JP2017126357A - メモリにエラーを注入する方法および装置 - Google Patents

メモリにエラーを注入する方法および装置 Download PDF

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Publication number
JP2017126357A
JP2017126357A JP2017043333A JP2017043333A JP2017126357A JP 2017126357 A JP2017126357 A JP 2017126357A JP 2017043333 A JP2017043333 A JP 2017043333A JP 2017043333 A JP2017043333 A JP 2017043333A JP 2017126357 A JP2017126357 A JP 2017126357A
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Japan
Prior art keywords
error
error injection
memory
system address
register
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Ceased
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JP2017043333A
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English (en)
Japanese (ja)
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JP2017126357A5 (https=
Inventor
イグザウ、セオドロス
Yigzaw Theodros
チェン、カイ
Kai Cheng
ジェー． クマー、モハン
Mohan J Kumar
ジェー． クマー、モハン
エー． バルガス、ホセ
A Vargas Jose
エー． バルガス、ホセ
ジャンダヤラ、ゴピクリシュナ
Jandhyala Gopikrishna
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Intel Corp
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Intel Corp
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Priority to JP2017043333A priority Critical patent/JP2017126357A/ja
Publication of JP2017126357A publication Critical patent/JP2017126357A/ja
Publication of JP2017126357A5 publication Critical patent/JP2017126357A5/ja
Ceased legal-status Critical Current

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  • Advance Control (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Debugging And Monitoring (AREA)
  • Memory System (AREA)
JP2017043333A 2017-03-07 2017-03-07 メモリにエラーを注入する方法および装置 Ceased JP2017126357A (ja)

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JP2017043333A JP2017126357A (ja) 2017-03-07 2017-03-07 メモリにエラーを注入する方法および装置

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JP2017043333A JP2017126357A (ja) 2017-03-07 2017-03-07 メモリにエラーを注入する方法および装置

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JP2014533256A Division JP2014531681A (ja) 2011-09-29 2011-09-29 メモリにエラーを注入する方法および装置

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JP2017126357A true JP2017126357A (ja) 2017-07-20
JP2017126357A5 JP2017126357A5 (https=) 2017-09-21

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019004124A1 (ja) 2017-06-28 2019-01-03 Ａｇｃ株式会社 化学強化ガラス、その製造方法および化学強化用ガラス
CN113064782A (zh) * 2021-03-22 2021-07-02 山东英信计算机技术有限公司 一种内存注错自动化系统、使用方法及介质
CN117498991A (zh) * 2023-11-14 2024-02-02 无锡众星微系统技术有限公司 一种基于重传功能原型设备的可测性注错方法和装置
CN117852104A (zh) * 2024-01-24 2024-04-09 奕算智能科技(上海)有限公司 一种对芯片软件注错进行保护加密的方法及系统

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007041665A (ja) * 2005-08-01 2007-02-15 Nec Engineering Ltd Ｅｃｃ機能検査回路およびｅｃｃ機能検査方法
JP2008502094A (ja) * 2004-06-11 2008-01-24 サムスン エレクトロニクス カンパニー リミテッド メモリテストモードインターフェース方法及び装置
US20090240986A1 (en) * 2008-03-24 2009-09-24 Emulex Design & Manufacturing Corporation Generation of simulated errors for high-level system validation
US7818626B1 (en) * 2007-01-12 2010-10-19 Oracle America, Inc. Memory error injector and associated methods

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008502094A (ja) * 2004-06-11 2008-01-24 サムスン エレクトロニクス カンパニー リミテッド メモリテストモードインターフェース方法及び装置
JP2007041665A (ja) * 2005-08-01 2007-02-15 Nec Engineering Ltd Ｅｃｃ機能検査回路およびｅｃｃ機能検査方法
US7818626B1 (en) * 2007-01-12 2010-10-19 Oracle America, Inc. Memory error injector and associated methods
US20090240986A1 (en) * 2008-03-24 2009-09-24 Emulex Design & Manufacturing Corporation Generation of simulated errors for high-level system validation

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019004124A1 (ja) 2017-06-28 2019-01-03 Ａｇｃ株式会社 化学強化ガラス、その製造方法および化学強化用ガラス
CN113064782A (zh) * 2021-03-22 2021-07-02 山东英信计算机技术有限公司 一种内存注错自动化系统、使用方法及介质
CN113064782B (zh) * 2021-03-22 2023-03-24 山东英信计算机技术有限公司 一种内存注错自动化系统、使用方法及介质
CN117498991A (zh) * 2023-11-14 2024-02-02 无锡众星微系统技术有限公司 一种基于重传功能原型设备的可测性注错方法和装置
CN117498991B (zh) * 2023-11-14 2024-05-28 无锡众星微系统技术有限公司 一种基于重传功能原型设备的可测性注错方法和装置
CN117852104A (zh) * 2024-01-24 2024-04-09 奕算智能科技(上海)有限公司 一种对芯片软件注错进行保护加密的方法及系统

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