JP2017103346A - Optical module - Google Patents

Optical module Download PDF

Info

Publication number
JP2017103346A
JP2017103346A JP2015235440A JP2015235440A JP2017103346A JP 2017103346 A JP2017103346 A JP 2017103346A JP 2015235440 A JP2015235440 A JP 2015235440A JP 2015235440 A JP2015235440 A JP 2015235440A JP 2017103346 A JP2017103346 A JP 2017103346A
Authority
JP
Japan
Prior art keywords
mounting substrate
carrier
mounting
optical module
temperature sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2015235440A
Other languages
Japanese (ja)
Other versions
JP6555106B2 (en
Inventor
芳幸 加茂
Yoshiyuki Kamo
芳幸 加茂
安井 伸之
Nobuyuki Yasui
伸之 安井
庸輔 秋田
Yosuke Akita
庸輔 秋田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP2015235440A priority Critical patent/JP6555106B2/en
Publication of JP2017103346A publication Critical patent/JP2017103346A/en
Application granted granted Critical
Publication of JP6555106B2 publication Critical patent/JP6555106B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Semiconductor Lasers (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide an optical module which can be hardly influenced by environmental temperature without adding another material and can secure a clearance at a time of mounting.SOLUTION: Semiconductor laser elements 7 to 10 are provided on a carrier 1. A mounting substrate 6 is provided on the carrier 1. A digging 16 is provided in the mounting substrate 6. A temperature sensor 17 is provided on the carrier 1 in the digging 16 of the mounting substrate 6.SELECTED DRAWING: Figure 1

Description

本発明は、光モジュールに関する。   The present invention relates to an optical module.

サーミスタなどの熱に敏感な温度センサを実装する際に、環境温度の影響を受け難くする必要がある。そこで、従来は、温度センサに接着剤などの有機物を塗布する(例えば、特許文献1(要約)参照)か、又はヒートシンクに設けられた掘り込み内にサーミスタを配置していた(例えば、特許文献2(図8)参照)。   When mounting a temperature sensor that is sensitive to heat, such as a thermistor, it is necessary to make it less susceptible to environmental temperatures. Therefore, conventionally, an organic substance such as an adhesive is applied to the temperature sensor (see, for example, Patent Document 1 (Abstract)), or a thermistor is disposed in a dug provided in a heat sink (for example, Patent Document 1). 2 (FIG. 8)).

特開2006−324524号公報JP 2006-324524 A 特開2007−5681号公報JP 2007-5681 A

接着剤などの有機物を別途塗布する従来技術では、プロセスが増える手間に加えて密閉内でのガス発生などを考慮する必要があった。また、ヒートシンクは加工費が高いという問題があった。   In the conventional technique in which an organic material such as an adhesive is separately applied, it is necessary to consider the generation of gas in the sealed space in addition to the labor of increasing the number of processes. In addition, the heat sink has a problem of high processing costs.

本発明は、上述のような課題を解決するためになされたもので、その目的は別材料を追加することなく環境温度の影響を受け難くでき、実装時のクリアランスを確保することができる光モジュールを得るものである。   The present invention has been made in order to solve the above-described problems, and an object of the present invention is to make it difficult to be affected by the environmental temperature without adding another material, and to ensure clearance during mounting. Is what you get.

本発明に係る光モジュールは、キャリアと、前記キャリア上に設けられた半導体レーザ素子と、前記キャリア上に設けられ、掘り込みを有する実装基板と、前記実装基板の前記掘り込み内において前記キャリア上に設けられた温度センサとを備えることを特徴とする。   An optical module according to the present invention includes a carrier, a semiconductor laser element provided on the carrier, a mounting substrate provided on the carrier and having a dig, and the carrier within the digging of the mounting substrate. And a temperature sensor provided in the apparatus.

本発明では、実装基板の掘り込み内に温度センサが設けられている。これにより、光モジュール外部から温度センサへの熱流入が実装基板により遮断される。従って、別材料を追加することなく環境温度の影響を受け難くできる。また、温度センサの上面の高さが低くなって部材の段差が少なくなるため、ピンセットによる他部材の実装又はキャピラリによるワイヤボンドなどの実装時のクリアランスを確保することができる。   In the present invention, the temperature sensor is provided in the digging of the mounting substrate. Thereby, the heat inflow from the outside of the optical module to the temperature sensor is blocked by the mounting substrate. Therefore, it is difficult to be influenced by the environmental temperature without adding another material. In addition, since the height of the upper surface of the temperature sensor is reduced and the step of the member is reduced, it is possible to secure a clearance when mounting other members using tweezers or wire bonding using a capillary.

本発明の実施の形態1に係る光モジュールを示す平面図である。It is a top view which shows the optical module which concerns on Embodiment 1 of this invention. 図1のI−IIに沿った断面図である。It is sectional drawing in alignment with I-II of FIG. 本発明の実施の形態2に係る光モジュールを示す平面図である。It is a top view which shows the optical module which concerns on Embodiment 2 of this invention. 本発明の実施の形態2に係る光モジュールの変形例を示す平面図である。It is a top view which shows the modification of the optical module which concerns on Embodiment 2 of this invention.

本発明の実施の形態に係る光モジュールについて図面を参照して説明する。同じ又は対応する構成要素には同じ符号を付し、説明の繰り返しを省略する場合がある。   An optical module according to an embodiment of the present invention will be described with reference to the drawings. The same or corresponding components are denoted by the same reference numerals, and repeated description may be omitted.

実施の形態1.
図1は、本発明の実施の形態1に係る光モジュールを示す平面図である。図2は図1のI−IIに沿った断面図である。キャリア1上に実装基板2〜6が設けられている。実装基板2〜5上にそれぞれ半導体レーザ素子7〜10が設けられている。実装基板2上の配線11が半導体レーザ素子7の下面電極に接続され、実装基板2上の配線12が半導体レーザ素子7の上面電極にワイヤ13により接続されている。他の実装基板2〜6も同様である。各実装基板2〜5の配線12,13が実装基板6のパッドにそれぞれワイヤ14,15により接続されている。実装基板6には回路が設けられているが、ここでは図示を省略する。
Embodiment 1 FIG.
FIG. 1 is a plan view showing an optical module according to Embodiment 1 of the present invention. FIG. 2 is a cross-sectional view taken along the line I-II in FIG. Mounting substrates 2 to 6 are provided on the carrier 1. Semiconductor laser elements 7 to 10 are provided on the mounting substrates 2 to 5, respectively. The wiring 11 on the mounting substrate 2 is connected to the lower surface electrode of the semiconductor laser element 7, and the wiring 12 on the mounting substrate 2 is connected to the upper surface electrode of the semiconductor laser element 7 by the wire 13. The same applies to the other mounting boards 2 to 6. The wirings 12 and 13 of the mounting substrates 2 to 5 are connected to the pads of the mounting substrate 6 by wires 14 and 15, respectively. Although a circuit is provided on the mounting substrate 6, illustration is omitted here.

実装基板6の中央部には掘り込み16が設けられている。この実装基板6の掘り込み16内において、サーミスタなどの温度センサ17がキャリア1上に設けられている。ここでは掘り込み16は実装基板6を上下に貫通する貫通孔であるが、これに限らず実装基板6の厚さ方向の途中まで掘り込まれた窪みであってもよい。何れの場合でも、温度センサ17の上面の高さが実装基板6の上面の高さよりも低くなることが好ましい。   A digging 16 is provided in the center of the mounting substrate 6. A temperature sensor 17 such as a thermistor is provided on the carrier 1 in the digging 16 of the mounting substrate 6. Here, the digging 16 is a through-hole penetrating the mounting substrate 6 up and down. However, the digging 16 is not limited to this, and may be a depression dug in the middle of the mounting substrate 6 in the thickness direction. In any case, the height of the upper surface of the temperature sensor 17 is preferably lower than the height of the upper surface of the mounting substrate 6.

キャリア1の裏面には、ペルチェ素子などの熱電変換素子18が設けられている。熱電変換素子18は、温度センサ17により検出した温度に基づいて制御される。熱電変換素子18は、供給される制御電流の電流量に応じてキャリア1から熱量を奪う又は与える。制御電流の方向に応じて熱電変換素子18の下面が吸熱面又は放熱面の一方となり、上面が吸熱面又は放熱面の他方となる。   A thermoelectric conversion element 18 such as a Peltier element is provided on the back surface of the carrier 1. The thermoelectric conversion element 18 is controlled based on the temperature detected by the temperature sensor 17. The thermoelectric conversion element 18 takes away or gives heat from the carrier 1 in accordance with the amount of control current supplied. Depending on the direction of the control current, the lower surface of the thermoelectric conversion element 18 is one of the heat absorption surface and the heat dissipation surface, and the upper surface is the other of the heat absorption surface and the heat dissipation surface.

以上説明したように、本実施の形態では、実装基板6の掘り込み16内に温度センサ17が設けられている。これにより、光モジュール外部から温度センサ17への熱流入が実装基板6により遮断される。従って、別材料を追加することなく環境温度の影響を受け難くできるため、半導体レーザ素子7〜10の温度を精度よく測定できる。そして、シビアな温度管理が求められる製品に対してより厳密に温度管理をすることができる。特に、光モジュールの場合は、半導体レーザ素子7〜10の発振波長の温度依存性を小さく抑えることができる。   As described above, in the present embodiment, the temperature sensor 17 is provided in the digging 16 of the mounting substrate 6. Thereby, the heat inflow from the outside of the optical module to the temperature sensor 17 is blocked by the mounting substrate 6. Therefore, the temperature of the semiconductor laser elements 7 to 10 can be accurately measured because it is difficult to be influenced by the environmental temperature without adding another material. In addition, temperature management can be more strictly performed for products that require severe temperature management. In particular, in the case of an optical module, the temperature dependence of the oscillation wavelength of the semiconductor laser elements 7 to 10 can be kept small.

また、温度センサ17の上面の高さが低くなって部材の段差が少なくなるため、ピンセットによる他部材の実装又はキャピラリによるワイヤボンドなどの実装時のクリアランスを確保することができる。従って、狭接実装に有利である。   Further, since the height of the upper surface of the temperature sensor 17 is reduced and the step of the member is reduced, it is possible to secure a clearance when mounting other members using tweezers or wire bonding using a capillary. Therefore, it is advantageous for narrow mounting.

実施の形態2.
図3は、本発明の実施の形態2に係る光モジュールを示す平面図である。互いに分離した実装基板19,20がキャリア1上に設けられている。実装基板2,3の配線11,12が実装基板19のパッドに接続され、実装基板4,5の配線11,12が実装基板20のパッドに接続されている。実装基板19,20上にそれぞれ回路が設けられているが、ここでは図示を省略する。
Embodiment 2. FIG.
FIG. 3 is a plan view showing an optical module according to Embodiment 2 of the present invention. The mounting substrates 19 and 20 separated from each other are provided on the carrier 1. The wirings 11 and 12 of the mounting substrates 2 and 3 are connected to the pads of the mounting substrate 19, and the wirings 11 and 12 of the mounting substrates 4 and 5 are connected to the pads of the mounting substrate 20. Although circuits are provided on the mounting substrates 19 and 20, respectively, illustration is omitted here.

実装基板19と実装基板20の間において、温度センサ17がキャリア1上に設けられている。温度センサ17の上面の高さが実装基板19,20の上面の高さよりも低くなることが好ましい。その他の構成は実施の形態1と同様である。   A temperature sensor 17 is provided on the carrier 1 between the mounting substrate 19 and the mounting substrate 20. The height of the upper surface of the temperature sensor 17 is preferably lower than the height of the upper surfaces of the mounting substrates 19 and 20. Other configurations are the same as those of the first embodiment.

本実施の形態では光モジュール外部から温度センサ17への熱流入が実装基板19,20により遮断される。また、本実施の形態でも温度センサ17の上面の高さが低くなって部材の段差が少なくなる。このため、実施の形態1と同様の効果を得ることができる。また、実装基板を2つに分けることで配線引き回しの自由度が高くなる。さらに、ワイヤボンド位置も分割されるため、ワイヤ干渉を避けることができる。そして、ワイヤボンドを行う際に必要な実装面積を確保することができるため、ワイヤボンド時のキャピラリなどのクリアランスを確保することができる。   In the present embodiment, heat inflow from the outside of the optical module to the temperature sensor 17 is blocked by the mounting boards 19 and 20. Also in the present embodiment, the height of the upper surface of the temperature sensor 17 is lowered, and the level difference of the members is reduced. For this reason, the same effect as Embodiment 1 can be acquired. Further, dividing the mounting board into two increases the degree of freedom of wiring routing. Furthermore, since the wire bond position is also divided, wire interference can be avoided. And since the mounting area required when performing wire bonding can be ensured, the clearance of the capillary etc. at the time of wire bonding can be ensured.

図4は、本発明の実施の形態2に係る光モジュールの変形例を示す平面図である。図3では実装基板19,20が同一形状で左右及び前後対称であるが、これに限らず図4のように実装基板19,20が異なる形状でもよい。   FIG. 4 is a plan view showing a modification of the optical module according to Embodiment 2 of the present invention. In FIG. 3, the mounting boards 19 and 20 have the same shape and are bilaterally and longitudinally symmetric. However, the mounting boards 19 and 20 may have different shapes as shown in FIG.

1 キャリア、6,19,20 実装基板、7〜10 半導体レーザ素子、16 掘り込み、17 温度センサ 1 carrier, 6, 19, 20 mounting substrate, 7-10 semiconductor laser element, 16 dug, 17 temperature sensor

Claims (2)

キャリアと、
前記キャリア上に設けられた半導体レーザ素子と、
前記キャリア上に設けられ、掘り込みを有する実装基板と、
前記実装基板の前記掘り込み内において前記キャリア上に設けられた温度センサとを備えることを特徴とする光モジュール。
Career,
A semiconductor laser element provided on the carrier;
A mounting substrate provided on the carrier and having a digging;
An optical module comprising: a temperature sensor provided on the carrier in the digging of the mounting substrate.
キャリアと、
前記キャリア上に設けられた半導体レーザ素子と、
前記キャリア上に設けられ、互いに分離した第1及び第2の実装基板と、
前記第1の実装基板と前記第2の実装基板の間において前記キャリア上に設けられた温度センサとを備えることを特徴とする光モジュール。
Career,
A semiconductor laser element provided on the carrier;
First and second mounting boards provided on the carrier and separated from each other;
An optical module comprising: a temperature sensor provided on the carrier between the first mounting substrate and the second mounting substrate.
JP2015235440A 2015-12-02 2015-12-02 Optical module Active JP6555106B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2015235440A JP6555106B2 (en) 2015-12-02 2015-12-02 Optical module

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015235440A JP6555106B2 (en) 2015-12-02 2015-12-02 Optical module

Publications (2)

Publication Number Publication Date
JP2017103346A true JP2017103346A (en) 2017-06-08
JP6555106B2 JP6555106B2 (en) 2019-08-07

Family

ID=59016916

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015235440A Active JP6555106B2 (en) 2015-12-02 2015-12-02 Optical module

Country Status (1)

Country Link
JP (1) JP6555106B2 (en)

Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4414465A (en) * 1980-03-05 1983-11-08 Thorn Domestic Appliances (Electrical) Ltd. Cooking apparatus
JPH0737638U (en) * 1993-12-21 1995-07-11 グラフテック株式会社 Thermal head
US20020085598A1 (en) * 2000-12-28 2002-07-04 Shaw Mark A. Low cost optical bench having high thermal conductivity
JP2003264331A (en) * 2002-03-11 2003-09-19 Opnext Japan Inc Optical module
US20060151859A1 (en) * 2002-09-19 2006-07-13 Ari Karkkainen Component packaging and assembly
JP2007005681A (en) * 2005-06-27 2007-01-11 Furukawa Electric Co Ltd:The Semiconductor laser module
JP2007036046A (en) * 2005-07-28 2007-02-08 Sumitomo Electric Ind Ltd Optical transmitting device
JP2008153467A (en) * 2006-12-18 2008-07-03 Sumitomo Electric Ind Ltd Light emitting module
JP2008182019A (en) * 2007-01-24 2008-08-07 Opnext Japan Inc Optical transmitting module, optical transmitting device
JP2013115257A (en) * 2011-11-29 2013-06-10 Mitsubishi Electric Corp Optical module
JP2014096424A (en) * 2012-11-08 2014-05-22 Sumitomo Electric Ind Ltd Light-emitting module and optical transceiver
JP2015095471A (en) * 2013-11-08 2015-05-18 住友電気工業株式会社 Light-emitting module

Patent Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4414465A (en) * 1980-03-05 1983-11-08 Thorn Domestic Appliances (Electrical) Ltd. Cooking apparatus
JPH0737638U (en) * 1993-12-21 1995-07-11 グラフテック株式会社 Thermal head
US20020085598A1 (en) * 2000-12-28 2002-07-04 Shaw Mark A. Low cost optical bench having high thermal conductivity
JP2003264331A (en) * 2002-03-11 2003-09-19 Opnext Japan Inc Optical module
US20060151859A1 (en) * 2002-09-19 2006-07-13 Ari Karkkainen Component packaging and assembly
JP2007005681A (en) * 2005-06-27 2007-01-11 Furukawa Electric Co Ltd:The Semiconductor laser module
JP2007036046A (en) * 2005-07-28 2007-02-08 Sumitomo Electric Ind Ltd Optical transmitting device
JP2008153467A (en) * 2006-12-18 2008-07-03 Sumitomo Electric Ind Ltd Light emitting module
JP2008182019A (en) * 2007-01-24 2008-08-07 Opnext Japan Inc Optical transmitting module, optical transmitting device
JP2013115257A (en) * 2011-11-29 2013-06-10 Mitsubishi Electric Corp Optical module
JP2014096424A (en) * 2012-11-08 2014-05-22 Sumitomo Electric Ind Ltd Light-emitting module and optical transceiver
JP2015095471A (en) * 2013-11-08 2015-05-18 住友電気工業株式会社 Light-emitting module

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
KUCHTA, DANIEL M.: "A 50 Gb/s NRZ Modulated 850 nm VCSEL Transmitter Operating Error Free to 90 °C", JOURNAL OF LIGHTWAVE TECHNOLOGY, vol. Volume: 33, Issue: 4, JPN6018045869, 15 February 2015 (2015-02-15), pages 802 - 810, ISSN: 0003924371 *

Also Published As

Publication number Publication date
JP6555106B2 (en) 2019-08-07

Similar Documents

Publication Publication Date Title
US8901748B2 (en) Direct external interconnect for embedded interconnect bridge package
JP6023253B2 (en) Vertical integration system
US10126462B2 (en) Proximity sensor, electronic apparatus and method for manufacturing proximity sensor
TW201640629A (en) Semiconductor device
US11353668B2 (en) Packaging with substrate and printed circuit board cutouts
US8002542B2 (en) Heat treatment jig and heat treatment jig set
US20180197835A1 (en) A surface mount device and a method of attaching such a device
TW201541677A (en) Crystal oscillation device
JP6555106B2 (en) Optical module
US9153511B2 (en) Chip on film including different wiring pattern, flexible display device including the same, and method of manufacturing flexible display device
JP2011185701A (en) Mounting structure of temperature detection element
JP6314591B2 (en) Semiconductor device and manufacturing method of semiconductor device
JP6716242B2 (en) Differential temperature sensor
JP2009059760A (en) Heat dissipation structure of electronic circuit board
JP5258877B2 (en) Active control of spatial temperature distribution changing with time
JP5892184B2 (en) Semiconductor device and manufacturing method of semiconductor device
JP6477105B2 (en) Semiconductor device
KR102475653B1 (en) Sensor package
JP6200693B2 (en) Electronic control unit
KR101279469B1 (en) Cof package having improved heat dissipation
JP2014120576A (en) Cooling device, electronic apparatus comprising the same, and cooling method
JP2016118554A (en) Differential temperature sensor
US6727193B2 (en) Apparatus and methods for enhancing thermal performance of integrated circuit packages
JP2010056279A (en) Semiconductor device
JP6540587B2 (en) Power module

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20180205

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20181017

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20181127

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20190124

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20190611

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20190624

R150 Certificate of patent or registration of utility model

Ref document number: 6555106

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250