CN103284734B - 一种校正辐射成像中散射影响的方法及装置 - Google Patents
一种校正辐射成像中散射影响的方法及装置 Download PDFInfo
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US11992356B2 (en) | 2018-08-31 | 2024-05-28 | Ibex Innovations Limited | X-ray imaging system |
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GB2535566A (en) * | 2014-10-04 | 2016-08-24 | Ibex Innovations Ltd | Improvements Relating to Scatter in X-Ray Apparatus and Methods of their use |
WO2017137792A1 (en) * | 2016-02-10 | 2017-08-17 | Eos Imaging | Method of radiography of an organ of a patient |
JP6951353B2 (ja) * | 2016-02-23 | 2021-10-20 | コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. | X線撮像装置におけるクロス散乱を補償するためのx線検出器の駆動 |
EP4125600A4 (en) * | 2020-04-20 | 2023-08-23 | Shanghai United Imaging Healthcare Co., Ltd. | IMAGING SYSTEMS AND METHODS |
CN114113173A (zh) * | 2021-11-18 | 2022-03-01 | 上海联影医疗科技股份有限公司 | 一种x射线设备、应用于x射线设备中的散射校正方法 |
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US11992356B2 (en) | 2018-08-31 | 2024-05-28 | Ibex Innovations Limited | X-ray imaging system |
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