JP2018163955A - Substrate housing apparatus - Google Patents

Substrate housing apparatus Download PDF

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JP2018163955A
JP2018163955A JP2017059687A JP2017059687A JP2018163955A JP 2018163955 A JP2018163955 A JP 2018163955A JP 2017059687 A JP2017059687 A JP 2017059687A JP 2017059687 A JP2017059687 A JP 2017059687A JP 2018163955 A JP2018163955 A JP 2018163955A
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substrate
storage device
support
substrate support
substrate storage
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川原 信途
Nobumichi Kawahara
信途 川原
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Canon Inc
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Canon Inc
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Abstract

PROBLEM TO BE SOLVED: To provide a substrate housing apparatus being advantageous in terms of degree of freedom in layout in a semiconductor manufacturing apparatus and downsizing of the semiconductor manufacturing apparatus.SOLUTION: A substrate housing apparatus for housing a substrate includes at least three support rods, and a substrate support part which is held by the support rods and designed to support end portions of the substrate. The substrate support part is disposed at each of the at least three support rods. The at least three support rods are arranged at positions that allow loading and unloading of the substrate in at least three directions in a plan view.SELECTED DRAWING: Figure 1

Description

本発明は、基板を収納する基板収納装置に関する。   The present invention relates to a substrate storage device that stores a substrate.

現在、半導体素子の製造工程ではパターンの微細化が進み、ナノメートルオーダーのデザインルールによる微細構造デバイスの生産が可能となっている。このような微細化が進むと、製造工程内で使用される基板(ウエハやマスクを含む)に付着するパーティクルについても、ナノメートルオーダーサイズの物質でさえも、製品の歩留まりを低下させる要因となりうる。このような理由から、半導体素子の製造は浮遊パーティクルの少ないクリーンルームで行われるが、クリーンルーム全体で高いクリーン度を保つことは多大なコストを要し、また、必要なクリーン度に到達するまでの立ち上がり時間が長くなってしまう。実際には、基板を処理する基板処理装置内の狭い領域で高いクリーン度に保つとともに、基板を、内部を高いクリーン度で密閉した容器に入れて搬送する方法がとられる。そのような容器としては例えば、FOUP(Front-Opening Unified Pods)やSMIF(Standard of Mechanical Interface)がある。   At present, in the manufacturing process of semiconductor elements, pattern miniaturization is progressing, and it is possible to produce microstructure devices based on design rules of nanometer order. As such miniaturization progresses, even particles that adhere to the substrates (including wafers and masks) used in the manufacturing process, even nanometer-sized substances, can be a factor in reducing product yield. . For these reasons, semiconductor devices are manufactured in a clean room with few airborne particles. However, maintaining a high level of cleanliness in the entire cleanroom is very costly, and it takes time to reach the required cleanliness. The time will be longer. In practice, a method of keeping a high cleanness in a narrow region in a substrate processing apparatus for processing a substrate and transporting the substrate in a sealed container with a high cleanness is used. Examples of such containers include FOUP (Front-Opening Unified Pods) and SMIF (Standard of Mechanical Interface).

図10は従来例(特許文献1)による半導体製造装置42の構成を示している。図10において、SMIFオープナ50は、半導体製造装置42に対して、Y方向の寸法を短縮するために、X方向にはみ出して配置されている。   FIG. 10 shows a configuration of a semiconductor manufacturing apparatus 42 according to a conventional example (Patent Document 1). In FIG. 10, the SMIF opener 50 is disposed so as to protrude in the X direction with respect to the semiconductor manufacturing apparatus 42 in order to shorten the dimension in the Y direction.

半導体製造装置42で基板3を収納する基板収納装置には一般的に、FOUPやSMIFが利用される。これらの基板収納装置は、例えば「SEMI E112−1106」等の規格によって基板収納部の形状および寸法が規定されている。図9に示す例では、一対の壁状の基板保持部47に櫛歯状に等間隔の開口溝48が成形されており、開口溝48に沿う一方向から基板3の出し入れが行われる。このため、半導体製造装置42内部で基板3の出し入れ方向を変更する必要がある場合には、図10の従来例に示すように、基板収納部の向きを変更することが必須であり、SMIFオープナ50の向きも変更せざるを得ない。   In general, FOUP or SMIF is used for a substrate storage apparatus that stores the substrate 3 in the semiconductor manufacturing apparatus 42. In these substrate storage apparatuses, the shape and dimensions of the substrate storage portion are defined by standards such as “SEMI E112-1106”, for example. In the example shown in FIG. 9, the pair of wall-shaped substrate holding portions 47 are formed with opening grooves 48 at equal intervals in a comb shape, and the substrate 3 is taken in and out from one direction along the opening grooves 48. For this reason, when it is necessary to change the direction in which the substrate 3 is taken in and out inside the semiconductor manufacturing apparatus 42, it is essential to change the direction of the substrate storage portion as shown in the conventional example of FIG. The direction of 50 must be changed.

特開2001−358194号公報JP 2001-358194 A

例えば図8に示す半導体製造装置42では、基板収納装置7a,7bは、装置へのアクセス方向51に対して平行で、かつ、ロボット45を挟んで対象に配置されている。このような配置では、基板収納装置7a,7bに対して、ロボット45はアクセス方向52a,52bからハンド43を基板収納装置内に挿入して、基板3a,3bの出し入れを行いたい。すなわち、図9において、現在のアクセス方向52の他に、アクセス方向52a,52bから基板3の出し入れができなければ、図8に示されるような半導体製造装置42では使用することができない。   For example, in the semiconductor manufacturing apparatus 42 shown in FIG. 8, the substrate storage apparatuses 7 a and 7 b are parallel to the access direction 51 to the apparatus and are arranged on the target with the robot 45 interposed therebetween. In such an arrangement, the robot 45 wants to insert and remove the substrates 3a and 3b from the access directions 52a and 52b into the substrate storage device with respect to the substrate storage devices 7a and 7b. That is, in FIG. 9, unless the substrate 3 can be taken in and out from the access directions 52a and 52b in addition to the current access direction 52, it cannot be used in the semiconductor manufacturing apparatus 42 as shown in FIG.

本発明は、半導体製造装置内のレイアウト自由度および半導体製造装置の小型化の点で有利な基板収納装置を提供することを目的とする。   SUMMARY OF THE INVENTION An object of the present invention is to provide a substrate storage device that is advantageous in terms of freedom of layout in a semiconductor manufacturing apparatus and miniaturization of the semiconductor manufacturing apparatus.

本発明の一側面によれば、基板を収納する基板収納装置であって、少なくとも3本の支柱と、前記支柱によって保持され、前記基板の端部を支持する基板支持部とを有し、前記基板支持部は、前記少なくとも3本の支柱のそれぞれに設けられ、前記少なくとも3本の支柱は、平面視で少なくとも3つの方向で前記基板の搬入出を行うことができる位置に配置されていることを特徴とする基板収納装置が提供される。   According to one aspect of the present invention, there is provided a substrate storage device for storing a substrate, comprising: at least three support columns; and a substrate support unit that is held by the support columns and supports an end portion of the substrate, A substrate support portion is provided on each of the at least three support columns, and the at least three support columns are arranged at positions where the substrate can be loaded and unloaded in at least three directions in plan view. The board | substrate storage apparatus characterized by these is provided.

本発明によれば、半導体製造装置内のレイアウト自由度および半導体製造装置の小型化の点で有利な基板収納装置が提供される。   ADVANTAGE OF THE INVENTION According to this invention, the board | substrate storage apparatus advantageous at the point of the layout freedom in a semiconductor manufacturing apparatus and the size reduction of a semiconductor manufacturing apparatus is provided.

基板収納装置の構成の一例を示す図。The figure which shows an example of a structure of a board | substrate storage apparatus. 基板が搭載された基板収納装置の例を示す図。The figure which shows the example of the board | substrate storage apparatus with which the board | substrate was mounted. 基板の形状を例示する図。The figure which illustrates the shape of a board | substrate. 基板収納装置の支柱の配置を説明する図。The figure explaining arrangement | positioning of the support | pillar of a board | substrate storage apparatus. 基板収納装置の基板支持部の構成例を示す図。The figure which shows the structural example of the board | substrate support part of a board | substrate storage apparatus. 基板収納装置の基板支持部の構成例を示す図。The figure which shows the structural example of the board | substrate support part of a board | substrate storage apparatus. 図6の基板支持部を用いた基板収納装置の構成を示す図。The figure which shows the structure of the board | substrate storage apparatus using the board | substrate support part of FIG. 基板収納装置が適用される半導体製造装置の構成例を示す図。The figure which shows the structural example of the semiconductor manufacturing apparatus with which a board | substrate storage apparatus is applied. 従来例による基板収納装置の形状を示す図。The figure which shows the shape of the board | substrate storage apparatus by a prior art example. 従来例による半導体製造装置の構成例を示す図。The figure which shows the structural example of the semiconductor manufacturing apparatus by a prior art example. 図2の基板収納装置をY方向からみた正面図。The front view which looked at the board | substrate storage apparatus of FIG. 2 from the Y direction. 基板収納装置の他の構成例を示す図。The figure which shows the other structural example of a board | substrate storage apparatus. 基板収納装置の他の構成例を示す図。The figure which shows the other structural example of a board | substrate storage apparatus. 基板支持部の他の構成例を示す図。The figure which shows the other structural example of a board | substrate support part.

以下、図面を参照して本発明の実施形態について詳細に説明する。なお、本発明は以下の実施形態に限定されるものではなく、以下の実施形態は本発明の実施の具体例を示すにすぎない。また、以下の実施形態の中で説明されている特徴の組み合わせの全てが本発明の課題解決のために必須のものであるとは限らない。   Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. In addition, this invention is not limited to the following embodiment, The following embodiment shows only the specific example of implementation of this invention. Moreover, not all combinations of features described in the following embodiments are indispensable for solving the problems of the present invention.

図1は、本実施形態に係る基板収納装置の構成の一例を示す図である。基板収納装置は、支柱1、支持部2、台座4を有する。支柱1は、台座4の四隅にそれぞれ立設される支柱1a,1b,1c,1dを含む。基板を支持する支持部2は、支柱1a,1b,1c,1dにそれぞれ保持される基板支持部2a,2b,2c,2dを含む。支柱1aには、基板支持部2aが設けられている。基板支持部2aは各支柱に複数配置されている。例えば本実施形態においては、基板支持部2aは、Z方向に等間隔で配置された複数(ここでは例えば5個)の基板支持部2a−1,2a−2,2a−3,2a−4,2a−5を含む。
支柱1bには、基板支持部2bが設けられている。基板支持部2bは、Z方向に等間隔で配置された5個の基板支持部2b−1,2b−2,2b−3,2b−4,2b−5を含む。
支柱1cには、基板支持部2cが設けられている。基板支持部2cは、Z方向に等間隔で配置された5個の基板支持部2c−1,2c−2,2c−3,2c−4,2c−5を含む。
支柱1dには、基板支持部2dが設けられている。基板支持部2dは、Z方向に等間隔で配置された5個の基板支持部2d−1,2d−2,2d−3,2d−4,2d−5を含む。
基板支持部2a−1,2b−1,2c−1,2d−1はZ方向に同じ高さに配置されており、残る4段の基板支持部も同様にそれぞれ同じ高さに固定されている。こうして複数段の基板の収納位置が形成されている。
FIG. 1 is a diagram illustrating an example of a configuration of a substrate storage device according to the present embodiment. The substrate storage device includes a support column 1, a support portion 2, and a pedestal 4. The column 1 includes columns 1 a, 1 b, 1 c, and 1 d erected at the four corners of the base 4. The support portion 2 that supports the substrate includes substrate support portions 2a, 2b, 2c, and 2d that are respectively held by the columns 1a, 1b, 1c, and 1d. The support 1a is provided with a substrate support 2a. A plurality of substrate support portions 2a are arranged on each column. For example, in the present embodiment, the substrate support portion 2a includes a plurality (for example, five in this case) of substrate support portions 2a-1, 2a-2, 2a-3, 2a-4, which are arranged at equal intervals in the Z direction. 2a-5.
The support 1b is provided with a substrate support 2b. The substrate support portion 2b includes five substrate support portions 2b-1, 2b-2, 2b-3, 2b-4, and 2b-5 arranged at equal intervals in the Z direction.
The support 1c is provided with a substrate support 2c. The substrate support portion 2c includes five substrate support portions 2c-1, 2c-2, 2c-3, 2c-4, and 2c-5 arranged at equal intervals in the Z direction.
The support 1d is provided with a substrate support 2d. The substrate support portion 2d includes five substrate support portions 2d-1, 2d-2, 2d-3, 2d-4, and 2d-5 arranged at equal intervals in the Z direction.
The substrate support portions 2a-1, 2b-1, 2c-1, 2d-1 are arranged at the same height in the Z direction, and the remaining four stages of substrate support portions are similarly fixed at the same height. . Thus, a plurality of stages of storage positions are formed.

図2は、図1に示した基板収納装置内において、下から2段目の基板支持部2a−2,2b−2,2c−2,2d−2上に基板3を搭載した図である。先に説明したように基板支持部2a−2,2b−2,2c−2,2d−2は同一の高さに配置されているので、基板3は台座4と平行に搭載されることになる。   FIG. 2 is a diagram in which the substrate 3 is mounted on the substrate support portions 2a-2, 2b-2, 2c-2, and 2d-2 in the second stage from the bottom in the substrate storage apparatus shown in FIG. As described above, since the substrate supporting portions 2a-2, 2b-2, 2c-2, 2d-2 are arranged at the same height, the substrate 3 is mounted in parallel with the base 4. .

図4は、図2の基板収納装置をZ方向の上方から見た図である。本実施形態で想定している基板3は平面視で四角形状の角型基板であり、X方向の幅Wxと、Y方向の幅Wyを有し、図3に示すように、2対の平行な側面21,22、23,24を有する。図4(A)において、基板3の第1側面21を含む平面を第1平面31とし、第1側面21と平行な第2側面22を含む平面を第2平面32とする。この場合、基板3をX方向に搬送する場合には、基板3は第1平面31と第2平面32とで挟まれた領域を通過する。同様に、基板3の第1側面21に隣接する第3側面23を含む平面を第3平面33とし、第3側面23と平行な第4側面24を含む平面を第4平面34とする。この場合、基板3をY方向に搬送する場合には、基板3は第3平面33と第4平面34とで挟まれた領域を通過する。   4 is a view of the substrate storage device of FIG. 2 as viewed from above in the Z direction. The substrate 3 assumed in this embodiment is a square substrate having a quadrangular shape in plan view, and has a width Wx in the X direction and a width Wy in the Y direction. As shown in FIG. Side surfaces 21, 22, 23, 24. In FIG. 4A, a plane including the first side surface 21 of the substrate 3 is referred to as a first plane 31, and a plane including the second side surface 22 parallel to the first side surface 21 is referred to as a second plane 32. In this case, when the substrate 3 is transported in the X direction, the substrate 3 passes through a region sandwiched between the first plane 31 and the second plane 32. Similarly, a plane including the third side surface 23 adjacent to the first side surface 21 of the substrate 3 is referred to as a third plane 33, and a plane including the fourth side surface 24 parallel to the third side surface 23 is referred to as a fourth plane 34. In this case, when the substrate 3 is transported in the Y direction, the substrate 3 passes through a region sandwiched between the third plane 33 and the fourth plane 34.

支柱1a〜1dは、平面視で少なくとも3つの方向で基板の搬入出を行うことができる位置に配置されている。図4の例においては、基板3の隅部付近に配置された支柱1a〜1dはいずれも、第1平面31と第2平面32とで挟まれた領域と、第3平面33と第4平面34とで挟まれた領域とを避けた領域に配置されている。すなわち、4本の支柱は、X方向またはY方向において、基板3の幅WxまたはWyよりも広い間隔を持って配置されている。このように複数の支柱は、基板の収納位置の外側の位置に配置されている。従って、基板3をX方向に移動する場合も、Y方向に移動する場合も、基板3は支柱1a〜1dのいずれとも干渉することはない。X方向についてもY方向についても支柱1a〜1dが基板3の動線と干渉することはないので、図4(B)に示すアクセス方向52a,52b,52c,52dのいずれの方向からも基板3を搬入/搬出することができる。一方、基板支持部2は、基板の収納位置の内側の位置で基板を支持するように配置されている。このように、平面視で少なくとも3つの方向で基板の搬入出を行うことができる基板収納装置が実現されている。   The support pillars 1a to 1d are arranged at positions where the substrate can be loaded and unloaded in at least three directions in plan view. In the example of FIG. 4, all of the support pillars 1 a to 1 d arranged near the corners of the substrate 3 are a region sandwiched between the first plane 31 and the second plane 32, and the third plane 33 and the fourth plane. 34 is arranged in a region that avoids the region sandwiched by 34. That is, the four struts are arranged with an interval wider than the width Wx or Wy of the substrate 3 in the X direction or the Y direction. As described above, the plurality of support columns are arranged at positions outside the substrate storage position. Therefore, the substrate 3 does not interfere with any of the columns 1a to 1d when the substrate 3 is moved in the X direction or the Y direction. Since the support pillars 1a to 1d do not interfere with the flow line of the substrate 3 in both the X direction and the Y direction, the substrate 3 can be viewed from any of the access directions 52a, 52b, 52c, and 52d shown in FIG. Can be carried in / out. On the other hand, the board | substrate support part 2 is arrange | positioned so that a board | substrate may be supported in the position inside the accommodation position of a board | substrate. In this way, a substrate storage device that can carry in and out the substrate in at least three directions in plan view is realized.

図11は、図2の基板収納装置をY方向からみた正面図である。上記説明のように、支柱1bと支柱1cとの間のX方向の間隔Wは、基板3の幅より広い。さらに、Z方向に配列された基板支持部2bおよび2cにおいて、各基板支持部は基板3の厚さよりも大きな隙間Hをもって配置されている。そのため、基板3は、この隙間Hの開口領域内を基板3が支柱1b,1cや基板支持部2b,2cに干渉することなくY方向に通過することができる。   FIG. 11 is a front view of the substrate storage device of FIG. 2 as viewed from the Y direction. As described above, the interval W in the X direction between the column 1 b and the column 1 c is wider than the width of the substrate 3. Further, in the substrate support portions 2 b and 2 c arranged in the Z direction, each substrate support portion is arranged with a gap H larger than the thickness of the substrate 3. Therefore, the substrate 3 can pass through the opening region of the gap H in the Y direction without interfering with the support columns 1b and 1c and the substrate support portions 2b and 2c.

図5に、基板支持部2の構成例を示す。図5(A)において、基板3が載置される載置部11は、基板支持部2の上面からZ方向に深さDだけ下がった位置に形成された段差底面である。また、段差底面から立ち上がる段差側面は、載置部11に載置された基板の水平方向の動きを規制するべく基板の端部が突き当てられる突き当て部12として使用される。突き当て部12としての段差側面は、例えば図5(A)に示されるような、基板を載置部11に載置する際の誘導用の傾斜面により形成されている。図4(A)において、隣り合う基板支持部の両者の載置部間の距離は、基板3のX方向の幅WxまたはY方向の幅Wyより狭くなるように配置される。そして、基板3は、同じ段の基板支持部の4つの載置部によって水平に搭載される。また、図11に示すように、基板3は幅W、基板3の厚さTよりも広い高さHの開口部を通過した後に、基板支持部の上面よりも深さDだけ下方の載置部に搭載される。このとき、突き当て部12には傾斜面が形成されているので、基板3を載置部11まで下降させる際の動きもスムースである。図11にはY方向からみた側面図を示したが、X方向からみた側面図も図11と同様であり、基板3をX方向に通過させるのに十分な開口を持っている。よって、本実施形態の基板収納装置は基板3を水平な4方向から搬入/搬出を行うことが可能である。   In FIG. 5, the structural example of the board | substrate support part 2 is shown. In FIG. 5A, the placement portion 11 on which the substrate 3 is placed is a step bottom surface formed at a position lower than the upper surface of the substrate support portion 2 by a depth D in the Z direction. Further, the step side surface rising from the step bottom surface is used as an abutting portion 12 against which an end portion of the substrate is abutted so as to restrict the horizontal movement of the substrate placed on the placing portion 11. The step side surface as the abutting portion 12 is formed by an inclined surface for guidance when the substrate is placed on the placement portion 11 as shown in FIG. 5A, for example. In FIG. 4A, the distance between the placement portions of the adjacent substrate support portions is arranged to be narrower than the width Wx in the X direction or the width Wy in the Y direction of the substrate 3. And the board | substrate 3 is mounted horizontally by the four mounting parts of the board | substrate support part of the same step. Also, as shown in FIG. 11, the substrate 3 is placed below the upper surface of the substrate support portion by a depth D after passing through an opening having a width W and a height H wider than the thickness T of the substrate 3. Mounted on the part. At this time, since the abutting portion 12 is formed with an inclined surface, the movement when the substrate 3 is lowered to the placement portion 11 is also smooth. Although the side view seen from the Y direction is shown in FIG. 11, the side view seen from the X direction is also the same as FIG. 11, and has a sufficient opening to allow the substrate 3 to pass in the X direction. Therefore, the substrate storage apparatus of the present embodiment can carry in / out the substrate 3 from four horizontal directions.

したがって、従来例として示した図8の半導体製造装置42における基板収納装置7a,7bに本実施形態の基板収納装置を適用する場合、本実施形態の基板収納装置は7a,7bのどちらの搭載位置にも互換性を持って使用可能である。また、本実施形態の基板収納装置を基板収納装置7a,7bに適用した場合、Z軸に対して90°回転させて搭載しても、内部の基板3をロボット45のハンド43によって搬出して、処理室46に移載することが可能である。   Therefore, when the substrate storage device of this embodiment is applied to the substrate storage devices 7a and 7b in the semiconductor manufacturing apparatus 42 shown in FIG. 8 as a conventional example, the substrate storage device of this embodiment has either of the mounting positions 7a and 7b. Can also be used interchangeably. Further, when the substrate storage device of the present embodiment is applied to the substrate storage devices 7a and 7b, the internal substrate 3 is unloaded by the hand 43 of the robot 45 even if the substrate storage device is rotated by 90 ° with respect to the Z axis. It is possible to transfer to the processing chamber 46.

例えば本実施形態の基板収納装置を図8の基板収納装置7aとして用いる場合を考える。まず、ロボット45は、図11に示される基板3の底面高さであるS2よりも低い位置にハンド43を挿入した後、高さS2までハンド43を上昇させ、ハンド43上の図示しない吸着パッドで基板3をハンド43上に吸着固定する。その後、ハンド43を高さS1よりも数ミリ高い位置まで更に持ち上げ、ハンド43をX方向に、ロボット45に中心位置Pまで移動させることで、基板3を基板収納装置7aから取り出すことができる。そして、上記と逆の駆動を実施することで、基板3を基板収納装置7aに戻すことができる。   For example, consider the case where the substrate storage device of the present embodiment is used as the substrate storage device 7a of FIG. First, the robot 45 inserts the hand 43 at a position lower than the bottom surface height S2 of the substrate 3 shown in FIG. Then, the substrate 3 is sucked and fixed on the hand 43. Thereafter, the hand 43 is further lifted to a position several millimeters higher than the height S1, and the hand 43 is moved in the X direction to the robot 45 to the center position P, whereby the substrate 3 can be taken out from the substrate storage device 7a. And the board | substrate 3 can be returned to the board | substrate storage apparatus 7a by implementing the reverse drive to the above.

ただし、処理室46内で基板3に処理を加える際に基板3の位置が1ミリ程度ずれる場合がある。この場合、処理室46からハンド43で受け取った基板3は、搬入した際からずれた状態でハンド43上に受け渡しされるため、基板収納装置7aに戻す際にも、そのままのずれ量が残ったまま載置部11上に搭載されうる。しかし、基板支持部2には図5(A)に示すように突き当て部12が傾斜面により形成されているため、基板3は下降の際に、斜面に沿って規定位置方向に位置が修正されて搭載される。   However, when processing the substrate 3 in the processing chamber 46, the position of the substrate 3 may be shifted by about 1 mm. In this case, since the substrate 3 received by the hand 43 from the processing chamber 46 is transferred to the hand 43 in a state of being shifted from the time when it is carried in, the shift amount remains as it is when returning to the substrate storage device 7a. It can be mounted on the mounting portion 11 as it is. However, since the abutting portion 12 is formed with an inclined surface as shown in FIG. 5A in the substrate support portion 2, the position of the substrate 3 is corrected in the specified position direction along the inclined surface when descending. To be installed.

図5(B)に示す例では、図5(A)で説明した突き当て部12の幅を例えば1mm以下の幅に成形して基板3との接触面が小さくなるようにしている。具体的には、基板支持部2は、その上面から下がった位置に形成された段差底面から立ち上がる基板支持部2の側壁部により形成されるリブを有する。そして、このリブの上面から下がった位置に形成されたリブ底面を載置部11とし、リブ底面から立ち上がるリブ側面を突き当て部12とする。この構造により、突き当て部12の表面と基板3との接触によって発生する摩擦抵抗が減少し、基板3が突き当て部12の途中で引っかかることが防止されるとともに、接触によって発生するパーティクルの量も減少させることができる。更に、図5(B)の例では、載置部11は、基板と当接する当接部が基板の中心に向かって低くなるような傾斜を有する。このため、基板3の底面と当接部とは面接触せずに、線接触または点接触となる。よって、当接部の上にパーティクルが乗っていたとしても、基板3の底面にパーティクルが転移するのを防止できる。   In the example shown in FIG. 5B, the width of the abutting portion 12 described in FIG. 5A is formed to a width of, for example, 1 mm or less so that the contact surface with the substrate 3 becomes small. Specifically, the substrate support part 2 has a rib formed by a side wall part of the substrate support part 2 rising from a step bottom surface formed at a position lowered from the upper surface thereof. The bottom surface of the rib formed at a position lowered from the top surface of the rib is referred to as a mounting portion 11, and the side surface of the rib that rises from the bottom surface of the rib is referred to as an abutment portion 12. With this structure, the frictional resistance generated by the contact between the surface of the abutting portion 12 and the substrate 3 is reduced, the substrate 3 is prevented from being caught in the middle of the abutting portion 12, and the amount of particles generated by the contact is reduced. Can also be reduced. Furthermore, in the example of FIG. 5B, the placement portion 11 has an inclination such that the contact portion that contacts the substrate becomes lower toward the center of the substrate. For this reason, the bottom surface of the substrate 3 and the contact portion are not in surface contact but are in line contact or point contact. Therefore, even if particles are on the contact portion, the particles can be prevented from transferring to the bottom surface of the substrate 3.

図5(C)に示す例では、載置部11は、基板支持部2の上面から下がった位置に形成された段差底面から突出して基板の底面と当接する突起部により構成されている。かかる構成によれば、パーティクルの発生や転移の懸念が更に少なくなる。   In the example shown in FIG. 5C, the mounting portion 11 is configured by a protruding portion that protrudes from the bottom surface of the step formed at a position lowered from the upper surface of the substrate support portion 2 and contacts the bottom surface of the substrate. According to this configuration, there is less concern about the generation or transfer of particles.

図1及び図2の例では、基板3の四隅を基板支持部2で支持する構成として説明した。しかし、基板3は四隅のうちの3か所を受けていれば、安定して固定することができるので、支柱は少なくとも3本あればよいと言える。更に言えば、基板支持部2が、同じ高さに少なくとも3か所配置されていればよい。図1に示す構成から、支柱1d、基板支持部2dを削除して、他の3本の支柱と基板支持部によって基板3を保持してもよいが、図12、図13により適切な例を示す。図12(A)に示す例では、支柱1eが、図1の支柱1cと支柱1dの中間位置に配置されている。この場合、図13に示すように、支柱1eがアクセス方向52cにおける基板の動線上にあるため、4方向からのアクセスはできないが、3方向からのアクセスは確保されている。すなわち、少なくとも3本の支柱のうちの少なくとも2本の支柱は、平面視で基板の少なくとも3つの方向の搬送軌跡の領域の外側に配置されていればよい。   In the example of FIGS. 1 and 2, the four corners of the substrate 3 are described as being configured to be supported by the substrate support portion 2. However, since the substrate 3 can be stably fixed as long as it receives three places in the four corners, it can be said that it is sufficient that there are at least three support columns. Furthermore, it is sufficient that at least three substrate support portions 2 are arranged at the same height. From the configuration shown in FIG. 1, the support column 1d and the substrate support unit 2d may be deleted, and the substrate 3 may be held by the other three support columns and the substrate support unit. Show. In the example shown in FIG. 12A, the column 1e is disposed at an intermediate position between the column 1c and the column 1d in FIG. In this case, as shown in FIG. 13, since the support 1e is on the flow line of the substrate in the access direction 52c, access from four directions is not possible, but access from three directions is secured. In other words, at least two of the at least three columns only need to be arranged outside the region of the transport locus in at least three directions of the substrate in plan view.

図13において、基板3の+X、−Y、+Y方向の移動は、基板支持部2aおよび2bによって規制されているため、基板支持部2eは−X方向の移動だけを規制すればよい。図14は、−X方向の移動だけを規制する基板支持部2の構成例を示している。この場合、突き当て部12は図5に示す形態とは異なり、一方向のみ、基板3と接する形状となっている。また、支柱1eを図12(A)に示すような基板の一辺の中間位置に設けるのではなく、例えば、図12(B)に示すように、隣り合う2本の支柱1cと支柱1dとを連結する連結部材の中間部に基板支持部2を設ける構成としてもよい。   In FIG. 13, the movement of the substrate 3 in the + X, −Y, and + Y directions is restricted by the substrate support parts 2 a and 2 b, so the substrate support part 2 e only needs to restrict the movement in the −X direction. FIG. 14 shows a configuration example of the substrate support 2 that restricts only movement in the −X direction. In this case, unlike the form shown in FIG. 5, the abutting portion 12 has a shape in contact with the substrate 3 only in one direction. Further, the support 1e is not provided at an intermediate position on one side of the substrate as shown in FIG. 12A. For example, as shown in FIG. 12B, two adjacent support 1c and support 1d are connected. It is good also as a structure which provides the board | substrate support part 2 in the intermediate part of the connecting member to connect.

図1の基板収納装置では、図5に示されるように、基板支持部2は支柱1に対して独立した部材として示したが、例えば図6に示すように、同じ段の複数の基板支持部が一体化された構成であってもよい。図6において、プレート5は同じ段の基板支持部2a,2b,2c,2dがプレート5に取り付けられることにより、同じ段の基板支持部が一体化されている。図7ではこのような形態の基板支持部を図1と同様の支柱1に対して固定した構成例を示している。同図において、プレート5は5段の基板支持部それぞれの間で、以下に説明するように、空間を分離する遮蔽板の役割を果たしている。   In the substrate storage apparatus of FIG. 1, as shown in FIG. 5, the substrate support 2 is shown as an independent member with respect to the support column 1, but for example, as shown in FIG. May be an integrated configuration. In FIG. 6, the same stage substrate support portions are integrated by attaching the same stage substrate support portions 2 a, 2 b, 2 c, 2 d to the plate 5. FIG. 7 shows a configuration example in which the substrate support portion having such a configuration is fixed to the column 1 similar to FIG. In the same figure, the plate 5 plays the role of the shielding board which isolate | separates space between each 5 steps | paragraphs of board | substrate support parts so that it may demonstrate below.

半導体製造装置で使用される基板は、先に説明したように、FOUPやSMIFのような基板収納装置で運搬されることが一般的である。そのような基板収納装置においては、基板の清浄度を高度に保証するために、搬送経路中に存在するガスやパーティクルが基板と接触することを防止することが重要である。したがって、基板収納装置を構成する部品には、全てパーティクルの発生を抑制する材質が適用されていることはもちろん、基板との接触面積も極力小さくなるように配慮されている。しかし、十分にパーティクルの発生を抑制しても、なお、基板3と基板支持部2との接触箇所において発塵が起こったり、外部で基板に付着したパーティクルが基板収納装置内に持ち込まれる場合がある。   As described above, a substrate used in a semiconductor manufacturing apparatus is generally transported by a substrate storage device such as FOUP or SMIF. In such a substrate storage device, it is important to prevent the gas or particles present in the transport path from coming into contact with the substrate in order to highly guarantee the cleanliness of the substrate. Therefore, not only the material that suppresses the generation of particles is applied to all the parts constituting the substrate storage device, but also consideration is given to making the contact area with the substrate as small as possible. However, even if the generation of particles is sufficiently suppressed, there is a case where dust is generated at the contact portion between the substrate 3 and the substrate support portion 2 or particles adhered to the substrate are brought into the substrate storage device. is there.

このように、基板収納装置内のパーティクル発生が完全になくならない状況においては、基板収納装置内で、パーティクルが拡散させないことが重要である。図7に示す構成によれば、基板3を搭載しても、基板間の空間がプレート5によって分断されているため、パーティクルが他の基板まで到達しにくい構造となっている。   Thus, in a situation where the generation of particles in the substrate storage device is not completely eliminated, it is important that the particles do not diffuse in the substrate storage device. According to the configuration shown in FIG. 7, even if the substrate 3 is mounted, the space between the substrates is divided by the plate 5, so that it is difficult for particles to reach other substrates.

以上説明した種々の実施形態によれば、基板収納装置内に基板を搬入/搬出する際に、図9に示したような壁状の基板保持部47によって基板の搬送経路を塞がれることがない。また、支柱は基板の収納位置の外側の位置に配置されているため、支柱によって基板の搬送経路が塞がれることもない。したがって、基板収納装置に対して、複数の方向から基板の出し入れが可能となり、半導体製造装置内のレイアウト自由度が向上し、かつ、半導体製造装置の小型化を図ることができる。   According to the various embodiments described above, when the substrate is carried in / out of the substrate storage apparatus, the substrate conveyance path can be blocked by the wall-shaped substrate holding portion 47 as shown in FIG. Absent. Further, since the support column is disposed outside the substrate storage position, the transfer route of the substrate is not blocked by the support column. Therefore, the substrate can be taken in and out of the substrate storage device from a plurality of directions, the layout freedom in the semiconductor manufacturing device is improved, and the semiconductor manufacturing device can be downsized.

以上、本発明の好ましい実施形態について説明したが、本発明はこれらの実施形態に限定されないことはいうまでもなく、その要旨の範囲内で種々の変形および変更が可能である。   As mentioned above, although preferred embodiment of this invention was described, it cannot be overemphasized that this invention is not limited to these embodiment, A various deformation | transformation and change are possible within the range of the summary.

1:支柱、2:基板支持部、3:基板、4:台座 1: support, 2: substrate support, 3: substrate, 4: pedestal

Claims (13)

基板を収納する基板収納装置であって、
少なくとも3本の支柱と、
前記支柱によって保持され、前記基板の端部を支持する基板支持部と、
を有し、
前記基板支持部は、前記少なくとも3本の支柱のそれぞれに設けられ、
前記少なくとも3本の支柱は、平面視で少なくとも3つの方向で前記基板の搬入出を行うことができる位置に配置されていることを特徴とする基板収納装置。
A substrate storage device for storing a substrate,
At least three struts,
A substrate support portion held by the support column and supporting an end portion of the substrate;
Have
The substrate support is provided on each of the at least three columns.
The substrate storage device, wherein the at least three support columns are arranged at positions where the substrate can be loaded and unloaded in at least three directions in plan view.
前記少なくとも3本の支柱のうちの少なくとも2本の支柱は、前記平面視で基板の少なくとも3つの方向の搬送軌跡の領域の外側に配置されていることを特徴とする請求項1に記載の基板収納装置。   2. The substrate according to claim 1, wherein at least two of the at least three columns are arranged outside a region of a conveyance locus in at least three directions of the substrate in the plan view. Storage device. 前記基板は角型基板であり、
前記少なくとも2本の支柱は、前記角型基板の第1側面を含む第1平面と前記第1側面と平行な第2側面を含む第2平面とに挟まれた領域と、前記第1側面に隣接する第3側面を含む第3平面と前記第3側面と平行な第4側面を含む第4平面とに挟まれた領域とを避けた領域に配置されていることを特徴とする請求項2に記載の基板収納装置。
The substrate is a square substrate;
The at least two struts are provided on a region sandwiched between a first plane including the first side surface of the square substrate and a second plane including a second side surface parallel to the first side surface, and on the first side surface. 3. The device according to claim 2, wherein the second flat plate is disposed in a region that avoids a region sandwiched between a third flat surface including a third side surface adjacent thereto and a fourth flat surface including a fourth side surface parallel to the third side surface. The board | substrate storage apparatus of description.
前記基板支持部は、前記基板が載置される載置部と、前記載置部に載置された前記基板の水平方向の動きを規制する突き当て部と有することを特徴とする、請求項1乃至3のいずれか1項に記載の基板収納装置。   The substrate support unit includes a mounting unit on which the substrate is mounted, and an abutting unit that restricts horizontal movement of the substrate mounted on the mounting unit. The substrate storage device according to any one of 1 to 3. 前記載置部は、前記基板支持部の上面から下がった位置に形成された段差底面であり、前記突き当て部は、前記段差底面から立ち上がる段差側面であることを特徴とする請求項4に記載の基板収納装置。   The said mounting part is a level | step difference bottom face formed in the position lowered | hung from the upper surface of the said board | substrate support part, The said abutment part is a level | step difference side surface which stands | starts up from the said level | step difference bottom face, Board storage device. 前記段差側面は、前記基板を前記載置部に載置する際の誘導用の傾斜面を有することを特徴とする請求項5に記載の基板収納装置。   6. The substrate storage device according to claim 5, wherein the step side surface has an inclined surface for guiding when the substrate is placed on the mounting portion. 前記基板支持部は、該基板支持部の上面から下がった位置に形成された段差底面から立ち上がる前記基板支持部の側壁部により形成されるリブを有し、
前記載置部は、前記リブの上面から下がった位置に形成されたリブ底面であり、前記突き当て部は、前記リブ底面から立ち上がるリブ側面であることを特徴とする請求項4に記載の基板収納装置。
The substrate support portion has a rib formed by a side wall portion of the substrate support portion rising from a step bottom surface formed at a position lowered from the upper surface of the substrate support portion,
5. The substrate according to claim 4, wherein the mounting portion is a rib bottom surface formed at a position lowered from an upper surface of the rib, and the abutting portion is a rib side surface rising from the rib bottom surface. Storage device.
前記リブ底面は、前記基板と線接触または点接触で当接するように傾斜していることを特徴とする請求項7に記載の基板収納装置。   The substrate storage device according to claim 7, wherein the rib bottom surface is inclined so as to come into contact with the substrate by line contact or point contact. 前記載置部は、前記基板支持部の上面から下がった位置に形成された段差底面から突出し、前記基板の底面と当接する突起部を有することを特徴とする請求項4に記載の基板収納装置。   5. The substrate storage device according to claim 4, wherein the mounting portion has a protrusion that protrudes from a bottom surface of a step formed at a position lowered from an upper surface of the substrate support portion and contacts the bottom surface of the substrate. . 前記基板支持部は、前記少なくとも3本の支柱のそれぞれに複数配置され、該配置の高さ方向の間隔を等間隔とすることで、複数段の基板の収納位置を形成することを特徴とする、請求項1乃至9のいずれか1項に記載の基板収納装置。   A plurality of the substrate support portions are arranged on each of the at least three support columns, and a plurality of substrate storage positions are formed by setting the intervals in the height direction of the arrangements at equal intervals. The substrate storage device according to any one of claims 1 to 9. 同じ段の前記基板支持部が取り付けられたプレートを有することを特徴とする請求項10に記載の基板収納装置。   The substrate storage device according to claim 10, further comprising a plate to which the substrate support portions at the same stage are attached. 前記少なくとも3本の支柱は、4本の支柱を有し、
前記4本の支柱のうちの隣り合う2本の支柱を連結する連結部材を更に有し、
前記連結部材の中間位置に前記基板支持部が配置されていることを特徴とする請求項1乃至11のいずれか1項に記載の基板収納装置。
The at least three struts have four struts;
A connecting member that connects two adjacent struts of the four struts;
The substrate storage device according to claim 1, wherein the substrate support portion is disposed at an intermediate position of the connecting member.
前記基板は、前記少なくとも3本の支柱のそれぞれに設けられた前記基板支持部の間に支持されることを特徴とする請求項1乃至12のいずれか1項に記載の基板収納装置。   The substrate storage device according to claim 1, wherein the substrate is supported between the substrate support portions provided on each of the at least three support columns.
JP2017059687A 2017-03-24 2017-03-24 Substrate housing apparatus Pending JP2018163955A (en)

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