JP2017039176A5 - - Google Patents
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- JP2017039176A5 JP2017039176A5 JP2015161187A JP2015161187A JP2017039176A5 JP 2017039176 A5 JP2017039176 A5 JP 2017039176A5 JP 2015161187 A JP2015161187 A JP 2015161187A JP 2015161187 A JP2015161187 A JP 2015161187A JP 2017039176 A5 JP2017039176 A5 JP 2017039176A5
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- JP
- Japan
- Prior art keywords
- substrate
- top ring
- area
- elastic film
- flow rate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 239000000758 substrate Substances 0.000 claims 24
- 238000005498 polishing Methods 0.000 claims 4
- 238000009530 blood pressure measurement Methods 0.000 claims 1
- 239000012528 membrane Substances 0.000 claims 1
- 238000000926 separation method Methods 0.000 claims 1
Claims (12)
前記基板の下面が支持部材に支持され、前記基板の上面が前記弾性膜の下面と接触した状態で、前記弾性膜の上面と前記トップリング本体との間に同心円状に形成された複数のエリアのうちの少なくとも1つのエリアを真空引きする真空引き工程と、
真空引きの対象エリアより外側にあるエリアにおけるガスの流量を計測する流量計測工程と、
前記ガスの流量に基づいて、前記トップリングに前記基板が吸着したか否かを判定する判定工程と、を備える基板吸着方法。 A substrate adsorption method for adsorbing a substrate to a top ring having a top ring body and an elastic film provided below the top ring body,
A plurality of areas formed concentrically between the upper surface of the elastic film and the top ring body with the lower surface of the substrate supported by a support member and the upper surface of the substrate in contact with the lower surface of the elastic film A vacuuming step of evacuating at least one area of
A flow rate measuring step for measuring a gas flow rate in an area outside the target area for vacuuming;
A determination step of determining whether or not the substrate has been adsorbed to the top ring based on the flow rate of the gas.
前記判定工程では、前記ガスの流量に加え、前記真空引きの対象エリアの少なくとも1つのエリアにおける圧力も考慮して、前記トップリングに前記基板が吸着したか否かを判定する、請求項1または2に記載の基板吸着方法。 After the evacuation step, a pressure measurement step of measuring the pressure of at least one area of the evacuation target area,
Wherein in the determination step, in addition to the flow rate of the gas, said pressure also consider at least one area of the target area of the evacuation, it is determined whether the substrate to the top ring is adsorbed, according to claim 1 or 3. The substrate adsorption method according to 2.
前記基板の上面と前記弾性膜の下面とを接触させる接触工程と、を備え、
その後に前記真空引き工程が行われる、請求項1ないし3のいずれかに記載の基板吸着方法。 A pressurizing step of pressurizing at least one of the plurality of areas;
A contact step of bringing the upper surface of the substrate into contact with the lower surface of the elastic film,
The substrate suction method according to claim 1, wherein the vacuuming step is performed thereafter.
前記トップリング本体の下方に設けられる弾性膜であって、その上面と前記トップリング本体との間に同心円状に複数のエリアが形成された弾性膜と、
支持部材によって下面が支持された基板の上面と前記弾性膜の下面とが接触した状態で、前記複数のエリアのうちの少なくとも1つのエリアを真空引きする圧力調整手段と、
前記真空引きの対象エリアより外側にあるエリアにおけるガスの流量を計測する流量計と、
前記ガスの流量に基づいて、前記弾性膜の下面に前記基板が吸着したか否かを判定する判定手段と、を備えるトップリング。 The top ring body,
An elastic membrane provided below the top ring body, wherein a plurality of concentric areas are formed between the upper surface of the top ring body and the top ring body;
Pressure adjusting means for evacuating at least one of the plurality of areas in a state where the upper surface of the substrate whose lower surface is supported by the support member is in contact with the lower surface of the elastic film;
A flow meter for measuring the flow rate of the gas in an area outside the target area for vacuuming;
And a determination unit for determining whether or not the substrate is adsorbed on the lower surface of the elastic film based on the flow rate of the gas.
前記トップリングに前記基板を受け渡す搬送機構と、
前記トップリングに保持された前記基板を研磨する研磨テーブルと、を備える基板研磨装置。
The top ring according to any one of claims 9 to 11,
A transport mechanism for delivering the substrate to the top ring;
A substrate polishing apparatus comprising: a polishing table that polishes the substrate held by the top ring.
Priority Applications (12)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015161187A JP6353418B2 (en) | 2015-08-18 | 2015-08-18 | Substrate adsorption method, top ring and substrate polishing apparatus |
SG10201606197XA SG10201606197XA (en) | 2015-08-18 | 2016-07-27 | Substrate adsorption method, substrate holding apparatus, substrate polishing apparatus, elastic film, substrate adsorption determination method for substrate holding apparatus, and pressure control method for substrate holding apparatus |
SG10202100910UA SG10202100910UA (en) | 2015-08-18 | 2016-07-27 | Substrate adsorption method, substrate holding apparatus, substrate polishing apparatus, elastic film, substrate adsorption determination method for substrate holding apparatus, and pressure control m |
SG10202002713PA SG10202002713PA (en) | 2015-08-18 | 2016-07-27 | Substrate adsorption method, substrate holding apparatus, substrate polishing apparatus, elastic film, substrate adsorption determination method for substrate holding apparatus, and pressure control method for substrate holding apparatus |
TW110108232A TWI785525B (en) | 2015-08-18 | 2016-08-02 | Substrate adsorption method, substrate holding apparatus, substrate polishing apparatus, elastic film, substrate adsorption determination method for substrate holding apparatus, and pressure control method for substrate holding apparatus |
TW105124413A TWI724010B (en) | 2015-08-18 | 2016-08-02 | Substrate adsorption method, substrate holding apparatus, substrate polishing apparatus, elastic film, substrate adsorption determination method for substrate holding apparatus, and pressure control method for substrate holding apparatus |
KR1020160102483A KR102134726B1 (en) | 2015-08-18 | 2016-08-11 | Substrate adsorption method, substrate holding apparatus, substrate polishing apparatus, substrate adsorption determination method for substrate holding apparatus, and pressure control method for substrate holding apparatus |
US15/234,058 US10537975B2 (en) | 2015-08-18 | 2016-08-11 | Substrate adsorption method, substrate holding apparatus, substrate polishing apparatus, elastic film, substrate adsorption determination method for substrate holding apparatus, and pressure control method for substrate holding apparatus |
CN201610688808.2A CN106466806B (en) | 2015-08-18 | 2016-08-18 | Substrate suction method, polishing apparatus, substrate holding apparatus, substrate suction determination method, and pressure control method |
CN202010673067.7A CN111775043B (en) | 2015-08-18 | 2016-08-18 | Substrate holding device and elastic film |
US16/695,637 US11472000B2 (en) | 2015-08-18 | 2019-11-26 | Substrate adsorption method, substrate holding apparatus, substrate polishing apparatus, elastic film, substrate adsorption determination method for substrate holding apparatus, and pressure control method for substrate holding apparatus |
KR1020200084573A KR102178517B1 (en) | 2015-08-18 | 2020-07-09 | Substrate holding apparatus, and elastic membrane |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015161187A JP6353418B2 (en) | 2015-08-18 | 2015-08-18 | Substrate adsorption method, top ring and substrate polishing apparatus |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2017039176A JP2017039176A (en) | 2017-02-23 |
JP2017039176A5 true JP2017039176A5 (en) | 2018-05-24 |
JP6353418B2 JP6353418B2 (en) | 2018-07-04 |
Family
ID=58202754
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2015161187A Active JP6353418B2 (en) | 2015-08-18 | 2015-08-18 | Substrate adsorption method, top ring and substrate polishing apparatus |
Country Status (1)
Country | Link |
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JP (1) | JP6353418B2 (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6463303B2 (en) * | 2016-05-13 | 2019-01-30 | 株式会社荏原製作所 | Elastic film, substrate holding device, substrate polishing device, substrate adsorption determination method and pressure control method in substrate holding device |
SG10201606197XA (en) | 2015-08-18 | 2017-03-30 | Ebara Corp | Substrate adsorption method, substrate holding apparatus, substrate polishing apparatus, elastic film, substrate adsorption determination method for substrate holding apparatus, and pressure control method for substrate holding apparatus |
US20230115469A1 (en) * | 2020-03-26 | 2023-04-13 | Nidec Read Corporation | Circuit board inspecting apparatus |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5423716A (en) * | 1994-01-05 | 1995-06-13 | Strasbaugh; Alan | Wafer-handling apparatus having a resilient membrane which holds wafer when a vacuum is applied |
JP3705670B2 (en) * | 1997-02-19 | 2005-10-12 | 株式会社荏原製作所 | Polishing apparatus and method |
JP3922887B2 (en) * | 2001-03-16 | 2007-05-30 | 株式会社荏原製作所 | Dresser and polishing device |
JP3846257B2 (en) * | 2001-10-25 | 2006-11-15 | 松下電器産業株式会社 | Pickup method in electronic component mounting apparatus |
JP4364106B2 (en) * | 2004-11-08 | 2009-11-11 | 株式会社東京精密 | Vacuum chuck device and adsorption pressure control method |
JP5390807B2 (en) * | 2008-08-21 | 2014-01-15 | 株式会社荏原製作所 | Polishing method and apparatus |
JP2015082586A (en) * | 2013-10-23 | 2015-04-27 | 株式会社荏原製作所 | Polish device and polish method |
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2015
- 2015-08-18 JP JP2015161187A patent/JP6353418B2/en active Active
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