JP2019520565A5 - - Google Patents
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- JP2019520565A5 JP2019520565A5 JP2018563733A JP2018563733A JP2019520565A5 JP 2019520565 A5 JP2019520565 A5 JP 2019520565A5 JP 2018563733 A JP2018563733 A JP 2018563733A JP 2018563733 A JP2018563733 A JP 2018563733A JP 2019520565 A5 JP2019520565 A5 JP 2019520565A5
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- JP
- Japan
- Prior art keywords
- grating
- ray
- ray conversion
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- analysis
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 238000006243 chemical reaction Methods 0.000 claims 39
- 230000005855 radiation Effects 0.000 claims 10
- 238000003384 imaging method Methods 0.000 claims 5
- 238000006073 displacement reaction Methods 0.000 claims 3
- 239000000463 material Substances 0.000 claims 3
- 235000012431 wafers Nutrition 0.000 claims 3
- 238000000034 method Methods 0.000 claims 2
- 229910052727 yttrium Inorganic materials 0.000 claims 2
- -1 Eu3 + added Inorganic materials 0.000 claims 1
- 229910052688 Gadolinium Inorganic materials 0.000 claims 1
- BEJKBIUCSXGNBU-UHFFFAOYSA-N [Y].[Gd].[Lu] Chemical compound [Y].[Gd].[Lu] BEJKBIUCSXGNBU-UHFFFAOYSA-N 0.000 claims 1
- 229910052782 aluminium Inorganic materials 0.000 claims 1
- 229910052797 bismuth Inorganic materials 0.000 claims 1
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 claims 1
- 238000005530 etching Methods 0.000 claims 1
- 229940075613 gadolinium oxide Drugs 0.000 claims 1
- 229910001938 gadolinium oxide Inorganic materials 0.000 claims 1
- CMIHHWBVHJVIGI-UHFFFAOYSA-N gadolinium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[Gd+3].[Gd+3] CMIHHWBVHJVIGI-UHFFFAOYSA-N 0.000 claims 1
- 239000002223 garnet Substances 0.000 claims 1
- 150000002290 germanium Chemical class 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 claims 1
- 239000006104 solid solution Substances 0.000 claims 1
- 125000006850 spacer group Chemical group 0.000 claims 1
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical compound [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP16173558 | 2016-06-08 | ||
| EP16173558.4 | 2016-06-08 | ||
| PCT/EP2017/064048 WO2017212000A1 (en) | 2016-06-08 | 2017-06-08 | Analyzing grid for phase contrast imaging and/or dark-field imaging |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2019520565A JP2019520565A (ja) | 2019-07-18 |
| JP2019520565A5 true JP2019520565A5 (OSRAM) | 2019-08-29 |
| JP6731077B2 JP6731077B2 (ja) | 2020-07-29 |
Family
ID=56131347
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2018563733A Expired - Fee Related JP6731077B2 (ja) | 2016-06-08 | 2017-06-08 | 位相コントラスト撮像及び／又は暗視野撮像のための分析格子 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US10679762B2 (OSRAM) |
| EP (1) | EP3469600B1 (OSRAM) |
| JP (1) | JP6731077B2 (OSRAM) |
| CN (1) | CN109478440A (OSRAM) |
| WO (1) | WO2017212000A1 (OSRAM) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109964118A (zh) * | 2016-11-10 | 2019-07-02 | 皇家飞利浦有限公司 | 基于光栅的相位对比成像 |
| EP3382719A1 (en) * | 2017-03-27 | 2018-10-03 | Koninklijke Philips N.V. | Detector arrangement for an x-ray phase contrast system and method for x-ray contrast imaging |
| JP6984783B2 (ja) * | 2019-02-21 | 2021-12-22 | 株式会社島津製作所 | Ｘ線位相イメージング装置およびｘ線位相イメージング方法 |
| EP3799787A1 (en) * | 2019-10-01 | 2021-04-07 | Koninklijke Philips N.V. | Detector for a dark-field; phase-contrast and attenuation interferometric imaging system |
| US11389124B2 (en) | 2020-02-12 | 2022-07-19 | General Electric Company | X-ray phase contrast detector |
| WO2022030156A1 (ja) * | 2020-08-06 | 2022-02-10 | パナソニックＩｐマネジメント株式会社 | 電離放射線変換デバイス、電離放射線の検出方法、及び電離放射線変換デバイスの製造方法 |
| JP2023127001A (ja) * | 2020-08-06 | 2023-09-13 | パナソニックＩｐマネジメント株式会社 | 電離放射線変換デバイス、その製造方法、および電離放射線の検出方法 |
| CN119596405A (zh) * | 2024-12-20 | 2025-03-11 | 同方威视技术股份有限公司 | 辐射检查系统 |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5949850A (en) | 1997-06-19 | 1999-09-07 | Creatv Microtech, Inc. | Method and apparatus for making large area two-dimensional grids |
| SE513536C2 (sv) | 1999-01-21 | 2000-09-25 | Christer Froejdh | Arrangemang för en röntgenbildpunktsdetektoranordning samt anordning vid ett röntgenavbildningsarrangemang |
| JP2004151007A (ja) * | 2002-10-31 | 2004-05-27 | Toshiba Corp | 放射線検出器 |
| US20040251420A1 (en) * | 2003-06-14 | 2004-12-16 | Xiao-Dong Sun | X-ray detectors with a grid structured scintillators |
| FR2864252B1 (fr) | 2003-12-23 | 2006-04-07 | Jobin Yvon Sas | Reseau de diffraction a empilements multicouches alternes et son procede de fabrication et dispositifs spectroscopiques comportant ces reseaux |
| CN101413905B (zh) * | 2008-10-10 | 2011-03-16 | 深圳大学 | X射线微分干涉相衬成像系统 |
| RU2505840C2 (ru) | 2008-11-18 | 2014-01-27 | Конинклейке Филипс Электроникс Н.В. | Детектор спектральной визуализации |
| WO2010119019A1 (de) * | 2009-04-17 | 2010-10-21 | Siemens Aktiengesellschaft | Detektoranordnung und röntgentomographiegerät zur durchführung von phasenkontrastmessungen sowie verfahren zur durchführung einer phasenkontrastmessung |
| US8848863B2 (en) * | 2009-12-10 | 2014-09-30 | Koninklijke Philips N.V. | Non-parallel grating arrangement with on-the-fly phase stepping, X-ray system |
| EP2585817B1 (en) * | 2010-06-28 | 2020-01-22 | Paul Scherrer Institut | A method for x-ray phase contrast and dark-field imaging using an arrangement of gratings in planar geometry |
| RU2013126110A (ru) * | 2010-11-08 | 2014-12-20 | Конинклейке Филипс Электроникс Н.В. | Дифракционная решетка для получения фазоконтрастного изображения |
| JP2012130503A (ja) * | 2010-12-21 | 2012-07-12 | Fujifilm Corp | 放射線画像撮影用グリッド及びその製造方法、並びに放射線画像撮影システム |
| US9486175B2 (en) * | 2011-07-04 | 2016-11-08 | Koninklijke Philips N.V. | Phase contrast imaging apparatus |
| JP2014195481A (ja) * | 2011-07-27 | 2014-10-16 | 富士フイルム株式会社 | 放射線撮影装置 |
| US9717470B2 (en) * | 2012-08-20 | 2017-08-01 | Koninklijke Philips N.V. | Aligning source-grating-to-phase-grating distance for multiple order phase tuning in differential phase contrast imaging |
| DE102012224258A1 (de) | 2012-12-21 | 2014-06-26 | Siemens Aktiengesellschaft | Röntgenaufnahmesystem zur differentiellen Phasenkontrast-Bildgebung eines Untersuchungsobjekts mit Phase-Stepping sowie angiographisches Untersuchungsverfahren |
| AU2015350146A1 (en) * | 2014-11-19 | 2017-06-08 | The Regents Of The University Of California | Novel thallium doped sodium, cesium or lithium iodide scintillators |
-
2017
- 2017-06-08 JP JP2018563733A patent/JP6731077B2/ja not_active Expired - Fee Related
- 2017-06-08 WO PCT/EP2017/064048 patent/WO2017212000A1/en not_active Ceased
- 2017-06-08 US US16/307,675 patent/US10679762B2/en not_active Expired - Fee Related
- 2017-06-08 CN CN201780035137.2A patent/CN109478440A/zh active Pending
- 2017-06-08 EP EP17727925.4A patent/EP3469600B1/en active Active
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