JP2017510818A - 非接触磁歪電流センサ - Google Patents

非接触磁歪電流センサ Download PDF

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Publication number
JP2017510818A
JP2017510818A JP2016575607A JP2016575607A JP2017510818A JP 2017510818 A JP2017510818 A JP 2017510818A JP 2016575607 A JP2016575607 A JP 2016575607A JP 2016575607 A JP2016575607 A JP 2016575607A JP 2017510818 A JP2017510818 A JP 2017510818A
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JP
Japan
Prior art keywords
magnetostrictive
magnetostrictive element
current sensor
magnetic core
magnetic field
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2016575607A
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English (en)
Japanese (ja)
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JP2017510818A5 (enExample
Inventor
ガレス ジェイ． ノウルズ，
ガレス ジェイ． ノウルズ，
ウィリアム エム． ブラッドレー，
ウィリアム エム． ブラッドレー，
ジョナサン エム． ズーク，
ジョナサン エム． ズーク，
ロス バード，
ロス バード，
シャファクキャン ツンクデミール，
シャファクキャン ツンクデミール，
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
QorTek Inc
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QorTek Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by QorTek Inc filed Critical QorTek Inc
Publication of JP2017510818A publication Critical patent/JP2017510818A/ja
Publication of JP2017510818A5 publication Critical patent/JP2017510818A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/18—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers
    • G01R15/183—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers using transformers with a magnetic core
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
    • G01L1/2206—Special supports with preselected places to mount the resistance strain gauges; Mounting of supports
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/18—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0052—Manufacturing aspects; Manufacturing of single devices, i.e. of semiconductor magnetic sensor chips
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N35/00—Magnetostrictive devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/12—Measuring force or stress, in general by measuring variations in the magnetic properties of materials resulting from the application of stress
    • G01L1/127—Measuring force or stress, in general by measuring variations in the magnetic properties of materials resulting from the application of stress by using inductive means

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Measuring Magnetic Variables (AREA)
JP2016575607A 2014-03-10 2015-03-10 非接触磁歪電流センサ Pending JP2017510818A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201461950815P 2014-03-10 2014-03-10
US61/950,815 2014-03-10
PCT/US2015/019778 WO2015138505A1 (en) 2014-03-10 2015-03-10 Non-contact magnetostrictive current sensor

Publications (2)

Publication Number Publication Date
JP2017510818A true JP2017510818A (ja) 2017-04-13
JP2017510818A5 JP2017510818A5 (enExample) 2019-08-15

Family

ID=54072344

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016575607A Pending JP2017510818A (ja) 2014-03-10 2015-03-10 非接触磁歪電流センサ

Country Status (5)

Country Link
US (1) US9983234B2 (enExample)
EP (1) EP3117195B1 (enExample)
JP (1) JP2017510818A (enExample)
KR (1) KR101718679B1 (enExample)
WO (1) WO2015138505A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102561039B1 (ko) * 2023-05-19 2023-07-28 주식회사 에코스 저주파 및 고주파 겸용 전류센서, 그것을 이용한 아크검출장치 및 아크차단장치

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106646293B (zh) * 2016-10-14 2019-02-26 东北大学 一种高精度大量程非接触式测量磁致应变的装置及方法
CN109425775B (zh) * 2017-08-25 2021-01-26 南京理工大学 一种采用磁电复合材料的手持式电流传感器
CN108152556B (zh) * 2018-01-18 2023-04-25 吉林大学 被动激励自供电无线非接触电流传感测量装置及测量方法
CN112345146B (zh) * 2020-10-23 2021-12-31 华中科技大学 一种基于霍尔元件的三维柔性力传感器及其制备方法
US12196784B1 (en) * 2022-01-18 2025-01-14 National Technology & Engineering Solutions Of Sandia, Llc Magnetostrictive current sensor method and system
CN115453429B (zh) * 2022-11-09 2023-03-24 南方电网数字电网研究院有限公司 磁传感器及其制备方法，磁场测量系统

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6395363A (ja) * 1986-09-22 1988-04-26 シーメンス、アクチエンゲゼルシヤフト 電流センサおよび被評価導体中の電流検出方法
JP2000088937A (ja) * 1998-09-17 2000-03-31 Ngk Insulators Ltd 磁界センサ及びそれを用いた電流検出器
US20050134253A1 (en) * 2003-04-10 2005-06-23 Kovanko Thomas E. Current sensor
JP2012532579A (ja) * 2009-07-02 2012-12-13 クーパー タイヤ アンド ラバー カンパニー 圧電磁歪デバイス
DE102012200556A1 (de) * 2012-01-16 2013-07-18 Siemens Aktiengesellschaft Anordnung und Verfahren zur potentialgetrennten Strommessung an einem elektrischen Leiter

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US3504282A (en) * 1964-10-14 1970-03-31 Westinghouse Electric Corp Magnetostrictive current responsive means and transducer means utilizing changes in dimensions of the magnetostrictive means to produce a variable signal which varies with current variations
US6781285B1 (en) * 1994-01-27 2004-08-24 Cymer, Inc. Packaged strain actuator
US6809515B1 (en) * 1998-07-31 2004-10-26 Spinix Corporation Passive solid-state magnetic field sensors and applications therefor
DE10000116A1 (de) * 2000-01-04 2001-07-26 Epcos Ag Sensor zur Messung eines Gleichstroms und Messverfahren
KR20050055066A (ko) * 2004-07-14 2005-06-10 (주)에이티에스네트웍스 직류 전류 센서
DE102004034723A1 (de) * 2004-07-17 2006-02-09 Carl Freudenberg Kg Magnetostriktives Element und dessen Verwendung
GB2429782B (en) * 2005-09-01 2010-03-03 Daniel Peter Bulte A method and apparatus for measuring the stress or strain of a portion of a ferromagnetic member
WO2007110943A1 (ja) * 2006-03-29 2007-10-04 Loyal Port Company Limited 磁歪変調型電流センサーとこのセンサーを用いた電流計測方法
US7994780B2 (en) 2007-09-14 2011-08-09 General Electric Company System and method for inspection of parts with an eddy current probe
CN101654759B (zh) * 2008-08-19 2011-09-21 北京麦格东方材料技术有限公司 一种磁致伸缩材料及其制备方法
DE102009054943A1 (de) * 2009-12-18 2011-06-22 SB LiMotive Company Ltd., Kyonggi Stromsensor mit Selbsttestfunktion

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6395363A (ja) * 1986-09-22 1988-04-26 シーメンス、アクチエンゲゼルシヤフト 電流センサおよび被評価導体中の電流検出方法
JP2000088937A (ja) * 1998-09-17 2000-03-31 Ngk Insulators Ltd 磁界センサ及びそれを用いた電流検出器
US20050134253A1 (en) * 2003-04-10 2005-06-23 Kovanko Thomas E. Current sensor
JP2012532579A (ja) * 2009-07-02 2012-12-13 クーパー タイヤ アンド ラバー カンパニー 圧電磁歪デバイス
DE102012200556A1 (de) * 2012-01-16 2013-07-18 Siemens Aktiengesellschaft Anordnung und Verfahren zur potentialgetrennten Strommessung an einem elektrischen Leiter

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102561039B1 (ko) * 2023-05-19 2023-07-28 주식회사 에코스 저주파 및 고주파 겸용 전류센서, 그것을 이용한 아크검출장치 및 아크차단장치

Also Published As

Publication number Publication date
KR20160118371A (ko) 2016-10-11
EP3117195A1 (en) 2017-01-18
WO2015138505A1 (en) 2015-09-17
EP3117195A4 (en) 2018-07-11
EP3117195B1 (en) 2019-11-06
US9983234B2 (en) 2018-05-29
KR101718679B1 (ko) 2017-03-21
US20170074906A1 (en) 2017-03-16

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