JP2018044912A5 - - Google Patents

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Publication number
JP2018044912A5
JP2018044912A5 JP2016181382A JP2016181382A JP2018044912A5 JP 2018044912 A5 JP2018044912 A5 JP 2018044912A5 JP 2016181382 A JP2016181382 A JP 2016181382A JP 2016181382 A JP2016181382 A JP 2016181382A JP 2018044912 A5 JP2018044912 A5 JP 2018044912A5
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JP
Japan
Prior art keywords
probes
probe
adjacent
locking
relatively shifted
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2016181382A
Other languages
English (en)
Japanese (ja)
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JP2018044912A (ja
JP6781598B2 (ja
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Application filed filed Critical
Priority to JP2016181382A priority Critical patent/JP6781598B2/ja
Priority claimed from JP2016181382A external-priority patent/JP6781598B2/ja
Publication of JP2018044912A publication Critical patent/JP2018044912A/ja
Publication of JP2018044912A5 publication Critical patent/JP2018044912A5/ja
Application granted granted Critical
Publication of JP6781598B2 publication Critical patent/JP6781598B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2016181382A 2016-09-16 2016-09-16 プローブカード Active JP6781598B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2016181382A JP6781598B2 (ja) 2016-09-16 2016-09-16 プローブカード

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2016181382A JP6781598B2 (ja) 2016-09-16 2016-09-16 プローブカード

Publications (3)

Publication Number Publication Date
JP2018044912A JP2018044912A (ja) 2018-03-22
JP2018044912A5 true JP2018044912A5 (it) 2019-10-03
JP6781598B2 JP6781598B2 (ja) 2020-11-04

Family

ID=61693645

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016181382A Active JP6781598B2 (ja) 2016-09-16 2016-09-16 プローブカード

Country Status (1)

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JP (1) JP6781598B2 (it)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2022059070A1 (ja) 2020-09-15 2022-03-24 日本電子材料株式会社 プローブカード
JP2022144851A (ja) * 2021-03-19 2022-10-03 株式会社日本マイクロニクス プローブおよびプローブカード
CN115248338A (zh) * 2021-04-27 2022-10-28 迪科特测试科技(苏州)有限公司 探针结构及其探针卡装置
CN115684677A (zh) * 2021-07-29 2023-02-03 迪科特测试科技(苏州)有限公司 探针及探针卡装置
JPWO2023105553A1 (it) * 2021-12-06 2023-06-15

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7671610B2 (en) * 2007-10-19 2010-03-02 Microprobe, Inc. Vertical guided probe array providing sideways scrub motion
TWM342638U (en) * 2008-03-10 2008-10-11 Hon Hai Prec Ind Co Ltd Electrical connector
JP2010091349A (ja) * 2008-10-06 2010-04-22 Japan Electronic Materials Corp 垂直型プローブカード
JP5341456B2 (ja) * 2008-10-06 2013-11-13 日本電子材料株式会社 プローブカード
JP5487050B2 (ja) * 2010-08-19 2014-05-07 株式会社日本マイクロニクス プローブカードの製造方法
JP2012093127A (ja) * 2010-10-25 2012-05-17 Advanced Systems Japan Inc バーチカルプローブヘッド
US8832933B2 (en) * 2011-09-15 2014-09-16 Taiwan Semiconductor Manufacturing Co., Ltd. Method of fabricating a semiconductor test probe head
US10359447B2 (en) * 2012-10-31 2019-07-23 Formfactor, Inc. Probes with spring mechanisms for impeding unwanted movement in guide holes
US10866266B2 (en) * 2015-10-29 2020-12-15 Taiwan Semiconductor Manufacturing Company Ltd. Probe head receiver and probe card assembly having the same

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