JP2017126357A5 - - Google Patents

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Publication number
JP2017126357A5
JP2017126357A5 JP2017043333A JP2017043333A JP2017126357A5 JP 2017126357 A5 JP2017126357 A5 JP 2017126357A5 JP 2017043333 A JP2017043333 A JP 2017043333A JP 2017043333 A JP2017043333 A JP 2017043333A JP 2017126357 A5 JP2017126357 A5 JP 2017126357A5
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Japan
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error
address
memory
register
mask
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JP2017043333A
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English (en)
Japanese (ja)
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JP2017126357A (ja
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Publication of JP2017126357A5 publication Critical patent/JP2017126357A5/ja
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JP2017043333A 2017-03-07 2017-03-07 メモリにエラーを注入する方法および装置 Ceased JP2017126357A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2017043333A JP2017126357A (ja) 2017-03-07 2017-03-07 メモリにエラーを注入する方法および装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2017043333A JP2017126357A (ja) 2017-03-07 2017-03-07 メモリにエラーを注入する方法および装置

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP2014533256A Division JP2014531681A (ja) 2011-09-29 2011-09-29 メモリにエラーを注入する方法および装置

Publications (2)

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JP2017126357A JP2017126357A (ja) 2017-07-20
JP2017126357A5 true JP2017126357A5 (https=) 2017-09-21

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JP2017043333A Ceased JP2017126357A (ja) 2017-03-07 2017-03-07 メモリにエラーを注入する方法および装置

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JP (1) JP2017126357A (https=)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7136096B2 (ja) 2017-06-28 2022-09-13 Ａｇｃ株式会社 化学強化ガラス、その製造方法および化学強化用ガラス
CN113064782B (zh) * 2021-03-22 2023-03-24 山东英信计算机技术有限公司 一种内存注错自动化系统、使用方法及介质
CN117498991B (zh) * 2023-11-14 2024-05-28 无锡众星微系统技术有限公司 一种基于重传功能原型设备的可测性注错方法和装置
CN117852104B (zh) * 2024-01-24 2025-12-12 奕算智能科技(上海)有限公司 一种对芯片软件注错进行保护加密的方法及系统

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100735575B1 (ko) * 2004-06-11 2007-07-04 삼성전자주식회사 메모리의 테스트 모드 인터페이스 방법 및 장치
JP2007041665A (ja) * 2005-08-01 2007-02-15 Nec Engineering Ltd Ｅｃｃ機能検査回路およびｅｃｃ機能検査方法
US7818626B1 (en) * 2007-01-12 2010-10-19 Oracle America, Inc. Memory error injector and associated methods
US8522080B2 (en) * 2008-03-24 2013-08-27 Emulex Design & Manufacturing Corporation Generation of simulated errors for high-level system validation

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