JP2017223487A5 - - Google Patents

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Publication number
JP2017223487A5
JP2017223487A5 JP2016117701A JP2016117701A JP2017223487A5 JP 2017223487 A5 JP2017223487 A5 JP 2017223487A5 JP 2016117701 A JP2016117701 A JP 2016117701A JP 2016117701 A JP2016117701 A JP 2016117701A JP 2017223487 A5 JP2017223487 A5 JP 2017223487A5
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JP
Japan
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light
cell
linearly polarized
optical axis
polarized light
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JP2016117701A
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English (en)
Japanese (ja)
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JP6825237B2 (ja
JP2017223487A (ja
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Priority to JP2016117701A priority Critical patent/JP6825237B2/ja
Priority claimed from JP2016117701A external-priority patent/JP6825237B2/ja
Priority to US15/614,961 priority patent/US10036786B2/en
Publication of JP2017223487A publication Critical patent/JP2017223487A/ja
Publication of JP2017223487A5 publication Critical patent/JP2017223487A5/ja
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JP2016117701A 2016-06-14 2016-06-14 磁場計測装置、磁場計測装置の製造方法 Active JP6825237B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2016117701A JP6825237B2 (ja) 2016-06-14 2016-06-14 磁場計測装置、磁場計測装置の製造方法
US15/614,961 US10036786B2 (en) 2016-06-14 2017-06-06 Magnetic field measuring apparatus and manufacturing method of magnetic field measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2016117701A JP6825237B2 (ja) 2016-06-14 2016-06-14 磁場計測装置、磁場計測装置の製造方法

Publications (3)

Publication Number Publication Date
JP2017223487A JP2017223487A (ja) 2017-12-21
JP2017223487A5 true JP2017223487A5 (https=) 2019-06-20
JP6825237B2 JP6825237B2 (ja) 2021-02-03

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JP2016117701A Active JP6825237B2 (ja) 2016-06-14 2016-06-14 磁場計測装置、磁場計測装置の製造方法

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US (1) US10036786B2 (https=)
JP (1) JP6825237B2 (https=)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6825241B2 (ja) * 2016-06-21 2021-02-03 セイコーエプソン株式会社 磁場計測装置、磁場計測装置の製造方法
US10976386B2 (en) 2018-07-17 2021-04-13 Hi Llc Magnetic field measurement system and method of using variable dynamic range optical magnetometers
US11262420B2 (en) 2018-08-17 2022-03-01 Hi Llc Integrated gas cell and optical components for atomic magnetometry and methods for making and using
WO2020040882A1 (en) 2018-08-20 2020-02-27 Hi Llc Magnetic field shaping components for magnetic field measurement systems and methods for making and using
US10627460B2 (en) 2018-08-28 2020-04-21 Hi Llc Systems and methods including multi-mode operation of optically pumped magnetometer(s)
WO2020060652A1 (en) 2018-09-18 2020-03-26 Hi Llc Dynamic magnetic shielding and beamforming using ferrofluid for compact magnetoencephalography (meg)
CN111289924B (zh) * 2018-12-10 2025-06-17 中科知影(北京)科技有限公司 多通道原子磁探测器
US11294008B2 (en) 2019-01-25 2022-04-05 Hi Llc Magnetic field measurement system with amplitude-selective magnetic shield
US11022658B2 (en) 2019-02-12 2021-06-01 Hi Llc Neural feedback loop filters for enhanced dynamic range magnetoencephalography (MEG) systems and methods
CA3130157A1 (en) 2019-03-29 2020-10-08 Hi Llc Integrated magnetometer arrays for magnetoencephalography (meg) detection systems and methods
US11269027B2 (en) 2019-04-23 2022-03-08 Hi Llc Compact optically pumped magnetometers with pump and probe configuration and systems and methods
US11839474B2 (en) 2019-05-31 2023-12-12 Hi Llc Magnetoencephalography (MEG) phantoms for simulating neural activity
US11131729B2 (en) 2019-06-21 2021-09-28 Hi Llc Systems and methods with angled input beams for an optically pumped magnetometer
US11415641B2 (en) 2019-07-12 2022-08-16 Hi Llc Detachable arrangement for on-scalp magnetoencephalography (MEG) calibration
WO2021026143A1 (en) 2019-08-06 2021-02-11 Hi Llc Systems and methods having an optical magnetometer array with beam splitters
WO2021045953A1 (en) 2019-09-03 2021-03-11 Hi Llc Methods and systems for fast field zeroing for magnetoencephalography (meg)
WO2021091867A1 (en) 2019-11-08 2021-05-14 Hi Llc Methods and systems for homogenous optically-pumped vapor cell array assembly from discrete vapor cells
WO2021242680A1 (en) 2020-05-28 2021-12-02 Hi Llc Systems and methods for recording neural activity
US11428756B2 (en) 2020-05-28 2022-08-30 Hi Llc Magnetic field measurement or recording systems with validation using optical tracking data
US11766217B2 (en) 2020-05-28 2023-09-26 Hi Llc Systems and methods for multimodal pose and motion tracking for magnetic field measurement or recording systems
WO2021242682A1 (en) 2020-05-28 2021-12-02 Hi Llc Systems and methods for recording biomagnetic fields of the human heart
JP7573240B2 (ja) * 2020-06-16 2024-10-25 浜松ホトニクス株式会社 光励起磁気センサ
US11774526B2 (en) 2020-09-10 2023-10-03 X Development Llc Magnetometry based on electron spin defects
US11604237B2 (en) 2021-01-08 2023-03-14 Hi Llc Devices, systems, and methods with optical pumping magnetometers for three-axis magnetic field sensing
US11803018B2 (en) 2021-01-12 2023-10-31 Hi Llc Devices, systems, and methods with a piezoelectric-driven light intensity modulator
US12007454B2 (en) 2021-03-11 2024-06-11 Hi Llc Devices, systems, and methods for suppressing optical noise in optically pumped magnetometers
JP2022186214A (ja) * 2021-06-04 2022-12-15 浜松ホトニクス株式会社 光励起磁気センサ
EP4160239A1 (en) * 2021-10-01 2023-04-05 Fundació Institut de Ciències Fotòniques A cell for an optically-pumped atomic magnetic gradiometer, an optically-pumped atomic magnetic gradiometer, and a system comprising the gradiometer and a microscopy system

Family Cites Families (10)

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US4327327A (en) * 1980-06-05 1982-04-27 The Singer Company All-angle gradient magnetometer
JP5178187B2 (ja) 2007-12-28 2013-04-10 キヤノン株式会社 原子磁気センサ、及び磁気センシング方法
JP5640335B2 (ja) * 2009-06-26 2014-12-17 セイコーエプソン株式会社 磁気センサー
JP5446731B2 (ja) * 2009-10-29 2014-03-19 セイコーエプソン株式会社 磁場測定装置
JP2011137687A (ja) * 2009-12-28 2011-07-14 Seiko Epson Corp 磁気計測装置
JP5434735B2 (ja) * 2010-03-25 2014-03-05 セイコーエプソン株式会社 セルユニット、セルユニット群および磁場測定装置
JP5799553B2 (ja) * 2011-04-01 2015-10-28 セイコーエプソン株式会社 磁場測定装置、磁場測定システムおよび磁場測定方法
JP2014119376A (ja) 2012-12-18 2014-06-30 Seiko Epson Corp 照射装置および計測装置
JP6459167B2 (ja) * 2013-11-27 2019-01-30 セイコーエプソン株式会社 磁場測定装置および磁場測定方法
JP6825241B2 (ja) * 2016-06-21 2021-02-03 セイコーエプソン株式会社 磁場計測装置、磁場計測装置の製造方法

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