JP2017039176A5 - - Google Patents

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JP2017039176A5
JP2017039176A5 JP2015161187A JP2015161187A JP2017039176A5 JP 2017039176 A5 JP2017039176 A5 JP 2017039176A5 JP 2015161187 A JP2015161187 A JP 2015161187A JP 2015161187 A JP2015161187 A JP 2015161187A JP 2017039176 A5 JP2017039176 A5 JP 2017039176A5
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Japan
Prior art keywords
substrate
top ring
area
elastic film
flow rate
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JP2015161187A
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Japanese (ja)
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JP2017039176A (en
JP6353418B2 (en
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Priority claimed from JP2015161187A external-priority patent/JP6353418B2/en
Priority to JP2015161187A priority Critical patent/JP6353418B2/en
Priority to SG10201606197XA priority patent/SG10201606197XA/en
Priority to SG10202100910UA priority patent/SG10202100910UA/en
Priority to SG10202002713PA priority patent/SG10202002713PA/en
Priority to TW110108232A priority patent/TWI785525B/en
Priority to TW105124413A priority patent/TWI724010B/en
Priority to KR1020160102483A priority patent/KR102134726B1/en
Priority to US15/234,058 priority patent/US10537975B2/en
Priority to CN201610688808.2A priority patent/CN106466806B/en
Priority to CN202010673067.7A priority patent/CN111775043B/en
Publication of JP2017039176A publication Critical patent/JP2017039176A/en
Publication of JP2017039176A5 publication Critical patent/JP2017039176A5/ja
Publication of JP6353418B2 publication Critical patent/JP6353418B2/en
Application granted granted Critical
Priority to US16/695,637 priority patent/US11472000B2/en
Priority to KR1020200084573A priority patent/KR102178517B1/en
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Claims (12)

トップリング本体と、その下方に設けられた弾性膜と、を有するトップリングに基板を吸着させる基板吸着方法であって、
前記基板の下面が支持部材に支持され、前記基板の上面が前記弾性膜の下面と接触した状態で、前記弾性膜の上面と前記トップリング本体との間に同心円状に形成された複数のエリアのうちの少なくとも1つのエリアを真空引きする真空引き工程と、
真空引きの対象エリアより外側にあるエリアにおけるガスの流量を計測する流量計測工程と、
前記ガスの流量に基づいて、前記トップリングに前記基板が吸着したか否かを判定する判定工程と、を備える基板吸着方法。
A substrate adsorption method for adsorbing a substrate to a top ring having a top ring body and an elastic film provided below the top ring body,
A plurality of areas formed concentrically between the upper surface of the elastic film and the top ring body with the lower surface of the substrate supported by a support member and the upper surface of the substrate in contact with the lower surface of the elastic film A vacuuming step of evacuating at least one area of
A flow rate measuring step for measuring a gas flow rate in an area outside the target area for vacuuming;
A determination step of determining whether or not the substrate has been adsorbed to the top ring based on the flow rate of the gas.
前記トップリングに前記基板が吸着したと判定された後に、前記基板が吸着された前記弾性膜と前記支持部材とを離間させる離間工程と、を備える請求項1に記載の基板吸着方法。The substrate adsorption method according to claim 1, further comprising: a separation step of separating the elastic film from which the substrate has been adsorbed and the support member after it is determined that the substrate has been adsorbed to the top ring. 前記真空引き工程の後に、前記真空引きの対象エリアの少なくとも1つのエリアの圧力を計測する圧力計測工程を備え、
前記判定工程では、前記ガスの流量に加え、前記真空引きの対象エリアの少なくとも1つのエリアにおける圧力も考慮して、前記トップリングに前記基板が吸着したか否かを判定する、請求項1または2に記載の基板吸着方法。
After the evacuation step, a pressure measurement step of measuring the pressure of at least one area of the evacuation target area,
Wherein in the determination step, in addition to the flow rate of the gas, said pressure also consider at least one area of the target area of the evacuation, it is determined whether the substrate to the top ring is adsorbed, according to claim 1 or 3. The substrate adsorption method according to 2.
前記複数のエリアのうちの少なくとも1つのエリアを加圧する加圧工程と、
前記基板の上面と前記弾性膜の下面とを接触させる接触工程と、を備え、
その後に前記真空引き工程が行われる、請求項1ないし3のいずれかに記載の基板吸着方法。
A pressurizing step of pressurizing at least one of the plurality of areas;
A contact step of bringing the upper surface of the substrate into contact with the lower surface of the elastic film,
The substrate suction method according to claim 1, wherein the vacuuming step is performed thereafter.
前記加圧工程では、前記真空引きの対象エリアを加圧する、請求項に記載の基板吸着方法。 The substrate suction method according to claim 4 , wherein in the pressurizing step, the area to be vacuumed is pressurized. 前記基板の上面と前記弾性膜の下面とが接触している際に、前記真空引きの対象エリアより外側にあるエリアを加圧しない、請求項1乃至のいずれかに記載の基板吸着方法。 The substrate adsorption method according to any one of claims 1 to 5 , wherein when the upper surface of the substrate and the lower surface of the elastic film are in contact with each other, an area outside the area to be vacuumed is not pressurized. 前記支持部材は、前記トップリングに前記基板を受け渡す搬送機構である、請求項1乃至のいずれかに記載の基板吸着方法。 The support member is a transport mechanism to pass the substrate to the top ring, the substrate adsorption method according to any one of claims 1 to 6. 前記支持部材は、前記トップリングに保持された基板を研磨する研磨テーブルである、請求項1乃至のいずれかに記載の基板吸着方法。 The support member is a polishing table for polishing a substrate held on the top ring, the substrate adsorption method according to any one of claims 1 to 7. トップリング本体と、
前記トップリング本体の下方に設けられる弾性膜であって、その上面と前記トップリング本体との間に同心円状に複数のエリアが形成された弾性膜と、
支持部材によって下面が支持された基板の上面と前記弾性膜の下面とが接触した状態で、前記複数のエリアのうちの少なくとも1つのエリアを真空引きする圧力調整手段と、
前記真空引きの対象エリアより外側にあるエリアにおけるガスの流量を計測する流量計と、
前記ガスの流量に基づいて、前記弾性膜の下面に前記基板が吸着したか否かを判定する判定手段と、を備えるトップリング。
The top ring body,
An elastic membrane provided below the top ring body, wherein a plurality of concentric areas are formed between the upper surface of the top ring body and the top ring body;
Pressure adjusting means for evacuating at least one of the plurality of areas in a state where the upper surface of the substrate whose lower surface is supported by the support member is in contact with the lower surface of the elastic film;
A flow meter for measuring the flow rate of the gas in an area outside the target area for vacuuming;
And a determination unit for determining whether or not the substrate is adsorbed on the lower surface of the elastic film based on the flow rate of the gas.
前記真空引きの対象エリアより外側にあるエリアには、前記流量計が設けられた流路が接続され、該エリアと前記流量計との間で、前記流路は分岐していない、請求項に記載のトップリング。 Wherein the area in the outside of the target area of the evacuation, the flow meter is a flow path that is provided is connected between the said area the flow meter, the flow path is not branched, claim 9 Top ring as described in. 前記複数のエリアが形成された位置において、前記弾性膜には孔が形成されていない、請求項または10に記載のトップリング。 The top ring according to claim 9 or 10 , wherein no hole is formed in the elastic film at a position where the plurality of areas are formed. 請求項乃至1のいずれかに記載のトップリングと、
前記トップリングに前記基板を受け渡す搬送機構と、
前記トップリングに保持された前記基板を研磨する研磨テーブルと、を備える基板研磨装置。



The top ring according to any one of claims 9 to 11,
A transport mechanism for delivering the substrate to the top ring;
A substrate polishing apparatus comprising: a polishing table that polishes the substrate held by the top ring.



JP2015161187A 2015-08-18 2015-08-18 Substrate adsorption method, top ring and substrate polishing apparatus Active JP6353418B2 (en)

Priority Applications (12)

Application Number Priority Date Filing Date Title
JP2015161187A JP6353418B2 (en) 2015-08-18 2015-08-18 Substrate adsorption method, top ring and substrate polishing apparatus
SG10201606197XA SG10201606197XA (en) 2015-08-18 2016-07-27 Substrate adsorption method, substrate holding apparatus, substrate polishing apparatus, elastic film, substrate adsorption determination method for substrate holding apparatus, and pressure control method for substrate holding apparatus
SG10202100910UA SG10202100910UA (en) 2015-08-18 2016-07-27 Substrate adsorption method, substrate holding apparatus, substrate polishing apparatus, elastic film, substrate adsorption determination method for substrate holding apparatus, and pressure control m
SG10202002713PA SG10202002713PA (en) 2015-08-18 2016-07-27 Substrate adsorption method, substrate holding apparatus, substrate polishing apparatus, elastic film, substrate adsorption determination method for substrate holding apparatus, and pressure control method for substrate holding apparatus
TW110108232A TWI785525B (en) 2015-08-18 2016-08-02 Substrate adsorption method, substrate holding apparatus, substrate polishing apparatus, elastic film, substrate adsorption determination method for substrate holding apparatus, and pressure control method for substrate holding apparatus
TW105124413A TWI724010B (en) 2015-08-18 2016-08-02 Substrate adsorption method, substrate holding apparatus, substrate polishing apparatus, elastic film, substrate adsorption determination method for substrate holding apparatus, and pressure control method for substrate holding apparatus
KR1020160102483A KR102134726B1 (en) 2015-08-18 2016-08-11 Substrate adsorption method, substrate holding apparatus, substrate polishing apparatus, substrate adsorption determination method for substrate holding apparatus, and pressure control method for substrate holding apparatus
US15/234,058 US10537975B2 (en) 2015-08-18 2016-08-11 Substrate adsorption method, substrate holding apparatus, substrate polishing apparatus, elastic film, substrate adsorption determination method for substrate holding apparatus, and pressure control method for substrate holding apparatus
CN201610688808.2A CN106466806B (en) 2015-08-18 2016-08-18 Substrate suction method, polishing apparatus, substrate holding apparatus, substrate suction determination method, and pressure control method
CN202010673067.7A CN111775043B (en) 2015-08-18 2016-08-18 Substrate holding device and elastic film
US16/695,637 US11472000B2 (en) 2015-08-18 2019-11-26 Substrate adsorption method, substrate holding apparatus, substrate polishing apparatus, elastic film, substrate adsorption determination method for substrate holding apparatus, and pressure control method for substrate holding apparatus
KR1020200084573A KR102178517B1 (en) 2015-08-18 2020-07-09 Substrate holding apparatus, and elastic membrane

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JP2017039176A JP2017039176A (en) 2017-02-23
JP2017039176A5 true JP2017039176A5 (en) 2018-05-24
JP6353418B2 JP6353418B2 (en) 2018-07-04

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JP6463303B2 (en) * 2016-05-13 2019-01-30 株式会社荏原製作所 Elastic film, substrate holding device, substrate polishing device, substrate adsorption determination method and pressure control method in substrate holding device
SG10201606197XA (en) 2015-08-18 2017-03-30 Ebara Corp Substrate adsorption method, substrate holding apparatus, substrate polishing apparatus, elastic film, substrate adsorption determination method for substrate holding apparatus, and pressure control method for substrate holding apparatus
US20230115469A1 (en) * 2020-03-26 2023-04-13 Nidec Read Corporation Circuit board inspecting apparatus

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US5423716A (en) * 1994-01-05 1995-06-13 Strasbaugh; Alan Wafer-handling apparatus having a resilient membrane which holds wafer when a vacuum is applied
JP3705670B2 (en) * 1997-02-19 2005-10-12 株式会社荏原製作所 Polishing apparatus and method
JP3922887B2 (en) * 2001-03-16 2007-05-30 株式会社荏原製作所 Dresser and polishing device
JP3846257B2 (en) * 2001-10-25 2006-11-15 松下電器産業株式会社 Pickup method in electronic component mounting apparatus
JP4364106B2 (en) * 2004-11-08 2009-11-11 株式会社東京精密 Vacuum chuck device and adsorption pressure control method
JP5390807B2 (en) * 2008-08-21 2014-01-15 株式会社荏原製作所 Polishing method and apparatus
JP2015082586A (en) * 2013-10-23 2015-04-27 株式会社荏原製作所 Polish device and polish method

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