CN108139494B - 用于直接转换x射线检测器的极化校正 - Google Patents

用于直接转换x射线检测器的极化校正 Download PDF

Info

Publication number
CN108139494B
CN108139494B CN201680061282.3A CN201680061282A CN108139494B CN 108139494 B CN108139494 B CN 108139494B CN 201680061282 A CN201680061282 A CN 201680061282A CN 108139494 B CN108139494 B CN 108139494B
Authority
CN
China
Prior art keywords
radiation
ray
electrical pulse
detector
radiation detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201680061282.3A
Other languages
English (en)
Chinese (zh)
Other versions
CN108139494A (zh
Inventor
R·斯特德曼布克
E·罗塞尔
H·德尔
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Koninklijke Philips NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips NV filed Critical Koninklijke Philips NV
Publication of CN108139494A publication Critical patent/CN108139494A/zh
Application granted granted Critical
Publication of CN108139494B publication Critical patent/CN108139494B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T7/00Details of radiation-measuring instruments
    • G01T7/005Details of radiation-measuring instruments calibration techniques
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/24Measuring radiation intensity with semiconductor detectors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/24Measuring radiation intensity with semiconductor detectors
    • G01T1/247Detector read-out circuitry
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/42Arrangements for detecting radiation specially adapted for radiation diagnosis
    • A61B6/4208Arrangements for detecting radiation specially adapted for radiation diagnosis characterised by using a particular type of detector
    • A61B6/4241Arrangements for detecting radiation specially adapted for radiation diagnosis characterised by using a particular type of detector using energy resolving detectors, e.g. photon counting
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/58Testing, adjusting or calibrating thereof
    • A61B6/582Calibration
    • A61B6/585Calibration of detector units

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Measurement Of Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CN201680061282.3A 2015-10-20 2016-10-11 用于直接转换x射线检测器的极化校正 Active CN108139494B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP15190530 2015-10-20
EP15190530.4 2015-10-20
PCT/EP2016/074325 WO2017067817A1 (en) 2015-10-20 2016-10-11 Polarization correction for direct conversion x-ray detectors

Publications (2)

Publication Number Publication Date
CN108139494A CN108139494A (zh) 2018-06-08
CN108139494B true CN108139494B (zh) 2022-07-26

Family

ID=54337193

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201680061282.3A Active CN108139494B (zh) 2015-10-20 2016-10-11 用于直接转换x射线检测器的极化校正

Country Status (5)

Country Link
US (1) US10725188B2 (enExample)
EP (1) EP3365706B1 (enExample)
JP (1) JP6797909B2 (enExample)
CN (1) CN108139494B (enExample)
WO (1) WO2017067817A1 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11076823B2 (en) * 2017-06-28 2021-08-03 Canon Medical Systems Corporation X-ray CT apparatus including a photon-counting detector and circuitry configured to set a control parameter corresponding to a position of each detecting element in the photon-counting detector
CN109211946B (zh) * 2018-08-29 2021-08-27 苏州瑞迈斯医疗科技有限公司 校正X-ray探测器中的探测通道的方法
US11071514B2 (en) * 2018-11-16 2021-07-27 Varex Imaging Corporation Imaging system with energy sensing and method for operation
CN111493904B (zh) * 2019-01-30 2023-03-10 群创光电股份有限公司 放射线感测装置
EP3756033B1 (en) 2019-05-13 2023-11-15 Varex Imaging Sweden AB Method of reading out data in a radiation detector, radiation detector and imaging apparatus
CN112859147B (zh) * 2019-09-26 2023-09-22 中国计量科学研究院 一种用于形成校准偏振度的环境的校准系统
IT202000011950A1 (it) * 2020-05-21 2021-11-21 Sacmi Metodo e dispositivo per ispezionare un oggetto
CN112346026B (zh) * 2020-10-21 2022-11-25 中国辐射防护研究院 一种测距传感器耐总剂量辐射性能测试系统及方法
EP4012460B1 (de) * 2020-12-08 2025-11-19 Siemens Healthineers AG Verfahren zum betrieb eines strahlungsdetektors sowie strahlungsdetektor

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0224351A1 (en) * 1985-11-22 1987-06-03 Mobil Oil Corporation A gamma-ray logging system
CN102112054A (zh) * 2008-08-04 2011-06-29 皇家飞利浦电子股份有限公司 数据采集
WO2013174141A1 (zh) * 2012-05-25 2013-11-28 同方威视技术股份有限公司 一种用于探测器系统的增益稳定装置及其控制方法
CN103890610A (zh) * 2011-10-19 2014-06-25 皇家飞利浦有限公司 光子计数探测器
CN103998952A (zh) * 2011-12-19 2014-08-20 皇家飞利浦有限公司 X射线探测器

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7652258B2 (en) 2007-01-08 2010-01-26 Orbotech Medical Solutions Ltd. Method, apparatus, and system of reducing polarization in radiation detectors
US8159286B2 (en) * 2007-10-08 2012-04-17 General Electric Company System and method for time-to-voltage conversion with lock-out logic
US20100078558A1 (en) 2008-09-26 2010-04-01 Michael Prokesch Infra-red light stimulated cdZnTe spectroscopic semiconductor x-ray and gamma-ray radiation detector
JP2011085479A (ja) * 2009-10-15 2011-04-28 Tele Systems:Kk 光子計数型放射線検出器のキャリブレーション装置及びそのキャリブレーション方法
DE102010015422B4 (de) * 2010-04-19 2013-04-18 Siemens Aktiengesellschaft Röntgendetektor mit einer direkt konvertierenden Halbleiterschicht und Kalibrierverfahren für einen solchen Röntgendetektor
JP6114745B2 (ja) * 2011-07-12 2017-04-12 コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. 撮像システムの検出器の校正
CN103890571B (zh) * 2011-10-26 2017-07-14 皇家飞利浦有限公司 具有偏移校正的用于探测光子的放射探测装置
US8824635B2 (en) * 2011-10-27 2014-09-02 General Electric Company Detector modules for imaging systems and methods of manufacturing
BR112015010277A2 (pt) 2012-11-09 2017-07-11 Koninklijke Philips Nv detector de radiação; e método para fabricar um detector de radiação
JP6388608B2 (ja) 2013-03-01 2018-09-12 コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. 検出器、検出方法、投影データ生成システム、投影データ生成方法及びコンピュータプログラム
JP2014228464A (ja) * 2013-05-24 2014-12-08 株式会社日立製作所 放射線計測装置および放射線計測方法
WO2016091981A1 (en) 2014-12-11 2016-06-16 Koninklijke Philips N.V. X-ray detector, imaging apparatus and calibration method
CN108027447B (zh) 2015-09-18 2022-03-11 皇家飞利浦有限公司 光子计数x射线辐射探测系统中的光子计数的校正

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0224351A1 (en) * 1985-11-22 1987-06-03 Mobil Oil Corporation A gamma-ray logging system
CN102112054A (zh) * 2008-08-04 2011-06-29 皇家飞利浦电子股份有限公司 数据采集
CN103890610A (zh) * 2011-10-19 2014-06-25 皇家飞利浦有限公司 光子计数探测器
CN103998952A (zh) * 2011-12-19 2014-08-20 皇家飞利浦有限公司 X射线探测器
WO2013174141A1 (zh) * 2012-05-25 2013-11-28 同方威视技术股份有限公司 一种用于探测器系统的增益稳定装置及其控制方法

Also Published As

Publication number Publication date
WO2017067817A1 (en) 2017-04-27
EP3365706B1 (en) 2023-12-06
EP3365706A1 (en) 2018-08-29
JP6797909B2 (ja) 2020-12-09
JP2018537149A (ja) 2018-12-20
US10725188B2 (en) 2020-07-28
CN108139494A (zh) 2018-06-08
US20180284303A1 (en) 2018-10-04

Similar Documents

Publication Publication Date Title
CN108139494B (zh) 用于直接转换x射线检测器的极化校正
EP2751593B1 (en) X-ray detector
US7696483B2 (en) High DQE photon counting detector using statistical recovery of pile-up events
US9971047B2 (en) Photon-counting type X-ray CT apparatus
US9176238B2 (en) Detection device for detecting photons emitted by a radiation source
CN101080653B (zh) 一种x射线照相成像设备、方法及x射线断层摄影扫描器
US10357214B2 (en) Photon counting CT apparatus, light detection device, radiation detection device, and radiation analysis device
JP6178272B2 (ja) 放射線計測装置、および放射線計測プログラム
US10470723B2 (en) X-ray device with reduced pile-up
WO2017130552A1 (ja) 放射線撮像装置、その制御方法及びプログラム
JP4547254B2 (ja) 画像アーティファクトを減少させる装置及び方法
JP2016061729A (ja) 光子検出素子、光子検出装置、及び放射線分析装置
JP2025123362A (ja) X線ct装置、データ処理方法及びプログラム
EP3465276A1 (en) Dead-time calibration for a radiation detector
JP2017096720A (ja) 放射線撮像システム、信号処理装置、及び、放射線画像の信号処理方法
US11307312B2 (en) Image acquisition
US20120056092A1 (en) X-ray detector with improved quantum efficiency
EP4495636A1 (en) Photon counting detector flicker noise correction

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant