JP2018016408A5 - - Google Patents

Download PDF

Info

Publication number
JP2018016408A5
JP2018016408A5 JP2016150859A JP2016150859A JP2018016408A5 JP 2018016408 A5 JP2018016408 A5 JP 2018016408A5 JP 2016150859 A JP2016150859 A JP 2016150859A JP 2016150859 A JP2016150859 A JP 2016150859A JP 2018016408 A5 JP2018016408 A5 JP 2018016408A5
Authority
JP
Japan
Prior art keywords
container
pressure
pressure value
inner container
double
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2016150859A
Other languages
English (en)
Japanese (ja)
Other versions
JP2018016408A (ja
JP6734724B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2016150859A priority Critical patent/JP6734724B2/ja
Priority claimed from JP2016150859A external-priority patent/JP6734724B2/ja
Publication of JP2018016408A publication Critical patent/JP2018016408A/ja
Publication of JP2018016408A5 publication Critical patent/JP2018016408A5/ja
Application granted granted Critical
Publication of JP6734724B2 publication Critical patent/JP6734724B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2016150859A 2016-07-29 2016-07-29 二重容器の破損検出装置及び破損検出方法、基板処理装置 Active JP6734724B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2016150859A JP6734724B2 (ja) 2016-07-29 2016-07-29 二重容器の破損検出装置及び破損検出方法、基板処理装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2016150859A JP6734724B2 (ja) 2016-07-29 2016-07-29 二重容器の破損検出装置及び破損検出方法、基板処理装置

Publications (3)

Publication Number Publication Date
JP2018016408A JP2018016408A (ja) 2018-02-01
JP2018016408A5 true JP2018016408A5 (enExample) 2019-09-05
JP6734724B2 JP6734724B2 (ja) 2020-08-05

Family

ID=61075779

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016150859A Active JP6734724B2 (ja) 2016-07-29 2016-07-29 二重容器の破損検出装置及び破損検出方法、基板処理装置

Country Status (1)

Country Link
JP (1) JP6734724B2 (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN118881980A (zh) * 2024-09-29 2024-11-01 中国空气动力研究与发展中心高速空气动力研究所 大型金属波纹管在线实时监测设备及泄漏判断方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07106925B2 (ja) * 1987-02-09 1995-11-15 住友電気工業株式会社 光フアイバ用母材の製造方法
JPH0845647A (ja) * 1994-07-28 1996-02-16 Nec Kansai Ltd 投げ込みヒータおよびそのクラック検出方法
JPH10321528A (ja) * 1997-05-22 1998-12-04 Hitachi Ltd 半導体処理装置及びその使用方法
JP2006303115A (ja) * 2005-04-19 2006-11-02 Se Techno Co Ltd 洗浄装置、洗浄方法および半導体製造装置

Similar Documents

Publication Publication Date Title
TWI500876B (zh) 氣體減壓供應裝置、具備其之壓缸櫃、閥箱及基板處理裝置,以及氣體減壓供應方法
KR102325923B1 (ko) 히터관의 기체 누설 검출 장치 및 히터관의 기체 누설 검출 방법
TWI723046B (zh) 檢查氣體供給系統之方法
TWI593038B (zh) 監控聲音的半導體基板處理系統及方法
US20070181192A1 (en) Method and apparatus for monitoring gas flow amount in semiconductor manufacturing equipment
JP2010247028A (ja) プラズマ処理装置、異常検出装置、及び異常検出方法
KR20210119295A (ko) 가스 검사 방법, 기판 처리 방법 및 기판 처리 시스템
JP2018016408A5 (enExample)
JP4649322B2 (ja) 超臨界流体洗浄装置
JP6734724B2 (ja) 二重容器の破損検出装置及び破損検出方法、基板処理装置
US10274972B2 (en) Method of inspecting gas supply system
US9332365B2 (en) Stereo device testing method and stereo device testing system
US20250157834A1 (en) High-pressure heat treatment apparatus and gas monitoring module used therefor
US9885567B2 (en) Substrate placement detection in semiconductor equipment using thermal response characteristics
JP2004152999A (ja) プラズマ処理方法およびプラズマ処理装置
JP2017116387A (ja) 差圧変化量算出装置及び差圧変化量算出方法
JP2006351756A (ja) 乾燥方法及び乾燥装置
JP5021562B2 (ja) 復帰安全確認方法及びガス遮断弁装置
KR20190050256A (ko) 기판 처리장치용 가스 공급유닛 및 이의 제어방법
JP2016156717A (ja) リーク検査方法及びリーク検査装置
JP2004309427A (ja) 石英管ヒーターのピンホール検出装置
KR20060010305A (ko) 가스누설검출장치를 갖는 반도체 제조설비
KR20050120283A (ko) 반도체 제조 장치의 압력 검출기 신뢰성 테스트 방법
JP2023016507A5 (enExample)
KR20070084829A (ko) 반도체 제조용 식각설비의 리크검출장치 및 그 방법