JP2018537149A5 - - Google Patents

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Publication number
JP2018537149A5
JP2018537149A5 JP2018520108A JP2018520108A JP2018537149A5 JP 2018537149 A5 JP2018537149 A5 JP 2018537149A5 JP 2018520108 A JP2018520108 A JP 2018520108A JP 2018520108 A JP2018520108 A JP 2018520108A JP 2018537149 A5 JP2018537149 A5 JP 2018537149A5
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JP
Japan
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radiation
ray
pulse signal
electrical pulse
amplitude
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JP2018520108A
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English (en)
Japanese (ja)
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JP6797909B2 (ja
JP2018537149A (ja
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Priority claimed from PCT/EP2016/074325 external-priority patent/WO2017067817A1/en
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Publication of JP2018537149A5 publication Critical patent/JP2018537149A5/ja
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JP2018520108A 2015-10-20 2016-10-11 直接変換x線検出器のための偏光補正 Active JP6797909B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP15190530.4 2015-10-20
EP15190530 2015-10-20
PCT/EP2016/074325 WO2017067817A1 (en) 2015-10-20 2016-10-11 Polarization correction for direct conversion x-ray detectors

Publications (3)

Publication Number Publication Date
JP2018537149A JP2018537149A (ja) 2018-12-20
JP2018537149A5 true JP2018537149A5 (enExample) 2019-11-21
JP6797909B2 JP6797909B2 (ja) 2020-12-09

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US (1) US10725188B2 (enExample)
EP (1) EP3365706B1 (enExample)
JP (1) JP6797909B2 (enExample)
CN (1) CN108139494B (enExample)
WO (1) WO2017067817A1 (enExample)

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US11076823B2 (en) * 2017-06-28 2021-08-03 Canon Medical Systems Corporation X-ray CT apparatus including a photon-counting detector and circuitry configured to set a control parameter corresponding to a position of each detecting element in the photon-counting detector
CN109211946B (zh) * 2018-08-29 2021-08-27 苏州瑞迈斯医疗科技有限公司 校正X-ray探测器中的探测通道的方法
US11071514B2 (en) * 2018-11-16 2021-07-27 Varex Imaging Corporation Imaging system with energy sensing and method for operation
CN111493904B (zh) * 2019-01-30 2023-03-10 群创光电股份有限公司 放射线感测装置
EP3756033B1 (en) 2019-05-13 2023-11-15 Varex Imaging Sweden AB Method of reading out data in a radiation detector, radiation detector and imaging apparatus
CN112859148B (zh) * 2019-09-26 2023-09-19 中国计量科学研究院 一种用于校准偏振度的非偏振射线源结构
IT202000011950A1 (it) * 2020-05-21 2021-11-21 Sacmi Metodo e dispositivo per ispezionare un oggetto
CN112346026B (zh) * 2020-10-21 2022-11-25 中国辐射防护研究院 一种测距传感器耐总剂量辐射性能测试系统及方法
EP4012460B1 (de) * 2020-12-08 2025-11-19 Siemens Healthineers AG Verfahren zum betrieb eines strahlungsdetektors sowie strahlungsdetektor

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EP0224351A1 (en) * 1985-11-22 1987-06-03 Mobil Oil Corporation A gamma-ray logging system
US7652258B2 (en) 2007-01-08 2010-01-26 Orbotech Medical Solutions Ltd. Method, apparatus, and system of reducing polarization in radiation detectors
US8159286B2 (en) * 2007-10-08 2012-04-17 General Electric Company System and method for time-to-voltage conversion with lock-out logic
EP2309927B1 (en) * 2008-08-04 2017-10-11 Koninklijke Philips N.V. Data acquisition for a radiation imaging system
US20100078558A1 (en) 2008-09-26 2010-04-01 Michael Prokesch Infra-red light stimulated cdZnTe spectroscopic semiconductor x-ray and gamma-ray radiation detector
JP2011085479A (ja) * 2009-10-15 2011-04-28 Tele Systems:Kk 光子計数型放射線検出器のキャリブレーション装置及びそのキャリブレーション方法
DE102010015422B4 (de) * 2010-04-19 2013-04-18 Siemens Aktiengesellschaft Röntgendetektor mit einer direkt konvertierenden Halbleiterschicht und Kalibrierverfahren für einen solchen Röntgendetektor
US9268046B2 (en) * 2011-07-12 2016-02-23 Koninklijke Philips N.V. Imaging system detector calibration
US9301378B2 (en) * 2011-10-19 2016-03-29 Koninklijke Philips N.V. Photon counting detector
EP2748594B1 (en) * 2011-10-26 2016-06-08 Koninklijke Philips N.V. Radiographic apparatus for detecting photons with offset correction
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JP6388608B2 (ja) 2013-03-01 2018-09-12 コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. 検出器、検出方法、投影データ生成システム、投影データ生成方法及びコンピュータプログラム
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