JP2018200305A5 - - Google Patents

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Publication number
JP2018200305A5
JP2018200305A5 JP2018084431A JP2018084431A JP2018200305A5 JP 2018200305 A5 JP2018200305 A5 JP 2018200305A5 JP 2018084431 A JP2018084431 A JP 2018084431A JP 2018084431 A JP2018084431 A JP 2018084431A JP 2018200305 A5 JP2018200305 A5 JP 2018200305A5
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JP
Japan
Prior art keywords
test
flows
primitive
program
control server
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Application number
JP2018084431A
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English (en)
Japanese (ja)
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JP6748671B2 (ja
JP2018200305A (ja
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Priority claimed from US15/582,137 external-priority patent/US10451668B2/en
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Publication of JP2018200305A publication Critical patent/JP2018200305A/ja
Publication of JP2018200305A5 publication Critical patent/JP2018200305A5/ja
Application granted granted Critical
Publication of JP6748671B2 publication Critical patent/JP6748671B2/ja
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JP2018084431A 2017-04-28 2018-04-25 テストプログラムフロー制御 Active JP6748671B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US15/582,137 US10451668B2 (en) 2017-04-28 2017-04-28 Test program flow control
US15/582,137 2017-04-28

Publications (3)

Publication Number Publication Date
JP2018200305A JP2018200305A (ja) 2018-12-20
JP2018200305A5 true JP2018200305A5 (cg-RX-API-DMAC7.html) 2019-06-27
JP6748671B2 JP6748671B2 (ja) 2020-09-02

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ID=63917144

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2018084431A Active JP6748671B2 (ja) 2017-04-28 2018-04-25 テストプログラムフロー制御

Country Status (5)

Country Link
US (1) US10451668B2 (cg-RX-API-DMAC7.html)
JP (1) JP6748671B2 (cg-RX-API-DMAC7.html)
KR (1) KR102481257B1 (cg-RX-API-DMAC7.html)
CN (1) CN109031086B (cg-RX-API-DMAC7.html)
TW (1) TWI759466B (cg-RX-API-DMAC7.html)

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KR200490761Y1 (ko) * 2019-01-16 2020-02-11 제이제이티솔루션 주식회사 Ssd 테스트 장비용 도킹 어셈블리 및 이를 포함하는 ssd 테스트 장비
CN112115013A (zh) 2019-06-21 2020-12-22 昆山纬绩资通有限公司 测试数据汇总系统与其方法
US11860229B2 (en) 2020-03-05 2024-01-02 Advantest Corporation Device interface board supporting devices with multiple different standards to interface with the same socket
US12320851B2 (en) 2020-03-05 2025-06-03 Advantest Corporation Software and firmware support for device interface board configured to allow devices supporting multiple different standards to interface with the same socket
DE112020007444T5 (de) * 2020-07-21 2023-06-15 Advantest Corporation Automatische Testeinrichtung, Prozess und Computerprogramm zum Testen eines oder mehrerer zu testender Geräte, wobei unterschiedliche Testaktivitäten Teilsätze von Ressourcen des zu testenden Geräts nutzen
CN112649717B (zh) * 2020-09-15 2024-07-26 深圳市几米物联有限公司 一种测试方法、装置、终端设备及存储介质
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CN115617665A (zh) * 2022-10-21 2023-01-17 道普信息技术有限公司 一种基于流程引擎和jmeter的性能测试方法及系统
TWI813505B (zh) * 2022-11-15 2023-08-21 瑞昱半導體股份有限公司 使用複數種儀器以進行複數種電路測試的方法以及建立可用於複數種儀器之通用格式檔案的方法

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JPH1139180A (ja) * 1997-07-16 1999-02-12 Mitsubishi Electric Corp 半導体デバイステストシステムおよびそのサーバ装置
US6205407B1 (en) * 1998-02-26 2001-03-20 Integrated Measurement Systems, Inc. System and method for generating test program code simultaneously with data produced by ATPG or simulation pattern capture program
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CN1243341C (zh) * 2001-03-22 2006-02-22 株式会社鼎新 测试语言转换方法
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