JP2019537482A5 - - Google Patents

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Publication number
JP2019537482A5
JP2019537482A5 JP2019525869A JP2019525869A JP2019537482A5 JP 2019537482 A5 JP2019537482 A5 JP 2019537482A5 JP 2019525869 A JP2019525869 A JP 2019525869A JP 2019525869 A JP2019525869 A JP 2019525869A JP 2019537482 A5 JP2019537482 A5 JP 2019537482A5
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JP
Japan
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data
ray image
image data
attenuated
basic
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Ceased
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JP2019525869A
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English (en)
Japanese (ja)
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JP2019537482A (ja
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Priority claimed from PCT/EP2017/078709 external-priority patent/WO2018091344A1/en
Publication of JP2019537482A publication Critical patent/JP2019537482A/ja
Publication of JP2019537482A5 publication Critical patent/JP2019537482A5/ja
Ceased legal-status Critical Current

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JP2019525869A 2016-11-16 2017-11-09 位相コントラスト像形成データから多エネルギーデータを生成するための装置 Ceased JP2019537482A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP16199050 2016-11-16
EP16199050.2 2016-11-16
PCT/EP2017/078709 WO2018091344A1 (en) 2016-11-16 2017-11-09 Apparatus for generating multi energy data from phase contrast imaging data

Publications (2)

Publication Number Publication Date
JP2019537482A JP2019537482A (ja) 2019-12-26
JP2019537482A5 true JP2019537482A5 (enExample) 2020-12-17

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ID=57442446

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JP2019525869A Ceased JP2019537482A (ja) 2016-11-16 2017-11-09 位相コントラスト像形成データから多エネルギーデータを生成するための装置

Country Status (5)

Country Link
US (1) US11234663B2 (enExample)
EP (1) EP3541285B1 (enExample)
JP (1) JP2019537482A (enExample)
CN (1) CN109982640A (enExample)
WO (1) WO2018091344A1 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2020103571A (ja) * 2018-12-27 2020-07-09 キヤノンメディカルシステムズ株式会社 医用処理装置及びｘ線診断システム
EP3832690A1 (en) * 2019-12-05 2021-06-09 Koninklijke Philips N.V. Estimation of full-field scattering for dax imaging
EP3838154A1 (en) * 2019-12-16 2021-06-23 Koninklijke Philips N.V. Apparatus for generating photon counting spectral image data
EP3845891B1 (en) * 2019-12-30 2022-02-09 Xenocs SAS X-ray scattering apparatus
US11389124B2 (en) * 2020-02-12 2022-07-19 General Electric Company X-ray phase contrast detector

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* Cited by examiner, † Cited by third party
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SE526838C2 (sv) * 2003-11-27 2005-11-08 Xcounter Ab Undersökningsmetod och anordning för detektion av joniserande strålning
JP4759519B2 (ja) * 2003-12-17 2011-08-31 チェック キャップ リミテッド 管腔内ポリープの検出
EP1928318B1 (en) * 2005-09-22 2013-01-23 Philips Intellectual Property & Standards GmbH Quantitative material decomposition for spectral ct
US7734076B2 (en) * 2006-12-11 2010-06-08 General Electric Company Material decomposition image noise reduction
WO2010119019A1 (de) * 2009-04-17 2010-10-21 Siemens Aktiengesellschaft Detektoranordnung und röntgentomographiegerät zur durchführung von phasenkontrastmessungen sowie verfahren zur durchführung einer phasenkontrastmessung
CN101900695B (zh) * 2009-05-27 2011-11-23 清华大学 伪双能欠采样物质识别系统和方法
US9230354B2 (en) * 2010-10-29 2016-01-05 Mayo Foundation For Medical Education And Research System and method for molecular breast imaging energy spectrum imaging and analysis
RU2596805C2 (ru) * 2011-02-07 2016-09-10 Конинклейке Филипс Н.В. Формирование дифференциальных фазо-контрастных изображений с увеличенным динамическим диапазоном
US9547889B2 (en) * 2011-07-15 2017-01-17 Koninklijke Philips N.V. Image processing for spectral CT
JP6177800B2 (ja) * 2012-01-12 2017-08-09 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． Ｘ線システムにおける減衰画像データおよび位相画像データの生成
CN104066375B (zh) * 2012-01-24 2017-08-11 皇家飞利浦有限公司 多方向相衬x射线成像
JP6197790B2 (ja) * 2012-06-11 2017-09-20 コニカミノルタ株式会社 医用画像システム及び医用画像処理装置
DE102012211146A1 (de) * 2012-06-28 2014-01-02 Siemens Aktiengesellschaft Verfahren und Röntgensystem zur Erzeugung einer Phasenkontrastdarstellung
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WO2015014677A1 (en) 2013-07-30 2015-02-05 Koninklijke Philips N.V. Monochromatic attenuation contrast image generation by using phase contrast ct
WO2015026766A1 (en) * 2013-08-19 2015-02-26 University Of Houston System Single step differential phase contrast x-ray imaging
CN105580054B (zh) 2013-09-26 2019-10-01 皇家飞利浦有限公司 电子密度图像的联合重建
US9155510B2 (en) * 2013-10-12 2015-10-13 Wisconsin Alumni Research Foundation Systems and methods for generating x-ray phase contrast images using a conventional x-ray imaging system
JP6524617B2 (ja) 2014-06-26 2019-06-05 ソニー株式会社 撮像装置および方法
JP2017521167A (ja) * 2014-07-17 2017-08-03 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 信号処理システム、信号処理方法、コンピュータプログラム及び記憶媒体
US9761023B1 (en) 2014-08-15 2017-09-12 Koninklijke Philips N.V. Device and method for iterative reconstruction of images recorded by at least two imaging methods
CN107077748B (zh) 2014-10-20 2020-10-27 皇家飞利浦有限公司 针对谱图像迭代重建的开始图像
JP6413950B2 (ja) * 2015-06-26 2018-10-31 コニカミノルタ株式会社 放射線撮影システム及び画像処理装置
US10332281B2 (en) * 2016-01-29 2019-06-25 Wisconsin Alumni Research Foundation System and method for denoising medical images by enforcing low rank spatial-temporal or spatial-spectral image matrices
US10466183B2 (en) * 2016-10-31 2019-11-05 Lawrence Livermore National Security, Llc System-independent characterization of materials using dual-energy computed tomography

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