JP2019508133A5 - - Google Patents

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Publication number
JP2019508133A5
JP2019508133A5 JP2018544160A JP2018544160A JP2019508133A5 JP 2019508133 A5 JP2019508133 A5 JP 2019508133A5 JP 2018544160 A JP2018544160 A JP 2018544160A JP 2018544160 A JP2018544160 A JP 2018544160A JP 2019508133 A5 JP2019508133 A5 JP 2019508133A5
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JP
Japan
Prior art keywords
pixel
radiation
storage nodes
ray
pixels
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JP2018544160A
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English (en)
Japanese (ja)
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JP6951353B2 (ja
JP2019508133A (ja
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Priority claimed from PCT/EP2017/053951 external-priority patent/WO2017144474A1/en
Publication of JP2019508133A publication Critical patent/JP2019508133A/ja
Publication of JP2019508133A5 publication Critical patent/JP2019508133A5/ja
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Publication of JP6951353B2 publication Critical patent/JP6951353B2/ja
Expired - Fee Related legal-status Critical Current
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JP2018544160A 2016-02-23 2017-02-21 Ｘ線撮像装置におけるクロス散乱を補償するためのｘ線検出器の駆動 Expired - Fee Related JP6951353B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP16156997.5 2016-02-23
EP16156997 2016-02-23
PCT/EP2017/053951 WO2017144474A1 (en) 2016-02-23 2017-02-21 Driving of an x-ray detector to compensate for cross scatter in an x-ray imaging apparatus

Publications (3)

Publication Number Publication Date
JP2019508133A JP2019508133A (ja) 2019-03-28
JP2019508133A5 true JP2019508133A5 (https=) 2020-04-02
JP6951353B2 JP6951353B2 (ja) 2021-10-20

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JP2018544160A Expired - Fee Related JP6951353B2 (ja) 2016-02-23 2017-02-21 Ｘ線撮像装置におけるクロス散乱を補償するためのｘ線検出器の駆動

Country Status (5)

Country Link
US (1) US10788595B2 (https=)
EP (1) EP3420722B1 (https=)
JP (1) JP6951353B2 (https=)
CN (1) CN109314754B (https=)
WO (1) WO2017144474A1 (https=)

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CN112218583B (zh) 2018-03-19 2025-02-21 森瑟实验室有限责任公司 X射线断层摄影术
JP7443331B2 (ja) * 2018-07-30 2024-03-05 センスラボ エルエルシー Ｘ線イメージング及び造影剤のための装置及び方法
CN111626278B (zh) * 2019-02-28 2024-04-16 京东方科技集团股份有限公司 纹路识别装置以及纹路识别装置的操作方法
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