JP2018016408A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2018016408A5 JP2018016408A5 JP2016150859A JP2016150859A JP2018016408A5 JP 2018016408 A5 JP2018016408 A5 JP 2018016408A5 JP 2016150859 A JP2016150859 A JP 2016150859A JP 2016150859 A JP2016150859 A JP 2016150859A JP 2018016408 A5 JP2018016408 A5 JP 2018016408A5
- Authority
- JP
- Japan
- Prior art keywords
- container
- pressure
- pressure value
- inner container
- double
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012545 processing Methods 0.000 claims description 24
- 238000010438 heat treatment Methods 0.000 claims description 22
- 238000001514 detection method Methods 0.000 claims description 18
- 239000000758 substrate Substances 0.000 claims description 14
- 239000007788 liquid Substances 0.000 claims description 13
- 238000009530 blood pressure measurement Methods 0.000 claims description 6
- 239000007789 gas Substances 0.000 description 14
- 230000003247 decreasing effect Effects 0.000 description 5
- 238000000034 method Methods 0.000 description 5
- 238000005259 measurement Methods 0.000 description 4
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 238000011109 contamination Methods 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 238000012993 chemical processing Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016150859A JP6734724B2 (ja) | 2016-07-29 | 2016-07-29 | 二重容器の破損検出装置及び破損検出方法、基板処理装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016150859A JP6734724B2 (ja) | 2016-07-29 | 2016-07-29 | 二重容器の破損検出装置及び破損検出方法、基板処理装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2018016408A JP2018016408A (ja) | 2018-02-01 |
| JP2018016408A5 true JP2018016408A5 (enExample) | 2019-09-05 |
| JP6734724B2 JP6734724B2 (ja) | 2020-08-05 |
Family
ID=61075779
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2016150859A Active JP6734724B2 (ja) | 2016-07-29 | 2016-07-29 | 二重容器の破損検出装置及び破損検出方法、基板処理装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP6734724B2 (enExample) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN118881980A (zh) * | 2024-09-29 | 2024-11-01 | 中国空气动力研究与发展中心高速空气动力研究所 | 大型金属波纹管在线实时监测设备及泄漏判断方法 |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07106925B2 (ja) * | 1987-02-09 | 1995-11-15 | 住友電気工業株式会社 | 光フアイバ用母材の製造方法 |
| JPH0845647A (ja) * | 1994-07-28 | 1996-02-16 | Nec Kansai Ltd | 投げ込みヒータおよびそのクラック検出方法 |
| JPH10321528A (ja) * | 1997-05-22 | 1998-12-04 | Hitachi Ltd | 半導体処理装置及びその使用方法 |
| JP2006303115A (ja) * | 2005-04-19 | 2006-11-02 | Se Techno Co Ltd | 洗浄装置、洗浄方法および半導体製造装置 |
-
2016
- 2016-07-29 JP JP2016150859A patent/JP6734724B2/ja active Active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TWI500876B (zh) | 氣體減壓供應裝置、具備其之壓缸櫃、閥箱及基板處理裝置,以及氣體減壓供應方法 | |
| KR102325923B1 (ko) | 히터관의 기체 누설 검출 장치 및 히터관의 기체 누설 검출 방법 | |
| TWI723046B (zh) | 檢查氣體供給系統之方法 | |
| TWI593038B (zh) | 監控聲音的半導體基板處理系統及方法 | |
| US20070181192A1 (en) | Method and apparatus for monitoring gas flow amount in semiconductor manufacturing equipment | |
| JP2010247028A (ja) | プラズマ処理装置、異常検出装置、及び異常検出方法 | |
| KR20210119295A (ko) | 가스 검사 방법, 기판 처리 방법 및 기판 처리 시스템 | |
| JP2018016408A5 (enExample) | ||
| JP4649322B2 (ja) | 超臨界流体洗浄装置 | |
| JP6734724B2 (ja) | 二重容器の破損検出装置及び破損検出方法、基板処理装置 | |
| US10274972B2 (en) | Method of inspecting gas supply system | |
| US9332365B2 (en) | Stereo device testing method and stereo device testing system | |
| US20250157834A1 (en) | High-pressure heat treatment apparatus and gas monitoring module used therefor | |
| US9885567B2 (en) | Substrate placement detection in semiconductor equipment using thermal response characteristics | |
| JP2004152999A (ja) | プラズマ処理方法およびプラズマ処理装置 | |
| JP2017116387A (ja) | 差圧変化量算出装置及び差圧変化量算出方法 | |
| JP2006351756A (ja) | 乾燥方法及び乾燥装置 | |
| JP5021562B2 (ja) | 復帰安全確認方法及びガス遮断弁装置 | |
| KR20190050256A (ko) | 기판 처리장치용 가스 공급유닛 및 이의 제어방법 | |
| JP2016156717A (ja) | リーク検査方法及びリーク検査装置 | |
| JP2004309427A (ja) | 石英管ヒーターのピンホール検出装置 | |
| KR20060010305A (ko) | 가스누설검출장치를 갖는 반도체 제조설비 | |
| KR20050120283A (ko) | 반도체 제조 장치의 압력 검출기 신뢰성 테스트 방법 | |
| JP2023016507A5 (enExample) | ||
| KR20070084829A (ko) | 반도체 제조용 식각설비의 리크검출장치 및 그 방법 |