JP2017215966A - 記憶デバイスにおける性能変動を制限するための技術 - Google Patents
記憶デバイスにおける性能変動を制限するための技術 Download PDFInfo
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
- G06F11/0706—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment
- G06F11/0727—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment in a storage system, e.g. in a DASD or network based storage system
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/14—Error detection or correction of the data by redundancy in operation
- G06F11/1402—Saving, restoring, recovering or retrying
- G06F11/1471—Saving, restoring, recovering or retrying involving logging of persistent data for recovery
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
- G06F11/0751—Error or fault detection not based on redundancy
- G06F11/0754—Error or fault detection not based on redundancy by exceeding limits
- G06F11/0757—Error or fault detection not based on redundancy by exceeding limits by exceeding a time limit, i.e. time-out, e.g. watchdogs
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
- G06F11/0793—Remedial or corrective actions
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
- G06F11/1068—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices in sector programmable memories, e.g. flash disk
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/14—Error detection or correction of the data by redundancy in operation
- G06F11/1402—Saving, restoring, recovering or retrying
- G06F11/1415—Saving, restoring, recovering or retrying at system level
- G06F11/1435—Saving, restoring, recovering or retrying at system level using file system or storage system metadata
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/38—Response verification devices
- G11C29/42—Response verification devices using error correcting codes [ECC] or parity check
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/44—Indication or identification of errors, e.g. for repair
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F2201/00—Indexing scheme relating to error detection, to error correction, and to monitoring
- G06F2201/81—Threshold
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F2201/00—Indexing scheme relating to error detection, to error correction, and to monitoring
- G06F2201/835—Timestamp
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- Debugging And Monitoring (AREA)
Abstract
Description
Claims (20)
- 記憶デバイスであって、
制御器であって、
1つ以上の動作を行う要求を受信することと、
前記要求の応答時間を推定することであって、前記応答時間は、前記要求を部分的に実行するために前記制御器が要する時間を示す、推定することと、
前記応答時間が実行時間閾値を超えていることを決定することと、
前記応答時間が前記実行時間閾値を超えているという決定に際し、1つ以上のエラー回復動作を実行するために追加のリソースを割り当てることと、のためのものである、制御器を備える、記憶デバイス。 - 前記制御器は、
前記要求の到着時刻を決定するためのものであり、前記到着時刻は、前記制御器が前記要求を受信した時刻である、請求項1に記載の記憶デバイス。 - 前記制御器は、
前記到着時刻を前記要求にタイムスタンプするためのものである、請求項2に記載の記憶デバイス。 - 前記制御器は、
前記要求の前記到着時刻を到着ログに記録するためのものである、請求項2に記載の記憶デバイス。 - 前記制御器は、
現在時刻を前記到着時刻と比較することと、
前記現在時刻と前記到着時刻との間の差異に基づき、前記応答時間を決定することと、のためのものである、請求項2に記載の記憶デバイス。 - 前記制御器は、
前記要求に含まれる前記1つ以上の動作の実行中にエラーが発生したことを決定することと、
検出された前記エラーを補償するために前記1つ以上のエラー回復動作を実行することと、のためのものである、請求項1に記載の記憶デバイス。 - 前記要求の前記1つ以上の動作が、読み出し動作及び書き込み動作の両方の混合作業負荷を含む、請求項1に記載の記憶デバイス。
- 前記実行時間閾値は、前記要求を行うための平均的な実行時間と等しい、請求項1に記載の記憶デバイス。
- 前記制御器は、
前記記憶デバイスのリソースに関して最優先されるように前記1つ以上のエラー回復動作を割り当てるためのものである、請求項1に記載の記憶デバイス。 - 前記記憶デバイスが、ソリッドステートドライブ(SSD)記憶デバイスである、請求項1に記載の記憶デバイス。
- 前記1つ以上のエラー回復動作が、前記記憶デバイスの1つ以上のメモリセルを再読み出しすることを含む、請求項1に記載の記憶デバイス。
- 前記1つ以上のエラー回復動作が、外部コード回復動作を含む、請求項1に記載の記憶デバイス。
- 記憶デバイスにおける性能変動を制限する方法であって、
前記記憶デバイスの制御器によって、1つ以上の動作を行う要求を受信することと、
前記要求の応答時間を推定することであって、前記応答時間は、前記要求を部分的に実行するために前記制御器が要する時間を示す、推定することと、
前記応答時間が実行時間閾値を超えていることを決定することと、
前記応答時間が前記実行時間閾値を超えているという決定に際し、1つ以上のエラー回復動作を実行するために追加のリソースを割り当てることと、を含む、方法。 - 前記制御器によって前記要求の到着時刻を決定することを更に含み、前記到着時刻は、前記制御器が前記要求を受信した時刻である、請求項13に記載の方法。
- 前記応答時間を推定することが、
現在時刻を前記到着時刻と比較することと、
前記現在時刻と前記到着時刻との間の差異に基づき、前記応答時間を決定することと、を更に含む、請求項14に記載の方法。 - 前記要求に含まれる前記1つ以上の動作の実行中にエラーが発生したことを決定することと、
検出された前記エラーを補償するために前記1つ以上のエラー回復動作を実行することと、を更に含む、請求項13に記載の方法。 - 前記実行時間閾値は、前記要求を行うための平均的な実行時間と等しい、請求項13に記載の方法。
- 前記1つ以上のエラー回復動作を実行するためにより多くのリソースを割り当てることが、前記記憶デバイスのリソースに関して最優先されるように前記1つ以上のエラー回復動作を割り当てることを更に含む、請求項13に記載の方法。
- 前記1つ以上のエラー回復動作が、前記記憶デバイスの1つ以上のメモリセルを再読み出しすることを含む、請求項13に記載の方法。
- 記憶デバイスにおける性能変動を制限するために構成されたコンピューティングデバイスであって、
プロセッサと、
前記プロセッサと電子通信するメモリと、を備え、前記メモリは、前記プロセッサによって実行されると、
前記記憶デバイスの制御器によって、1つ以上の動作を行う要求を受信するステップと、
前記要求の応答時間を推定するステップであって、前記応答時間は、前記要求を部分的に実行するために前記制御器が要する時間を示す、ステップと、
前記応答時間が実行時間閾値を超えていることを決定するステップと、
前記応答時間が前記実行時間閾値を超えているという決定に際し、1つ以上のエラー回復動作を実行するために追加のリソースを割り当てるステップと、を前記プロセッサに行わせるコンピュータ実行可能命令を記憶する、コンピューティングデバイス。
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US15/170,709 US10423500B2 (en) | 2016-06-01 | 2016-06-01 | Technologies for limiting performance variation in a storage device |
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KR102219826B1 (ko) | 2021-02-23 |
KR20170136449A (ko) | 2017-12-11 |
CN107451006A (zh) | 2017-12-08 |
US11216345B2 (en) | 2022-01-04 |
US20190391886A1 (en) | 2019-12-26 |
US10423500B2 (en) | 2019-09-24 |
CN107451006B (zh) | 2022-03-18 |
US20170351582A1 (en) | 2017-12-07 |
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