formed in a tubular shape through which the test pin 21 can be inserted. And a knob 42 (an example of a “knob”) formed separately from the cover main body 41 and fitted to the cover main body 41. Although two knobs 42 are shown in FIG. 4 to show the shape of the front surface and the shape of the back surface of the knob 42, only one knob 42 is fitted to the cover main body 41.

  In this case, in the test lead 3 of this example, both the cover main body 41 and the knob 42 are respectively formed of an insulating material such as polycarbonate or ABS (an example of a “second insulating material”), but different materials are used. The cover main body 41 and the knob 42 can also be formed by using. In the test lead 3 of this example, the cover body 41 and the knob 42 are formed of the same insulating material as the grip 22, but either or both of the cover body 41 and the knob 42 are made of a material different from the grip 22. Can also be formed.

  As shown in FIG. 6, the cover main body 41 has a cylindrical shape whose outer diameter is smaller than the inner diameter of the grip portion 31 of the grip 22 and whose inner diameter is larger than the outer diameter of the holding portion 32 of the grip 22. Is formed. In this case, one end of the cover body 41 (the end protruding from the grip 22) is reduced in diameter so that its inner diameter is slightly larger than the outer diameter of the test pin 21. As shown in FIGS. 4 and 6, fitting holes 41 a and 41 b for fitting the knob 42 are formed in the cover main body 41.

  The knob 42 is a slide operation knob that slides the pin cover 23 with respect to the test pin 21 and the grip 22, and is formed in a flat plate having a width that can be fitted into the slit 31 b of the grip portion 31 of the grip 22. On the back surface, projections 42a and 42b are provided so as to be inserted into the fitting holes 41a and 41b of the cover body 41.

  The pin cover 23 has a position (an example of a “first position”) where the exposed length of the distal end portion 21a of the test pin 21 from the pin cover 23 has a length L1 (see FIGS. 2 and 6, left diagram). And a position where the exposed length of the tip 21a of the test pin 21 from the pin cover 23 is a length L2 shorter than the length L1 (see FIG. 3 and the right drawing of FIG. 6) (an example of a “second position”). The test pin is slidably disposed between the grip portion 31 of the grip 22 and the test pin.

  In this case, the above-described length L1 is an example of a “predetermined first length”. In the test lead 3 of this example, the length L1 = The slidable range of the pin cover 23 is defined so as to be about 18.5 mm. The length L2 is an example of a “predetermined second length”. In the test lead 3 of the present example, the length L2 = 3 according to the definition of “measurement category: CAT III”. The slidable range of the pin cover 23 is defined to be about 0.5 mm.

  In the test lead 3 of this example, as shown in FIG. 6, when the knob 42 is fitted to the cover main body 41, the heads of the projections 42a and 42b through which the fitting holes 41a and 41b are inserted. The lengths of the projections 42a and 42b are defined such that the (tip) is fitted into the above-described guide groove 32a provided in the holding portion 32 located inside the cover main body 41.

  Further, as shown in FIG. 5, in the test lead 3 of the present example, when the pin cover 23 is slid to the “first position”, the head (tip) of the protrusion 42 a of the knob 42 of the pin cover 23 is moved. The first and second concave portions 33a and 33a for restricting the slide of the pin cover 23 with respect to the test pin 21 and the grip 22 by causing the first cover portion to function as the "first slide restricting convex portion". For example) is provided on one end side of the guide groove 32a. In this case, in the test lead 3 of the present example, convex portions 33c, 33c protruding in the groove width direction are formed at one end side of the guide groove 32a, and concave portions 33a, 33a with which the protrusions 42a can be formed are formed. I have.

  Furthermore, in the test lead 3 of this example, when the pin cover 23 is slid to the “second position”, the head (tip) of the protrusion 42 b of the knob 42 is moved to the “second slide restricting protrusion”. The recesses 33b, 33b (an example of a “second slide regulating recess”) for restricting the slide of the pin cover 23 with respect to the test pin 21 and the grip 22 by functioning and fitting as a “portion” are formed in the guide groove 32a. It is provided on the other end side. In this case, in the test lead 3 of the present example, convex portions 33c, 33c protruding in the groove width direction are formed on the other end side of the guide groove 32a, and concave portions 33b, 33b with which the protrusion 42b can be formed. ing.

  Further, in the test lead 3 of the present example, as shown in FIG. 7, the grip portion 31 of the grip 22 has a "first length that can specify that the exposed length of the test pin from the pin cover is the first length". And a category display 34b, which is an example of "a second display that can specify that the exposed length of the test pin from the pin cover is the second length". Is provided. Specifically, as shown in the upper diagram in FIG. 3, when the pin cover 23 is slid to the “first position”, the grip portion 31 is moved to a position adjacent to the knob 42 in the circumferential direction. A category display 34a of "CAT II" is provided. When the pin cover 23 is slid to the “second position” as shown in the lower diagram in FIG. 11, the “CAT III” is positioned at a position adjacent to the knob 42 in the gripping portion 31 in the circumferential direction. A category display 34b is provided.

  As described above, the signal cable 24 has one end electrically connected to the base end 21b of the test pin 21 and the other end electrically connected to the measurement circuit in the casing 11 of the measurement apparatus main body 2. You.

  Next, a procedure of a measuring operation using the measuring device 1 will be described with reference to the accompanying drawings.

  When the measuring operation using the measuring device 1 is started, first, the exposure length of the test pins 21 on the test leads 3 is changed according to the measurement category to which the measuring object belongs. Note that there is no regulation on the exposure length of the test pin 21 at the time of a measurement operation on a measurement object belonging to “measurement category: CATI” or when the assumed maximum voltage value is a very small value. The user may determine whether to perform the operation with the exposure length of the length L1 or to perform the operation with the exposure length of the length L2. Further, the user may want to perform the operation in a state where the exposed length of the test pin 21 is the length L2 during the measurement operation on the measurement object belonging to the “measurement category: CAT II”. At this time, the knob 42 is operated so that the exposed length of the test pin 21 becomes the length L2 as described later.

  On the other hand, when performing a measurement work on a measurement object belonging to “measurement category: CATI” or a measurement object belonging to “measurement category: CATII”, when it is desired to perform the operation with the test pin 21 sufficiently exposed, The exposure length is length L1. Specifically, when the test pins 21 are sufficiently exposed in a state where the exposed length of the test pins 21 is shorter than the length L1 (for example, in a state where the exposed length is the length L2), as an example, Then, the knob 42 is operated in the direction of arrow A1 with the thumb of the hand gripping the grip 22 (grip portion 31) of the test lead 3.

  At this time, according to the guide of the slit 31b formed in the grip portion 31 of the grip 22 and the guide groove 32a formed in the holding portion 32, the knob 42 is linearly moved in the direction of arrow A1 along the longitudinal direction of the test pin 21. The cover body 41 (the entire pin cover 23) on which the knob 42 is fitted is linearly slid in the direction of the arrow A <b> 1 with respect to the grip 22. As a result, the pin cover 23 is positioned at the “first position”, and the test from the pin cover 23 (the cover body 41) is performed as shown in FIGS. The exposed length of the pin 21 becomes the length L1.

  In the state where the pin cover 23 is located at the “first position”, as shown in the upper diagram of FIG. 7, the category display 34a written on the grip portion 31 of the grip 22, the knob 42 of the pin cover 23, and Are in the circumferential direction of the grip 22, that is, the category display 34 a is pointed to by the knob 42. Therefore, the user who sees the category display 34a indicated by the knob 42 knows that the exposed length of the test pin 21 is a length that satisfies the definition of “measurement category: CAT II”.

  In the state where the pin cover 23 is located at the “first position”, as shown in the left diagram of FIG. 6, the protrusions 42 a of the knob 42 are engaged with the recesses 33 a and 33 a of the guide groove 32 a in the holding portion 32 of the grip 22. It will be in the fitted state. As a result, the movement of the knob 42 with respect to the holding portion 32, that is, the movement of the pin cover 23 with respect to the grip 22 and the test pin 21 is limited. As a result, the finger (the thumb in the above example) operating the knob 42 is moved from the knob 42. Even if it is released, the state where the pin cover 23 is located at the “first position”, that is, the state where the exposed length of the test pin 21 is the length L1 is maintained.

  The operation of changing the exposure length of the test pins 21 may be performed separately for the two test leads 3 and 3. However, in the test lead 3 of the present example, the test leads 3 ( By operating the knob 42 with the thumb of the hand gripping the grip portion 31) of the grip 22, the pin cover 23 can be slid with respect to the test pin 21 and the grip 22. By holding the test leads 21 with different hands, the exposure length of the test pin 21 can be simultaneously changed for both test leads 3.

  Thereafter, the user operates the operation unit 12 of the measuring device main body 2 to select a desired measurement mode, and then brings the test pins 21 and 21 of the test leads 3 and 3 into contact with the measurement target, thereby setting the test pins 21 and The electric parameters measured via 21 are displayed on the display unit 13. This completes the measurement work on the measurement object belonging to “measurement category: CATI” and the measurement object belonging to “measurement category: CATII”.

  On the other hand, the exposure length of the test pin 21 is measured at the time of the measurement operation of the measurement object belonging to the measurement object belonging to the “measurement category: CATIII” or at the time of the measurement operation of the measurement object belonging to the “measurement category: CATII” or the measurement category: CATI Is to be shortened, the exposed length of the test pin 21 is set to the length L2. Specifically, for example, in a state in which the exposed length of the test pin 21 is longer than the length L2 (for example, a state in which the exposed length is the length L1), the measurement object belonging to the “measurement category: CATIII” For example, when performing a measurement operation on a measurement target belonging to the test lead 3, the knob 42 is operated in the direction of the arrow A2 with the thumb of the hand gripping the grip 22 (the grip portion 31) of the test lead 3.

  At this time, the knob 42 is linearly moved in the direction of arrow A2 along the longitudinal direction of the test pin 21 according to the guide of the slit 31b formed in the grip portion 31 of the grip 22 and the guide groove 32a formed in the holding portion 32. The cover main body 41 (the entire pin cover 23) on which the knob 42 is fitted is slid linearly in the direction of the arrow A2 with respect to the grip 22. As a result, the pin cover 23 is positioned at the “second position”, and the test pins from the pin cover 23 (cover main body 41) as shown in FIGS. The exposed length of 21 is in the state of length L2.

  In the state where the pin cover 23 is located at the “second position”, as shown in the lower diagram of FIG. 7, the category display 34b written on the grip portion 31 of the grip 22 and the knob 42 of the pin cover 23 The state is the same in the circumferential direction of the grip 22, that is, the state in which the category display 34b is pointed by the knob 42. Therefore, the user who sees the category display 34b indicated by the knob 42 understands that the exposed length of the test pin 21 is a length that satisfies the definition of "measurement category: CAT III".

  In the state where the pin cover 23 is located at the “second position”, as shown in the right diagram of FIG. 6, the protrusion 42 b of the knob 42 is inserted into the concave portions 33 b and 33 b of the guide groove 32 a of the holding portion 32 of the grip 22. It will be in the fitted state. As a result, the movement of the knob 42 with respect to the holding portion 32, that is, the movement of the pin cover 23 with respect to the grip 22 and the test pin 21 is limited. As a result, the finger (the thumb in the above example) operating the knob 42 is moved from the knob 42. Even if it is released, the state where the pin cover 23 is located at the "second position", that is, the state where the exposed length of the test pin 21 is the length L2 is maintained.

  In the same manner as in the above-mentioned "operation for setting the exposed length of the test pin 21 to the length L1", the "operation for setting the exposed length of the test pin 21 to the length L2" is also used. The user may arbitrarily select whether the test is performed separately for the test leads 3 or the test leads 3 and 3 simultaneously. Thereafter, the user operates the operation unit 12 of the measuring device main body 2 to select a desired measurement mode, and then brings the test pins 21 and 21 of the test leads 3 and 3 into contact with the measurement target, thereby setting the test pins 21 and The electric parameters measured via 21 are displayed on the display unit 13. This completes the measurement work for the measurement object belonging to “measurement category: CAT III”.

  As described above, in the test lead 3, the cover main body 41 in the pin cover 23 including the cylindrical cover main body 41 through which the test pin 21 can be inserted and the knob 42 for sliding the test pin 21 and the grip 22. Reference numeral 41 denotes a "first position" where the exposed length of the distal end 21a of the test pin 21 from the pin cover 23 is the length L1, and the exposed length of the distal end 21a of the test pin 21 from the pin cover 23 is the length. It is slidably disposed between the grip portion 31 of the grip 22 and the test pin 21 at a “second position” having a length L2 shorter than L1 and allows the knob 42 to move in the longitudinal direction. In addition, a slit 31 b that regulates the rotation of the knob 42 with respect to the grip 22 is provided in the grip portion 31 of the grip 22. In addition, the measuring device 1 includes the test lead 3 described above and a measuring device main body 2 that can execute an electrical measurement process via the test lead 3.

  Therefore, according to the test lead 3 and the measuring device 1, even if a person who does not know the operation method of the test lead 3, the existence of the slit 31b and the knob 42 can be surely and easily recognized. By performing the above operation, it is possible to reliably and easily recognize that the pin cover 23 slides with respect to the test pin 21 and the grip 22 to change the exposure length of the test pin 21. Further, when the exposure length of the test pin 21 is to be set to the length L1, that is, when the pin cover 23 is to be slid in a direction to retract the test pin 21 and the grip 22, the knob 42 is operated in that direction. When the pin cover 23 is positioned at the "first position" by a simple operation, the exposed length of the test pin 21 can be set to the length L1, and when the exposed length of the test pin 21 is set to the length L2, When the user wants to slide the pin cover 23 forward with respect to the test pin 21 and the grip 22, the pin cover 23 is moved to the “second position” by a very simple operation of operating the knob 42 in that direction. Thus, the exposed length of the test pin 21 can be set to the length L2. It can be reliably and easily changed. Further, since there is no possibility of erroneous operation of the knob 42, it is preferable that the grip 22 (slit 31b) and the pin cover 23 (knob 42) be damaged by an operation for changing the exposure length of the test pin 21. Can be avoided. In the measurement operation using the test lead 3, the exposed length of the test pin 21 can be reduced without inadvertent sliding of the pin cover 23 only by gripping the grip portion 31 of the grip 22 without touching the knob 42. The intended length can be maintained.

  In the test lead 3, the knob 42 is formed separately from the cover main body 41 and is fitted to the cover main body 41. Therefore, according to the test lead 3 and the measuring device 1, when the knob 42 employs the pin cover 23 integrally formed with the cover main body 41, when the pin cover 23 is mounted on the test pin 21 and the grip 22, the knob 42 is not used. Since the grip 22 and the pin cover 23 need to be largely deformed when the 42 is inserted into the slit 31b, the grip 22 and the pin cover 23 may be damaged during manufacturing. It is necessary to form the knob 42 with a low height so that the knob 42 can be fitted into the slit 31b without being deformed, so that operation of the knob 42 may be difficult. On the other hand, the knob 42 is separate from the cover main body 41. The cover body 41 is attached to the test pin 21 and the grip 22 by adopting the configuration of By fitting the knob 42 to the cover main body 41 after wearing, even if the knob 42 having a sufficient height that can be operated reliably and easily is adopted, the situation in which the grip 22 and the pin cover 23 are damaged during manufacturing may occur. It can be avoided suitably.

  In the test lead 3, when the pin cover 23 is slid to the “first position” in the grip portion 31 of the grip 22, the pin cover of the test pin 21 is located at a position adjacent to the knob 42 in the circumferential direction. A category display 34a that can specify that the exposure length from the length 23 is the length L1 is provided, and when the pin cover 23 is slid to the “second position” in the grip portion 31 of the grip 22. A category display 34b is provided at a position adjacent to the knob 42 in the circumferential direction so as to specify that the exposed length of the test pin 21 from the pin cover 23 is the length L2. Therefore, according to the test lead 3 and the measuring device 1, it is possible to specify the length of the exposed portion of the metal portion such as the test pin 21 with a very simple structure, and to use the test pin 3 for example. Even when the measurement is performed by inserting the test pin 21 into the hole, that is, even when the test pin 21 is difficult to see visually, whether the exposed length of the test pin 21 is the length L1 or the length L2. Can be reliably and easily recognized.

  In the test lead 3, concave portions 33 a, 33 a that regulate the slide of the pin cover 23 slid to the “first position” are formed in the grip 22 and are slid to the “first position”. The pin cover 23 (knob 42) is formed with a projection 42a for restricting the slide of the pin cover 23. Therefore, according to the test lead 3 and the measuring device 1, even if the finger is released from the knob 42 after the operation of sliding the pin cover 23 to the “first position” by operating the knob 42, the pin cover 23 is Since the slide is not inadvertently slid with respect to the grip 22, the state in which the exposed length of the test pin 21 is the length L1 can be suitably maintained, and the measurement operation can be performed safely.

  In the test lead 3, concave portions 33 b, 33 b that regulate the slide of the pin cover 23 slid to the “second position” are formed in the grip 22 and are slid to the “second position”. A protrusion 42b for restricting the slide of the pin cover 23 is formed on the pin cover 23 (knob 42). Therefore, according to the test lead 3 and the measuring device 1, even when the finger is released from the knob 42 after the operation of sliding the pin cover 23 to the “second position” by operating the knob 42, the pin cover 23 Since the slide is not unintentionally slid on the grip 22, the state where the exposed length of the test pin 21 is the length L2 is preferably maintained, and the measurement operation can be performed safely.

  Note that the configurations of the “test lead” and the “measuring device” are not limited to the above examples of the configuration of the test lead 3 and the measuring device 1.

  For example, the test lead 3 including the pin cover 23 in which the cover body 41 and the knob 42 are integrated by fitting the knob 42 formed separately from the cover body 41 to the cover body 41 has been described as an example. However, it is also possible to provide a “pin cover” in which a portion corresponding to the cover main body 41 and a portion corresponding to the knob 42 in the pin cover 23 are integrally formed (not shown). When such a configuration is adopted, a portion corresponding to the knob 42 is formed with a low profile, or a “grip” is formed of a material that can be easily deformed, so that the “test lead” is manufactured at the time of manufacturing. The situation where the "grip" or the "pin cover" is damaged can be avoided.

  Also, instead of (or in addition to) such a configuration for restricting the slide of the pin cover 23 with respect to the grip 22 in the test lead 3, for example, a test lead 3A (“test lead”) shown in FIG. As another example, a protrusion 35a functioning as a "first slide restricting projection" is formed in a slit 31c (another example of the "knob guide") of the grip 22A (another example of the "grip"). , 35a, and projections 35b, 35b functioning as "second slide regulating protrusions", and the knob 42 functioning as "first slide regulating recesses" and "second slide regulating recesses". The recess 43 is provided, and the projection 35a, 35a is engaged with the recess 43 as shown by the solid line in FIG. The slide of the cover 23 is restricted, and the protrusions 35b, 35b are engaged with the recesses 43 as shown by the broken lines in the figure, so that the slide of the pin cover 23 with respect to the grip 22 from the "second position". A regulation configuration may be employed.

  Note that, in the test lead 3A shown in the figure and the test leads 3B and 3C shown in FIGS. 9 and 10 to be referred later, the components having the same functions as those of the above-described test lead 3 are denoted by the same reference numerals and overlap. Description is omitted. In FIG. 8, the illustration of the category displays 34a and 34b provided on the grip portion 31 is omitted. In this case, in the above-described test lead 3A, a configuration is adopted in which the concave portion 43 is also used as a “first slide restricting concave portion” and a “second slide restricting concave portion”. The knob 42 may be provided with a "first slide restricting recess" in which the protrusions 35a and 35a engage and a "second slide restricting recess" in which the protrusions 35b and 35b engage. (Not shown).

  Further, a configuration including a “first slide restricting convex portion” and a “first slide restricting concave portion” and not having a “second slide restricting convex portion” and a “second slide restricting concave portion” ( A configuration in which the sliding of the “pin cover” from the “second position” is not restricted), and a “second slide restricting convex portion” and a “second slide restricting concave portion” are provided to “the first slide restrictive portion”. A configuration that does not include the “projecting portion” and the “first slide regulating concave portion” (a configuration that does not limit the sliding of the “pin cover” from the “first position”) can be adopted (not shown).

  Further, the “first slide restricting convex portion” and “first slide restricting concave portion”, the “second slide restricting convex portion” and the “second slide restricting concave portion” are not provided, and the “first slide restricting concave portion” is not provided. The force required to slide the “pin cover” without limiting both the sliding of the “pin cover” from the “position” and the sliding of the “pin cover” from the “second position” is “first”. A "pin cover" is arranged between the "grip" of the "grip" and the "test pin" so as to be constant between the "position" and the "second position" to form a "test lead". (Not shown). According to the “test lead” having such a configuration and the “measuring device” including such a “test lead”, for example, the exposed length of the “test pin” is the “first length”. For example, when the measurement work on the measurement target of the power measurement category and the measurement work on the measurement object of the measurement category for which the exposure length of the “test pin” should be the “second length” are alternately performed in a short time. In addition, since the “pin cover” can be smoothly slid with respect to the “test pin” and the “grip”, each measurement process can be performed quickly.

  Furthermore, like the test lead 3B (still another example of the “test lead”) shown in FIG. 9, the pin cover 23 is oriented from the “first position” to the “second position” (the direction of the arrow A2). It is also possible to adopt a configuration in which a coil spring 25 (an example of a “spring”) biased along with the pin cover 23 is housed in the grip portion 31 of the grip 22B (another example of the “grip”).

  According to such a test lead 3 and the measuring device 1 provided with such a test lead 3, the pin cover 23 can be moved by the biasing force of the coil spring 25 without operating the knob 42 and the like. The test pin 21 is slid with respect to the second position (the state shown in the left diagram in FIG. 3), and the exposed length of the test pin 21 is a length at which the possibility of an electric shock accident or a short circuit accident is low. In the state of L2, even if the user forgets to slide the pin cover 23 during the measurement operation to be performed in the state where the exposure length is the length L2, the operation can be performed in a sufficiently safe state. Further, for example, when the test pin 21 is inserted into the outlet (the insertion hole of the blade) to perform the measurement operation, the operation of inserting the test pin 21 into the outlet causes the pin cover 23 to resist the urging force of the coil spring 25. As a result, the test pin 21 can be slid with respect to the test pin 21 and the grip 22, so that the test pin 21 can be easily brought into contact with a measurement object (a contact fitting or the like) in the outlet.

  In the test lead 3B, as an example, the “first slide regulating protrusion” and the “first slide regulating concave”, the “second slide regulating convex”, and the “second slide regulating A configuration is adopted in which both the sliding of the “pin cover” from the “first position” and the sliding of the “pin cover” from the “second position” are not limited without providing the “recess recess”. Instead of such a configuration, a “first slide regulating convex portion” and a “first slide regulating concave portion” are provided to restrict the sliding of the “pin cover” from the “first position”. Thereby, the state where the pin cover 23 is located at the “first position” can be suitably maintained at the time of a measurement operation to be performed in a state where the exposed length of the test pin 21 is the length L1. In addition, by providing a “second slide restricting convex portion” and a “second slide restricting concave portion” to restrict the slide of the “pin cover” from the “second position”, the exposure of the test pin 21 is reduced. At the time of the measurement operation to be performed in the state where the length is the length L2, it is possible to preferably avoid a situation in which the pin cover 23 unintentionally slides from the “second position” to increase the exposed length of the test pin 21. .

  Further, test leads 3, 3A, 3B having a configuration in which pin cover 23 is slid with respect to test pin 21 and grip 22 between "first position" and "second position" will be described as an example. However, instead of such a configuration, as shown in a test lead 3C (a further example of a “test lead”) shown in FIG. 10, the distal end 21a of the test pin 21 has a pin cover 23C (a “pin cover”). The gripping portion 31 of the grip 22C (still another example of the “grip”) and the test are slidable to a “third position” where the tip portion 21a is housed in the inside and the tip portion 21a is not exposed from the pin cover 23C. A pin cover 23C can be provided between the pins 21.

  In this case, in the test lead 3C, the state where the pin cover 23C is located at the “first position” (the state shown in the upper drawing in FIG. 3) and the state where the pin cover 23C is located at the “second position” (see FIG. , And the pin cover 23C is slidable with respect to the test pin 21 and the grip 22C so that the pin cover 23C is located at the "third position" (the state shown in the lower diagram in FIG. 3). It is configured. Specifically, in the test lead 3C, as an example, the slit 31d (still another example of the “knob guide portion”) for guiding the knob 42 is formed longer than the slit 31b of the test lead 3 or the like. By operating the knob 42 in the direction of arrow A2 from a state where the pin cover 23C is formed longer than the pin cover 23 such as the test lead 3 and the pin cover 23 is located at the "second position". The pin cover 23C is slid to the “third position”, so that the tip 21a of the test pin 21 is housed in the pin cover 23C.

  According to the test lead 3C having such a configuration and the “measuring device” including the test lead 3C, when the test lead 3C is not used, the pin cover 23C is slid to the “third position” so that the inside of the pin cover 23C is When the test pins 21 are housed in the test pins 21, the test pins 21 can be suitably prevented from being damaged or bent, and, for example, the test leads 3 </ b> C (the test leads 3 </ b> C When the “measurement device” provided is accommodated, the tip 21a of the test pin 21 does not catch on a bag or a pocket, so that damage to the bag or the pocket can be suitably avoided.

DESCRIPTION OF SYMBOLS 1 Measuring device 2 Measuring device main body 3, 3A-3C Test lead 21 Test pin 21a Tip 21b Base end 22, 22A-22C Grip 23, 23C Pin cover 24 Signal cable 25 Coil spring 31 Grip 31a Flange 31b-31d Slit 32 Holding part 32a, 32b Guide groove 33a, 33b, 43 Concave part 33c Convex part 34a, 34b Category indication 35a, 35b, 42a, 42b Projection 41 Cover body 41a, 41b Fitting hole 42 Knob L1, L2 Length

Claims (9)

A test pin formed of a conductive material;
A cylindrical gripping portion capable of gripping an outer peripheral portion, and a grip in which a holding portion for holding the test pin in a state where a tip portion protrudes from a tube tip of the gripping portion is integrally formed of a first insulating material;
A pin cover formed of a second insulating material into a cylindrical shape through which the test pin can be inserted,
The pin cover has a knob for sliding operation with respect to the test pin and the grip, and a first position at which the exposed length of the test pin from the pin cover is a first length that is defined in advance. The grip of the grip is slidable between a second position where the exposed length of the test pin from the pin cover is shorter than the first length and has a second predetermined length. Unit and a cover body disposed between the test pins,
The grip is formed in a long hole shape along the longitudinal direction of the test pin, the knob is fitted therein, the knob is allowed to move along the longitudinal direction, and the knob of the knob is gripped. A test lead provided with a knob guide for restricting rotation with respect to.   The test lead according to claim 1, wherein the knob is formed separately from the cover main body and is fitted to the cover main body.   The grip portion of the grip has an exposed length of the test pin from the pin cover at a position adjacent to the knob in a circumferential direction when the pin cover is slid to the first position. A first indicator is provided for identifying that the knob has the first length, and is located at a position circumferentially adjacent to the knob when the pin cover is slid to the second position. 3. The test lead according to claim 1, wherein a second display is provided that can specify that an exposed length of the test pin from the pin cover is the second length. 4.   One of a first slide restricting convex portion and a first slide restricting concave portion for restricting the slide of the pin cover slid to the first position is formed on the grip, and the first slide restricting concave portion is formed on the grip. The test lead according to any one of claims 1 to 3, wherein the other of the slide restricting convex portion and the first slide restricting concave portion is formed on the pin cover.   One of a second slide restricting convex portion and a second slide restricting concave portion for restricting the slide of the pin cover slid to the second position is formed on the grip, and the second slide restrictive concave portion is formed on the grip. The test lead according to any one of claims 1 to 4, wherein the other of the slide restricting convex portion and the second slide restricting concave portion is formed on the pin cover.   The pin cover is disposed between the grip portion of the grip and the test pin such that a force required to slide the pin cover is constant between the first position and the second position. The test lead according to claim 1, wherein the test lead is provided.   6. The spring according to claim 1, wherein a spring for urging the pin cover along the direction from the first position toward the second position is housed in the grip portion of the grip together with the pin cover. Test lead described.   The pin cover is configured such that the tip of the test pin is housed in the pin cover and the tip is slidable to a third position where the tip is not exposed from the pin cover. The test lead according to any one of claims 1 to 7, which is provided between test pins.   A measurement device comprising: the test lead according to claim 1; and a measurement device main body capable of executing an electrical measurement process via the test lead.

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