JP2019537482A5 - - Google Patents

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Publication number
JP2019537482A5
JP2019537482A5 JP2019525869A JP2019525869A JP2019537482A5 JP 2019537482 A5 JP2019537482 A5 JP 2019537482A5 JP 2019525869 A JP2019525869 A JP 2019525869A JP 2019525869 A JP2019525869 A JP 2019525869A JP 2019537482 A5 JP2019537482 A5 JP 2019537482A5
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JP
Japan
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data
ray image
image data
attenuated
basic
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Ceased
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JP2019525869A
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English (en)
Japanese (ja)
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JP2019537482A (ja
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Priority claimed from PCT/EP2017/078709 external-priority patent/WO2018091344A1/en
Publication of JP2019537482A publication Critical patent/JP2019537482A/ja
Publication of JP2019537482A5 publication Critical patent/JP2019537482A5/ja
Ceased legal-status Critical Current

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JP2019525869A 2016-11-16 2017-11-09 位相コントラスト像形成データから多エネルギーデータを生成するための装置 Ceased JP2019537482A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP16199050 2016-11-16
EP16199050.2 2016-11-16
PCT/EP2017/078709 WO2018091344A1 (en) 2016-11-16 2017-11-09 Apparatus for generating multi energy data from phase contrast imaging data

Publications (2)

Publication Number Publication Date
JP2019537482A JP2019537482A (ja) 2019-12-26
JP2019537482A5 true JP2019537482A5 (enExample) 2020-12-17

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JP2019525869A Ceased JP2019537482A (ja) 2016-11-16 2017-11-09 位相コントラスト像形成データから多エネルギーデータを生成するための装置

Country Status (5)

Country Link
US (1) US11234663B2 (enExample)
EP (1) EP3541285B1 (enExample)
JP (1) JP2019537482A (enExample)
CN (1) CN109982640A (enExample)
WO (1) WO2018091344A1 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2020103571A (ja) * 2018-12-27 2020-07-09 キヤノンメディカルシステムズ株式会社 医用処理装置及びｘ線診断システム
EP3832690A1 (en) * 2019-12-05 2021-06-09 Koninklijke Philips N.V. Estimation of full-field scattering for dax imaging
EP3845891B1 (en) * 2019-12-30 2022-02-09 Xenocs SAS X-ray scattering apparatus
US11389124B2 (en) * 2020-02-12 2022-07-19 General Electric Company X-ray phase contrast detector

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SE526838C2 (sv) * 2003-11-27 2005-11-08 Xcounter Ab Undersökningsmetod och anordning för detektion av joniserande strålning
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EP1928318B1 (en) * 2005-09-22 2013-01-23 Philips Intellectual Property & Standards GmbH Quantitative material decomposition for spectral ct
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WO2010119019A1 (de) * 2009-04-17 2010-10-21 Siemens Aktiengesellschaft Detektoranordnung und röntgentomographiegerät zur durchführung von phasenkontrastmessungen sowie verfahren zur durchführung einer phasenkontrastmessung
CN101900695B (zh) * 2009-05-27 2011-11-23 清华大学 伪双能欠采样物质识别系统和方法
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JP6150940B2 (ja) * 2013-07-30 2017-06-21 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 位相コントラストｃｔを使うことによる単色減衰コントラスト画像生成
WO2015026766A1 (en) * 2013-08-19 2015-02-26 University Of Houston System Single step differential phase contrast x-ray imaging
US9613441B2 (en) 2013-09-26 2017-04-04 Koninklijke Philips N.V. Joint reconstruction of electron density images
US9155510B2 (en) * 2013-10-12 2015-10-13 Wisconsin Alumni Research Foundation Systems and methods for generating x-ray phase contrast images using a conventional x-ray imaging system
JP6524617B2 (ja) 2014-06-26 2019-06-05 ソニー株式会社 撮像装置および方法
EP3170148B1 (en) 2014-07-17 2018-10-31 Koninklijke Philips N.V. Iterative reconstruction method for spectral, phase-contrast imaging
CN105612557B (zh) 2014-08-15 2018-02-23 皇家飞利浦有限公司 用于对由至少两种成像方法记录的图像进行迭代重建的设备和方法
US9761024B1 (en) 2014-10-20 2017-09-12 Koninklijke Philips N.V. Start image for spectral image iterative reconstruction
JP6413950B2 (ja) * 2015-06-26 2018-10-31 コニカミノルタ株式会社 放射線撮影システム及び画像処理装置
US10332281B2 (en) * 2016-01-29 2019-06-25 Wisconsin Alumni Research Foundation System and method for denoising medical images by enforcing low rank spatial-temporal or spatial-spectral image matrices
US10466183B2 (en) * 2016-10-31 2019-11-05 Lawrence Livermore National Security, Llc System-independent characterization of materials using dual-energy computed tomography

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