JP2018183757A - Inspection equipment - Google Patents

Inspection equipment Download PDF

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JP2018183757A
JP2018183757A JP2017088543A JP2017088543A JP2018183757A JP 2018183757 A JP2018183757 A JP 2018183757A JP 2017088543 A JP2017088543 A JP 2017088543A JP 2017088543 A JP2017088543 A JP 2017088543A JP 2018183757 A JP2018183757 A JP 2018183757A
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light
inspection
guide
shape
inspection object
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健司 遠山
Kenji Toyama
健司 遠山
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Toppan Inc
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Toppan Printing Co Ltd
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Abstract

PROBLEM TO BE SOLVED: To provide equipment that achieves the selection of a normal article by automatically and inexpensively determining the presence or absence of a shape abnormality such as a chip in outer shapes of a rectangular parallelepiped-shaped cake piece, an electric component and the like, which are supplied from a rotary feeder and the like.SOLUTION: Inspection equipment includes a guide that is made of a pair of L-shaped bodies comprising a side surface and an undersurface, notched parts on the side surface and the undersurface of the guide, four sets of floodlight parts and light receiving parts, and shape inspection means. Light is applied from the floodlight parts to positions of a side surface near a lower side and a side surface near an upper side when an inspection object with no shape abnormality is carried on the guide. The light is applied to the side surface near the lower side through the notched part. The absence of the shape abnormality is determined when the light from the floodlight parts is blocked, and the presence of the shape abnormality is determined when the light from any one of the floodlight parts is not blocked.SELECTED DRAWING: Figure 5

Description

本発明は菓子片や電子部品などの形状検査装置に関する。   The present invention relates to a shape inspection apparatus for confectionery pieces, electronic parts, and the like.

回転式フィーダなどから供給される、直方体形状の菓子片、電気部品などにおいて、外形的形状を自動的に検査し、形状正常品を選別することが行われてきた。特許文献1や特許文献2では、搬送中の被検査物を、カメラによって撮像し、形状の検査を行っている。   In a rectangular parallelepiped shaped confectionery piece, an electrical component, or the like supplied from a rotary feeder or the like, it has been performed to automatically inspect the outer shape and select a normal shape product. In Patent Literature 1 and Patent Literature 2, an object to be inspected during transportation is picked up by a camera and the shape is inspected.

しかしながら、これらの方法では、直方体の各面を検査するには、各面毎の検査が必要であり、また、被検査物は隣接することはできなく、被検査物の間は間隙が必要であった。
したがってシステムが高価でありコスト高になっていた。
However, in these methods, in order to inspect each surface of the rectangular parallelepiped, it is necessary to inspect each surface, and the inspection objects cannot be adjacent to each other, and a gap is required between the inspection objects. there were.
Therefore, the system is expensive and expensive.

特許第2519588号公報Japanese Patent No. 2519588 特許第4143869号公報Japanese Patent No. 4143869

回転式フィーダなどから供給される、直方体形状の菓子片、電気部品などの外形的形状において欠けなどの形状異常を自動的に安価に検査し、正常品を選別することを実現する装置を提供することを課題とする。   Provide a device that automatically and inexpensively inspects abnormal shapes such as chips in the outer shape of a rectangular confectionery piece, electrical component, etc. supplied from a rotary feeder, etc., and sorts out normal products. This is the issue.

本発明は上記課題を解決するためになされたもので、請求項1に係る発明は、直方体形状の被検査物の形状を検査する検査装置であって、側面と下面からなるL型状体の一対からなるガイドと、前記ガイド上を被検査物が整列状態で等速で移動する搬送手段と、前記ガイドの側面と下面に切り欠きを有する一対の切り欠き部と、前記ガイド上で被検査物が搬送された場合の搬送方向に平行な被検査物の下面2辺それぞれの付近の被検査物側面通過位置を、前記切り欠き部を通じて光照射する投光部と、前記投光部に対向して設置される受光部と、前記ガイド上で被検査物が搬送された場合の搬送方向に平行な被検査物の上面2辺それぞれの付近の被検査物側面通過位置に光照射する投光部と、前記投光部に対向して設置される受光部と、前記ガイド上で被検査物通過時に、前記投光部の光を被検査物が遮光し前記受光部で前記投光部の光を検出しなかった場合に被検査物は形状異常なしと判断し、前記投光部いずれかの光を被検査物が遮光することなく前記受光部で前記投光部の光を検出した場合に被検査物は形状異常と判断する形状検査手段と、を備えることを特徴とする検査装置である。   SUMMARY OF THE INVENTION The present invention has been made to solve the above problems, and the invention according to claim 1 is an inspection apparatus for inspecting the shape of a rectangular parallelepiped object to be tested, which is an L-shaped body composed of a side surface and a lower surface. A pair of guides, a conveying means for moving the object to be inspected on the guide at a constant speed, a pair of notches having notches on the side surface and the lower surface of the guide, and the object to be inspected on the guide A light projecting portion that irradiates light through the notch portion with respect to each of the two side surfaces of the lower surface of the test object that are parallel to the transport direction when the object is transported, and facing the light projecting portion And a light projecting unit that irradiates light to the inspection object side surface passing positions in the vicinity of each of the two top surfaces of the inspection object parallel to the conveyance direction when the inspection object is conveyed on the guide. A light receiving unit installed opposite to the light projecting unit, When the inspection object passes on the id, when the inspection object blocks the light of the light projecting unit and the light receiving unit does not detect the light of the light projection unit, the inspection object is determined to have no shape abnormality, A shape inspection means for determining that the object to be inspected has a shape abnormality when the light receiving unit detects the light of the light projecting unit without blocking the light of any of the light projecting units by the object to be inspected. This is a characteristic inspection device.

請求項2に係る発明は、前記ガイド上の、前記切り欠き部は、L型状体の側面部に半円状と下面部に半円状の切りかきで、連続していることを特徴とする請求項1記載の検査装置である。   The invention according to claim 2 is characterized in that the notch on the guide is continuous with a semicircular notch on the side surface of the L-shaped body and a semicircular notch on the lower surface. The inspection apparatus according to claim 1.

請求項3に係る発明は、前記投光部の光のスポット径が、0.1mm以上1.0mm以下であることを特徴とする、請求項1または請求項2に記載の検査装置である。   The invention according to claim 3 is the inspection apparatus according to claim 1 or 2, wherein a spot diameter of light of the light projecting unit is 0.1 mm or more and 1.0 mm or less.

本発明によれば、回転式フィーダなどから供給される、直方体形状の菓子片、電気部品などの外形的形状において形状異常を自動的に安価に検査し、正常品を選別することを実現する装置を提供することが出来る。   According to the present invention, an apparatus that automatically and inexpensively inspects an abnormal shape in an external shape such as a rectangular parallelepiped shaped confectionery piece, an electrical component, etc., supplied from a rotary feeder or the like, and selects a normal product. Can be provided.

本発明の検査装置の一実施例において被検査物のガイドを示す模式的斜視図である。It is a typical perspective view which shows the guide of a to-be-inspected object in one Example of the inspection apparatus of this invention. (a)は図1におけるA−A断面図、(b)は図1におけるB−B断面図である。(A) is AA sectional drawing in FIG. 1, (b) is BB sectional drawing in FIG. 図3は図1の本発明の検査装置の一実施例において対象物を運ぶガイドにおいて、被検査物が載っている場合を説明する模式的斜視図である。FIG. 3 is a schematic perspective view for explaining a case where an object to be inspected is placed in a guide for carrying an object in the embodiment of the inspection apparatus of the present invention shown in FIG. (a)は図3におけるA−A断面図、(b)は図3におけるB−B断面図である。(A) is AA sectional drawing in FIG. 3, (b) is BB sectional drawing in FIG. 図5は本発明の検査装置の概略構成を示す図である。FIG. 5 is a diagram showing a schematic configuration of the inspection apparatus of the present invention. (a)は本発明の検査装置において、被検査物が形状正常である場合の、検査時の挙動を説明する図、(b)は本発明の検査装置において、被検査物が不良である場合の、検査時の挙動を説明する図である。(A) is a figure explaining the behavior at the time of inspection when the inspection object has a normal shape in the inspection apparatus of the present invention, and (b) is a case where the inspection object is defective in the inspection apparatus of the present invention. It is a figure explaining the behavior at the time of an inspection. (a)は本発明の検査装置に被検査物を投入する回転式フィーダとガイドを示す概略図、(b)はガイドに並ぶ被検査物の様子を模式的に示す上面図である。(A) is the schematic which shows the rotary feeder and guide which throws into a test | inspection object into the test | inspection apparatus of this invention, (b) is a top view which shows typically the mode of the test object located in a guide.

以下、本発明の実施形態について、図面を参照して説明する。   Hereinafter, embodiments of the present invention will be described with reference to the drawings.

本発明は、直方体形状の被検査物の形状を検査する検査装置であり、デクスタなどの回転式フィーダなどから被検査物が、回転式フィーダに接続されたガイドに供給され、隣接して整列状態で等速で移動するものを光学的に検査するものである。   The present invention is an inspection apparatus for inspecting the shape of a rectangular parallelepiped-shaped inspection object, and the inspection object is supplied from a rotary feeder such as a dexter to a guide connected to the rotary feeder, and is in an adjacently aligned state. In this case, an object that moves at a constant speed is optically inspected.

図7(a)は本発明の検査装置に被検査物を投入する回転式フィーダとガイドを示す概略図、(b)はガイドに並ぶ被検査物の様子を模式的に示す上面図である。   FIG. 7A is a schematic view showing a rotary feeder and a guide for loading the inspection object into the inspection apparatus of the present invention, and FIG.

図1は本発明の検査装置の一実施例において被検査物のガイドを示す模式的斜視図である。図2(a)は図1におけるA−A断面図、(b)は図1におけるB−B断面図である。   FIG. 1 is a schematic perspective view showing a guide for an object to be inspected in an embodiment of the inspection apparatus of the present invention. 2A is a cross-sectional view taken along line AA in FIG. 1, and FIG. 2B is a cross-sectional view taken along line BB in FIG.

デクスタなどの回転式フィーダ100は、排出ガイド101を通じて、被検査物Dを押せ押せの状態で、ガイド15、16に供給し、ガイド15、16上で被検査物Dが隣接して整列状態で等速で移動する搬送手段を提供する。   A rotary feeder 100 such as a dexter feeds the inspection object D through the discharge guide 101 to the guides 15 and 16 in a pressed state, and the inspection object D is adjacent and aligned on the guides 15 and 16. Provided is a conveying means that moves at a constant speed.

回転式フィーダ100から被検査物Dが供給されるガイド15、16は、側面と下面からなるL型状体の一対からなる。   The guides 15 and 16 to which the inspection object D is supplied from the rotary feeder 100 are composed of a pair of L-shaped bodies having side surfaces and a lower surface.

ガイド15の側面151と下面152には切り欠き部10があり、ガイド16の側面161と下面162には切り欠き部11があり、ガイド15の切り欠き部10とガイド16の切り欠き部11は相対している。   The side surface 151 and the lower surface 152 of the guide 15 have a notch portion 10, the side surface 161 and the lower surface 162 of the guide 16 have a notch portion 11, and the notch portion 10 of the guide 15 and the notch portion 11 of the guide 16 have Relative.

図5は本発明の検査装置の概略構成を示す図である。   FIG. 5 is a diagram showing a schematic configuration of the inspection apparatus of the present invention.

ガイド15、16上で形状異常無き被検査物が搬送された場合の被検査物Dの下面の辺で搬送方向に平行な2辺それぞれの付近の被検査物Dの側面が通過する位置を、切り欠き部10、11を通じて光照射する投光部20、24と、これら投光部それぞれに対向して
設置される受光部21、25がある。
When the inspection object having no shape abnormality is conveyed on the guides 15 and 16, the side of the inspection object D in the vicinity of each of the two sides parallel to the conveyance direction on the side of the lower surface of the inspection object D passes. There are light projecting portions 20 and 24 that irradiate light through the notches 10 and 11, and light receiving portions 21 and 25 that are installed to face the light projecting portions, respectively.

また、ガイド15、16上で形状異常無き被検査物が搬送された場合の被検査物Dの上面の辺で搬送方向に平行な2辺それぞれの付近の被検査物Dの側面が通過する位置に光照射する投光部22、26と、これら投光部それぞれに対向して設置される受光部23、27がある。   Further, the positions of the side surfaces of the inspection object D in the vicinity of the two sides parallel to the conveyance direction on the side of the upper surface of the inspection object D when the inspection object having no shape abnormality is conveyed on the guides 15 and 16. There are light projecting units 22 and 26 for irradiating light, and light receiving units 23 and 27 installed to face the light projecting units, respectively.

次に、本発明を構成する形状検査手段について説明する。   Next, the shape inspection means constituting the present invention will be described.

図6(a)は本発明の検査装置において、被検査物Dが形状正常である場合の、検査時の挙動を説明する図、(b)は本発明の検査装置において、被検査物Dが不良である場合の、検査時の挙動を説明する図である。   FIG. 6A is a diagram for explaining the behavior at the time of inspection when the inspection object D has a normal shape in the inspection apparatus of the present invention, and FIG. 6B is the inspection apparatus D of the present invention. It is a figure explaining the behavior at the time of an inspection in the case of being defective.

ガイド15、16上で被検査物Dの通過時に、投光部20、24、22、26の光を被検査物Dが遮光し受光部21、25、23、27で投光部20、24、22、26の光を検出しなかった場合、被検査物は形状異常なしと判断する。   When the inspection object D passes through the guides 15 and 16, the inspection object D blocks the light from the light projecting units 20, 24, 22 and 26, and the light receiving units 21, 25, 23 and 27 transmit the light projecting units 20 and 24. , 22 and 26 are not detected, it is determined that the object to be inspected has no shape abnormality.

投光部20、24、22、26の光を被検査物Dが遮光しなく受光部21、25、23、27で投光部20、24、22、26のいずれかの光を検出した場合、被検査物は形状異常と判断する。   When the light to be inspected D does not block the light from the light projecting parts 20, 24, 22, 26, and any of the light from the light projecting parts 20, 24, 22, 26 is detected by the light receiving parts 21, 25, 23, 27 The object to be inspected is determined to be abnormal in shape.

ただし、この検査は、被検査物Dが隣接している間の、搬送方向に垂直の側面が通過するときは、行わない。被検査物は、完全な直方体形状になっておらず、各辺は、曲面になっており、被検査物Dの搬送方向に垂直の側面が、投光部と受光部が存在する面を通過するときは、投光部20、24、22、26の光を、側面の角の曲率のため被検査物Dによる遮光がなく、受光部21、25、23、27で投光部20、24、22、26の光を検出する。したがって、投光部と受光部の存在する面に、被検査物Dの搬送方向に垂直の側面が通過する時には、被検査物Dの形状検査を行わないように、タイミングを計って検査する。検査工程の前準備の時に、実際に、被検査物Dを搬送して、受光部21、25、23、27で投光部20、24、22、26の光を検出する事象の間隔を計測することによって、側面通過時間間隔が決められる。   However, this inspection is not performed when a side surface perpendicular to the transport direction passes while the inspection object D is adjacent. The object to be inspected does not have a perfect rectangular parallelepiped shape, each side has a curved surface, and the side surface perpendicular to the conveying direction of the object to be inspected D passes through the surface where the light projecting part and the light receiving part exist. When the light is emitted from the light projecting units 20, 24, 22 and 26, the light is received by the light receiving units 21, 25, 23 and 27 and the light receiving units 21, 25, 23 and 27 do not block the light from the inspected object D due to the curvature of the side corners. , 22 and 26 are detected. Therefore, when a side surface perpendicular to the conveyance direction of the inspection object D passes through the surface where the light projecting unit and the light receiving unit exist, the inspection is performed at a timing so that the shape inspection of the inspection object D is not performed. At the time of preparation for the inspection process, the object D is actually transported, and the interval between events in which the light of the light projecting units 20, 24, 22, 26 is detected by the light receiving units 21, 25, 23, 27 is measured. By doing so, the side passage time interval is determined.

被検査物Dを搬送する前は受光部21、25、23、27で投光部20、24、22、26の光を検出する。そして最初の被検査物Dが投光部と受光部が存在する面を通過したときに、投光部20、24、22、26の光を被検査物Dが遮光し受光部21、25、23、27で投光部20、24、22、26の光を検出しない。この時を検査開始時刻とする。この検査開始時刻から、側面通過時間間隔の整数倍時間が経った時刻の前後のある時間区間を除いた時間で、形状検査を行う。   Before the inspection object D is conveyed, the light of the light projecting units 20, 24, 22, 26 is detected by the light receiving units 21, 25, 23, 27. When the first inspection object D passes through the surface where the light projecting unit and the light receiving unit exist, the light to be inspected D blocks the light from the light projecting units 20, 24, 22, 26, and the light receiving units 21, 25, 23 and 27 do not detect the light of the light projecting units 20, 24, 22, and 26. This time is set as the inspection start time. The shape inspection is performed at a time excluding a certain time section before and after the time that is an integral multiple of the side surface passage time interval from the inspection start time.

ガイド15の切り欠き部10において、側面151の切り欠きと、下面152の切り欠きはそれぞれ半円状をしており、それらは連続している。ガイド16の切り欠き部11において、側面161の切り欠きと、下面162の切り欠きはそれぞれ半円状をしており、それらは連続している。そしてガイド15の切り欠き部10とガイド16の切り欠き部11は相対している。ただし切り欠け部の切り欠けの形状はこれに限定されない。   In the cutout portion 10 of the guide 15, the cutout of the side surface 151 and the cutout of the lower surface 152 are each semicircular, and they are continuous. In the notch portion 11 of the guide 16, the notch on the side surface 161 and the notch on the lower surface 162 each have a semicircular shape, and they are continuous. The notch 10 of the guide 15 and the notch 11 of the guide 16 are opposed to each other. However, the shape of the notch in the notch is not limited to this.

被検査物の形状異常を検出する精度のために、投光部20、24、22、26の光のスポット径は0.1mm以上1.0mm以下が望ましい。   In order to detect the shape abnormality of the object to be inspected, it is desirable that the light spot diameter of the light projecting units 20, 24, 22, and 26 is 0.1 mm or greater and 1.0 mm or less.

本発明により、回転式フィーダから供給される、直方体形状の菓子片、電気部品などの外形的形状において形状異常を自動的に安価に検査し、正常品を選別することを実現する
装置を提供することが出来るようになった。
According to the present invention, there is provided an apparatus that automatically and inexpensively inspects a shape abnormality in an outer shape such as a rectangular parallelepiped shaped confectionery piece, an electric component, etc., supplied from a rotary feeder, and selects a normal product. I was able to do it.

10・・・切り欠き部
11・・・切り欠き部
15・・・ガイド
16・・・ガイド
20・・・投光部1
21・・・受光部1
22・・・投光部2
23・・・受光部2
24・・・投光部3
25・・・受光部3
26・・・投光部4
27・・・受光部4
100・・・回転式フィーダ
101・・・排出ガイド
151・・・ガイド側面
152・・・ガイド下面
161・・・ガイド側面
162・・・ガイド下面
D・・・被検査物
F・・・欠け部
DESCRIPTION OF SYMBOLS 10 ... Notch part 11 ... Notch part 15 ... Guide 16 ... Guide 20 ... Light emission part 1
21... Light receiving unit 1
22 ... Projection unit 2
23: Light receiving part 2
24 .. Projection part 3
25. Light receiving part 3
26 .. Projection part 4
27. Light receiving part 4
DESCRIPTION OF SYMBOLS 100 ... Rotary feeder 101 ... Discharge guide 151 ... Guide side surface 152 ... Guide lower surface 161 ... Guide side surface 162 ... Guide lower surface D ... Inspection object F ... Chipping part

Claims (3)

直方体形状の被検査物の形状を検査する検査装置であって、
側面と下面からなるL型状体の一対からなるガイドと、
前記ガイド上を被検査物が整列状態で等速で移動する搬送手段と、
前記ガイドの側面と下面に切り欠きを有する一対の切り欠き部と、
前記ガイド上で被検査物が搬送された場合の搬送方向に平行な被検査物の下面2辺それぞれの付近の被検査物側面通過位置を、前記切り欠き部を通じて光照射する投光部と、前記投光部に対向して設置される受光部と、
前記ガイド上で被検査物が搬送された場合の搬送方向に平行な被検査物の上面2辺それぞれの付近の被検査物側面通過位置に光照射する投光部と、前記投光部に対向して設置される受光部と、
前記ガイド上で被検査物通過時に、前記投光部の光を被検査物が遮光し前記受光部で前記投光部の光を検出しなかった場合に被検査物は形状異常なしと判断し、前記投光部いずれかの光を被検査物が遮光することなく前記受光部で前記投光部の光を検出した場合に被検査物は形状異常と判断する形状検査手段と、
を備えることを特徴とする検査装置。
An inspection apparatus for inspecting the shape of a rectangular parallelepiped inspection object,
A guide consisting of a pair of L-shaped bodies consisting of side and bottom surfaces;
A conveying means for moving the inspection objects on the guide at a constant speed in an aligned state;
A pair of notches having notches on the side and bottom surfaces of the guide;
A light projecting unit that irradiates light through the notch part with respect to the inspection object side surface passing position in the vicinity of each of the two lower surface sides of the inspection object parallel to the conveyance direction when the inspection object is conveyed on the guide; A light receiving unit installed opposite to the light projecting unit;
A light projecting unit that irradiates light to the inspected object side surface passing positions in the vicinity of each of the top two sides of the inspected object parallel to the conveying direction when the inspected object is conveyed on the guide, and opposed to the light projecting unit A light receiving unit installed
When the inspection object passes on the guide, the inspection object determines that the inspection object has no shape abnormality when the inspection object blocks the light of the light projection part and the light reception part does not detect the light of the light projection part. A shape inspection means for determining that the object to be inspected is abnormal in shape when the light receiving unit detects the light of the light projecting unit without blocking the light of any of the light projecting units;
An inspection apparatus comprising:
前記ガイド上の、前記切り欠き部は、L型状体の側面部に半円状と下面部に半円状の切りかきで、連続していることを特徴とする請求項1記載の検査装置。   2. The inspection apparatus according to claim 1, wherein the notch portion on the guide is continuous with a semicircular notch on the side surface portion of the L-shaped body and a semicircular notch on the lower surface portion. . 前記投光部の光のスポット径が、0.1mm以上1.0mm以下であることを特徴とする、請求項1または請求項2に記載の検査装置。   The inspection apparatus according to claim 1, wherein a spot diameter of light of the light projecting unit is 0.1 mm or greater and 1.0 mm or less.
JP2017088543A 2017-04-27 2017-04-27 Inspection equipment Pending JP2018183757A (en)

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