JP2017535759A5 - - Google Patents

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Publication number
JP2017535759A5
JP2017535759A5 JP2017517249A JP2017517249A JP2017535759A5 JP 2017535759 A5 JP2017535759 A5 JP 2017535759A5 JP 2017517249 A JP2017517249 A JP 2017517249A JP 2017517249 A JP2017517249 A JP 2017517249A JP 2017535759 A5 JP2017535759 A5 JP 2017535759A5
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JP
Japan
Prior art keywords
gamma
image
alpha
imaging device
ray head
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JP2017517249A
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English (en)
Japanese (ja)
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JP6678660B2 (ja
JP2017535759A (ja
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Priority claimed from FR1459704A external-priority patent/FR3027119B1/fr
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Publication of JP2017535759A publication Critical patent/JP2017535759A/ja
Publication of JP2017535759A5 publication Critical patent/JP2017535759A5/ja
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Publication of JP6678660B2 publication Critical patent/JP6678660B2/ja
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JP2017517249A 2014-10-09 2015-10-08 デュアル撮像デバイス Active JP6678660B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR1459704A FR3027119B1 (fr) 2014-10-09 2014-10-09 Dispositif d'imagerie duale
FR1459704 2014-10-09
PCT/EP2015/073310 WO2016055594A1 (fr) 2014-10-09 2015-10-08 Dispositif d'imagerie duale

Publications (3)

Publication Number Publication Date
JP2017535759A JP2017535759A (ja) 2017-11-30
JP2017535759A5 true JP2017535759A5 (enExample) 2018-11-08
JP6678660B2 JP6678660B2 (ja) 2020-04-08

Family

ID=52824299

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2017517249A Active JP6678660B2 (ja) 2014-10-09 2015-10-08 デュアル撮像デバイス

Country Status (7)

Country Link
US (1) US10126431B2 (enExample)
EP (1) EP3204795B1 (enExample)
JP (1) JP6678660B2 (enExample)
CN (1) CN107110982A (enExample)
ES (1) ES2721758T3 (enExample)
FR (1) FR3027119B1 (enExample)
WO (1) WO2016055594A1 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3079310B1 (fr) * 2018-03-23 2020-04-17 Commissariat A L'energie Atomique Et Aux Energies Alternatives Dispositif de mesure de rayonnements alpha et/ou beta provenant d'une surface solide
FR3102254B1 (fr) * 2019-10-16 2021-11-05 Commissariat Energie Atomique Procédé de suivi de la position d'une source irradiante
FR3111714B1 (fr) 2020-06-22 2022-10-28 Commissariat Energie Atomique Système pour corréler des mesures de spectrométrie alpha et gamma pour la caractérisation radiologique in situ d’un échantillon
CN111736205A (zh) * 2020-06-30 2020-10-02 中国人民解放军火箭军特色医学中心 一种α放射源光学成像检测系统及其检测方法
JP7408512B2 (ja) * 2020-09-04 2024-01-05 浜松ホトニクス株式会社 放射線検出器及び穴明け装置
GB2634905A (en) * 2023-10-24 2025-04-30 Univ Bristol Imaging of alpha emitters

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3129353A (en) * 1960-05-17 1964-04-14 Mrs Jennings Multiple radiation source microscope
ZA747725B (en) * 1974-12-04 1976-07-28 De Beers Ind Diamond Improvements in or relating to diamonds
FR2664380B1 (fr) * 1990-07-03 1994-04-15 Cogema Appareil de mesure multifonctionnel.
WO1994002946A1 (en) * 1992-07-27 1994-02-03 Thomas Jefferson University Methods and apparatus for non-invasive imaging including quenchable phosphor-based screens
US5493121A (en) * 1992-11-30 1996-02-20 Optical Semiconductors, Inc. Method and apparatus for measuring incident radiation
US5514870A (en) * 1994-03-11 1996-05-07 James R. Langenbrunner Fast CsI-phoswich detector
US5489781A (en) * 1994-10-03 1996-02-06 General Electric Company Dual modality detector
FR2725793B1 (fr) * 1994-10-13 1997-01-03 Commissariat Energie Atomique Sonde de controle de contamination avec tete de detection coudee
FR2746927B1 (fr) * 1996-03-29 1998-04-24 Commissariat Energie Atomique Dispositif et procede de localisation a distance de sources alpha
JP3597973B2 (ja) * 1997-08-13 2004-12-08 アロカ株式会社 ダストモニタ
JPH11307756A (ja) * 1998-02-20 1999-11-05 Canon Inc 光電変換装置および放射線読取装置
JPH11271453A (ja) * 1998-03-25 1999-10-08 Toshiba Corp 放射線弁別測定方法および放射線弁別測定装置
US6792070B2 (en) * 2001-10-16 2004-09-14 Fuji Photo Film Co., Ltd. Radiation image recording method and apparatus
FR2879304B1 (fr) 2004-12-14 2007-01-26 Commissariat Energie Atomique Dispositif d'imagerie gamma ameliore.
FR2932573B1 (fr) * 2008-06-16 2014-09-05 Commissariat Energie Atomique Dispositif d'imagerie gamma ameliore permettant la localisation precise de sources irradiantes dans l'espace
JP2014139555A (ja) * 2012-12-17 2014-07-31 Japan Shield Technical Research Co Ltd 放射線検知器
JP6117071B2 (ja) * 2013-09-30 2017-04-19 株式会社東芝 放射線検出器および放射線検出方法

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