JP2018537144A5 - - Google Patents
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- Publication number
- JP2018537144A5 JP2018537144A5 JP2018516181A JP2018516181A JP2018537144A5 JP 2018537144 A5 JP2018537144 A5 JP 2018537144A5 JP 2018516181 A JP2018516181 A JP 2018516181A JP 2018516181 A JP2018516181 A JP 2018516181A JP 2018537144 A5 JP2018537144 A5 JP 2018537144A5
- Authority
- JP
- Japan
- Prior art keywords
- diffraction grating
- grating structure
- electrostrictive material
- layer
- ridge
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP15187536 | 2015-09-30 | ||
| EP15187536.6 | 2015-09-30 | ||
| PCT/EP2016/072651 WO2017055181A1 (en) | 2015-09-30 | 2016-09-23 | Focussing of gratings for differential phase contrast imaging by means of electro-mechanic transducer foils |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2018537144A JP2018537144A (ja) | 2018-12-20 |
| JP2018537144A5 true JP2018537144A5 (cg-RX-API-DMAC10.html) | 2019-10-31 |
Family
ID=54293044
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2018516181A Pending JP2018537144A (ja) | 2015-09-30 | 2016-09-23 | 電気機械トランスデューサフォイルによる微分位相コントラスト撮像のための回折格子の合焦 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20180294065A1 (cg-RX-API-DMAC10.html) |
| EP (1) | EP3192080B1 (cg-RX-API-DMAC10.html) |
| JP (1) | JP2018537144A (cg-RX-API-DMAC10.html) |
| CN (1) | CN108140439B (cg-RX-API-DMAC10.html) |
| WO (1) | WO2017055181A1 (cg-RX-API-DMAC10.html) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6613988B2 (ja) * | 2016-03-30 | 2019-12-04 | コニカミノルタ株式会社 | 放射線撮影システム |
| EP3403581A1 (en) * | 2017-05-15 | 2018-11-21 | Koninklijke Philips N.V. | Grid-mounting device for slit-scan differential phase contrast imaging |
| WO2019087605A1 (ja) * | 2017-10-31 | 2019-05-09 | 株式会社島津製作所 | X線位相差撮像システム |
| US11116463B2 (en) * | 2019-01-11 | 2021-09-14 | The Board Of Trustees Of The Leland Stanford Junior University | Apparatus with flexible x-ray gratings |
| EP3826032A1 (en) * | 2019-11-22 | 2021-05-26 | Koninklijke Philips N.V. | Modular fabrication technique for gratings for interferometric x-ray imaging |
| CN115373010A (zh) * | 2022-08-31 | 2022-11-22 | 山东航天电子技术研究所 | 一种基于磁致变形材料的智能x射线光学系统 |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3493287A (en) * | 1966-04-26 | 1970-02-03 | Ibm | Optical detour phase system |
| JPS60256643A (ja) * | 1984-05-31 | 1985-12-18 | Moritomo Ando | 減速装置 |
| US5794023A (en) * | 1996-05-31 | 1998-08-11 | International Business Machines Corporation | Apparatus utilizing a variably diffractive radiation element |
| US6985294B1 (en) * | 2003-03-27 | 2006-01-10 | Eric Rosenthal | Full spectrum color projector |
| US6930817B2 (en) * | 2003-04-25 | 2005-08-16 | Palo Alto Research Center Incorporated | Configurable grating based on surface relief pattern for use as a variable optical attenuator |
| DE102006037256B4 (de) * | 2006-02-01 | 2017-03-30 | Paul Scherer Institut | Fokus-Detektor-Anordnung einer Röntgenapparatur zur Erzeugung projektiver oder tomographischer Phasenkontrastaufnahmen sowie Röntgensystem, Röntgen-C-Bogen-System und Röntgen-CT-System |
| JP2008048910A (ja) * | 2006-08-24 | 2008-03-06 | Shimadzu Corp | X線グリッド |
| KR101391025B1 (ko) * | 2006-09-29 | 2014-04-30 | 가부시키가이샤 니콘 | 이동체 시스템, 패턴 형성 장치, 노광 장치 및 노광 방법, 그리고 디바이스 제조 방법 |
| JP5705826B2 (ja) * | 2009-03-27 | 2015-04-22 | コーニンクレッカ フィリップス エヌ ヴェ | 円形格子を用いる差分位相コントラスト撮像 |
| WO2010119019A1 (de) * | 2009-04-17 | 2010-10-21 | Siemens Aktiengesellschaft | Detektoranordnung und röntgentomographiegerät zur durchführung von phasenkontrastmessungen sowie verfahren zur durchführung einer phasenkontrastmessung |
| EP2443491B1 (en) * | 2009-06-16 | 2020-03-04 | Koninklijke Philips N.V. | Tilted gratings and method for production of tilted gratings |
| CN101813796B (zh) * | 2010-02-26 | 2012-07-18 | 深圳大学 | 一种硅基x射线相位光栅制作方法及其制作装置 |
| JP2012090945A (ja) * | 2010-03-30 | 2012-05-17 | Fujifilm Corp | 放射線検出装置、放射線撮影装置、放射線撮影システム |
| JP5634318B2 (ja) * | 2011-04-19 | 2014-12-03 | 三菱電機株式会社 | 半導体装置 |
| JP5930866B2 (ja) * | 2012-06-22 | 2016-06-08 | キヤノン株式会社 | 液体吐出ヘッド |
| JP2014006194A (ja) * | 2012-06-26 | 2014-01-16 | Canon Inc | 構造体の製造方法 |
| US10008659B2 (en) * | 2014-12-09 | 2018-06-26 | Lg Innotek Co., Ltd. | Fingerprint sensor |
-
2016
- 2016-09-23 EP EP16777585.7A patent/EP3192080B1/en not_active Not-in-force
- 2016-09-23 CN CN201680057949.2A patent/CN108140439B/zh not_active Expired - Fee Related
- 2016-09-23 US US15/763,899 patent/US20180294065A1/en not_active Abandoned
- 2016-09-23 WO PCT/EP2016/072651 patent/WO2017055181A1/en not_active Ceased
- 2016-09-23 JP JP2018516181A patent/JP2018537144A/ja active Pending
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