JP2018509764A - ワークピースの温度均一性を改善する装置 - Google Patents
ワークピースの温度均一性を改善する装置 Download PDFInfo
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- JP2018509764A JP2018509764A JP2017547422A JP2017547422A JP2018509764A JP 2018509764 A JP2018509764 A JP 2018509764A JP 2017547422 A JP2017547422 A JP 2017547422A JP 2017547422 A JP2017547422 A JP 2017547422A JP 2018509764 A JP2018509764 A JP 2018509764A
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- Prior art keywords
- platen
- heater
- edge
- top surface
- edge heater
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- 238000010438 heat treatment Methods 0.000 claims description 23
- 238000012545 processing Methods 0.000 abstract description 2
- 239000000463 material Substances 0.000 description 10
- 239000000919 ceramic Substances 0.000 description 8
- 238000010884 ion-beam technique Methods 0.000 description 8
- 239000010409 thin film Substances 0.000 description 7
- 238000004519 manufacturing process Methods 0.000 description 6
- 238000000034 method Methods 0.000 description 5
- 238000012544 monitoring process Methods 0.000 description 3
- 230000008646 thermal stress Effects 0.000 description 3
- 230000001154 acute effect Effects 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- 229910010293 ceramic material Inorganic materials 0.000 description 2
- 239000010408 film Substances 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 239000011253 protective coating Substances 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010344 co-firing Methods 0.000 description 1
- 239000000356 contaminant Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67103—Apparatus for thermal treatment mainly by conduction
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67248—Temperature monitoring
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Drying Of Semiconductors (AREA)
- Resistance Heating (AREA)
Abstract
Description
Claims (15)
- 頂面、底面、並びに該頂面及び底面の間を延びる側壁を備えるプラテンと、
第1の平面に配置される主ヒーターと、
前記第1の平面よりも前記頂面により近い第2の平面に配置される縁部ヒーターと、
を備える、ワークピース保持・加熱装置。 - 前記第1の平面、前記第2の平面及び前記頂面は、互いに平行である、請求項1記載のワークピース保持・加熱装置。
- 前記主ヒーターは、前記プラテンの前記底面に取り付けられる、請求項1記載のワークピース保持・加熱装置。
- 前記主ヒーターは、前記プラテンに埋設される、請求項1記載のワークピース保持・加熱装置。
- 前記縁部ヒーターは、前記プラテンに埋め込まれる、請求項1記載のワークピース保持・加熱装置。
- 前記縁部ヒーターは、前記プラテンの外面に取り付けられる、請求項1記載のワークピース保持・加熱装置。
- 前記第1の平面及び前記第2の平面と異なる第3の平面に配置される第2の縁部ヒーターを更に備え、
前記頂面、前記第1の平面、前記第2の平面及び前記第3の平面は、全て平行である、請求項1記載のワークピース保持・加熱装置。 - 前記主ヒーター及び前記縁部ヒーターは、独立に制御される、請求項1記載のワークピース保持・加熱装置。
- 頂面、底面、並びに該頂面及び底面の間を延びる側壁を備えるプラテンであって、該側壁は、前記頂面に平行な水平環状リング部分を備える、プラテンと、
主ヒーターと、
前記水平環状リング部分に配置される縁部ヒーターと、
を備える、ワークピース保持・加熱装置。 - 前記縁部ヒーターはリング形状である、請求項9記載のワークピース保持・加熱装置。
- 前記側壁は、前記頂面に平行な第2の水平環状リング部分を備え、
前記ワークピース保持・加熱装置は、前記第2の水平環状リング部分に配置される第2の縁部ヒーターを更に備える、
請求項9記載のワークピース保持・加熱装置。 - 前記側壁は、
前記頂面と前記水平環状リング部分との間を延びる先細の部分と、
前記水平環状リング部分と前記底面との間を延びる垂直部分と、
を更に備える、請求項9記載のワークピース保持・加熱装置。 - 頂面、底面、並びに該頂面及び底面の間を延びる先細の側壁を備えるプラテンと、
主ヒーターと、
前記先細の側壁に平行に配置される縁部ヒーターと、
を備える、ワークピース保持・加熱装置。 - 前記縁部ヒーターは、前記先細の側壁に配置される、請求項13記載のワークピース保持・加熱装置。
- 前記縁部ヒーターは、前記プラテンに埋め込まれる、請求項13記載のワークピース保持・加熱装置。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US14/657,193 US9633875B2 (en) | 2015-03-13 | 2015-03-13 | Apparatus for improving temperature uniformity of a workpiece |
US14/657,193 | 2015-03-13 | ||
PCT/US2016/020253 WO2016148907A1 (en) | 2015-03-13 | 2016-03-01 | Apparatus for improving temperature uniformity of a workpiece |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2018509764A true JP2018509764A (ja) | 2018-04-05 |
JP2018509764A5 JP2018509764A5 (ja) | 2019-03-22 |
JP6882181B2 JP6882181B2 (ja) | 2021-06-02 |
Family
ID=56888119
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2017547422A Active JP6882181B2 (ja) | 2015-03-13 | 2016-03-01 | ワークピース保持・加熱装置 |
Country Status (6)
Country | Link |
---|---|
US (1) | US9633875B2 (ja) |
JP (1) | JP6882181B2 (ja) |
KR (1) | KR102411024B1 (ja) |
CN (2) | CN107533997B (ja) |
TW (1) | TWI685914B (ja) |
WO (1) | WO2016148907A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7248182B1 (ja) | 2022-08-30 | 2023-03-29 | 住友大阪セメント株式会社 | 静電チャック部材及び静電チャック装置 |
Citations (10)
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JP2002015840A (ja) * | 2000-06-28 | 2002-01-18 | Toshiba Ceramics Co Ltd | 半導体加熱用セラミックヒーターおよびその製造方法 |
US6342691B1 (en) * | 1999-11-12 | 2002-01-29 | Mattson Technology, Inc. | Apparatus and method for thermal processing of semiconductor substrates |
US20030080109A1 (en) * | 2001-10-19 | 2003-05-01 | Samsung Electronics Co., Ltd. | Heater assembly for manufacturing a semiconductor device |
JP2009170739A (ja) * | 2008-01-18 | 2009-07-30 | Komatsu Ltd | 基板温度制御装置用ステージ |
KR20100060688A (ko) * | 2008-11-28 | 2010-06-07 | 세메스 주식회사 | 기판 코팅 유닛, 이를 갖는 기판 처리 장치 및 이를 이용한기판 처리 방법 |
KR20110130631A (ko) * | 2010-05-28 | 2011-12-06 | 엘지디스플레이 주식회사 | 박막처리장치 및 이를 이용하는 박막처리공정의 기판가열방법 |
US8555810B2 (en) * | 2009-06-25 | 2013-10-15 | Samsung Electronics Co., Ltd. | Plasma dry etching apparatus having coupling ring with cooling and heating units |
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-
2015
- 2015-03-13 US US14/657,193 patent/US9633875B2/en active Active
-
2016
- 2016-03-01 KR KR1020177028767A patent/KR102411024B1/ko active IP Right Grant
- 2016-03-01 CN CN201680014843.4A patent/CN107533997B/zh active Active
- 2016-03-01 CN CN202011109040.1A patent/CN112234000B/zh active Active
- 2016-03-01 WO PCT/US2016/020253 patent/WO2016148907A1/en active Application Filing
- 2016-03-01 JP JP2017547422A patent/JP6882181B2/ja active Active
- 2016-03-02 TW TW105106222A patent/TWI685914B/zh active
Patent Citations (11)
Publication number | Priority date | Publication date | Assignee | Title |
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US5695568A (en) * | 1993-04-05 | 1997-12-09 | Applied Materials, Inc. | Chemical vapor deposition chamber |
JP2001102157A (ja) * | 1999-10-01 | 2001-04-13 | Ngk Insulators Ltd | セラミックスヒータ |
US6342691B1 (en) * | 1999-11-12 | 2002-01-29 | Mattson Technology, Inc. | Apparatus and method for thermal processing of semiconductor substrates |
JP2001217060A (ja) * | 1999-11-19 | 2001-08-10 | Ibiden Co Ltd | セラミックヒータ |
JP2002015840A (ja) * | 2000-06-28 | 2002-01-18 | Toshiba Ceramics Co Ltd | 半導体加熱用セラミックヒーターおよびその製造方法 |
US20030080109A1 (en) * | 2001-10-19 | 2003-05-01 | Samsung Electronics Co., Ltd. | Heater assembly for manufacturing a semiconductor device |
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JP2009170739A (ja) * | 2008-01-18 | 2009-07-30 | Komatsu Ltd | 基板温度制御装置用ステージ |
KR20100060688A (ko) * | 2008-11-28 | 2010-06-07 | 세메스 주식회사 | 기판 코팅 유닛, 이를 갖는 기판 처리 장치 및 이를 이용한기판 처리 방법 |
US8555810B2 (en) * | 2009-06-25 | 2013-10-15 | Samsung Electronics Co., Ltd. | Plasma dry etching apparatus having coupling ring with cooling and heating units |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7248182B1 (ja) | 2022-08-30 | 2023-03-29 | 住友大阪セメント株式会社 | 静電チャック部材及び静電チャック装置 |
JP2024033170A (ja) * | 2022-08-30 | 2024-03-13 | 住友大阪セメント株式会社 | 静電チャック部材及び静電チャック装置 |
Also Published As
Publication number | Publication date |
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US20160268150A1 (en) | 2016-09-15 |
KR102411024B1 (ko) | 2022-06-20 |
KR20170127534A (ko) | 2017-11-21 |
CN112234000A (zh) | 2021-01-15 |
TWI685914B (zh) | 2020-02-21 |
CN107533997A (zh) | 2018-01-02 |
WO2016148907A1 (en) | 2016-09-22 |
CN112234000B (zh) | 2024-06-11 |
US9633875B2 (en) | 2017-04-25 |
TW201637121A (zh) | 2016-10-16 |
JP6882181B2 (ja) | 2021-06-02 |
CN107533997B (zh) | 2021-05-11 |
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