JP2017538471A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2017538471A5 JP2017538471A5 JP2017525975A JP2017525975A JP2017538471A5 JP 2017538471 A5 JP2017538471 A5 JP 2017538471A5 JP 2017525975 A JP2017525975 A JP 2017525975A JP 2017525975 A JP2017525975 A JP 2017525975A JP 2017538471 A5 JP2017538471 A5 JP 2017538471A5
- Authority
- JP
- Japan
- Prior art keywords
- ray
- imaging system
- grating
- detector
- line
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000003384 imaging method Methods 0.000 claims 16
- 238000004590 computer program Methods 0.000 claims 3
- 238000000034 method Methods 0.000 claims 3
- 230000001154 acute effect Effects 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP14194482 | 2014-11-24 | ||
| EP14194482.7 | 2014-11-24 | ||
| PCT/EP2015/076734 WO2016083182A1 (en) | 2014-11-24 | 2015-11-17 | Detector and imaging system for x-ray phase contrast tomo-synthesis imaging |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2017538471A JP2017538471A (ja) | 2017-12-28 |
| JP2017538471A5 true JP2017538471A5 (OSRAM) | 2018-12-06 |
| JP6688795B2 JP6688795B2 (ja) | 2020-04-28 |
Family
ID=52016407
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2017525975A Expired - Fee Related JP6688795B2 (ja) | 2014-11-24 | 2015-11-17 | Ｘ線位相コントラストトモシンセシス撮像に対する検出器及び撮像システム |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US10470721B2 (OSRAM) |
| EP (1) | EP3223707A1 (OSRAM) |
| JP (1) | JP6688795B2 (OSRAM) |
| CN (1) | CN106999137B (OSRAM) |
| BR (1) | BR112017010593B1 (OSRAM) |
| MX (1) | MX2017006619A (OSRAM) |
| RU (1) | RU2708816C2 (OSRAM) |
| WO (1) | WO2016083182A1 (OSRAM) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107106101B (zh) * | 2014-12-22 | 2020-04-24 | 株式会社岛津制作所 | 放射线相位差摄影装置 |
| KR20200133361A (ko) * | 2018-03-19 | 2020-11-27 | 젠셀랩, 엘엘씨 | 엑스레이 단층 촬영 |
| KR20210041587A (ko) * | 2018-07-30 | 2021-04-15 | 젠셀랩, 엘엘씨 | 엑스레이 이미징 시스템 및 방법, 그리고 조영제 |
| US11860319B2 (en) * | 2022-03-10 | 2024-01-02 | GE Precision Healthcare LLC | High-resolution detector having a reduced number of pixels |
Family Cites Families (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2073040A2 (en) | 2007-10-31 | 2009-06-24 | FUJIFILM Corporation | Radiation image detector and phase contrast radiation imaging apparatus |
| JP2010012030A (ja) * | 2008-07-03 | 2010-01-21 | Fujifilm Corp | 放射線画像撮影装置 |
| CN101413905B (zh) * | 2008-10-10 | 2011-03-16 | 深圳大学 | X射线微分干涉相衬成像系统 |
| CN102197303A (zh) * | 2008-10-29 | 2011-09-21 | 佳能株式会社 | X射线成像装置和x射线成像方法 |
| JP5759474B2 (ja) | 2009-12-10 | 2015-08-05 | コーニンクレッカ フィリップス エヌ ヴェ | 移動可能ｘ線検出器要素を有する位相コントラスト画像化装置及び方法 |
| JP2012090945A (ja) * | 2010-03-30 | 2012-05-17 | Fujifilm Corp | 放射線検出装置、放射線撮影装置、放射線撮影システム |
| JP2012143550A (ja) | 2010-12-20 | 2012-08-02 | Fujifilm Corp | 放射線画像撮影装置および放射線画像取得方法 |
| JP2012148068A (ja) * | 2010-12-27 | 2012-08-09 | Fujifilm Corp | 放射線画像取得方法および放射線画像撮影装置 |
| JP2012200567A (ja) * | 2011-03-28 | 2012-10-22 | Fujifilm Corp | 放射線撮影システム及び放射線撮影方法 |
| JP2014155509A (ja) * | 2011-06-10 | 2014-08-28 | Fujifilm Corp | 放射線撮影システム |
| JP6353361B2 (ja) | 2011-07-04 | 2018-07-04 | コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． | 位相コントラストイメージング装置 |
| US9380987B2 (en) * | 2011-12-12 | 2016-07-05 | Hitachi Medical Corporation | X-ray CT device |
| US9597050B2 (en) * | 2012-01-24 | 2017-03-21 | Koninklijke Philips N.V. | Multi-directional phase contrast X-ray imaging |
| JP2013164339A (ja) | 2012-02-10 | 2013-08-22 | Canon Inc | Ｘ線撮像装置 |
| US20150055743A1 (en) * | 2012-02-24 | 2015-02-26 | University Of Massachusetts Medical School | Apparatus and method for x-ray phase contrast imaging |
| CN103364418B (zh) * | 2012-04-01 | 2016-08-03 | 中国科学院高能物理研究所 | 光栅剪切二维成像系统及光栅剪切二维成像方法 |
| JP2014090967A (ja) * | 2012-11-06 | 2014-05-19 | Canon Inc | Ｘ線撮像装置 |
| JP2014178130A (ja) * | 2013-03-13 | 2014-09-25 | Canon Inc | Ｘ線撮像装置及びｘ線撮像システム |
| EP3064930B1 (en) * | 2013-10-31 | 2018-04-18 | Tohoku University | Non-destructive inspection device |
-
2015
- 2015-11-17 WO PCT/EP2015/076734 patent/WO2016083182A1/en not_active Ceased
- 2015-11-17 CN CN201580063910.7A patent/CN106999137B/zh not_active Expired - Fee Related
- 2015-11-17 US US15/528,992 patent/US10470721B2/en not_active Expired - Fee Related
- 2015-11-17 BR BR112017010593-4A patent/BR112017010593B1/pt not_active IP Right Cessation
- 2015-11-17 RU RU2017122152A patent/RU2708816C2/ru active
- 2015-11-17 JP JP2017525975A patent/JP6688795B2/ja not_active Expired - Fee Related
- 2015-11-17 MX MX2017006619A patent/MX2017006619A/es unknown
- 2015-11-17 EP EP15798366.9A patent/EP3223707A1/en not_active Withdrawn