JP2017500654A - 3次元基板検査装置のグラフィックユーザインタフェース - Google Patents
3次元基板検査装置のグラフィックユーザインタフェース Download PDFInfo
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- 238000005259 measurement Methods 0.000 claims abstract description 50
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- 238000010586 diagram Methods 0.000 description 6
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
- G06F30/30—Circuit design
- G06F30/39—Circuit design at the physical level
- G06F30/398—Design verification or optimisation, e.g. using design rule check [DRC], layout versus schematics [LVS] or finite element methods [FEM]
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
- G01R31/309—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits or circuit substrates
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/048—Interaction techniques based on graphical user interfaces [GUI]
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/048—Interaction techniques based on graphical user interfaces [GUI]
- G06F3/0481—Interaction techniques based on graphical user interfaces [GUI] based on specific properties of the displayed interaction object or a metaphor-based environment, e.g. interaction with desktop elements like windows or icons, or assisted by a cursor's changing behaviour or appearance
- G06F3/04815—Interaction with a metaphor-based environment or interaction object displayed as three-dimensional, e.g. changing the user viewpoint with respect to the environment or object
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/048—Interaction techniques based on graphical user interfaces [GUI]
- G06F3/0484—Interaction techniques based on graphical user interfaces [GUI] for the control of specific functions or operations, e.g. selecting or manipulating an object, an image or a displayed text element, setting a parameter value or selecting a range
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
- G06F30/30—Circuit design
- G06F30/31—Design entry, e.g. editors specifically adapted for circuit design
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/08—Monitoring manufacture of assemblages
- H05K13/081—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
- H05K13/0815—Controlling of component placement on the substrate during or after manufacturing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
- G01N2021/95638—Inspecting patterns on the surface of objects for PCB's
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F2115/00—Details relating to the type of the circuit
- G06F2115/12—Printed circuit boards [PCB] or multi-chip modules [MCM]
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- Life Sciences & Earth Sciences (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Operations Research (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Supply And Installment Of Electrical Components (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- User Interface Of Digital Computer (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Processing Or Creating Images (AREA)
Abstract
Description
Claims (12)
- 3次元基板検査装置のグラフィックユーザインタフェースにおいて、
基板上の検査対象体の3次元実測データに基いて前記検査対象体の3次元実測画面をディスプレイする実測画面ディスプレイ領域と、
前記検査対象体の前記3次元実測データと前記3次元基板検査装置に予め貯蔵されている前記検査対象体の基準寸法情報に基づいて前記検査対象体の寸法情報をディスプレイする寸法情報ディスプレイ領域を含み、
前記実測画面ディスプレイ領域には前記基準寸法情報に基いた前記検査対象体の第1輪郭線と前記3次元実測データに基づいた前記検査対象体の第2輪郭線が前記検査対象体の3次元実測画面にオーバラップされて表示されることを特徴とする3次元基板検査装置のグラフィックユーザインタフェース。 - 前記寸法情報ディスプレイ領域は前記基準寸法情報を表示するための基準寸法表示領域、前記3次元実測データを表示するための実測寸法表示領域及び前記検査対象体の勧奨寸法情報を表示するための勧奨寸法表示領域を含むことを特徴とする請求項1に記載の3次元基板検査装置のグラフィックユーザインタフェース。
- 前記寸法情報ディスプレイ領域は前記勧奨寸法情報を前記予め貯蔵されている前記検査対象体の基準寸法情報にアップデートするための設定メニューが表示されることを特徴とする請求項2に記載の3次元基板検査装置のグラフィックユーザインタフェース。
- 前記第1輪郭線または前記第2輪郭線の横、縦または高さのうちいずれか一つの位置で所定入力が入力されると、前記横、縦または高さのうちいずれか一つに対応する勧奨寸法情報を前記予め貯蔵された前記検査対象体の基準寸法情報に変更するためのアップデートが自動に設定されることを特徴とする請求項2に記載の3次元基板検査装置のグラフィックユーザインタフェース。
- 前記検査対象体は前記基板上に実装される部品または前記部品のリードであることを特徴とする請求項1に記載の3次元基板検査装置のグラフィックユーザインタフェース。
- 前記第1輪郭線及び第2輪郭線は前記検査対象体の横、縦及び高さ線のうち少なくとも一つを含むことを特徴とする請求項1に記載の3次元基板検査装置のグラフィックユーザインタフェース。
- 前記第1輪郭線及び第2輪郭線は互いに異なる色相で表示されることを特徴とする請求項1に記載の3次元基板検査装置のグラフィックユーザインタフェース。
- キャドデータ上の前記検査対象体の部品寸法に対する前記3次元実測データ上の検査対象体の寸法の比率が予め設定された値の範囲を外れる場合、勧奨寸法は寸法設定ディスプレイ領域上で区別して表示されることを特徴とする請求項1に記載の3次元基板検査装置のグラフィックユーザインタフェース。
- 前記実測画面ディスプレイ領域上で前記検査対象体の3次元実測画面は入力値によってX軸、Y軸及びZ軸のうち一つで回転可能であるようにディスプレイされることを特徴とする請求項1に記載の3次元基板検査装置のグラフィックユーザインタフェース。
- 前記3次元基板検査装置のグラフィックユーザインタフェースは基準値設定メニューを含み、
前記基準値設定メニューが選択されると、前記寸法情報ディスプレイ領域はポップアップ窓の形態に表示されることを特徴とする請求項1に記載の3次元基板検査装置のグラフィックユーザインタフェース。 - 前記第1輪郭線または前記第2輪郭線にポインタが位置すると、前記位置での検査対象体の横、縦及び高さ値のうち少なくとも一つが表示されることを特徴とする請求項1に記載の3次元基板検査装置のグラフィックユーザインタフェース。
- 第1項乃至第11項のうちいずれか一つに記載の3次元基板検査装置のグラフィックユーザインタフェースを具現するための命令語を含むプログラムが貯蔵された記録媒体。
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KR1020130105389A KR101457040B1 (ko) | 2013-09-03 | 2013-09-03 | 3차원 기판검사장치의 그래픽 유저 인터페이스 |
KR10-2013-0105389 | 2013-09-03 | ||
PCT/KR2014/008220 WO2015034244A1 (ko) | 2013-09-03 | 2014-09-03 | 3차원 기판검사장치의 그래픽 유저 인터페이스 |
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JP2017500654A true JP2017500654A (ja) | 2017-01-05 |
JP6167242B2 JP6167242B2 (ja) | 2017-07-19 |
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JP2016540803A Active JP6167242B2 (ja) | 2013-09-03 | 2014-09-03 | 3次元基板検査装置のグラフィックユーザインタフェース |
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US (1) | US10025898B2 (ja) |
EP (1) | EP3043248B1 (ja) |
JP (1) | JP6167242B2 (ja) |
KR (1) | KR101457040B1 (ja) |
CN (1) | CN104823143B (ja) |
WO (1) | WO2015034244A1 (ja) |
Cited By (1)
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WO2021187003A1 (ja) * | 2020-03-19 | 2021-09-23 | 株式会社Screenホールディングス | 検査システム、検査結果の表示方法および表示プログラム |
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KR101784276B1 (ko) | 2015-02-27 | 2017-10-12 | 주식회사 고영테크놀러지 | 기판 검사 방법 및 시스템 |
WO2016137130A1 (ko) * | 2015-02-27 | 2016-09-01 | 주식회사 고영테크놀러지 | 기판 검사 방법 및 시스템 |
DE202016008484U1 (de) * | 2015-06-30 | 2018-02-20 | Koh Young Technology Inc. | Gegenstandsprüfvorrichtung |
KR101794964B1 (ko) | 2015-07-17 | 2017-11-07 | 주식회사 고영테크놀러지 | 검사 시스템 및 검사 방법 |
KR101750521B1 (ko) | 2015-07-27 | 2017-07-03 | 주식회사 고영테크놀러지 | 기판 검사 장치 및 방법 |
TWI602256B (zh) * | 2016-05-18 | 2017-10-11 | 財團法人工業技術研究院 | 自動封裝產線、封裝方法及封裝系統 |
FR3054914B1 (fr) | 2016-08-03 | 2021-05-21 | Vit | Procede d'inspection optique d'un objet |
KR101970335B1 (ko) * | 2017-09-14 | 2019-04-18 | 강수용 | 인쇄회로기판 제조용 생산 관리 시스템 |
CN111507056B (zh) * | 2020-04-17 | 2023-04-11 | 成都寰蓉光电科技有限公司 | 一种实现元器件管理及共享的pcb设计方法和系统 |
CN114780188B (zh) * | 2022-04-08 | 2023-09-01 | 上海迈内能源科技有限公司 | 网页3d模型顶牌展示方法、系统、终端及存储介质 |
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- 2013-09-03 KR KR1020130105389A patent/KR101457040B1/ko active IP Right Grant
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- 2014-09-03 EP EP14843126.5A patent/EP3043248B1/en active Active
- 2014-09-03 WO PCT/KR2014/008220 patent/WO2015034244A1/ko active Application Filing
- 2014-09-03 JP JP2016540803A patent/JP6167242B2/ja active Active
- 2014-09-03 CN CN201480001602.7A patent/CN104823143B/zh active Active
- 2014-09-03 US US14/916,361 patent/US10025898B2/en active Active
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JPH10135686A (ja) * | 1996-10-25 | 1998-05-22 | Sanyo Electric Co Ltd | データ処理装置及び電子部品装着装置 |
JP2003279333A (ja) * | 2002-03-26 | 2003-10-02 | Toshiba Eng Co Ltd | 形状計測装置、外観検査装置、寸法検査装置、体積検査装置および変位・変形計測装置 |
JP2009047458A (ja) * | 2007-08-14 | 2009-03-05 | Toray Ind Inc | 回路パターン検査装置および検査方法 |
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WO2021187003A1 (ja) * | 2020-03-19 | 2021-09-23 | 株式会社Screenホールディングス | 検査システム、検査結果の表示方法および表示プログラム |
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CN104823143A (zh) | 2015-08-05 |
US20160224718A1 (en) | 2016-08-04 |
EP3043248B1 (en) | 2024-04-03 |
JP6167242B2 (ja) | 2017-07-19 |
EP3043248C0 (en) | 2024-04-03 |
WO2015034244A1 (ko) | 2015-03-12 |
EP3043248A4 (en) | 2017-05-03 |
US10025898B2 (en) | 2018-07-17 |
CN104823143B (zh) | 2018-07-20 |
KR101457040B1 (ko) | 2014-10-31 |
EP3043248A1 (en) | 2016-07-13 |
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