JP2019169825A5 - - Google Patents
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- Publication number
- JP2019169825A5 JP2019169825A5 JP2018055446A JP2018055446A JP2019169825A5 JP 2019169825 A5 JP2019169825 A5 JP 2019169825A5 JP 2018055446 A JP2018055446 A JP 2018055446A JP 2018055446 A JP2018055446 A JP 2018055446A JP 2019169825 A5 JP2019169825 A5 JP 2019169825A5
- Authority
- JP
- Japan
- Prior art keywords
- gate
- semiconductor device
- data
- transistor
- storage unit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 239000004065 semiconductor Substances 0.000 claims 9
- 230000002123 temporal effect Effects 0.000 claims 5
- 230000032683 aging Effects 0.000 claims 4
- 238000006243 chemical reaction Methods 0.000 claims 1
- 238000013500 data storage Methods 0.000 claims 1
- 238000001514 detection method Methods 0.000 claims 1
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2018055446A JP2019169825A (ja) | 2018-03-23 | 2018-03-23 | 半導体装置及び電力変換装置 |
| US16/137,854 US20190296730A1 (en) | 2018-03-23 | 2018-09-21 | Semiconductor device and power convertor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2018055446A JP2019169825A (ja) | 2018-03-23 | 2018-03-23 | 半導体装置及び電力変換装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2019169825A JP2019169825A (ja) | 2019-10-03 |
| JP2019169825A5 true JP2019169825A5 (https=) | 2020-03-05 |
Family
ID=67985871
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2018055446A Abandoned JP2019169825A (ja) | 2018-03-23 | 2018-03-23 | 半導体装置及び電力変換装置 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US20190296730A1 (https=) |
| JP (1) | JP2019169825A (https=) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109804230B (zh) * | 2017-04-13 | 2021-06-04 | 富士电机株式会社 | 温度检测装置以及具备其的功率转换装置 |
| DE112020007545T5 (de) * | 2020-08-25 | 2023-06-15 | Mitsubishi Electric Corporation | Treiber-steuerungsschaltung für leistungshalbleiter-element, leistungshalbleiter-modul sowie stromrichter |
| JP7414700B2 (ja) | 2020-12-01 | 2024-01-16 | 株式会社東芝 | 半導体装置 |
| US12126253B2 (en) * | 2022-01-19 | 2024-10-22 | Dialog Semiconductor Inc. | In-circuit detection of early failure of power switch transistors in switching power converters |
| JP2025035370A (ja) | 2023-09-01 | 2025-03-13 | 株式会社東芝 | 駆動装置および半導体装置 |
| US20260074607A1 (en) * | 2024-09-06 | 2026-03-12 | Renesas Design (UK) Limited | Advanced Gate Driver for Improved EMI Performance During MOSFET Turn-on |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7035064B2 (en) * | 1998-05-29 | 2006-04-25 | Semikron Elektronik Gmbh | Method and circuit arrangement with adaptive overload protection for power switching devices |
| US9030054B2 (en) * | 2012-03-27 | 2015-05-12 | Raytheon Company | Adaptive gate drive control method and circuit for composite power switch |
-
2018
- 2018-03-23 JP JP2018055446A patent/JP2019169825A/ja not_active Abandoned
- 2018-09-21 US US16/137,854 patent/US20190296730A1/en not_active Abandoned
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