JP2018512573A - 光を検出するための装置のダイナミックレンジを改善するための方法 - Google Patents
光を検出するための装置のダイナミックレンジを改善するための方法 Download PDFInfo
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Abstract
Description
Claims (20)
- 少なくとも2つの検出領域(8、9)を用いる、とりわけ顕微鏡において使用するための、光を検出するための装置のダイナミックレンジを改善するための方法において、
前記検出領域(8、9)は、それぞれ、複数の単一光子アバランシェダイオード(SPAD)(3)から成る装置(アレイ)(4)から形成され、
前記検出領域(8、9)は、それぞれ、少なくとも1つの信号出力端(10、11)を有し、
前記検出領域(8、9)それぞれに対して、特性曲線(12、13)を求め、
前記特性曲線(12、13)を、補正曲線(15)および/または補正率(17)を得るために相互に組み合わせる、および/または、相互にオフセットさせる、
方法。 - 複数の前記信号出力端(10、11)の出力信号から形成された総特性曲線(14)を、前記補正曲線(15)および/または前記補正率(17)に基づいて補正する、特に線形化する、
請求項1記載の方法。 - 前記補正曲線(15)および/または前記補正率(17)を、前記特性曲線(12、13)の除算によって求める、
請求項1または2記載の方法。 - 出力信号の補正を、前記光の本来の検出後に、例えばDSP、FPGAまたはコンピュータによる、ディジタル信号処理によって行う、
請求項1から3までのいずれか1項記載の方法。 - 前記検出領域(8、9)の前記特性曲線(12、13)を、較正測定によって一度決定する、
請求項1から4までのいずれか1項記載の方法。 - 複数の前記検出領域(8、9)に、検出すべき前記光を異なる強度で供給する、および/または、異なるスペクトル領域の、検出すべき前記光を供給する、
請求項1から5までのいずれか1項記載の方法。 - 前記出力信号の補正を、必要に応じて実行する、
請求項1から6までのいずれか1項記載の方法。 - 少なくとも2つの検出領域(8、9)を用いる、とりわけ請求項1から7までのいずれか1項記載の方法を実施するための、特に顕微鏡において使用するための、光を検出するための装置において、
前記検出領域(8、9)は、それぞれ、複数の単一光子アバランシェダイオード(SPAD)(3)から成る装置(アレイ)(4)から形成されており、
前記検出領域(8、9)は、それぞれ、少なくとも1つの信号出力端(10、11)を有している、
装置。 - 内側の第1の検出領域(8)と、前記第1の検出領域(8)を包囲する、外側の第2の検出領域(9)と、が配置されている、
請求項8記載の装置。 - 前記少なくとも2つの検出領域(8、9)が、それぞれ、シリコン光電子倍増管(SiPM)の部分アレイとして形成されている、
請求項8または9記載の装置。 - 前記少なくとも2つの検出領域(8、9)が、それぞれ1つのシリコン光電子倍増管(SiPM)のアレイ(8、9)として形成されている、
請求項8または9記載の装置。 - ビームスプリッタが配置されており、それにより、検出すべき前記光が少なくとも2つのSiPMに分配される、
請求項11記載の装置。 - 複数の前記検出領域(8、9)に検出すべき前記光の異なるスペクトル成分が供給されるように、分散素子、特にプリズムまたは格子が配置されている、
請求項8から12までのいずれか1項記載の装置。 - 前記検出領域(8、9)は、相互に対称的または非対称的に配置されている、
請求項8から13までのいずれか1項記載の装置。 - 前記検出領域(8、9)は、円形またはほぼ円形の検出面を形成する、
請求項8から14までのいずれか1項記載の装置。 - 前記信号出力端(10、11)の出力信号をディジタル信号処理するための処理モジュールが配置されている、
請求項8から15までのいずれか1項記載の装置。 - 前記処理モジュールは、ディジタルシグナルプロセッサ(DSP)として、または、フィールドプログラマブルゲートアレイ(FPGA)として形成されている、
請求項16記載の装置。 - 前記検出領域(8、9)の前記信号出力端(10、11)の出力信号が、電子式に、または後段に接続されているコンピュータにおいて結合または統合されて、単一の総信号が形成される、
請求項8から17までのいずれか1項記載の装置。 - 請求項8から18までのいずれか1項記載の光を検出するための装置が設けられていることを特徴とする、顕微鏡、特に走査型顕微鏡、とりわけレーザ走査型顕微鏡。
- 蛍光顕微鏡検査および/またはSHG顕微鏡検査および/またはラマン顕微鏡検査のための顕微鏡である、
請求項19記載の顕微鏡。
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Also Published As
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JP6785782B2 (ja) | 2020-11-18 |
EP3262453B1 (de) | 2022-11-30 |
US20180031420A1 (en) | 2018-02-01 |
WO2016135178A1 (de) | 2016-09-01 |
US10488251B2 (en) | 2019-11-26 |
LU92665B1 (de) | 2016-08-25 |
EP3262453A1 (de) | 2018-01-03 |
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