JP2017525284A - I/oインターフェース信号の動的な電圧調整 - Google Patents

I/oインターフェース信号の動的な電圧調整 Download PDF

Info

Publication number
JP2017525284A
JP2017525284A JP2017501713A JP2017501713A JP2017525284A JP 2017525284 A JP2017525284 A JP 2017525284A JP 2017501713 A JP2017501713 A JP 2017501713A JP 2017501713 A JP2017501713 A JP 2017501713A JP 2017525284 A JP2017525284 A JP 2017525284A
Authority
JP
Japan
Prior art keywords
voltage
temperature
swing
interface
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2017501713A
Other languages
English (en)
Japanese (ja)
Other versions
JP2017525284A5 (enExample
Inventor
パク、ヘ・ジュン
チュン、デクスター・タミオ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Qualcomm Inc
Original Assignee
Qualcomm Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Qualcomm Inc filed Critical Qualcomm Inc
Publication of JP2017525284A publication Critical patent/JP2017525284A/ja
Publication of JP2017525284A5 publication Critical patent/JP2017525284A5/ja
Pending legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K3/00Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/01Details
    • H03K3/012Modifications of generator to improve response time or to decrease power consumption
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/4074Power supply or voltage generation circuits, e.g. bias voltage generators, substrate voltage generators, back-up power, power control circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/409Read-write [R-W] circuits 
    • G11C11/4093Input/output [I/O] data interface arrangements, e.g. data buffers
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1051Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
    • G11C7/1057Data output buffers, e.g. comprising level conversion circuits, circuits for adapting load
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1078Data input circuits, e.g. write amplifiers, data input buffers, data input registers, data input level conversion circuits
    • G11C7/1084Data input buffers, e.g. comprising level conversion circuits, circuits for adapting load
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K3/00Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/01Details
    • H03K3/011Modifications of generator to compensate for variations in physical values, e.g. voltage, temperature

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Power Sources (AREA)
  • Logic Circuits (AREA)
JP2017501713A 2014-07-14 2015-05-18 I/oインターフェース信号の動的な電圧調整 Pending JP2017525284A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US14/330,464 2014-07-14
US14/330,464 US9461626B2 (en) 2014-07-14 2014-07-14 Dynamic voltage adjustment of an I/O interface signal
PCT/US2015/031433 WO2016010623A1 (en) 2014-07-14 2015-05-18 Dynamic voltage adjustment of an i/o interface signal

Publications (2)

Publication Number Publication Date
JP2017525284A true JP2017525284A (ja) 2017-08-31
JP2017525284A5 JP2017525284A5 (enExample) 2018-06-07

Family

ID=53404851

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2017501713A Pending JP2017525284A (ja) 2014-07-14 2015-05-18 I/oインターフェース信号の動的な電圧調整

Country Status (5)

Country Link
US (1) US9461626B2 (enExample)
EP (1) EP3170177A1 (enExample)
JP (1) JP2017525284A (enExample)
CN (1) CN106796566A (enExample)
WO (1) WO2016010623A1 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105283854B (zh) * 2013-06-11 2019-05-07 株式会社索思未来 半导体集成电路及包括该半导体集成电路的数据接口系统
US11487341B2 (en) * 2018-08-09 2022-11-01 Nvidia Corporation Techniques for configuring a processor to execute instructions efficiently
CN114489235B (zh) * 2022-01-18 2024-09-27 上海天数智芯半导体有限公司 一种用于异常温度处理的芯片频率动态调节方法及系统
WO2025250808A1 (en) 2024-05-29 2025-12-04 The Brigham And Women’S Hospital, Inc. Anti-crispr delivery compositions and methods

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002045268A1 (en) * 2000-11-30 2002-06-06 Hitachi, Ltd Semiconductor integrated circuit and data processing system
US20060066351A1 (en) * 2004-09-15 2006-03-30 Lau Benedict C Scalable I/O signaling topology using source-calibrated reference voltages
WO2008076700A2 (en) * 2006-12-13 2008-06-26 Rambus Inc. Interface with variable data rate
JP2008227696A (ja) * 2007-03-09 2008-09-25 Nec Corp インタフェース回路および信号出力調整方法
JP2010178262A (ja) * 2009-02-02 2010-08-12 Fujitsu Semiconductor Ltd ドライバストレングス調整回路、半導体集積回路、及びドライバストレングスの調整方法

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6928559B1 (en) 1997-06-27 2005-08-09 Broadcom Corporation Battery powered device with dynamic power and performance management
US6218901B1 (en) 1999-10-12 2001-04-17 International Business Machines Corporation High speed differential output driver with increased voltage swing and predrive common mode adjustment
US7941675B2 (en) * 2002-12-31 2011-05-10 Burr James B Adaptive power control
US6600346B1 (en) 2002-07-30 2003-07-29 National Semiconductor Corporation Low voltage differential swing (LVDS) signal driver circuit with low PVT and load sensitivity
US7583555B2 (en) 2003-04-11 2009-09-01 Qualcomm Incorporated Robust and Efficient dynamic voltage scaling for portable devices
US20060072241A1 (en) * 2004-09-30 2006-04-06 Feliss Norbert A System, method, and apparatus for a wireless hard disk drive
US7301410B2 (en) 2006-03-07 2007-11-27 International Business Machines Corporation Hybrid current-starved phase-interpolation circuit for voltage-controlled devices
US7405594B1 (en) 2006-06-16 2008-07-29 Integrated Device Technology, Inc. Current mode driver with constant voltage swing
US7616509B2 (en) * 2007-07-13 2009-11-10 Freescale Semiconductor, Inc. Dynamic voltage adjustment for memory
KR100889314B1 (ko) * 2007-09-10 2009-03-18 주식회사 하이닉스반도체 버퍼 회로
US8143911B2 (en) 2008-03-31 2012-03-27 Intel Corporation Input/output driver swing control and supply noise rejection
US8055477B2 (en) 2008-11-20 2011-11-08 International Business Machines Corporation Identifying deterministic performance boost capability of a computer system
CN102063144B (zh) * 2010-11-17 2014-08-13 东南大学 一种面向低功耗应用的动态电压调节系统及实现方法
US8578222B2 (en) * 2011-02-17 2013-11-05 Qualcomm Incorporated SerDes power throttling as a function of detected error rate

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002045268A1 (en) * 2000-11-30 2002-06-06 Hitachi, Ltd Semiconductor integrated circuit and data processing system
US20060066351A1 (en) * 2004-09-15 2006-03-30 Lau Benedict C Scalable I/O signaling topology using source-calibrated reference voltages
WO2008076700A2 (en) * 2006-12-13 2008-06-26 Rambus Inc. Interface with variable data rate
JP2008227696A (ja) * 2007-03-09 2008-09-25 Nec Corp インタフェース回路および信号出力調整方法
JP2010178262A (ja) * 2009-02-02 2010-08-12 Fujitsu Semiconductor Ltd ドライバストレングス調整回路、半導体集積回路、及びドライバストレングスの調整方法

Also Published As

Publication number Publication date
CN106796566A (zh) 2017-05-31
WO2016010623A1 (en) 2016-01-21
EP3170177A1 (en) 2017-05-24
US20160013774A1 (en) 2016-01-14
US9461626B2 (en) 2016-10-04

Similar Documents

Publication Publication Date Title
KR102449725B1 (ko) 판정 궤환 등화기
KR102477268B1 (ko) 메모리 모듈의 정보를 실시간으로 모니터링하는 방법 및 시스템
US9792173B2 (en) Interface control circuit, memory system, and method of controlling an interface control circuit
US9436388B2 (en) Memory access alignment in a double data rate (‘DDR’) system
CN105706172A (zh) 用于基于存储器模块中的选通信号来训练控制信号的方法
US11144410B2 (en) System and method to dynamically increase memory channel robustness at high transfer rates
CN105247791A (zh) I/o驱动器发射摆幅控制
TWI791436B (zh) 晶粒上終端電路與記憶體系統
JP2007095067A (ja) デバイス間の配電を管理する方法およびシステム(改善された電力管理および熱分散のための選択的オンダイ終端)
US9461626B2 (en) Dynamic voltage adjustment of an I/O interface signal
JP2013065086A (ja) メモリインタフェース回路及びタイミング調整方法
JPWO2002045268A1 (ja) 半導体集積回路及びデータ処理システム
CN104216808A (zh) 电源芯片检测装置及方法
US9690306B2 (en) Display interface temperature compensation
TWI823812B (zh) 介面電路、記憶體控制器與校正方法
TWI822563B (zh) 介面電路與記憶體控制器
KR101637998B1 (ko) 에스피아이 통신 장치 및 방법
US20250218502A1 (en) Rtt trim method
TW202528945A (zh) 記憶體系統中使用主動重新訓練引擎之封閉迴路時序控制
US10061720B2 (en) Storage system and signal transfer method
CN109243506B (zh) 半导体器件
TW201314460A (zh) 取樣相位校正方法,使用此取樣相位校正方法的儲存系統
US20140233612A1 (en) Technique for optimizing the phase of a data signal transmitted across a communication link
TW201624298A (zh) 儲存裝置及計算機系統
CN105373500A (zh) 半导体器件和包括半导体器件的半导体系统

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20170327

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20180420

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20180420

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20190228

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20190402

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20191023